BS IEC 61671-4-2016 Standard for automatic test markup language (ATML) test configuration《自动测试标记语言 (ATML) 的测试配置标准》.pdf

1、BSI Standards PublicationStandard for automatic testmarkup language (ATML) test configurationBS IEC 61671-4:2016National forewordThis British Standard is the UK implementation of IEC 61671-4:2016.The UK participation in its preparation was entrusted to TechnicalCommittee EPL/501, Electronic Assembly

2、 Technology.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2016.Published by

3、BSI Standards Limited 2016ISBN 978 0 580 92303 6ICS 25.040.01; 35.060Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 30 April 2016.Amendments/corrigenda issued sin

4、ce publicationDate Text affectedBRITISH STANDARDBS IEC 61671-4:2016IEC 61671-4 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test configuration INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3266-8 Warning! Make sure that

5、you obtained this publication from an authorized distributor. IEEE Std 1671.4 Registered trademark of the International Electrotechnical Commission BS IEC 61671-4:2016IEC 61671-4 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test configuration INTERNAT

6、IONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3266-8 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.4 Registered trademark of the International Electrotechnical Commission BS IEC 61671-4:2016Contents 1. Overview 1 1.1 Genera

7、l 1 1.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. TestConfiguration schema 7 4.1 Background 7 4.

8、2 Test configuration.xsd . 7 5. TestConfiguration instance schema .32 6. ATML TestConfiguration XML schema names and locations 32 7. ATML XML schema extensibility 34 8. Conformance .34 Annex A (informative) IEEE download web-site material associated with this document .35 Annex B (informative) Test

9、Configuration XML element mappings to MTPSI card fields .36 Annex C (informative) Examples 41 Annex D (informative) Bibliography 44 Annex E (informative) List of IEEE Participants .4IEC 61671-4:2016 IEEE Std 1671.4-2014 - ii -BS IEC 61671-4:2016IEC 61671-4:2016 IEEE Std 1671.4-2014 Published by IEC

10、under license from IEEE. 2014 IEEE. All rights reserved. STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) INSTRUMENT DESCRIPTION FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC

11、National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, P

12、ublicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-gov

13、ernmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus developm

14、ent process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to promote fairness in the consensus develo

15、pment process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standar

16、ds.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on

17、 the relevant subjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of

18、materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted

19、 by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In ord

20、er to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding nation

21、al or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any s

22、ervices carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees an

23、d IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including leg

24、al fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct applicatio

25、n of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection th

26、erewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission o

27、f a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. - iii -BS IEC

28、 61671-4:2016BS IEC 61671-4:2016IEC 61671-4:2016IEEE Std 1671.4-2014 ii Contents 1. Overview 1 1.1 General 1 1.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 3 2. Normative references 4 3. Definitions, acronyms, and abbreviations 4

29、 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. TestConfiguration schema 7 4.1 Background 7 4.2 Test configuration.xsd . 7 5. TestConfiguration instance schema .32 6. ATML TestConfiguration XML schema names and locations 32 7. ATML XML schema extensibility 34 8. Conformance .34 Annex A (i

30、nformative) IEEE download web-site material associated with this document .35 Annex B (informative) Test Configuration XML element mappings to MTPSI card fields .36 Annex C (informative) Examples 41 Annex D (informative) Bibliography 44 Annex E (informative) List of IEEE Participants .4IEC 61671-4:2

31、016 IEEE Std 1671.4-2014 - ii -BS IEC 61671-4:2016IEC 61671-4:2016 IEEE Std 1671.4-2014 Published by IEC under license from IEEE. 2014 IEEE. All rights reserved. STANDARD FOR AUTOMATIC TEST MARKUP LANGUAGE (ATML) INSTRUMENT DESCRIPTION FOREWORD 1) The International Electrotechnical Commission (IEC)

32、is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition t

33、o other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in

34、 the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE

35、Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensat

36、ion. While IEEE administers the process and establishes rules to promote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE d

37、ocuments are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decis

38、ions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE

39、 Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE-SA) Standard

40、s Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be he

41、ld responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their nationa

42、l and regional publications. Any divergence between any IEC/IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment s

43、ervices and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or IEEE or their dir

44、ectors, employees, servants or agents including individual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board, for any personal injury, property

45、 damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references

46、cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights. By publication of this stand

47、ard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. IEC or IEEE shall not be held responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent

48、 Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent

49、 rights, and the risk of infringement of such rights, is entirely their own responsibility. - iii -BS IEC 61671-4:2016BS IEC 61671-4:2016IEC 61671-4:2016IEEE Std 1671.4-2014 iii IEC 61671-4:2016 IEEE Std 1671.4-2014 Published by IEC under license from IEEE. 2014 IEEE. All rights reserved. International Standard IEC 61671-4/IEEE Std 1671.4-2014 has been processed through IEC technical committee 91: Electronics assembly technology, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on v