1、BRITISH STANDARD BS EN ISO 3543:2001 Incorporating Corrigendum No. 1 Metallic and non-metallic coatings Measurement of thickness Beta backscatter method The European Standard EN ISO 3543:2000 has the status of a British Standard ICS 17.040.20; 25.220.40 BS EN ISO 3543:2001 This British Standard, hav
2、ing been prepared under the direction of the Sector Committee for Materials and Chemicals, was published under the authority of the Standards Committee and comes into effect on 15 March 2001 BSI 2006 ISBN 0 580 37053 4 National foreword This British Standard is the official English language version
3、of EN ISO 3543:2000, including Corrigendum April 2006. It is identical with ISO 3543:2000. It supersedes BS EN ISO 3543:1995 which is withdrawn. The UK participation in its preparation was entrusted to Technical Committee STI/37, Methods of test for metallic and related coatings, which has the respo
4、nsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references Attention is drawn to the fact that CEN and CENELEC Standards normally include an annex which lists normative references to international publications with their correspo
5、nding European publications. The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic
6、Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to underst
7、and the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises
8、a front cover, an inside front cover, the EN ISO title page, the EN ISO foreword page, the ISO title page, pages ii to iv, pages 1 to 14, an inside back cover and a back cover. The BSI copyright date displayed in this document indicates when the document was last issued. Amendments issued since publ
9、ication Amd. No. Date Comments 16494 Corrigendum No. 1 30 June 2006 Correction to subclause 5.1 and Figure A.1EUROPEANSTANDARD NORMEEUROPENNE EUROPISCHENORM ENISO3543 December2000 ICS02.022.20 SupersedesENISO3543:1994 Englishversion MetallicandnonmetalliccoatingsMeasurementofthickness Betabackscatte
10、rmethod(ISO3543:2000) RevtementsmtalliquesetnonmtalliquesMesuragede lpaisseurMthodeparrtrodiffusiondesrayonsbta (ISO3543:2000) MetallischeundandereanorganischeSchichten DickenmessungBetarckstreuVerfahren(ISO 3543:2000) ThisEuropeanStandardwasapprovedbyCENon15December2000. CENmembersareboundtocomplyw
11、iththeCEN/CENELECInternalRegulationswhichstipulatetheconditionsforgivingthisEurope an Standardthestatusofanationalstandardwithoutanyalteration.Uptodatelistsandbibliographicalreferencesconcernings uchnational standardsmaybeobtainedonapplicationtotheManagementCentreortoanyCENmember. ThisEuropeanStanda
12、rdexistsinthreeofficialversions(English,French,German).Aversioninanyotherlanguagemadebytra nslation undertheresponsibilityofaCENmemberintoitsownlanguageandnotifiedtotheManagementCentrehasthesamestatusasthe official versions. CENmembersarethenationalstandardsbodiesofAustria,Belgium,CzechRepublic,Denm
13、ark,Finland,France,Germany,Greece, Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway,Portugal,Spain,Sweden,SwitzerlandandUnitedKingdom. EUROPEANCOMMITTEEFORSTANDARDIZATION COMITEUROPENDENORMALISATION EUROPISCHESKOMITEEFRNORMUNG ManagementCentre:ruedeStassart,36B1050Brussels 2000CEN Allrightsofexpl
14、oitationinanyformandbyanymeansreserved worldwideforCENnationalMembers. Ref.No.ENISO3543:2000E Incorporating Corrigendum April 2006Foreword ThetextoftheInternationalStandardISO3543:2000hasbeenpreparedby TechnicalCommitteeISO/TC107“Metallicandotherinorganiccoatings“in collaborationwithTechnicalCommitt
15、eeCEN/TC262“Metallicandotherinorganic coatings“,thesecretariatofwhichisheldbyBSI . ThisEuropeanStandardsupersedesENISO3543:1994. ThisEuropeanStandardshallbegiventhestatusofanationalstandard,eitherby publicationofanidenticaltextorbyendorsement,atthelatestbyJune2001,and conflictingnationalstandardssha
16、llbewithdrawnatthelatestbyJune2001 . AccordingtotheCEN/CENELECInternalRegulations,thenationalstandards organizationsofthefollowingcountriesareboundtoimplementthisEuropean Standard:Austria,Belgium,CzechRepublic,Denmark,Finland,France,Germany, Greece,Iceland,Ireland,Italy,Luxembourg,Netherlands,Norway
17、,Portugal,Spain, Sweden,SwitzerlandandtheUnitedKingdom. NOTEFROMCMC: Theforewordissusceptibletobeamendedonreceptionofthe Germanlanguageversion.Theconfirmedoramendedforeword,andwhen appropriate,thenormativeannexZAforthereferencestointernationalpublications withtheirrelevantEuropeanpublicationswillbec
18、irculatedwiththeGermanversion. Endorsementnotice ThetextoftheInternationalStandardISO3543:2000wasapprovedbyCENasa EuropeanStandardwithoutanymodification. ENISO3543:2000Reference number ISO 3543:2000(E) INTERNATIONAL STANDARD ISO 3543 Second edition 2000-12-15 Metallic and non-metallic coatings Measu
19、rement of thickness Beta backscatter method Revtements mtalliques et non mtalliques Mesurage de lpaisseur Mthode par rtrodiffusion des rayons beta ENISO3543:2000ii ISO 3453:(0002)Eiii Contents Page Foreword.iv 1 Scope 1 2 Terms and definitions .1 3 Principle4 4 Apparatus .6 5 Factors relating to mea
20、surement uncertainty 6 6 Calibration of instruments 9 7 Measuring procedure 10 8 Measurement uncertainty .11 9 Test report 11 Annex A (informative) General information13 ENISO3543:2000ISO 3453:(0002)E iv Foreword ISO (the International Organization for Standardization) is a worldwide federation of n
21、ational standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. Inter
22、national organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the
23、 rules given in the ISO/IEC Directives, Part 3. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the
24、 possibility that some of the elements of this International Standard may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. International Standard ISO 3543 was prepared by Technical Committee ISO/TC 107, Metallic and other inorganic coa
25、tings, Subcommittee SC 2, Methods of inspection and coordination of test methods. This second edition cancels and replaces the first edition (ISO 3543:1981), which has been technically revised. Annex A of this International Standard is for information only. ENISO3543:2000INTENRATIONAL TSANDADR ISO 3
26、453:(0002)E1 Metallic and non-metallic coatings Measurement of thickness Beta backscatter method 1 Scope WARNING Beta backscatter instruments used for the measurement of coating thicknesses use a number of different radioactive sources. Although the activities of these sources are normally very low,
27、 they can present a hazard to health, if incorrectly handled. Therefore, reference should be made to current international and national standards, where these exist. This International Standard specifies a method for the non-destructive measurement of coating thicknesses using beta backscatter gauge
28、s. It applies to both metallic and non-metallic coatings on both metallic and non-metallic substrates. To make use of this method, the atomic numbers or equivalent atomic numbers of the coating and the substrate need to differ by an appropriate amount. NOTE Since the introduction of the X-ray fluore
29、scence method (ISO 3497), the beta backscatter method has been used less and less for the measurement of coating thickness. However, because of its lower cost, it is still a very useful method of measurement for many applications. In addition it has a wider measuring range. 2 Terms and definitions F
30、or the purposes of this International Standard, the following terms and definitions apply. 2.1 radioactive decay spontaneous nuclear transformation in which particles or gamma radiation are emitted or X-radiation is emitted following orbital electron capture, or the nucleus undergoes spontaneous fis
31、sion ISO 921:1997, definition 972 2.2 beta particle electron or positron which has been emitted by an atomic nucleus or neutron in a nuclear transformation ISO 921:1997, definition 81 2.3 beta-emitting isotope beta-emitting source beta emitter material, the nuclei of which emit beta particles NOTE 1
32、 It is possible to classify beta emitters by the maximum energy level of the particles that they release during their disintegration. NOTE 2 Table A.1 lists some isotopes used with beta backscatter gauges. ENISO3543:2000ISO 3453:(0002)E 2 2.4 electron-volt unit of energy equal to the change in energ
33、y of an electron in passing through a potential difference of 1 V NOTE 1 1 eV = 1,602 19 10 19 J ISO 921:1997, definition 393 NOTE 2 Since the electron-volt is too small for the energies encountered with beta particles, the mega-electron-volt (MeV) is commonly used. 2.5 activity disintegration rate
34、number of spontaneous nuclear disintegrations occurring in a given quantity of material during a suitably small interval of time divided by that interval of time ISO 921:1997, definition 23 NOTE 1 In beta backscatter measurements a higher activity corresponds to a greater emission of beta particles.
35、 NOTE 2 The SI unit of activity is the becquerel (Bq). The activity of a radioactive element used in beta backscatter gauges is generally expressed in microcuries ( Ci) (1 Ci = 3,7 10 4 Bq, which represents 3,7 x 10 4 disintegrations per second). 2.6 radioactive half-life time required for the activ
36、ity to decrease to half its value by a single radioactive decay process ISO 921:1997, definition 975 2.7 scattering process in which a change in direction or energy of an incident particle or incident radiation is caused by a collision with a particle or a system of particles ISO 921:1997, definitio
37、n 1085 2.8 backscatter scattering as a result of which a particle leaves a body of matter from the same surface at which it entered NOTE Radiations other than beta rays are emitted or backscattered by a coating and substrate and some of these can be included in the backscatter measurement. In this I
38、nternational Standard the term “backscatter” is used to mean the total radiation measured. 2.9 backscatter coefficient (of a body) R ratio of the number of particles backscattered to that entering the body NOTE The value of R is independent of the activity of the isotope and of the measuring time. E
39、NISO3543:2000ISO 3453:(0002)E3 2.10 backscatter count 2.10.1 absolute backscatter count X number of particles backscattered during a fixed interval of time, and received by a detector NOTE X depends on the activity of the isotope, the measuring time, the geometric configuration of the measuring syst
40、em and the properties of the detector. The count produced by the uncoated substrate is generally designated by X o , and that of the coating material by X s . To obtain these values, both these materials have to be available with a thickness greater than the saturation thickness (see 2.13). 2.10.2 n
41、ormalized backscatter count X n quantity that is independent of the activity of the isotope, the measuring time and the properties of the detector and defined by the equation: o n so XX X XX where X o is the absolute backscatter count of the saturation thickness of the substrate material; X s is the
42、 absolute backscatter count of the saturation thickness of the coating material; X is the absolute backscatter count of the coated specimen; each of these counts being taken over the same interval of time NOTE 1 The value of X n is valid between 0 and 1. NOTE 2 For simplicity, it is often advantageo
43、us to express the normalized backscatter count as a percentage by multiplying X n by 100. 2.11 normalized backscatter curve curve obtained by plotting the coating thickness as a function of X n 2.12 equivalent (apparent) atomic number for a material, which can be an alloy or a compound, the atomic n
44、umber of an element that has the same backscatter coefficient R as the material 2.13 saturation thickness minimum thickness of a material that, if exceeded, does not produce a change in backscatter NOTE Figure A.1 shows saturation thickness, s, plotted as a function of density for different isotopes
45、. ENISO3543:2000ISO 3453:(0002)E 4 2.14 sealed source radioactive source sealed in a container or having a bonded cover, the container or cover being strong enough to prevent contact with and dispersion of the radioactive material under the conditions of use and wear for which it was designed ISO 92
46、1:1997, definition 1094 NOTE Also referred to as “sealed isotope”. 2.15 aperture opening of the mask abutting the test specimen and that determines the size of the area on which the coating thickness is to be measured NOTE This mask is also often referred to as a platen, an aperture platen or a spec
47、imen support. 2.16 source geometry spatial arrangement of the source, the aperture and the detector, with respect to each other 2.17 dead time time period during which a Geiger-Mller detector is unresponsive to the receipt of further beta particles 2.18 resolving time recovery time of the Geiger-Mll
48、er detector tube and associated electronic equipment during which the counting circuit is unresponsive to further pulses 2.19 basis material basis metal material upon which coatings are deposited or formed ISO 2080:1981, definition 134 2.20 substrate material upon which a coating is directly deposited N
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