1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationOrganic light emitting diode(OLED) displaysPart 6-2: Measuring methods of visual quality and ambient performanceBS EN 62341-6-2:2012National forewordThis British Standard is the
2、UK implementation of EN 62341-6-2:2012. It isidentical to IEC 62341-6-2:2012.The UK participation in its preparation was entrusted to Technical CommitteeEPL/47, Semiconductors.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not p
3、urport to include all the necessary provisions of acontract. Users are responsible for its correct application. The British Standards Institution 2012Published by BSI Standards Limited 2012ISBN 978 0 580 67198 2ICS 31.260Compliance with a British Standard cannot confer immunity fromlegal obligations
4、.This British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 30 April 2012.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 62341-6-2:2012EUROPEAN STANDARD EN 62341-6-2 NORME EUROPENNE EUROPISCHE NORM March 2012 CENELEC
5、European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide fo
6、r CENELEC members. Ref. No. EN 62341-6-2:2012 E ICS 31.260 English version Organic light emitting diode (OLED) displays - Part 6-2: Measuring methods of visual quality and ambient performance (IEC 62341-6-2:2012) Afficheurs diodes lectroluminescentes organiques (OLED) - Partie 6-2: Mthodes de mesure
7、 de la qualit visuelle et des caractristiques de fonctionnement sous conditions ambiantes (CEI 62341-6-2:2012) Anzeigen mit organischen Leuchtdioden (OLEDs) - Teil 6-2: Messverfahren fr Bildqualitt und Umgebungsbetriebseigenschaften (IEC 62341-6-2:2012) This European Standard was approved by CENELEC
8、 on 2012-02-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards
9、may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and
10、 notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland,
11、 Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 62341-6-2:2012EN 62341-6-2:2012 - 2 - Foreword The text of document 110/338/FDIS, future edition 1 of IEC 62341-6-2,
12、prepared by IEC TC 110, “Flat panel display devices“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62341-6-2:2012. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard
13、or by endorsement (dop) 2012-11-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2015-02-28 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be hel
14、d responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62341-6-2:2012 was approved by CENELEC as a European Standard without any modification. BS EN 62341-6-2:2012- 3 - EN 62341-6-2:2012 Annex ZA (normative) Normative references to
15、international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edit
16、ion of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60050 Series International electrotechnical vocabulary - - IEC 60
17、081 - Double-capped fluorescent lamps - Performance specifications EN 60081- IEC 61966-2-1 - Multimedia systems and equipment - Colour measurement and management - Part 2-1: Colour management - Default RGB colour space - sRGB EN 61966-2-1 - IEC 62341-1-2 - Organic light emitting diode displays - Par
18、t 1-2: Terminology and letter symbols EN 62341-1-2 - CIE 15 2004 Colorimetry - - BS EN 62341-6-2:2012 2 62341-6-2 IEC:2012 CONTENTS 1 Scope . 6 2 Normative references . 6 3 Terms, definitions and abbreviations 6 3.1 Terms and definitions 6 3.2 Abbreviations 9 4 Structure of measuring equipment 9 5 S
19、tandard measuring conditions . 9 5.1 Standard measuring environmental conditions . 9 5.2 Standard lighting conditions 10 5.2.1 Dark-room conditions 10 5.2.2 Ambient illumination conditions 10 5.3 Standard setup conditions . 15 5.3.1 General . 15 5.3.2 Adjustment of OLED display modules 15 5.3.3 Star
20、ting conditions of measurements . 16 5.3.4 Conditions of measuring equipment . 16 6 Visual inspection of static images . 17 6.1 General . 17 6.2 Classification of visible defects 17 6.2.1 Classification scheme 17 6.2.2 Reference examples for subpixel defects . 17 6.2.3 Reference example for line def
21、ects 19 6.2.4 Reference example for mura defects . 19 6.3 Visual inspection method and criteria 20 6.3.1 Standard inspection conditions 20 6.3.2 Standard inspection method 21 6.3.3 Inspection criteria 23 7 Electro-optical measuring methods under ambient illumination . 24 7.1 Reflection measurements
22、24 7.1.1 Purpose . 24 7.1.2 Measuring conditions . 24 7.1.3 Measuring the hemispherical diffuse reflectance factor 25 7.1.4 Measuring the reflectance factor for a directed light source . 27 7.2 Ambient contrast ratio . 29 7.2.1 Purpose . 29 7.2.2 Measuring conditions . 29 7.2.3 Measuring method . 30
23、 7.3 Ambient display colour 30 7.3.1 Purpose . 30 7.3.2 Measuring conditions . 30 7.3.3 Measuring method . 30 7.4 Ambient colour gamut volume . 31 7.4.1 Purpose . 31 7.4.2 Measuring conditions . 32 7.4.3 Measuring method . 32 BS EN 62341-6-2:201262341-6-2 IEC:2012 3 7.4.4 Reporting 33 Annex A (infor
24、mative) Measuring relative photoluminescence contribution from displays 35 Annex B (informative) Calculation method of ambient colour gamut volume . 38 Bibliography 44 Figure 1 Example of visual inspection room setup for control of ambient room lighting and reflections 10 Figure 2 Example of measure
25、ment geometries for diffuse illumination condition using an integrating sphere and sampling sphere . 13 Figure 3 Directional source measurement geometry using an isolated source 15 Figure 4 Directional source measurement geometry using a ring light source . 15 Figure 5 Layout diagram of measurement
26、set up 16 Figure 6 Classification of visible defects 17 Figure 7 Bright subpixel defects . 18 Figure 8 Criteria for classifying bright and dark subpixel defects 19 Figure 9 Bright and dark line defects 19 Figure 10 Sample image of line mura defect associated with TFT non-uniformity . 20 Figure 11 Ex
27、ample of spot mura defect in a grey background 20 Figure 12 Setup condition for visual inspection of electro-optical visual defects . 22 Figure 13 Shape of scratch and dent defect . 24 Figure 14 An example of range in colours produced by a given display as represented by the CIELAB colour space 33 F
28、igure A.1 Scaled bi-spectral photoluminescence response from a display . 36 Figure A.2 Decomposed bi-spectral photoluminescence response from a display . 36 Figure B.1 Analysis flow chart for calculating the colour gamut volume 38 Figure B.2 Graphical representation of the colour gamut volume for sR
29、GB in the CIELAB colour space 39 Table 1 Definitions for type of scratch and dent defects . 24 Table 2 Eigenvalues M1and M2 for CIE Daylight Illuminants D50 and D75 26 Table 3 Example of minimum colours required for gamut volume calculation of a 3-primary 8-bit display . 32 Table 4 Measured tristimu
30、lus values for the minimum set of colours (see Table 3) required for gamut volume calculation under the specified ambient illumination condition . 34 Table 5 Calculated white point in the darkened room and ambient condition 34 Table 6 Colour gamut volume in the CIELAB colour space . 34 Table B.1 Tri
31、stimulus values of the sRGB primary colours . 39 Table B.2 Example of sRGB colour set represented in the CIELAB colour space . 39 Table B.3 Example of sRGB colour gamut volume in the CIELAB colour space 40 BS EN 62341-6-2:2012 6 62341-6-2 IEC:2012 ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS Part 6-
32、2: Measuring methods of visual quality and ambient performance 1 Scope This part of IEC 62341 specifies the standard measurement conditions and measurement methods for determining the visual quality and ambient performance of organic light-emitting diode (OLED) display modules and panels. This docum
33、ent mainly applies to colour display modules. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition o
34、f the referenced document (including any amendments) applies. IEC 60050 (all parts), International Electrotechnical Vocabulary (available at ) IEC 60081, Double-capped fluorescent lamps Performance specifications IEC 61966-2-1, Multimedia systems and equipment Colour measurement and management Part
35、2-1: Colour management Default RGB colour space sRGB IEC 62341-1-2, Organic light emitting diode displays Part 1-2: Terminology and letter symbols CIE 15:2004, Colorimetry 3 Terms, definitions and abbreviations For the purposes of this document, the terms, definitions and abbreviations given in IEC
36、62341-1-2 and IEC 60050-845:1987 as well as the following apply. 3.1 Terms and definitions 3.1.1 visual inspection a means for checking image quality by human visual observation for classification and comparison against limit sample criteria 3.1.2 subpixel defect for colour displays, all or part of
37、a single subpixel, the minimum colour element, which is visibly brighter or darker than surrounding subpixels of the same colour. They are classified depending on the number and configuration of multiple subpixel defects within a region of the display BS EN 62341-6-2:201262341-6-2 IEC:2012 7 3.1.3 d
38、ot defect for monochromatic displays, all or part of a single subpixel, the minimum dot element, which is visibly brighter or darker than surrounding dots. They are classified depending on the number and configuration of multiple subpixel defects within a region of the display 3.1.4 bright subpixel
39、defect subpixels or dots which are visibly brighter than surrounding subpixels of the same colour when addressed with a uniform dark or grey background 3.1.5 dark subpixel defect subpixels or dots are visibly darker than surrounding subpixels of the same colour when addressed with a uniform bright b
40、ackground (e.g. 50 % full screen luminance) 3.1.6 partial subpixel defect subpixel or dot with part of the emission area obscured such that a visible difference in brightness is observed in comparison with neighbouring subpixels of the same colour 3.1.7 clustered subpixel defects subpixel or dot def
41、ects gathered in specified area or within a specified distance. Also known as “close subpixel defect” 3.1.8 unstable subpixel subpixel or dot that changes luminance in an uncontrollable way 3.1.9 pixel shrinkage reduction in the active emissive area of one or more subpixels (or dots) over time 3.1.1
42、0 panel edge shrinkage reduction in the active emissive area from the edges of the display area over time 3.1.11 line defect vertical or horizontal bright or dark line parallel to a row or column observed against a dark or bright background, respectively 3.1.12 bright line defect a line appearing br
43、ight on a screen displaying a uniform dark or grey pattern 3.1.13 dark line defect a line appearing dark when displayed with a uniform bright or grey pattern 3.1.14 mura region(s) of luminance and colour non-uniformity that generally vary more gradually than subpixel level defects. For classificatio
44、n, the maximum dimension should be less than one fourth of the display width or height BS EN 62341-6-2:2012 8 62341-6-2 IEC:2012 3.1.15 line mura variation in luminance consisting of one or more lines extending horizontally or vertically across all or a portion of the display (such as may be caused
45、by TFT threshold voltage variation from laser induced crystallization) 3.1.16 colour mura mura that appears primarily in only one colour channel and results in a local variation of the white point (or CCT) 3.1.17 spot mura region of luminance variation larger than a single pixel appearing as a local
46、ized slightly darker or brighter region with a smoothly varying edge 3.1.18 stain mura region of luminance variation larger than a single pixel appearing as clearly defined edge bordering a region of brighter or darker luminance than surrounding regions 3.1.19 mechanical defects image artefacts aris
47、ing from defects in protective and contrast enhancement films, coatings, mechanical fixturing, or other elements within in the active area of the display 3.1.20 scratch defect defect appearing as fine single or multiple lines or scratches, generally light in appearance on a dark background, and inde
48、pendent of display state 3.1.21 dent defect localized spot generally white or grey in appearance on dark background and independent of display state 3.1.22 foreign material defect caused by foreign material like dust or thread in between contrast enhancement films, protective films, or on emitting s
49、urface within the active area of the display 3.1.23 bubble defect caused by a cavity in or between sealing materials, adhesives, contrast enhancement films, protective films, or any other films within the visible area of the display 3.1.24 ambient contrast ratio contrast ratio of a display with external natural or artificial illumination incident onto its surface NOTE Includes indoor illumination from luminaires, or outdoor daylight illumination. 3.1.25 c
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