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本文(BS IEC 62243-2005 Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)《与所有试验环境有关的人工智能交换和服务(Al-ESTATE)》.pdf)为本站会员(feelhesitate105)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

BS IEC 62243-2005 Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)《与所有试验环境有关的人工智能交换和服务(Al-ESTATE)》.pdf

1、BRITISH STANDARDBS IEC 62243:2005Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)ICS 35.240; 35.160g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g3

2、8g50g51g60g53g44g42g43g55g3g47g36g58BS IEC 62243:2005This British Standard was published under the authority of the Standards Policy and Strategy Committee on 14 November 2005 BSI 14 November 2005ISBN 0 580 46675 2National forewordThis British Standard reproduces verbatim IEC 62243 Ed 1.0:2005 and i

3、mplements it as the UK national standard.The UK participation in its preparation was entrusted to Technical Committee GEL/93, Design automation, which has the responsibility to: aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the int

4、erpretation, or proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in the UK.A list of organizations represented on this committee can be obtained on request to its secretary.Cross-referencesThe British Standards which im

5、plement international publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online.This publication does not purp

6、ort to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations.Summary of pagesThis document comprises a front cover, an inside front cover, the IEC title page,

7、 pages 2 to 121 and a back cover.The BSI copyright notice displayed in this document indicates when the document was last issued.Amendments issued since publicationAmd. No. Date CommentsINTERNATIONAL STANDARD IEC62243First edition2005-07IEEE 1232 Artificial intelligence exchange and service tie to a

8、ll test environments (AI-ESTATE) Reference number IEC 62243(E):2005 IEEE Std. 1232(E):2002 1. Overview.71.1 Scope 81.2 Purpose 81.3 Conventions used in this standard. 92. References .93. Definitions and acronyms .93.1 Definitions.93.2 Acronyms .114. Description of AI-ESTATE .114.1 AI-ESTATE architec

9、ture .114.2 Interchange format.144.3 Binding strategy .144.4 Extensibility154.5 Status codes 164.6 Conformance 174.7 Service order dependence. 185. Models 215.1 Common Element Model. 215.2 Diagnostic Inference Model. 545.3 Dynamic Context Model . 585.4 Enhanced Diagnostic Inference Model 895.5 Fault

10、 Tree Model. 936. Services. 976.1 Model management services 986.2 Reasoner manipulation services103Annex A (informative) Bibliography . 111 Annex B (informative) Overview of EXPRESS. 113CONTENTSFOREWORD . 3 IEEE Introduction 6Annex C (informative) List of Participants 120BS IEC 62243:2005 2 INTERNAT

11、IONAL ELECTROTECHNICAL COMMISSION _ ARTIFICIAL INTELLIGENCE EXCHANGE AND SERVICE TIE TO ALL TEST ENVIRONMENTS (AI-ESTATE) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National

12、Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly A

13、vailable Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental

14、 organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on techn

15、ical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IE

16、C National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international unifor

17、mity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) I

18、EC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC sha

19、ll not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 62243 has been processed through IEC technical committee 93: Design automation. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting 1232 (2002) 93/214/F

20、DIS 93/220/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives. The committee has decided that the contents of this publication will remain

21、unchanged until 2007. BS IEC 62243:2005 3 IEC/IEEE Dual Logo International Standards This Dual Logo International Standard is the result of an agreement between the IEC and the Institute of Electrical and Electronics Engineers, Inc. (IEEE). The original IEEE Standard was submitted to the IEC for con

22、sideration under the agreement, and the resulting IEC/IEEE Dual Logo International Standard has been published in accordance with the ISO/IEC Directives. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Association (IEEE

23、-SA) Standards Board. The IEEE develops its standards through a consensus development process, approved by the American National Standards Institute, which brings together volunteers representing varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of

24、the Institute and serve without compensation. While the IEEE administers the process and establishes rules to promote fairness in the consensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of the information contained in its standards. Use of an

25、IEC/IEEE Dual Logo International Standard is wholly voluntary. The IEC and IEEE disclaim liability for any personal injury, property or other damage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resulting from the publication, use of, or

26、 reliance upon this, or any other IEC or IEEE Standard document. The IEC and IEEE do not warrant or represent the accuracy or content of the material contained herein, and expressly disclaim any express or implied warranty, including any implied warranty of merchantability or fitness for a specific

27、purpose, or that the use of the material contained herein is free from patent infringement. IEC/IEEE Dual Logo International Standards documents are supplied “AS IS”. The existence of an IEC/IEEE Dual Logo International Standard does not imply that there are no other ways to produce, test, measure,

28、purchase, market, or provide other goods and services related to the scope of the IEC/IEEE Dual Logo International Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments

29、 received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not whol

30、ly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. In publishing and making this document available, the IEC and IEEE are not suggesting or rendering professional or other services for, or on behalf of, any perso

31、n or entity. Neither the IEC nor IEEE is undertaking to perform any duty owed by any other person or entity to another. Any person utilizing this, and any other IEC/IEEE Dual Logo International Standards or IEEE Standards document, should rely upon the advice of a competent professional in determini

32、ng the exercise of reasonable care in any given circumstances. Interpretations Occasionally questions may arise regarding the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate a

33、ction to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating

34、Committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments for revision of IEC/IEEE Dual Logo International Standards are welcome from any interested party, regardless of membership a

35、ffiliation with the IEC or IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board, 445 Hoes Lane, P

36、.O. Box 1331, Piscataway, NJ 08855-1331, USA and/or General Secretary, IEC, 3, rue de Varemb, PO Box 131, 1211 Geneva 20, Switzerland. Authorization to photocopy portions of any individual standard for internal or personal use is granted by the Institute of Electrical and Electronics Engineers, Inc.

37、, provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for

38、 educational classroom use can also be obtained through the Copyright Clearance Center. NOTE Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to t

39、he existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. BS

40、 IEC 62243:2005 4 IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATES)SponsorIEEE Standards Coordinating Committee 20Approved 13 November 2002American National Standards InstituteApproved 13 June 2002IEEE-SA Standards BoardAbstract: AI-ESTATE is a

41、set of specifications for data interchange and for standard services for thetest and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces betweenfunctional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledgeand data for use by such diag

42、nostic reasoners. Formal information models are defined to form thebasis for a format to facilitate exchange of persistent diagnostic information between two reasoners,and also to provide a formal typing system for diagnostic services. This standard then defines theservices to manipulate diagnostic

43、information and to control a diagnostic reasoner.Keywords: AI-ESTATE, diagnosis, diagnostic interference, diagnostic model, diagnostic services,dynamic content, fault tree, knowledge exchange, system testBS IEC 62243:2005 5 This AI-ESTATE standard provides a formal framework for exchanging diagnosti

44、c knowledge andconstructingdiagnosticreasoners.Theintentistoprovideastandardframeworkforidentifyingrequired information for diagnosis and defining the diagnostic information in a machine-processableway. In addition, software interfaces are defined whereby diagnostic tools can be developed to process

45、the diagnostic information in a consistent and reliable way.IEEE IntroductionBS IEC 62243:2005 6 Artificial intelligence exchange and service1. OverviewThe Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) standardwas developed by the Diagnostic and Maintenance Co

46、ntrol (D however, such implementations may not be portable. As shownin Figure 1, a diagnostic model can be moved from one AI-ESTATE implementation to another bytranslating it into the interchange format. Another AI-ESTATE implementation can then utilize thisinformation as a complete package by trans

47、lating the data and knowledge from the interchangeformat to its own internal form.The translation step is not a requirement; an AI-ESTATE implementation may use the interchangeformat for its own internal form.Software specifications defined in this standard will ensure the interchangeability of diag

48、nosticreasoners through the definition of encapsulated services. This will allow diagnostic reasoners to beinterchanged within an AI-ESTATE conformant system with no eect on the other elements of thesystem.1.1 ScopeThe AI-ESTATE standard defines formal specifications for supporting system diagnosis.

49、 Thesespecifications support the exchange and processing of diagnostic information and the control ofdiagnostic processes. Diagnostic processes include, but are not limited to, testability analysis,diagnosability assessment, diagnostic reasoning, maintenance support, and diagnostic maturation.1.2 PurposeThe AI-ESTATE standard provides formal models of diagnostic information to ensure unambiguousaccess to an understanding of the information supporting system test and diagnosis. The standardunifies and expands on the specifications published in IEEE Std 1232T

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