BS IEC 61671-6-2016 Standard for automatic test markup language (ATML) test station description《自动测试标记语言 (ATML) 的测试台描述标准》.pdf

1、BSI Standards Publication Standard for automatic test markup language (ATML) test station description BS IEC 61671-6:2016National foreword This British Standard is the UK implementation of IEC 61671-6:2016. The UK participation in its preparation was entrusted to Technical Committee EPL/501, Electro

2、nic Assembly Technology. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 20

3、16. Published by BSI Standards Limited 2016 ISBN 978 0 580 92305 0 ICS 25.040; 35.060 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 April 2016. Amendments/

4、corrigenda issued since publication Date Text affected BRITISH STANDARD BS IEC 61671-6:2016IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (ATML) test station description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3

5、268-2 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.6 Registered trademark of the International Electrotechnical Commission BS IEC 61671-6:2016 IEC 61671-6 Edition 1.0 2016-04 INTERNATIONAL STANDARD Standard for automatic test markup language (AT

6、ML) test station description INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040; 35.060 ISBN 978-2-8322-3268-2 Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671.6 Registered trademark of the International Electrotechnical Commission BS IEC 61671-6:

7、2016Contents 1. Overview 1 1.1 General 1 1.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations . 5 4. SchemaTes

8、tStationDescription.xsd 6 4.1 General 6 4.2 Elements 6 4.3 Child elements . 8 4.4 Complex types . 9 5. SchemaTestStationInstance.xsd 10 5.1 General .10 5.2 Elements .10 5.3 Child elements 12 5.4 Complex types 12 6. ATML TestStationDescription XML schema names and locations 14 7. ATML XML schema exte

9、nsibility 15 8. Conformance .16 8.1 Conformance of a TestStationDescription instance document .16 8.2 Conformance of a TestStationInstance instance document 16 Annex A (informative) IEEE download website material associated with this document 17 Annex B (informative) Users information and examples .

10、18 B.1 Partial automatic test station 18 Annex C (informative) Glossary .21 Annex D (informative) Bibliography 22Annex E (informative) IEEE List of Participants23IEC 61671-6:2016 IEEE Std 1671.6-2015 - i - BS IEC 61671-6:2016IEC 61671-6:2016 IEEE Std 1671.6-2015 Published by IEC under license from I

11、EEE. 2015 IEEE. All rights reserved. Standard for Automatic Test Markup Language (ATML) Test Station Description FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committee

12、s). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available

13、Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non - governmental organi

14、zations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE develops its standards through a consensus development process, whi

15、ch brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rules to pr omote fairness in the consensus development process,

16、IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important notices and legal disclaimers (see http:/standards.ieee.org/IPR

17、/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant s

18、ubjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been reached, is determined by a balanced ballot of materially inte

19、rested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE -SA) Standards Board. 3) IEC/IEEE Publications have the form of recommendations for international use and are accepted by IEC Nation

20、al Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote

21、international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC /IEEE Publication and the corresponding national or regiona

22、l publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC and IEEE are not responsible for any services carri

23、ed out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication . 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individual experts and members of technical committees and IEC Nation

24、al Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE -SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) an

25、d expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this p

26、ublication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights . By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. I

27、EC or IEEE shall not be held respons ible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Lette

28、r of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. - ii - BS IEC 61671-6:

29、2016 BS IEC 61671-6:2016 IEC 61671-6:2016 IEEE Std 1671.6-2015 ii Contents 1. Overview 1 1.1 General 1 1.2 Application of this documents annexes 2 1.3 Scope . 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 D

30、efinitions . 4 3.2 Acronyms and abbreviations . 5 4. SchemaTestStationDescription.xsd 6 4.1 General 6 4.2 Elements 6 4.3 Child elements . 8 4.4 Complex types . 9 5. SchemaTestStationInstance.xsd 10 5.1 General .10 5.2 Elements .10 5.3 Child elements 12 5.4 Complex types 12 6. ATML TestStationDescrip

31、tion XML schema names and locations 14 7. ATML XML schema extensibility 15 8. Conformance .16 8.1 Conformance of a TestStationDescription instance document .16 8.2 Conformance of a TestStationInstance instance document 16 Annex A (informative) IEEE download website material associated with this docu

32、ment 17 Annex B (informative) Users information and examples .18 B.1 Partial automatic test station 18 Annex C (informative) Glossary .21 Annex D (informative) Bibliography 22Annex E (informative) IEEE List of Participants23IEC 61671-6:2016 IEEE Std 1671.6-2015 - i - BS IEC 61671-6:2016IEC 61671-6:2

33、016 IEEE Std 1671.6-2015 Published by IEC under license from IEEE. 2015 IEEE. All rights reserved. Standard for Automatic Test Markup Language (ATML) Test Station Description FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising al

34、l national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Te

35、chnical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory w

36、ork. International, governmental and non - governmental organizations liaising with the IEC also participate in this preparation. IEEE Standards documents are developed within IEEE Societies and Standards Coordinating Committees of the IEEE Standards Association (IEEE-SA) Standards Board. IEEE devel

37、ops its standards through a consensus development process, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of IEEE and serve without compensation. While IEEE administers the process and establishes rul

38、es to pr omote fairness in the consensus development process, IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of IEEE Standards documents is wholly voluntary. IEEE documents are made available for use subject to important n

39、otices and legal disclaimers (see http:/standards.ieee.org/IPR/disclaimers.html for more information). IEC collaborates closely with IEEE in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions of IEC on technical matters express, as nearly as pos

40、sible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. The formal decisions of IEEE on technical matters, once consensus within IEEE Societies and Standards Coordinating Committees has been

41、reached, is determined by a balanced ballot of materially interested parties who indicate interest in reviewing the proposed standard. Final approval of the IEEE standards document is given by the IEEE Standards Association (IEEE -SA) Standards Board. 3) IEC/IEEE Publications have the form of recomm

42、endations for international use and are accepted by IEC National Committees/IEEE Societies in that sense. While all reasonable efforts are made to ensure that the technical content of IEC/IEEE Publications is accurate, IEC or IEEE cannot be held responsible for the way in which they are used or for

43、any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications (including IEC/IEEE Publications) transparently to the maximum extent possible in their national and regional publications. Any divergence between any I

44、EC /IEEE Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC and IEEE do not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of confo

45、rmity. IEC and IEEE are not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication . 7) No liability shall attach to IEC or IEEE or their directors, employees, servants or agents including individ

46、ual experts and members of technical committees and IEC National Committees, or volunteers of IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE -SA) Standards Board, for any personal injury, property damage or other damage of any nature whatsoever, whet

47、her direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC/IEEE Publication or any other IEC or IEEE Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publi

48、cations is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that implementation of this IEC/IEEE Publication may require use of material covered by patent rights . By publication of this standard, no position is taken with respect to the existen

49、ce or validity of any patent rights in connection therewith. IEC or IEEE shall not be held respons ible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patent Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the r