BS EN 61207-6-2015 Expression of performance of gas analyzers Photometric analyzers《气体分析仪性能 第6部分 光度分析仪》.pdf

1、BSI Standards PublicationExpression of performanceof gas analyzers Part 6: Photometric analyzersBS EN 61207-6:2015National forewordThis British Standard is the UK implementation of EN 61207-6:2015. It isidentical to IEC 61207-6:2014. It supersedes BS EN 61207-6:1994, which willbe withdrawn on 30 Dec

2、ember 2017.The UK participation in its preparation was entrusted by Technical Com-mittee GEL/65, Measurement and control, to Subcommittee GEL/65/2,Elements of systems.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to

3、 include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 83062 4ICS 19.080; 71.040.40Compliance with a British Standard cannot confer immunity fromlegal obligati

4、ons.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 January 2015.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 61207-6:2015EUROPEAN STANDARDNORME EUROPENNEEUROPISCHE NORMEN 61207-6 January 2015 ICS 19

5、.080; 71.040.40 Supersedes EN 61207-6:1994 English Version Expression of performance of gas analyzers - Part 6:Photometric analyzers (IEC 61207-6:2014) Expression des performances des analyseurs de gaz - Partie 6: Analyseurs photomtriques (IEC 61207-6:2014) Angabe zum Betriebsverhalten von Gasanalys

6、atoren - Teil 6: Fotometrische Analysatoren (IEC 61207-6:2014) This European Standard was approved by CENELEC on 2014-12-30. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standar

7、d without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in

8、any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia

9、, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey

10、and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation ElectrotechniqueEuropisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2015 CENELEC All rights of exploitation in any form and by

11、any means reserved worldwide for CENELEC Members. Ref. No. EN 61207-6:2015 E EN 61207-6:2015 - 2 - Foreword The text of document 65B/947/FDIS, future edition 2 of IEC 61207-6, prepared by SC 65B “Measurement and control devices“, of IEC/TC 65 “Industrial-process measurement, control and automation“

12、was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61207-6:2015. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2015-09-30 latest date by which

13、 the national standards conflicting with the document have to be withdrawn (dow) 2017-12-30 This document supersedes EN 61207-6:1994. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible

14、 for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61207-6:2014 was approved by CENELEC as a European Standard without any modification. BS EN 61207-6:2015- 3 - EN 61207-6:2015 Annex ZA (normative) Normative references to international publi

15、cations with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenc

16、ed document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: w

17、ww.cenelec.eu. Publication Year Title EN/HD Year IEC 60079-29-1 - Explosive atmospheres - Part 29-1: Gas detectors - Performance requirements of detectors for flammable gases EN 60079-29-1 - IEC 60079-29-4 - Explosive atmospheres - Part 29-4: Gas detectors - Performance requirements of open path det

18、ectors for flammable gases EN 60079-29-4 - IEC 60654 series Operating conditions for industrial-process measurement and control equipment EN 60654 series IEC 61207-1 - Expression of performance of gas analyzers - Part 1: General EN 61207-1 - IEC 61207-7 - Expression of performance of gas analyzers -

19、 Part 7: Tuneable semiconductor laser gas analyzers EN 61207-7 - ISO 9001 - Quality management systems - Requirements EN ISO 9001 - BS EN 61207-6:2015 2 IEC 61207-6:2014 IEC 2014 CONTENTS INTRODUCTION . 5 1 Scope and object . 6 2 Normative references 6 3 Terms and definitions 7 4 Procedure for speci

20、fication 13 4.1 General . 13 4.2 Specification of essential ancillary units and services . 13 4.3 Additional terms related to the specification of performance 13 5 Recommended standard values and range of influence quantities . 14 6 Procedures for compliance testing . 14 6.1 Verification of performa

21、nce values 14 6.2 Test equipment . 14 6.3 Simulation of duct width 14 6.4 Testing procedures . 15 6.4.1 General . 15 6.4.2 Linearity uncertainty 15 6.4.3 Interference uncertainty . 15 6.4.4 Delay time, rise and fall time 16 Annex A (normative) Techniques and systems of photometric analysis 17 Annex

22、B (informative) Methods of preparation of water-vapor in test gases 20 Bibliography 22 Figure A.1 Wavelength range for photometric measurements . 17 Figure A.2 Analysis systems for gases . 17 Figure A.3 Test apparatus to apply gases and water vapor to analysis systems . 18 Figure A.4 Test apparatus

23、to simulate duct conditions for in-situ/across-duct analyzers 19 BS EN 61207-6:2015IEC 61207-6:2014 IEC 2014 5 INTRODUCTION Photometric analyzers utilize detectors which respond to wavelengths in the ultraviolet, visible and infrared part of the electromagnetic spectrum within the wavelength range 0

24、,1 m to 50 m (see Figure A.1). Within this range of wavelengths, many gases have absorption and/or emission bands. Analyzers designed to utilize these bands employ several techniques, including sensing of specific absorbed radiation by the sample gas or emitted radiation from the gas sample after ar

25、tificial excitation. The volume of gas measured may be contained within a sample cell and this sample may or may not be conditioned, or (for in-situ analyzers) the concentration may be directly measured within the sample gas itself (see Figure A.2). BS EN 61207-6:2015 6 IEC 61207-6:2014 IEC 2014 EXP

26、RESSION OF PERFORMANCE OF GAS ANALYZERS Part 6: Photometric analyzers 1 Scope and object This part of IEC 61207 applies to all aspects of analyzers using photometric techniques for the measurement of concentration of one or more components in a mixture of gases or vapors. It should be used in conjun

27、ction with IEC 61207-1. For photometric analyzers utilizing tuneable semiconductor laser absorption spectroscopy (TSLAS) for gas measurements, IEC 61207-7 should also be referred to. This part of IEC 61207 applies to analyzers using non-dispersive and dispersive wavelength selection and using absorp

28、tion, emission, wavelength derivative or scattering techniques. It applies to analyzers which receive either a conditioned or unconditioned sample of gas either under vacuum, at ambient pressure or pressurized. It applies to analyzers which measure gas concentrations directly within the sample gas.

29、The object of this part is: to specify the terminology and definitions related to the functional performance of gas analyzers, utilizing a photometric analyzer, for the continuous measurement of gas or vapor concentration in a source gas; to unify methods used in making and verifying statements on t

30、he functional performance of such analyzers; to specify what tests should be performed to determine the functional performance and how such tests should be carried out; to provide basic documents to support the application of standards of quality assurance ISO 9001. 2 Normative references The follow

31、ing documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60079-29-1, E

32、xplosive atmospheres Part 29-1: Gas detectors Performance requirements of detectors for flammable gases IEC 60079-29-4, Explosive atmospheres Part 29-4: Gas detectors Performance requirements of open path detectors for flammable gases IEC 60654 (all parts), Operating conditions for industrial-proces

33、s measurement and control equipment IEC 61207-1, Expression of performance of gas analyzers Part 1: General BS EN 61207-6:2015IEC 61207-6:2014 IEC 2014 7 IEC 61207-7, Expression of performance of gas analyzers Part 7: Tuneable semiconductor laser gas analyzers ISO 9001, Quality management systems Re

34、quirements 3 Terms and definitions For the purposes of the present document, the following terms and definitions apply. NOTE The following definitions and examples of equipment and measuring techniques are for illustration and do not constitute a complete list of all possible measurement types. See

35、Figure A.1 for the relationship between the different optical wavelength ranges. 3.1 light source device that emits light within the wavelength range 0,1 m to 50 m Note 1 to entry: A source may be, but is not limited to: a gas or solid state laser, semiconductor laser diode, light emitting diode, el

36、ectric discharge source or incandescent filament. 3.2 light detector device that is sensitive to light and that may be used to detect light within the wavelength range 0,1 m to 50 m Note 1 to entry: A light detector may be, but is not limited to: a photomultiplier tube, semiconductor device (photovo

37、ltaic or photoconductive) such as a photodiode, avalanche photodiode or charge coupled device (CCD) and, additionally, in the infrared region: pyroelectric detector, bolometer or thermopile. 3.3 wavelength selection wavelength or range of wavelengths selected for use in particular measurement Note 1

38、 to entry: A suitable wavelength transmission range may be selected by using an appropriate means including a band-pass optical filter or dispersive element such as a diffraction grating. Note 2 to entry: The wavelength from the light source may be tuned or modulated such as by using the current or

39、temperature for a semiconductor laser diode, varying the temperature of an incandescent source or varying the input angle to a band-pass filter. 3.4 optical sample cell enclosed volume where the optical measurement of the sample gas takes place Note 1 to entry: The optical measurement may take place

40、 by measuring the absorption or emission of the analyte after light of a suitable wavelength has been passed through an optical sample cell. Note 2 to entry: The sample cell shall have some means of gas inlet and outlet, which may be via piping for flow or pressure driven systems or via diffusion th

41、rough a mechanical filter. Note 3 to entry: The cell may require a high integrity seal from the outside environment for extractive systems other than the gas inlet and outlet means. Note 4 to entry: Cell windows of the appropriate optical transmission band are required for the light ingress and egre

42、ss. Note 5 to entry: Internal mechanical or optical features of the sample cell may be used to decrease stray light interference or to direct or concentrate the light where appropriate. Note 6 to entry: The cell is designed to give an optical path length which is appropriate to the analyte and range

43、 required. BS EN 61207-6:2015 8 IEC 61207-6:2014 IEC 2014 3.5 multi-pass sample cell optical sample cell with increased effective absorption light path achieved by multiple reflections within the optical cavity of the sample cell Note 1 to entry: The effect of the multi-pass cell is to increase the

44、sensitivity of the measurement for the same total cell pared to a single pass cell. Note 2 to entry: Typical design models used include Herriott or White cells. 3.6 environmental monitoring gas analyzer photometric gas analyzer used for environmental monitoring purposes 3.6.1 open path monitoring op

45、tical measurement where no containment for the sample gas is required Note 1 to entry: This may be across a large space or an external measurement path. Note 2 to entry: Typically, the light source and detector are separated by a distance and aligned to give a straight line absorption pathway. Note

46、3 to entry: The net absorption will be the integrated effect across the whole of the absorption path length. 3.6.2 point monitoring monitoring giving localized gas concentration information Note 1 to entry: This gives monitoring information from a localized position rather than averaged data across

47、an extended path length as per 3.6.1. 3.7 in-situ analyzer analyzer where the volume of gas sensed, that is gas within the measuring path for a photometric analyzer, is situated within the process source fluid Note 1 to entry: An in-situ analyzer may contain a fixed-length measuring cell within the

48、duct and hence its calibration is not affected by the dimensions of the duct. 3.7.1 across duct or cross stack analyzer analyzer where the measuring path is formed by the entire width of a process duct or stack Note 1 to entry: The radiation source and detector can be mounted on opposite sides of th

49、e duct, or both can be mounted on the same side and a retroreflector employed. Where the retroreflector is within the duct, the analyzer is of the in-situ type. 3.7.2 across process line or pipe analyzer analyzer where the measuring path is formed by the entire width of a process pipe Note 1 to entry: The radiation source and detector can be mounted on opposite sides of the pipe, or both can be mounted on the same side and a retroreflector employed. Where the retroreflector is wit