BS IEC 61671-2-2016 Standard for automatic test markup language (ATML) instrument description《自动测试标记语言 (ATML) 的仪器描述标准》.pdf

1、BSI Standards PublicationStandard for automatic testmarkup language (ATML) instrument descriptionBS IEC 61671-2:2016National forewordThis British Standard is the UK implementation of IEC 61671-2:2016.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/501, Electronic Asse

2、mbly Technology.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2016.Published

3、 by BSI Standards Limited 2016ISBN 978 0 580 92302 9ICS 25.040; 35.060Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 30 April 2016.Amendments/corrigenda issued si

4、nce publicationDate Text affectedBRITISH STANDARDBS IEC 61671-2:2016IEC 61671-2 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) instrument description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3265-1 Warning! Make sure

5、that you obtained this publication from an authorized distributor. IEEE Std 1671.2 Registered trademark of the International Electrotechnical Commission BS IEC 61671-2:2016IEC 61671-2 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) instrument description

6、 INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3265-1 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.2 Registered trademark of the International Electrotechnical Commission BS IEC 61671-2:2016Copyright 2013 IEEE. All

7、 rights reserved. ix Contents 1. Overview 1 1.1 General 1 1.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, abbreviations, and acronyms 4 3.1 Definitions . 4 3.2 Abbreviations and acronyms

8、 . 5 4. InstrumentDescription schema . 7 4.1 General 7 4.2 Elements 7 4.3 Child elements 10 4.4 Complex types 13 4.5 Simple types .28 5. InstrumentDescription instance schema 28 5.1 Elements .28 5.2 Complex types 29 5.3 Simple types .31 6. ATML InstrumentDescription XML schema names and locations .3

9、1 7. ATML XML schema extensibility 33 8. Conformance .33 Annex A (informative) IEEE download Web site material associated with this document 34 Annex B (informative) Users information and examples 35 Annex C (informative) Glossary .38 Annex D (informative) Bibliography 39 Annex E (informative) IEEE

10、List of Participants .41 IEC 61671-2:2016 IEEE Std 1671.2-2012 - ii -BS IEC 61671-2:2016IEC 61671-2:2016 IEEE Std 1671.2-2012 Published by IEC under license from IEEE. 2012 IEEE. All rights reserved. STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) INSTRUMENT DESCRIPTION FOREWORD 1) The Internatio

11、nal Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic

12、 fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; an

13、y IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standard

14、s Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily membe

15、rs of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards

16、 documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the

17、two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technic

18、al matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE St

19、andards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications

20、 is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the ma

21、ximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification

22、bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability sh

23、all attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Bo

24、ard, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention

25、 is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by paten

26、t rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into

27、 the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that deter

28、mination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. - iii -BS IEC 61671-2:2016BS IEC 61671-2:2016IEC 61671-2:2016IEEE Std 1671.2-2012 ii Copyright 2013 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 General 1 1.2

29、 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, abbreviations, and acronyms 4 3.1 Definitions . 4 3.2 Abbreviations and acronyms . 5 4. InstrumentDescription schema . 7 4.1 General 7 4.2 El

30、ements 7 4.3 Child elements 10 4.4 Complex types 13 4.5 Simple types .28 5. InstrumentDescription instance schema 28 5.1 Elements .28 5.2 Complex types 29 5.3 Simple types .31 6. ATML InstrumentDescription XML schema names and locations .31 7. ATML XML schema extensibility 33 8. Conformance .33 Anne

31、x A (informative) IEEE download Web site material associated with this document 34 Annex B (informative) Users information and examples 35 Annex C (informative) Glossary .38 Annex D (informative) Bibliography 39 Annex E (informative) IEEE List of Participants .41 IEC 61671-2:2016 IEEE Std 1671.2-201

32、2 - ii -BS IEC 61671-2:2016IEC 61671-2:2016 IEEE Std 1671.2-2012 Published by IEC under license from IEEE. 2012 IEEE. All rights reserved. STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) INSTRUMENT DESCRIPTION FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organiza

33、tion for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC

34、 publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with

35、 may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (

36、IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE adminis

37、ters the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made avail

38、able for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technica

39、l matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standard

40、s Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Pu

41、blications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the

42、way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publicat

43、ions. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some ar

44、eas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or IEEE or their directors, employees, serv

45、ants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property damage or other damage

46、 of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publicati

47、on. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no position is tak

48、en with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining

49、whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. - iii -BS IEC 61671-2:2016BS IEC 61671-2:2016IEC 61671-2:2016IEEE Std 1671.2-2012 iii IEC 61671-2:2016 IEEE Std 1671.2-2012 Published by IEC under license from IEEE. 2012 IEEE. All rights res