BS EN 62475-2010 High-current test techniques Definitions and requirements for test currents and measuring systems《大电流试验技术 试验电流和测量系统的定义和要求》.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationHigh-current test techniques Definitions and requirements for test currents and measuring systemsBS EN 62475:2010National forewordThis British Standard is the UK implementation o

2、f EN 62475:2010. It is identical to IEC 62475:2010.The UK participation in its preparation was entrusted to Technical CommitteePEL/42, Testing techniques for high voltages and currents.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication d

3、oes not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010 ISBN 978 0 580 56946 3 ICS 19.080Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority

4、of the Standards Policy and Strategy Committee on 31 December 2010.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 62475:2010EUROPEAN STANDARD EN 62475 NORME EUROPENNE EUROPISCHE NORM December 2010 CENELEC European Committee for Electrotechnical Standardization Co

5、mit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62475:2010 E ICS 19.080 Eng

6、lish version High-current test techniques - Definitions and requirements for test currents and measuring systems (IEC 62475:2010) Techniques des essais haute intensit - Dfinitions et exigences relatives aux courants dessai et systmes de mesure (CEI 62475:2010) Hochstrom-Prftechnik - Begriffe und Anf

7、orderungen fr Hochstrom-Messungen (IEC 62475:2010) This European Standard was approved by CENELEC on 2010-12-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without an

8、y alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language mad

9、e by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, D

10、enmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 62475:2010EN 62475:2010 - 2 - Foreword The text

11、of document 42/278/FDIS, future edition 1 of IEC 62475, prepared by IEC TC 42, High-voltage testing techniques, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62475 on 2010-12-01. Attention is drawn to the possibility that some of the elements of this document may b

12、e the subject of patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 20

13、11-09-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2013-12-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62475:2010 was approved by CENELEC as a European Standard without any modification. I

14、n the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60076-5:2000 NOTE Harmonized as EN 60076-5:2000 (not modified). IEC 60099-4:2004 NOTE Harmonized as EN 60099-4:2004 (modified). IEC 60265-1:1998 NOTE Harmonized as EN 60265-1:1998 (not mod

15、ified). IEC 60282-1:2009 NOTE Harmonized as EN 60282-1:2009 (not modified). IEC 60947-1:2007 NOTE Harmonized as EN 60947-1:2007 (not modified). IEC 60947-2:2006 NOTE Harmonized as EN 60947-2:2006 (not modified). IEC 60947-3:2008 NOTE Harmonized as EN 60947-3:2009 (not modified). IEC 61000-4-5 NOTE H

16、armonized as EN 61000-4-5. IEC 61083-1:2001 NOTE Harmonized as EN 61083-1:2001 (not modified). IEC 61083-2:1996 NOTE Harmonized as EN 61083-2:1997 (not modified). IEC 61180-2:1994 NOTE Harmonized as EN 61180-2:1994 (not modified). IEC 61230:2008 NOTE Harmonized as EN 61230:2008 (not modified). IEC 6

17、1643-11 NOTE Harmonized as EN 61643-11. IEC 61643-21 NOTE Harmonized as EN 61643-21. IEC 62271-1 NOTE Harmonized as EN 62271-1. IEC 62271-100:2008 NOTE Harmonized as EN 62271-100:2009 (not modified). IEC 62271-101 NOTE Harmonized as EN 62271-101. IEC 62271-102:2001 NOTE Harmonized as EN 62271-102:20

18、02 (not modified). BS EN 62475:2010- 3 - EN 62475:2010 IEC 62271-103 NOTE Harmonized as EN 62271-103. IEC 62271-104 NOTE Harmonized as EN 62271-104. IEC 62271-105 NOTE Harmonized as EN 62271-105. IEC 62271-110:2009 NOTE Harmonized as EN 62271-110:2009 (not modified). IEC 62305-1 NOTE Harmonized as E

19、N 62305-1. ISO/IEC 17025:2005 NOTE Harmonized as EN ISO/IEC 17025:2005 (not modified). _ BS EN 62475:2010EN 62475:2010 - 4 - Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for

20、 the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the

21、 relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60051-2 1984 Direct acting indicating analogue electrical measuring instruments and their accessories -Part 2: Special requirements for ammeters and voltmeters EN 60051-2 1989 IEC 60060-1 2010 High-voltage test techniques - Part 1: Gener

22、al definitions and test requirements EN 60060-1 2010 IEC 61180-1 - High-voltage test techniques for low-voltage equipment - Part 1: Definitions, test and procedure requirements EN 61180-1 - ISO/IEC Guide 98-3 2008 Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measure

23、ment (GUM:1995) - - BS EN 62475:2010 2 62475 IEC:2010 CONTENTS 1 Scope.10 2 Normative references .10 3 Terms and definitions .10 3.1 Measuring systems11 3.2 Components of a measuring system 11 3.3 Scale factors .12 3.4 Rated values .13 3.5 Definitions related to the dynamic behaviour .13 3.6 Definit

24、ions related to uncertainty .14 3.7 Definitions related to tests on measuring systems .16 4 Procedures for qualification and use of a measuring system.17 4.1 General principles .17 4.2 Schedule of performance tests 17 4.3 Schedule of performance checks.17 4.4 Requirements for the record of performan

25、ce18 4.4.1 Contents of the record of performance.18 4.4.2 Exceptions.18 4.5 Operating conditions .18 4.6 Uncertainty19 5 Tests and test requirements for an approved measuring system.20 5.1 General requirements20 5.2 Calibration Determination of the scale factor 20 5.2.1 Calibration of a measuring sy

26、stem by comparison with a reference measuring system (preferred method) .20 5.2.2 Determination of the scale factor of a measuring system from those of its components 24 5.3 Linearity test .25 5.3.1 Application 25 5.3.2 Alternative methods in order of suitability 26 5.4 Dynamic behaviour26 5.5 Short

27、-term stability 27 5.5.1 Method 27 5.5.2 Steady-state current 27 5.5.3 Impulse current and short-time current 28 5.5.4 Periodic impulse current and periodic short-time current28 5.6 Long-term stability.29 5.7 Ambient temperature effect .29 5.8 Effect of nearby current paths .30 5.9 Software effect 3

28、2 5.10 Uncertainty calculation 32 5.10.1 General .32 5.10.2 Uncertainty of calibration.32 5.10.3 Uncertainty of measurement using an approved measuring system .33 5.11 Uncertainty calculation of time-parameter measurements (impulse currents only)34 5.11.1 General .34 BS EN 62475:201062475 IEC:2010 3

29、 5.11.2 Uncertainty of the time-parameter calibration.34 5.11.3 Uncertainty of a time-parameter measurement using an approved measuring system .35 5.12 Interference test 36 5.12.1 Application 36 5.12.2 Current-converting shunts and current transformers with iron 37 5.12.3 Inductive measuring systems

30、 without iron (Rogowski coils) .38 5.13 Withstand tests .38 5.13.1 Voltage withstand tests38 5.13.2 Current withstand tests39 6 Steady-state direct current .39 6.1 Application 39 6.2 Terms and definitions 39 6.3 Test current.39 6.3.1 Requirements 39 6.3.2 Tolerances 39 6.4 Measurement of the test cu

31、rrent40 6.4.1 Requirements for an approved measuring system40 6.4.2 Uncertainty contributions .40 6.4.3 Dynamic behaviour40 6.4.4 Calibrations and tests on an approved measuring system40 6.4.5 Performance check41 6.5 Measurement of ripple amplitude.41 6.5.1 Requirements for an approved measuring sys

32、tem41 6.5.2 Uncertainty contributions .41 6.5.3 Dynamic behaviour for ripple .41 6.5.4 Calibrations and tests on an approved ripple-current measuring system.42 6.5.5 Measurement of the scale factor at the ripple frequency 42 6.5.6 Performance check for ripple current measuring system 42 6.6 Test pro

33、cedures 43 7 Steady-state alternating current43 7.1 Application 43 7.2 Terms and definitions 43 7.3 Test current.43 7.3.1 Requirements 43 7.3.2 Tolerances 44 7.4 Measurement of the test current44 7.4.1 Requirements for an approved measuring system44 7.4.2 Uncertainty contributions .44 7.4.3 Dynamic

34、behaviour44 7.4.4 Calibrations and tests on an approved measuring system46 7.4.5 Performance check47 7.5 Test procedures 47 8 Short-time direct current.47 8.1 Application 47 8.2 Terms and definitions 48 8.3 Test currents .49 8.3.1 Requirements for the test current 49 BS EN 62475:2010 4 62475 IEC:201

35、0 8.3.2 Tolerances 49 8.4 Measurement of the test current49 8.4.1 Requirements for an approved measuring system49 8.4.2 Uncertainty contributions .49 8.4.3 Dynamic behaviour49 8.4.4 Calibrations and tests on an approved measuring system50 8.4.5 Performance check51 8.4.6 Linearity test51 8.5 Test pro

36、cedures 51 9 Short-time alternating current .51 9.1 Application 51 9.2 Terms and definitions 52 9.3 Test current.53 9.3.1 Requirements for the test current 53 9.3.2 Tolerances 53 9.4 Measurement of the test current54 9.4.1 Requirements for an approved measuring system54 9.4.2 Uncertainty contributio

37、ns .54 9.4.3 Dynamic behaviour54 9.4.4 Calibrations and tests on an approved measuring system55 9.4.5 Performance check56 9.4.6 Linearity test56 9.4.7 Interference test 57 9.5 Test procedures 57 10 Impulse currents.57 10.1 Application 57 10.2 Terms and definitions 57 10.3 Test current.61 10.3.1 Gene

38、ral .61 10.3.2 Tolerances 61 10.4 Measurement of the test current62 10.4.1 Requirements for an approved measuring system62 10.4.2 Uncertainty contributions .62 10.4.3 Dynamic behaviour62 10.4.4 Calibrations and tests on an approved measuring system64 10.4.5 Performance check64 10.5 Test procedures 6

39、5 11 Current measurement in high-voltage dielectric testing.65 11.1 Application 65 11.2 Terms and definitions 65 11.3 Measurement of the test current66 11.3.1 Requirements for an approved measuring system66 11.3.2 Uncertainty contributions .66 11.3.3 Dynamic behaviour66 11.3.4 Calibrations and tests

40、 on an approved measuring system66 11.3.5 Performance check67 11.3.6 Linearity test67 11.3.7 Interference test 67 11.4 Test procedures 67 BS EN 62475:201062475 IEC:2010 5 12 Reference measuring systems67 12.1 General .67 12.2 Interval between subsequent calibrations of reference measuring systems67

41、Annex A (informative) Uncertainty of measurement68 Annex B (informative) Examples of the uncertainty calculation in high-current measurements 76 Annex C (informative) Step-response measurements.82 Annex D (informative) Convolution method for estimation of dynamic behaviour from step-response measure

42、ments .85 Annex E (informative) Constraints for certain wave shapes88 Annex F (informative) Temperature rise of measuring resistors90 Annex G (informative) Determination of r.m.s. values of short-time a.c. current .91 Annex H (informative) Examples of IEC standards with high current tests98 Bibliogr

43、aphy100 Figure 1 Examples of amplitude frequency responses for limit frequencies (f1; f2). 14 Figure 2 Calibration by comparison over full assigned measurement range22 Figure 3 Uncertainty contributions of the calibration (example with the minimum of 5 current levels).23 Figure 4 Calibration by comp

44、arison over a limited current range with a linearity test (see 5.3) providing extension up to the largest value in the assigned measurement range 24 Figure 5 Linearity test of the measuring system with a linear device in the extended voltage range26 Figure 6 Short-term stability test for steady-stat

45、e current. 28 Figure 7 Short-term stability test for impulse current and short-time current.28 Figure 8 Short-term stability test for periodic impulse-current and periodic short-time current29 Figure 9 Test circuit for effect of nearby current path for current-converting shunts and current transform

46、ers with iron. .31 Figure 10 Test circuit for effect of nearby current path for inductive measuring systems without iron (Rogowski coils).31 Figure 11 Principle of interference test circuit. .37 Figure 12 Interference test on the measuring system i1(t) based on current-converting shunt or current tr

47、ansformer with iron in a typical 3-phase short-circuit set-up (example). 37 Figure 13 Test circuit for interference test for inductive systems without iron. 38 Figure 14 Acceptable normalized amplitude-frequency response of an a.c. measuring system intended for a single fundamental frequency fnom.45

48、 Figure 15 Acceptable normalized amplitude-frequency response of an a.c. measuring system intended for a range of fundamental frequencies fnom1to fnom2.46 Figure 16 Example of short-time direct current.48 Figure 17 Example of short-time alternating current. 52 Figure 18 Exponential impulse current.

49、58 Figure 19 Exponential impulse current oscillating tail. .58 Figure 20 Impulse current Rectangular, smooth. .59 BS EN 62475:2010 6 62475 IEC:2010 Figure 21 Impulse current Rectangular with oscillations. .59 Figure A.1 Normal probability distribution p(x) of a continuous random variable x.75 Figure A.2 Rectangular symmetric probability distribution p(x) of the estimate x of an input quantity X .75 Figure B.1 Comparison betwee