BS ISO 10110-7-2017 Optics and photonics Preparation of drawings for optical elements and systems Surface imperfections《光学和光子学 光学元件和系统制图 表面瑕疵》.pdf

1、Optics and photonics - Preparation of drawings for optical elements and systemsPart 7: Surface imperfectionsBS ISO 101107:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06 ISO 2017Optics and photonics Preparation of drawings for optical elements and systems Part 7

2、: Surface imperfectionsOptique et photonique Indications sur les dessins pour lments et systmes optiques Partie 7: Imperfections de surfaceINTERNATIONAL STANDARDISO10110-7Third edition2017-08Reference numberISO 10110-7:2017(E)National forewordThis British Standard is the UK implementation of ISO 101

3、107:2017. It supersedes BS ISO 101107:2008, which is withdrawn.The UK participation in its preparation was entrusted to Technical Committee CPW/172, Optics and Photonics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purpor

4、t to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2017 Published by BSI Standards Limited 2017ISBN 978 0 580 88811 3ICS 01.100.20; 37.020Compliance with a British Standard cannot confer immunity from legal ob

5、ligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 September 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS ISO 101107:2017 ISO 2017Optics and photonics Preparation of drawings for optical el

6、ements and systems Part 7: Surface imperfectionsOptique et photonique Indications sur les dessins pour lments et systmes optiques Partie 7: Imperfections de surfaceINTERNATIONAL STANDARDISO10110-7Third edition2017-08Reference numberISO 10110-7:2017(E)BS ISO 101107:2017ISO 10110-7:2017(E)ii ISO 2017

7、All rights reservedCOPYRIGHT PROTECTED DOCUMENT ISO 2017, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the inte

8、rnet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyr

9、ightiso.orgwww.iso.orgBS ISO 101107:2017ISO 10110-7:2017(E)ii ISO 2017 All rights reservedCOPYRIGHT PROTECTED DOCUMENT ISO 2017, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, e

10、lectronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Ver

11、nier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyrightiso.orgwww.iso.orgISO 10110-7:2017(E)Foreword ivIntroduction v1 Scope . 12 Normative references 13 Terms and definitions . 14 Indication in drawings 34.1 General . 34.2 Dimensional specification method for optical elements an

12、d assemblies 34.2.1 Maximum permissible surface imperfections 34.2.2 Surface imperfection indication for the dimensional specification method 64.2.3 Imperfections with a smaller grade number in the dimensional specification method 64.2.4 Concentrations of surface imperfections in the dimensional spe

13、cification method 64.2.5 Test methods for the dimensional specification method 74.3 Visibility specification method for optical elements and assemblies 74.3.1 Maximum permissible surface imperfections 74.3.2 Visibility specification imperfections with smaller grade number .104.3.3 Concentrations of

14、visibility imperfections .104.3.4 Test method for visibility . 104.4 Location of the indication . 10Bibliography .12 ISO 2017 All rights reserved iiiContents PageBS ISO 101107:2017ISO 10110-7:2017(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of nationa

15、l standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. Internation

16、al organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended f

17、or its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www .iso

18、.org/ directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will

19、 be in the Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the voluntary nature of standards, the meani

20、ng of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www .iso .org/ iso/ foreword .html.This document was prepared by Tec

21、hnical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 1, Fundamental standards.This third edition cancels and replaces the second edition (ISO 10110-7:2008), which has been technically revised.The main changes compared to the previous edition are as follows: an additional notation has b

22、een added which allows the specification of a maximum allowable width for imperfections; long imperfection accumulation rules have been corrected to coincide with the Renard series of grades; the rules for determining concentrations have been clarified; the test method notations and meanings have be

23、en clarified; an additional notation has been added which allows the use of the popular scratch and dig specification for cosmetic surface imperfections; in addition, several changes have been made to bring this document into alignment with the inspection methods for surface imperfections which are

24、described in ISO 14997, and various editorial corrections have been made throughout this document.A list of all parts in the ISO 10110 series can be found on the ISO website.iv ISO 2017 All rights reservedBS ISO 101107:2017ISO 10110-7:2017(E)ForewordISO (the International Organization for Standardiz

25、ation) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be

26、 represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to

27、 develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of th

28、e ISO/IEC Directives, Part 2 (see www .iso .org/ directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified

29、during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www .iso .org/ patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on t

30、he voluntary nature of standards, the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following URL: www .iso .org/ iso/ forew

31、ord .html.This document was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 1, Fundamental standards.This third edition cancels and replaces the second edition (ISO 10110-7:2008), which has been technically revised.The main changes compared to the previous edition a

32、re as follows: an additional notation has been added which allows the specification of a maximum allowable width for imperfections; long imperfection accumulation rules have been corrected to coincide with the Renard series of grades; the rules for determining concentrations have been clarified; the

33、 test method notations and meanings have been clarified; an additional notation has been added which allows the use of the popular scratch and dig specification for cosmetic surface imperfections; in addition, several changes have been made to bring this document into alignment with the inspection m

34、ethods for surface imperfections which are described in ISO 14997, and various editorial corrections have been made throughout this document.A list of all parts in the ISO 10110 series can be found on the ISO website.iv ISO 2017 All rights reserved ISO 10110-7:2017(E)IntroductionA localized surface

35、imperfection, such as a dig or a scratch resulting from handling or manufacture, can degrade the perceived quality of an optical component. In some cases, surface imperfections are specified according to their visibility, and in other cases, according to their size.Visual dark field inspection revea

36、ls the location of very small imperfections. The use of a brightness comparison standard, together with tolerance levels agreed upon by the manufacturer and user, permits classification of an imperfection as acceptable or unacceptable. This form of subjective inspection based on visibility or a visu

37、al assessment of brightness or apparent size, although economical and fast, lacks precision.In cases where the size, and not the brightness, is important, surface imperfections are specified according to their affected area (dimensional assessment). In this case, visual assessment using a dimensiona

38、l comparison standard is still possible, but lacks the precision required for some applications. Measurement is only required as a second stage operation following a visual inspection to determine location and to select a surface imperfection worthy of study. In such cases, a drawing notation indica

39、ting this level of inspection is required and can be added to the specification. ISO 2017 All rights reserved vBS ISO 101107:2017BS ISO 101107:2017Optics and photonics Preparation of drawings for optical elements and systems Part 7: Surface imperfections1 ScopeISO 10110 (all parts) specifies the pre

40、sentation of design and functional requirements for single optical elements and for optical assemblies in technical drawings used for their manufacture and inspection.This document specifies the indication of the level of acceptability of surface imperfections within a test region on individual opti

41、cal elements and optical assemblies. These include localized surface imperfections, edge chips and long scratches.The acceptance level for imperfections is specified, taking into account functional effects (affecting image formation or durability of the optical element), as well as cosmetic (appeara

42、nce) effects.This document applies to transmitting and reflecting surfaces of finished optical elements, whether or not they are coated, and to optical assemblies. It allows permissible imperfections to be specified according to the area affected by imperfections, or alternatively by the visibility

43、of imperfections, on components or in optical assemblies.2 Normative referencesThe following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document. For dated references, only the edition cited applies. For undated references,

44、the latest edition of the referenced document (including any amendments) applies.ISO 10110-1, Optics and photonics Preparation of drawings for optical elements and systems Part 1: GeneralISO 14997, Optics and photonics Test methods for surface imperfections of optical elements3 Terms and definitions

45、For the purposes of this document, the terms and definitions given in ISO 10110-1 and the following apply.ISO and IEC maintain terminological databases for use in standardization at the following addresses: IEC Electropedia: available at h t t p :/ www .electropedia .org/ ISO Online browsing platfor

46、m: available at h t t p :/ www .iso .org/ obpNOTE See also Figure 1 for an illustration of the classification of imperfections.INTERNATIONAL STANDARD ISO 10110-7:2017(E) ISO 2017 All rights reserved 1BS ISO 101107:2017ISO 10110-7:2017(E)3.1localized surface imperfectionartefact of limited extent wit

47、hin a test region on an optical surface, optical element or optical assembly produced by improper treatment during or after fabrication or in use, or by a material imperfection located at the surfaceNote 1 to entry: Examples of localized artefacts are scratches, pits, sleeks, scuffs and fixture mark

48、s and adherent particles. Also included are localized coating imperfections defined in ISO 9211-1. The line-like imperfections in ISO 9211-1 are regarded as kinds of scratches. The point-like imperfections in ISO 9211-1 are regarded as kinds of digs. Imperfections can be on a surface or within the m

49、aterial. ISO 9802 includes a glossary of terms in use.Note 2 to entry: Localized surface imperfections in optical assemblies can occur on any optical surface of the assembly. This also includes bubbles and inclusions in a cement layer of the optical subassembly.Figure 1 Classification of imperfections3.2long scratchsurface imperfection longer than 2 mmNote 1 to entry: These imperfections tend to be more visible than shorter imperfections of the same width because of their length.3.3edge chipmater