BS ISO 11382-2011 Optics and photonics Optical materials and components Characterization of optical materials used in the infrared spectral range from 0 78 $Gmm to 25 $Gmm《光学和光子学 光.pdf

1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS ISO 11382:2010Optics and photonics Optical materials and components Characterization of optical materials used in the infrared spectral range from 0,78 m to 25 mBS ISO 11382:2

2、010 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of ISO 11382:2010.The UK participation in its preparation was entrusted to TechnicalCommittee CPW/172/3, Optics and Photonics - Optical Materials andComponents.A list of organizations represented on this committee ca

3、n beobtained on request to its secretary.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. BSI 2011ISBN 978 0 580 65098 7ICS 37.020Compliance with a British Standard cannot confer immunity fromlegal obligations.T

4、his British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 January 2011.Amendments issued since publicationDate Text affectedBS ISO 11382:2010Reference numberISO 11382:2010(E)ISO 2010INTERNATIONAL STANDARD ISO11382First edition2010-10-01Optics and phot

5、onics Optical materials and components Characterization of optical materials used in the infrared spectral range from 0,78 m to 25 m Optique et photonique Matriaux et composants optiques Caractrisation des matriaux optiques utiliss dans la bande spectrale infrarouge de 0,78 m 25 m BS ISO 11382:2010I

6、SO 11382:2010(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downlo

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9、ven below. COPYRIGHT PROTECTED DOCUMENT ISO 2010 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at th

10、e address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2010 All rights reservedBS ISO 11382:2010ISO 11382:2010(E)

11、ISO 2010 All rights reserved iiiContents Page Foreword iv Introduction.v 1 Scope1 2 Normative references1 3 Terms and definitions .2 4 Symbols and units.2 5 Nomenclature.2 5.1 General .2 5.2 Name.3 5.3 Manufacturer reference.3 5.4 Material structure 3 5.5 Manufacturing process.3 5.6 Form of nomencla

12、ture.3 6 Optical properties3 6.1 General .3 6.2 Transmittance 5 6.3 Absorption coefficient 6 6.4 Transmittance uniformity .7 6.5 Refractive index.7 6.6 Variation of the refractive index.8 6.7 Dependence of the refractive index on temperature .8 6.8 Optical homogeneity (homogeneity of the refractive

13、index) 8 6.9 Birefringence .9 6.10 Photoelastic constant .9 6.11 Dispersion 9 7 Other properties 10 7.1 General .10 7.2 Specific gravity 10 7.3 Molecular weight .10 7.4 Thermal properties 10 7.5 Hardness 10 7.6 Elastic modulus .10 7.7 Maximum dimensions.10 Bibliography12 BS ISO 11382:2010ISO 11382:2

14、010(E) iv ISO 2010 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body

15、 interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotec

16、hnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by

17、the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent righ

18、ts. ISO shall not be held responsible for identifying any or all such patent rights. ISO 11382 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Subcommittee SC 3, Optical materials and components. BS ISO 11382:2010ISO 11382:2010(E) ISO 2010 All rights reserved vIntroduction Many

19、 standards for optical glass exist that are primarily used for the visible range, however, it is not easy to apply these standards directly to infrared materials. Often, the properties of infrared materials are known with less certainty than those used in the visible range because the methods of mea

20、surements are different, incomplete or inaccurate. BS ISO 11382:2010BS ISO 11382:2010INTERNATIONAL STANDARD ISO 11382:2010(E) ISO 2010 All rights reserved 1Optics and photonics Optical materials and components Characterization of optical materials used in the infrared spectral range from 0,78 m to 2

21、5 m 1 Scope This International Standard provides guidelines for the description of data sheets for infrared materials. It specifies the nomenclature and the properties of infrared materials which are reported on such data sheets. These data sheets do not necessarily contain information on every prop

22、erty identified in this International Standard. This International Standard also specifies the parameters needed to characterize optical materials intended for use in the infrared spectral range from 0,78 m to 25 m and provides various methods to be used for measuring these parameters. This Internat

23、ional Standard is applicable only to materials used in the manufacture of passive optical components. The properties of materials used in active applications (e.g. optoelectronics) are not taken into account. Materials specified in this International Standard can also transmit in other spectral doma

24、ins (microwaves, visible or ultraviolet). 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amend

25、ments) applies. ISO 10110-3, Optics and optical instruments Preparation of drawings for optical elements and systems Part 3: Material imperfections Bubbles and inclusions ISO 12123, Optics and photonics Specification of raw optical glass ISO 15368, Optics and optical instruments Measurement of refle

26、ctance of plane surfaces and transmittance of plane parallel elements ISO 80000-7, Quantities and units Part 7: Light BS ISO 11382:2010ISO 11382:2010(E) 2 ISO 2010 All rights reserved3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 12123, ISO 80000-7

27、and the following apply.1)3.1 regular transmittance ratio of the regularly transmitted part of the (whole) transmitted flux to the incident flux 3.2 regular reflectance specular reflectance ratio of the regularly reflected part of the (whole) reflected flux to the incident flux 3.3 absorptance ratio

28、 of the absorbed radiant flux to the incident flux 3.4 scatter scatterance ratio of the scattered radiant flux to the incident flux 3.5 standard uncertainty uncertainty of the result of a measurement expressed as a standard deviation 3.6 expanded uncertainty quantity defining an interval about the r

29、esult of a measurement that may be expected to encompass a large fraction of the distribution of values that could reasonably be attributed to the measurand 4 Symbols and units For the purposes of this document, the following symbols and units apply. d thickness of the sample, expressed in millimetr

30、es absorptance scatter wavelength, expressed in micrometres reflectance transmittance 5 Nomenclature 5.1 General The optical materials covered by this International Standard shall be identified as follows: a) the name (see 5.2); 1) These terms and definitions are consistent with those given in IEC 6

31、0050-845 and ISO/IEC Guide 98-3. BS ISO 11382:2010ISO 11382:2010(E) ISO 2010 All rights reserved 3b) the manufacturer reference (see 5.3); c) the material structure (optional) (see 5.4); d) the manufacturing process (see 5.5); e) a reference to this International Standard. 5.2 Name Either the tradem

32、ark or the generic name (e.g. germanium or sapphire), followed by reference to the method of manufacture, shall be given in the nomenclature. 5.3 Manufacturer reference A reference to the manufacturer shall be given in the nomenclature. 5.4 Material structure If known, the type of the material struc

33、ture shall be given, i.e. the following: amorphous material (e.g. glasses and some plastics); polycrystalline material; crystal (natural or synthetic); ceramics, etc. 5.5 Manufacturing process The manufacturing process shall be given in the nomenclature; this description may be simplified (e.g. CVD

34、instead of chemical vapour deposition). If a change in the manufacturing process modifies one or several properties of the material, another reference shall be used. NOTE A great number of materials which transmit in the infrared spectral range exist in nature. However, due to their scarcity, small

35、size, or impurity levels, the optical materials are usually manufactured or refined by industrial processes. 5.6 Form of nomenclature The nomenclature shall be expressed in sequence, separated by dashes, as shown in the following examples. EXAMPLE 1 Germanium Manufacturer A Monocrystalline n type Zo

36、ne fusion ISO 11382:2010 EXAMPLE 2 ZnS Manufacturer B Polycrystalline Hot isostatic pressed ISO 11382:2010 6 Optical properties 6.1 General The methods for obtaining data should be reported. If the data are quoted from a reference, the reference document and publication data date shall be reported.

37、The material is assumed to be in the form of a plane-parallel element with optically polished surfaces 1 and 2, as shown in Figure 1. BS ISO 11382:2010ISO 11382:2010(E) 4 ISO 2010 All rights reserved4541 23566666Key 1, 2 optically polished surfaces 3 incident light beam 4 reflected part 5 transmitte

38、d part 6 scattered part Figure 1 Schematic of the light propagation through an element The light beam incident on the schema given in Figure 1 is divided into a reflected part, a transmitted part, a scattered part, and an absorbed part. If m denotes a surface number, the light beam incident can be d

39、escribed by Equations (1) to (3), as follows: 1mmmm+= (1) 2si1i2tt2212 si ior11 =(2) (3) where tis the transmittance of the element; mis the regular transmittance of the surface m; 1is the regular transmittance of surface 1; 2is the regular transmittance of surface 2; sis the regular transmittance o

40、f the surface m when surfaces 1 and 2 are identical; dmis the scattered transmittance of the surface m; iis the internal transmittance of the element; BS ISO 11382:2010ISO 11382:2010(E) ISO 2010 All rights reserved 5mis the regular reflectance of the surface m; 1is the regular reflectance of surface

41、 1; 2is the regular reflectance of surface 2; sis the regular reflectance of the surface m when surfaces 1 and 2 are identical; dmis the scattered reflectance of the surface m; mis the absorptance of the surface m; ddmmm =+ is the total scatter of the surface m. 6.2 Transmittance 6.2.1 Specification

42、 to be provided The measurement shall be made in accordance with ISO 15368. The transmittance shall be measured at 3120 C.+The standard thicknesses of the specimens shall be (2 0,1) mm, (5 0,1) mm or (10 0,2) mm. The transmittance shall be represented by a graph, with the wavelength (or wave number)

43、 as the X-axis, and the transmittance as the Y-axis. Uncertainty e.g. standard uncertainty () or expanded uncertainty (k) with k = 2 for the transmittance shall be provided by error bars on the curves, or in a statement in the graph description. The following shall be reported: the thickness of the

44、sample (in the case of multiple curves, with suitable annotation, denoting different thicknesses should be on the same graph); the temperature of the piece during the measurement, with its uncertainty of measurement; the value of the parameters affecting the transmittance (e.g. resistivity for a sem

45、iconductor). Unless otherwise reported, the incident beam is assumed to be normal to the surface and unpolarized. An example is given in Figure 2. BS ISO 11382:2010ISO 11382:2010(E) 6 ISO 2010 All rights reserved0,01001011,00,80,60,40,2YXGermanium, thickness 2 mm, temperature (20 0,5) C Key X wavele

46、ngth, m Y transmittance Figure 2 Example of transmittance 6.2.2 Temperature dependence The transmittance shall be measured over an appropriate range of temperatures, selected in a suitable manner to clearly show any temperature dependence. Graphs of this data shall be presented as described in 6.2.1

47、. The usual temperature range is 40 C to +70 C, but for specific applications, some materials may be used at cryogenic temperatures (50 K or 77 K), or at high temperatures (u 500 C or u 700 C). 6.3 Absorption coefficient 6.3.1 General The internal transmittance, i, is expressed in terms of an absorp

48、tion coefficient, , as calculated by Equation (4): ide= (4) 6.3.2 Specification to be provided (to be consistent with 6.5.2) The values of the absorption coefficient, , shall be reported, along with the uncertainty values, in the form of tables, including the following: wavelength (sampling shall be

49、 sufficient to show any significant spectral structure); temperature; direction of propagation (for anisotropic materials); specific parameters (e.g. resistivity for semiconductors). BS ISO 11382:2010ISO 11382:2010(E) ISO 2010 All rights reserved 76.4 Transmittance uniformity 6.4.1 General Non-uniformity of transmittance may be due to numerous phenomena such as inclusion