BS EN 62496-2-2017 Optical circuit boards Basic test and measurement procedures General guidance for definition of measurement conditions for optical characteristics of optical cir.pdf

1、Optical circuit boards - Basic test and measurement proceduresPart 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards (IEC 62496-2:2017)BS EN 62496-2:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06E

2、UROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62496-2 September 2017 ICS 33.180.01 English Version Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards (IEC 62496

3、-2:2017) Cartes circuits optiques - Procdures fondamentales dessais et de mesures - Partie 2: Recommandations gnrales relatives la dtermination des conditions de mesure des caractristiques optiques des cartes circuits optiques (IEC 62496-2:2017) Optische Leiterplatten - Grundlegende Prf- und Messver

4、fahren - Teil 2: Allgemeiner Leitfaden zur Festlegung der Bedingungen fr die Messung der optischen Eigenschaften von optischen Leiterplatten (IEC 62496-2:2017) This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations

5、which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.

6、This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. C

7、ENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Nethe

8、rlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Manag

9、ement Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 62496-2:2017 E National forewordThis British Standard is the UK implementation of EN 62496-2:2017. It is identical to IEC 62496-2:2

10、017.The UK participation in its preparation was entrusted to Technical Committee GEL/86, Fibre optics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are r

11、esponsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 88468 9ICS 33.180.01; 45.060Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of

12、 the Standards Policy and Strategy Committee on 31 October 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 624962:2017EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 62496-2 September 2017 ICS 33.180.01 English Version Optical circuit boards - Basic te

13、st and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards (IEC 62496-2:2017) Cartes circuits optiques - Procdures fondamentales dessais et de mesures - Partie 2: Recommandations gnrales relatives la dtermin

14、ation des conditions de mesure des caractristiques optiques des cartes circuits optiques (IEC 62496-2:2017) Optische Leiterplatten - Grundlegende Prf- und Messverfahren - Teil 2: Allgemeiner Leitfaden zur Festlegung der Bedingungen fr die Messung der optischen Eigenschaften von optischen Leiterplatt

15、en (IEC 62496-2:2017) This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date list

16、s and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation un

17、der the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, E

18、stonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European

19、 Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide fo

20、r CENELEC Members. Ref. No. EN 62496-2:2017 E BS EN 624962:2017EN 62496-2:2017 2 European foreword The text of document 86/509/CDV, future edition 1 of IEC 62496-2, prepared by IEC/TC 86 “Fibre optics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 62496-2:2017. The fol

21、lowing dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-03-28 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2020-06-28 Attent

22、ion is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62496-2:2017 was approved by CENELEC as a

23、 European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60793-2 NOTE Harmonized as EN 60793-2. IEC 60793-1-43 NOTE Harmonized as EN 60793-1-43. IEC 60825-1 NOTE Harmonized as EN 60825-1. IEC 61280-4

24、-1 NOTE Harmonized as EN 61280-4-1. IEC 61745 NOTE Harmonized as EN 61745. IEC 62496-1 NOTE Harmonized as EN 62496-1. IEC 62496-2-4 NOTE Harmonized as EN 62496-2-4. IEC 62496-4-1 1)NOTE Harmonized as EN 62496-4-1 2). 1) Under preparation. Stage at the time of publication: IEC PCC 62496-4-1:2017. 2)

25、Under preparation. Stage at the time of publication: prEN 62496-4-1. BS EN 624962:2017EN 62496-2:2017 2 European foreword The text of document 86/509/CDV, future edition 1 of IEC 62496-2, prepared by IEC/TC 86 “Fibre optics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as E

26、N 62496-2:2017. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2018-03-28 latest date by which the national standards conflicting with the document have to be withdrawn

27、(dow) 2020-06-28 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 62496-2:2017 was a

28、pproved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60793-2 NOTE Harmonized as EN 60793-2. IEC 60793-1-43 NOTE Harmonized as EN 60793-1-43. IEC 60825-1 NOTE Harmonized as

29、EN 60825-1. IEC 61280-4-1 NOTE Harmonized as EN 61280-4-1. IEC 61745 NOTE Harmonized as EN 61745. IEC 62496-1 NOTE Harmonized as EN 62496-1. IEC 62496-2-4 NOTE Harmonized as EN 62496-2-4. IEC 62496-4-1 1)NOTE Harmonized as EN 62496-4-1 2). 1) Under preparation. Stage at the time of publication: IEC

30、PCC 62496-4-1:2017. 2) Under preparation. Stage at the time of publication: prEN 62496-4-1. EN 62496-2:2017 3 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following documents are referred to in the text in such a way that

31、some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common

32、 modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 61300-1 - Fibre optic interconnecting devices and passive compo

33、nents - Basic test and measurement procedures - Part 1: General and guidance EN 61300-1 - IEC 61300-3-53 - Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-53: Examinations and measurements - Encircled angular flux (EAF) measurement method b

34、ased on two-dimensional far field data from step index multimode waveguide (including fibre) EN 61300-3-53 - IEC 62496-2-1 2011 Optical circuit boards - Part 2-1: Measurements - Optical attenuation and isolation EN 62496-2-1 2011 IEC 62614 - Fibre optics - Launch condition requirements for measuring

35、 multimode attenuation EN 62614 - BS EN 624962:2017This page deliberately left blank 2 IEC 62496-2:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Measurement definition system for optical circuit boards . 9 4.1 General . 9 4.2 Meas

36、urement definition system requirements 9 4.2.1 Accuracy . 9 4.2.2 Accountability 9 4.2.3 Efficiency . 10 4.2.4 Convenience . 10 4.2.5 Independent 10 4.2.6 Scalable 10 4.2.7 Customised requirements 10 4.2.8 Prioritised structure . 10 4.3 Measurement definition criteria . 10 4.3.1 General . 10 4.3.2 S

37、ource characteristics . 11 4.3.3 Launch conditions 11 4.3.4 Input coupling conditions . 14 4.3.5 Output coupling conditions 15 4.3.6 Capturing conditions 16 4.4 Launch and capturing position 16 4.5 Launch and capture direction 17 5 Measurement identification code . 19 5.1 General . 19 5.2 Measuremen

38、t identification code construction . 19 5.2.1 General . 19 5.2.2 AAA Source characteristics. 19 5.2.3 BBB(b1) Launch conditions . 19 5.2.4 CCC Input coupling conditions 20 5.2.5 DDD Output coupling conditions . 20 5.2.6 EEE Capturing conditions . 20 5.3 Extended measurement identification code with

39、customisation parameters . 20 5.3.1 General . 20 5.3.2 Customisation parameters with placeholders . 20 5.4 Reference measurements . 21 5.5 Coordinate table AAA Source characteristics . 21 5.5.1 Mandatory parameters . 21 5.5.2 Customisation parameters . 21 5.6 Coordinate table BBB Launch conditions 2

40、4 5.6.1 Mandatory parameter. 24 5.6.2 Customisation parameters . 24 5.7 Coordinate table CCC Input coupling conditions. 27 2 IEC 62496-2:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Measurement definition system for optical circu

41、it boards . 9 4.1 General . 9 4.2 Measurement definition system requirements 9 4.2.1 Accuracy . 9 4.2.2 Accountability 9 4.2.3 Efficiency . 10 4.2.4 Convenience . 10 4.2.5 Independent 10 4.2.6 Scalable 10 4.2.7 Customised requirements 10 4.2.8 Prioritised structure . 10 4.3 Measurement definition cr

42、iteria . 10 4.3.1 General . 10 4.3.2 Source characteristics . 11 4.3.3 Launch conditions 11 4.3.4 Input coupling conditions . 14 4.3.5 Output coupling conditions 15 4.3.6 Capturing conditions 16 4.4 Launch and capturing position 16 4.5 Launch and capture direction 17 5 Measurement identification cod

43、e . 19 5.1 General . 19 5.2 Measurement identification code construction . 19 5.2.1 General . 19 5.2.2 AAA Source characteristics. 19 5.2.3 BBB(b1) Launch conditions . 19 5.2.4 CCC Input coupling conditions 20 5.2.5 DDD Output coupling conditions . 20 5.2.6 EEE Capturing conditions . 20 5.3 Extended

44、 measurement identification code with customisation parameters . 20 5.3.1 General . 20 5.3.2 Customisation parameters with placeholders . 20 5.4 Reference measurements . 21 5.5 Coordinate table AAA Source characteristics . 21 5.5.1 Mandatory parameters . 21 5.5.2 Customisation parameters . 21 5.6 Co

45、ordinate table BBB Launch conditions 24 5.6.1 Mandatory parameter. 24 5.6.2 Customisation parameters . 24 5.7 Coordinate table CCC Input coupling conditions. 27 BS EN 624962:2017IEC 62496-2:2017 IEC 2017 3 5.7.1 Mandatory parameters . 27 5.7.2 Customisation parameters . 27 5.8 Coordinate table DDD O

46、utput coupling conditions 29 5.8.1 Mandatory parameters . 29 5.8.2 Customisation parameters . 29 5.9 Coordinate table EEE Capturing conditions 31 5.9.1 Mandatory parameters . 31 5.9.2 Customisation parameters . 31 5.10 Examples of deployment . 34 5.10.1 General . 34 5.10.2 MIC-042-113(400)-001-001-1

47、12 (integrating sphere device details including supplier and model number) 34 5.10.3 MIC-072-123(205)-053(1.56, X,X)-001-042 (integrating sphere device details including supplier and model number) 34 5.10.4 Fast polarisation axis: MIC-091-072(150)-042(1.53, 25, -30)-051-004; slow polarisation axis:

48、MIC-091-072(75)-042(1.53, 25, -120)-051-004 . 35 Annex A (informative) State of the art in optical interconnect technologies . 36 A.1 Diversity of optical interconnect technologies 36 A.2 Fibre-optic circuit laminates 36 A.3 Polymer waveguides . 36 A.4 Planar glass waveguides 36 A.5 Free space optic

49、s . 37 A.6 Target applications . 37 Bibliography 38 Figure 1 Optical circuit board varieties . 6 Figure 2 Recommended test setup for single-mode fibre launch conditions 13 Figure 3 Recommended test setup for multimode fibre launch conditions . 13 Figure 4 Cross-sectional views of channel under test at input 15 Figure 5 Cross-sectional views of the channel under test at output 16 Figure 6 Measurement setup with collinear launch and capture direction . 17 Figure