BS IEC 60748-4-1997 Semiconductor devices Integrated circuits Interface integrated circuits《半导体器件 集成电路 接口集成电路》.pdf

1、BRITISH STANDARD BSIEC 60748-4:1997 Semiconductor devices Integratedcircuits Part 4: Interface integrated circuits ICS 31.200BSIEC60748-4:1997 This British Standard, having been prepared under the directionof the Electrotechnical Sector Board, was published underthe authority of the Standards Board

2、and comes intoeffect on 15 September1997 BSI 04-2000 ISBN 0 580 28094 2 National foreword This British Standard reproduces verbatim IEC60748-4:1997 and implements it as the UK national standard. It supersedes BS6493-2.4:1989 which is withdrawn. The UK participation in its preparation was entrusted b

3、y Technical Committee EPL/47, Semiconductors, to Subcommittee EPL/47/5, Performance of semiconductors, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and

4、keep the UKinterests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this subcommittee can be obtained on request to its secretary. From1 January1997, all IEC publications have the number60000 added to the old nu

5、mber. For instance, IEC27-1 has been renumbered as IEC60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-references The British Standards which implement international or European publications ref

6、erred to in this document may be found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a co

7、ntract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theIEC title page, pages ii t

8、o vi, pages1 to134 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSIEC60748-4:1997 BSI 04-2000 i Conten

9、ts Page National foreword Inside front cover Text of IEC 60748-4 1ii blankBSIEC60748-4:1997 ii BSI 04-2000 Contents Page Chapter I. General 1 Scope 1 2 Normative references 1 Chapter II. Terminology and letter symbols 1 Category I 2 2 Category II 6 3 Letter symbols 23 Chapter III. Essential ratings

10、and characteristics Section1. Category I (line circuits, sense amplifiers, peripheral drivers and level shifters, voltage comparators) 1 General 27 2 Functional specifications 27 3 Description of the circuit 28 4 Ratings (limiting values) 28 5 Recommended operating conditions 29 6 Electrical charact

11、eristics 30 7 Mechanical characteristics and other data 34 8 Application data 34 Section 2. Category II (linear and non-linear analogue-to-digital and digital-to-analogue converters) 1 General 35 2 Description of integrated circuit 35 3 Ratings (limiting values) 35 4 Recommended operating conditions

12、 37 5 Electrical characteristics 37 6 Mechanical ratings, characteristics and other data 40 7 Additional information 40 Section 3. Category III (control circuits for switch-mode power supplies) 1 General 41 2 Electrical and functional description of the circuits 41 3 Ratings (limiting values) 42 4 R

13、ecommended operating conditions 43 5 Electrical characteristics 43 6 Mechanical ratings, characteristics and other data 45 7 Handling precautions 45 8 Application data, additional information 45 Section 4. Category IV (companding PCM coder-decoders CODEC) 1 General 47 2 Circuit identification and de

14、scription 47 3 Functional specifications 47 4 Ratings (limiting values) 48 5 Recommended operating conditions 49 6 Electrical characteristics 49 7 Mechanical ratings, characteristics and other data 52 8 Additional information 52 Section 5. Category IV (filters for companding PCM coder-decoders CODEC

15、) 1 General 53 2 Circuit identification and description 53 3 Functional specifications 53BSIEC60748-4:1997 BSI 04-2000 iii Page 4 Ratings (limiting values) 54 5 Recommended operating conditions 55 6 Electrical characteristics 55 7 Mechanical ratings, characteristics and other data 58 8 Additional in

16、formation 58 Section 6. Category IV (PCM codec with filters COMBO) 1 General 59 2 Application related description 59 3 Specification of the function 60 4 Ratings (limiting values) 61 5 Recommended operating conditions 62 6 Electrical characteristics 63 7 Mechanical and environmental ratings, charact

17、eristics and data 65 8 Additional information 65 Section 7. Category V (digital interface integrated circuits UFB including CPU peripheral circuits, peripheral device controllers and communication interface circuits) 1 General 67 2 Application related description 68 3 Functional specification 68 4 L

18、imiting values 69 5 Operating conditions 70 6 Electrical characteristics 70 7 Mechanical and environmental ratings, characteristics and data 72 8 Additional information 72 Section 8. Category VI (integrated service digital network ISDN oriented modular interface circuits) 1 General 74 2 Application

19、related description 74 3 Specification of the function 75 4 Limiting values 77 5 Operating conditions of use within the specified operating temperature range 77 6 Electrical characteristics 78 Chapter IV. Measuring methods Section1. General 1 Basic requirements 83 2 Specific requirements 83 3 Applic

20、ation matrix 83 Section 2. Category I (line circuits, sense amplifiers, peripheral drivers and level shifters, voltage comparators) 1 Common-mode input triggering voltage (V ICT ) 86 2 Average bias current (I IB ) and input offset current (I IO ) 88 3 Differential-mode input overload recovery time (

21、t ord ) and common-mode input overload recovery time (t orc ) 89 4 Basic measuring circuits for voltage comparators 90 5 Input offset voltage (of a voltage comparator) (V IO ) 93 6 Mean temperature coefficient of the input offset voltage (of a voltage comparator) ( VIO ) 94BSIEC60748-4:1997 iv BSI 0

22、4-2000 Page 7 Differential-mode voltage amplification (of a voltage comparator) (A V ) 95 8 Differential input threshold voltage (of a voltage comparator) (V ITHand V ITL ) 96 9 Input offset current (I IO ) and its temperature coefficient ( IIO ) (of a voltage comparator) 97 Section 3. Category II (

23、linear analogue-to-digital and digital-to-analogue converters) Group I linear analogue-to-digital converters (ADC) 10 Supply currents (I CCand I EE ) 99 11 Origin error (E Oand E ZS ) 100 12 Temperature coefficient of voltage change (! EOand ! EZS ) 101 13 Full resolution errors (E Gand E FS ) 102 1

24、4 Temperature coefficient of voltage change for gain and full-scale errors (! EGand ! EFS ) 104 15 Linearity error of a linear ADC (E L ) (E L(adj) ) (E T ) 105 16 Differential linearity error (E D ) 109 17 Maximum operating frequency (f max ) 110 Group II Linear digital-to-analogue converters (DAC)

25、 18 Supply currents (I CCand I EE ) 113 19 Output voltage (output current) sensitivity (K SVS(V) , K SVS(I) ) 115 20 Origin error (E Oand E ZS ) 116 21 Temperature coefficient of voltage change (! EOand ! EZS ) 117 22 Full resolution errors (E Gand E FS ) 118 23 Temperature coefficient of voltage ch

26、ange for gain and full-scale error (! EGand ! EFS ) 119 24 Linearity error of an adjustable linear DAC (E L ) (E L(adj) ) 121 25 Total error, absolute accuracy error (E T ) of a non-adjustable linear DAC 125 26 Differential linearity error (E D ) 125 27 Digital response times (t sd ) (t dd ) (S VOAV

27、d ) 126 28 Reference response times (t sr ) (t dr ) (S VOAVr ) 130 Figure 1 Response times 5 Figure 2 Elements of transfer diagrams 8 Figure 3 Ideal straight line, full-scale and zero-scale values (shown for ideal linear ADC) 10 Figure 4 Adjustment in offset point and gain point 12 Figure 5 Offset e

28、rror, gain error (of a linear3-bit natural binary-coded converter) 15 Figure 6 Linearity errors (of a linear,3-bit natural binary-coded converter) 16 Figure 7 Differential linearity error of a linear ADC or DAC 17 Figure 8 Missing code (for an ADC) 17 Figure 9 Non-monotonic conversion (of an ADC or

29、DAC) 18 Figure 10 Absolute accuracy error, total error (of a linear ADC or DAC) 19 Figure 11 Digital characteristics (of a linear or a multiplying DAC) 21 Figure 12 Reference signal characteristics (of a multiplying DAC) 23 Figure 13 27 Figure 14 28BSIEC60748-4:1997 BSI 04-2000 v Page Figure 15 36 F

30、igure 16 Block diagram (example) 46 Figure 17 Terminal connections 48 Figure 18 Example of a block diagram 54 Figure 19 61 Figure 20 Digital interface integrated circuit 67 Figure 21 Timing relations or digital interface integrated circuit 72 Figure 22 Block diagram 75 Figure 23 Relationship in TE m

31、ode 80 Figure 24 General interface, TE mode 81 Figure 25 General interface, NT, LT-S and LT-T modes 81 Figure 26 Output and input synchronization 82 Figure 27 Measurement of the common-mode input triggering voltage 87 Figure 28 Measurement of average bias current I IBand input offset I IO 88 Figure

32、29 Measurement of differential-mode input overload recovery time (t ord ) and common-mode input overload recovery time (t orc ) 89 Figure 30 Basic circuit diagram Manual measurement Method A 91 Figure 31 Basic circuit diagram Automatic measurement Method B 92 Figure 32 Transfer characteristics of a

33、voltage comparator (with digital output characteristics) 93 Figure 33 Measuring circuit of a linear ADC for supply currents, offset error, zero-scale error, gain error, full scale error, temperature coefficient of voltage change for the offset error, zero-scale error, gain error and full-scale error

34、 100 Figure 34 Measuring equipment for linearity errors of a linear ADC (applicable with a current generator) 108 Figure 35 Measuring circuit of a linear ADC for (end-points) linearity error, best-straight-line linearity error, total error, and differential linearity error (applicable with a referen

35、ce DAC) 109 Figure 36 Measuring circuit (with a reference DAC) for maximum operating frequency (f max ) of a linear ADC 111 Figure 37 Analogue input signal for maximum operating frequency measurement of a linear ADC 111 Figure 38 Measuring circuit (with a digital signal processing technique) for max

36、imum operating frequency measurement of a linear ADC 112 Figure 39 Analogue input signal for maximum operating frequency measurement of a linear ADC 112 Figure 40 Measuring circuit for supply currents and output voltage or current sensitivity of a linear DAC, or with a two input multiplying DAC 114

37、Figure 41 Measuring circuit of a linear DAC for offset error, zero-scale error, gain error, full-scale error, and temperature coefficient of voltage change for the offset error, zero-scale error, gain error and full-scale error 117 Figure 42 Measuring equipment for linearity errors of a DAC (applica

38、ble with a voltage generator) 123BSIEC60748-4:1997 vi BSI 04-2000 Page Figure 43 Measuring circuit for (end-points) linearity error, best-straight-line linearity error, total error, and differential linearity error of a linear DAC 124 Figure 44 Measuring circuit for (digital) response times; (digita

39、l) settling time, (digital) delay time and average rate of change of the output voltage of a linear DAC 129 Figure 45 Output response signal in (digital) response time measurement of the linear DAC 130 Figure 46 Measuring circuit for (reference) response times; (reference) settling time, (reference)

40、 delay time and (reference) average rate of change of the output voltage of a linear DAC 133 Figure 47 Output response signal in (reference) response times measurement of a linear DAC 134 Table 1 77 Table 2 77 Table 3 78 Table 4 Clock synchronization 79 Table 5 TE mode 79 Table 6 NT, LT-S and LT-T m

41、odes 79 Table 7 Special function timing 80 Table 8 82 Table 9 Application matrix 83BSIEC60748-4:1997 BSI 04-2000 1 Chapter I. General 1 Scope This part of IEC60748 gives requirements for the following categories or subcategories of interfaceintegrated circuits. Category I: subcategory A: line circui

42、ts (transmitters and receivers); subcategory B: sense amplifiers; subcategory C: peripheral drivers (including memory drivers) and level shifters; subcategory D: voltage comparators. Category II: linear and non-linear analogue-to-digital and digital-to-analogue converters. Category III: control circ

43、uits for switch-mode power supplies. Category IV: companding PCM coder-decoders (CODEC). Category V: digital interface integrated circuits (UBF). Category VI: integrated service digital network (ISDN). As stated in the foreword, this standard is to be used in conjunction with IEC60747-1 and IEC60748

44、-1. Inthese standards, the user will find all basic information on: terminology; letter symbols; essential ratings and characteristics; measuring methods. The sequence of the different chapters is in accordance with IEC60747-1,2.1, chapter III. 2 Normative references The following normative document

45、s contain provisions which, through reference in this text, constitute provisions of this part of IEC60748. At the time of publication, the editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC60748 are encouraged to inves

46、tigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of currently valid InternationalStandards. IEC60134:1961, Rating systems for electronic tubes and valves and analogous semiconductor devices. IEC60617-12:

47、1996, Graphical symbols for diagrams Part12: Binary logic elements. IEC60747, Semiconductor devices Discrete devices. IEC60747-1:1983, Semiconductor devices Discrete devices and integrated circuits Part1: General. IEC60748, Semiconductor devices Integrated circuits. IEC60748-1:1984, Semiconductor de

48、vices Integrated circuits Part1: General. IEC60748-2:1985, Semiconductor devices Integrated circuits Part2: Digital integrated circuits. IEC60748-3:1986, Semiconductor devices Integrated circuits Part3: Analogue integrated circuits. ITU-T Recommendation G712:1993, Transmission performance characteri

49、stics of pulse code modulation. ITU-T Recommendation|430:1994, Basic user-network interface Layer1 specification. BSIEC60748-4:1997 2 BSI 04-2000 Chapter II. Terminology and letter symbols 1 Category I (line circuits, sense amplifiers, peripheral drivers including memory drivers and level shifters, voltage comparators) 1.1 General terms 1.1.1 line transmitter an integrated circuit operating as a transmitter, the