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本文(BS EN 61830-1998 Microwave ferrite components - Measuring methods for major properties《微波铁氧体元件 主要性能的测量方法》.pdf)为本站会员(terrorscript155)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

BS EN 61830-1998 Microwave ferrite components - Measuring methods for major properties《微波铁氧体元件 主要性能的测量方法》.pdf

1、BRITISH STANDARD BS EN 61830:1998 IEC 61830: 1997 Microwave ferrite components Measuring methods for major properties The European Standard EN 61830:1998 has the status of a British Standard ICS 29.100.10BSEN61830:1998 This British Standard, having been prepared under the directionof the Electrotech

2、nical Sector Board, was published underthe authority of the Standards Board and comes into effect on 15 April 1998 BSI 04-1999 ISBN 0 580 29289 4 National foreword This British Standard is the English language version of EN61830:1998. It is identical with IEC61830:1997. The UK participation in its p

3、reparation was entrusted to Technical Committee EPL/51, Transformers, inductors, magnetic components and ferrite materials, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or propo

4、sals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secretary. From 1 January 1997, all IEC publications have the number 600

5、00 added to the old number. For instance, IEC 27-1 has been renumbered as IEC60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references Attention is drawn to the fact that CEN and CENELEC stand

6、ards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards which implement international or European publications referred to in this document may be found in the BSI Standards Catalogue under th

7、e section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applic

8、ation. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 10 and a back cover. This standard has been updated (see copyright date) a

9、nd may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSEN61830:1998 BSI 04-1999 i Contents Page National foreword Inside front cover Foreword 2 Text of EN 61830 3ii blankEUROPEAN ST

10、ANDARD NORME EUROPENNE EUROPISCHE NORM EN 61830 February 1998 ICS 29.100.10 Descriptors: Microwave ferrite components, major microwave properties, measuring methods, return loss, forward loss, reverse loss, phase-shift, group-delay English version Microwave ferrite components Measuring methods for m

11、ajor properties (IEC 61830:1997) Composants ferrites pour hyperfrquences Mthodes de mesure des principales proprits (CEI 61830:1997) Mikrowellenferritbauelemente Meverfahren fr die Hauptmikrowelleneigenschaften (IEC 61830:1997) This European Standard was approved by CENELEC on 1998-01-01. CENELEC me

12、mbers are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on applica

13、tion to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat

14、 has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdo

15、m. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC All rights of exploitation in any form and by any means reserved w

16、orldwide for CENELEC members. Ref. No. EN 61830:1998 EEN61830:1998 BSI 04-1999 2 Foreword The text of document 51/486/FDIS, future edition 1 of IEC61830, prepared by IEC TC 51, Magnetic components and ferrite materials, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN

17、61830 on1998-01-01. The following dates were fixed: Annexes designated “normative” are part of the body of the standard. In this standard, Annex ZA is normative. Annex ZA has been added by CENELEC. Endorsement notice The text of the International Standard IEC61830:1997 was approved by CENELEC as a E

18、uropean Standard without any modification. Contents Page Foreword 2 1 Scope 3 2 Normative reference 3 3 Return loss 3 3.1 The relationship between impedance, return loss, reflection coefficient and voltage standing wave ratio (VSWR) 3 3.2 Method of measurement of return loss 3 3.3 General considerat

19、ions of the measuring equipment 3 3.4 Measuring procedure 4 3.5 Presentation of results 4 3.6 Detail to be specified 4 4 Forward loss and reverse loss 4 4.1 Definition and general considerations 4 4.2 Method of measurement 4 4.3 General considerations of the measuring equipment 4 4.4 Measuring proce

20、dure 5 4.5 Presentation of results 5 5 Phase-shift and group-delay 5 5.1 Definition and general considerations 5 5.2 Method of measurement 6 5.3 Presentation of results 6 Annex ZA (normative) Normative references to international publications with their corresponding European publications 10 Figure

21、1 Arrangement of equipment for measuring return loss 7 Figure 2 Example of oscilloscope display of return loss 7 Figure 3 Arrangement of equipment for measuring forward loss and reverse loss 8 Figure 4 Example of oscilloscope display of forward loss and reverse loss 8 Figure 5 Arrangement of equipme

22、nt for measuring phase-shift and group-delay 9 Figure 6 Example of oscilloscope display of phase-shift and group-delay 9 latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 1998-10-01 latest date by which the na

23、tional standards conflicting with the EN have to be withdrawn (dow) 1998-10-01EN61830:1998 BSI 04-1999 3 1 Scope This International Standard gives guidance on the measuring methods for major microwave properties, such as return loss, forward loss, reverse loss, phase shift and group delay, of microw

24、ave ferrite components. NOTE 1The methods of measurement are compiled after the model of IEC60510-1-3. NOTE 2Network analyzers are being used by most manufacturers to evaluate such properties of microwave ferrite components at present. However, knowledge of basic measuring methods is necessary for u

25、nderstanding the general purpose of measurements including the use of network analyzers. Therefore, orthodox methods of measurement are described herein. 2 Normative reference The following normative document contains provisions which, through reference in this text, constitute provisions of this st

26、andard. At the time of publication, the edition indicated was valid. All normative documents are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent edition of the normative document indicated b

27、elow. Members of IEC and ISO maintain registers of currently valid International Standards. IEC 60510-1-3:1980, Methods of measurement for radio equipment used in satellite earth stations Part 1: Measurements common to sub-systems and combinations of sub-systems Section 3: Measurements in the i.f. r

28、ange Amendment 1 (1988). 3 Return loss 3.1 The relationship between impedance, return loss, reflection coefficient and voltage standing wave ratio (VSWR) In microwave ferrite components, interest is essentially in the measurement of return loss rather than that of impedance, reflection coefficient,

29、or VSWR. The return loss L in decibels of an impedance Z relative to its nominal value Z 0is given by: Alternatively, the return loss in decibels is given by: where is the voltage reflection coefficient of the impedance Z relative to Z 0 , i.e. VSWR is given by: 3.2 Method of measurement of return l

30、oss Measurements may be made by using either point-by-point or sweep-frequency methods. For the latter case, an example is described in following subclauses, but any alternative method capable of providing the required accuracy (typically 1 dB) may be used. In this example, the equipments listed bel

31、ow and shown in Figure 1, are needed: a sweep-frequency generator; a microwave bridge; a calibrated attenuator; an amplitude detector; an oscilloscope. The method is intended for measuring the return loss of linear and passive ports, for example the input impedance of an isolator. It also may be use

32、d for measuring the return loss of linear, active and passive devices, for example at the output of device (source impedance) provided that no signal is present and that the device under test can be considered as a linear, passive network. The return loss of cables, attenuators, adapters, etc., used

33、 during the measurements, as well as the return loss at the input and the output of measuring equipment, may be checked using the same method. 3.3 General considerations of the measuring equipment 3.3.1 Sweep-frequency generator Over a specified frequency range, the generator should be able to gener

34、ate a sinusoidal, radio frequency signal, and its output level should be constant. The repetition rate f sof the sweep should be in the range 10 Hz to 100 Hz provided that the passband of the receiver section, i.e., amplitude detector and oscilloscope, is about 50 times to 100 times the chosen sweep

35、 rate. (1) (2) (3) (4)EN61830:1998 4 BSI 04-1999 3.3.2 Microwave bridge Over a specified range of signal levels, the voltage at the output of the bridge should be proportional to the magnitude of the reflection coefficient of the impedance under test. 3.3.3 Detector sensitivity The minimum level det

36、ectable by the detector should be at least 20 dB below the minimum level expected from the bridge under conditions given in3.4.3. 3.4 Measuring procedure 3.4.1 General The measuring procedure comprises three steps: namely, calibration, balance check of the bridge and measurement. 3.4.2 Calibration T

37、he output level of the sweep-frequency generator is adjusted to obtain the desired voltage across the impedance Z in the bridge. Care should be taken to avoid overloading the equipment under test. The test arm of the bridge is left short-circuited and the calibrated attenuator is then adjusted to ob

38、tain a suitable d.c. level at the output of the amplitude detector. 3.4.3 Checking the residual return loss of the bridge A matched load Z 0 , coaxial or waveguide, is connected to the bridge in place of the unknown impedance Z. The residual return loss is then checked by adjusting the calibrated at

39、tenuator until the traces on the screen of the oscilloscope approach coincidence. It is possible to obtain exact coincidence only if sufficient receiver sensitivity is available. The setting of the attenuator should be noted when coincidence of the traces occurs or when the limit of receiver sensiti

40、vity is reached. This setting determines the maximum value of return loss which can be measured with specified accuracy. Return loss values up to 20 dB less than the value obtained above can be measured with an accuracy of 1 dB. For example, when the value is 50 dB, return loss values up to 30 dB ca

41、n be measured with an accuracy of 1 dB. 3.4.4 Measurement of return loss One port of the device under test with unknown impedance Z is connected to the bridge and the other port(s) of the device should be terminated by matched load(s) Z 0 . The calibrated attenuator is adjusted until the measuring t

42、race and the reference trace on the screen of the oscilloscope coincide at the specified frequency as indicated by the frequency marker. The difference between this attenuator setting and that obtained under 3.4.2 is equal to the return loss of the unknown impedance Z. When it is necessary to measur

43、e return loss of the other ports of the device, repeat the above procedure regarding the port to be measured. 3.5 Presentation of results The results of the measurements should be presented preferably as a curve or photograph of the oscilloscope display with the vertical scale as shown in Figure 2 o

44、r with this scale inverted. Reference lines may be added on the oscilloscope display. In every case the residual return loss curve should be shown as well as the measured curve. When the results of the measurements are not presented graphically, they should be given as in the following example: a) r

45、eturn loss more than 23 dB from 3,5 GHz to4,5 GHz; b) residual return loss more than 45 dB. 3.6 Detail to be specified The following should be included as required in the detailed equipment specification: a) return loss limits; b) frequency band limits. 4 Forward loss and reverse loss 4.1 Definition

46、 and general considerations The forward loss and reverse loss are given by the curve representing the difference, expressed in decibels, between the output level and a reference level, as a function of frequency for a constant input level. 4.2 Method of measurement Measurements may be made using eit

47、her point-by-point or sweep-frequency methods. For the latter case, an example of the arrangement of the measuring equipment is shown in Figure 3. Use of isolators at the input and output port of the device under test is recommended to reduce mismatch errors. 4.3 General considerations of the measur

48、ing equipment When using the sweep-frequency methods, repetition of the sweep-frequency generator, the waveform of the sweep signal and the pass-band of the detector and the oscilloscope should conform to3.3.1. Care should be taken to ensure that the results of the measurements are not affected by h

49、armonics of the test signal.EN61830:1998 BSI 04-1999 5 Before commencing the measurements on the equipment to be tested, the magnitude of the inherent errors of the measuring equipment including the cables, attenuators and other accessories which are to be used, should be calibrated by connecting the output of the signal generator to the input of the detector. When measurements are made on the devices having no connectors such as stripline or pin type devices, appropriate test fixture furnished with connectors should be

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