1、BSI Standards PublicationBS ISO 13322-1:2014Particle size analysis Image analysis methodsPart 1: Static image analysis methodsBS ISO 13322-1:2014 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of ISO 13322-1:2014. It supersedes BS ISO 13322-1:2005 which is withdrawn.
2、The UK participation in its preparation was entrusted to Technical Committee LBI/37, Particle characterization including sieving.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions
3、 of a contract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standards Limited 2014ISBN 978 0 580 72312 4ICS 19.120Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under
4、the authority of the Standards Policy and Strategy Committee on 31 May 2014.Amendments/corrigenda issued since publicationDate T e x t a f f e c t e dBS ISO 13322-1:2014 ISO 2014Particle size analysis Image analysis methods Part 1: Static image analysis methodsAnalyse granulomtrique Mthodes par anal
5、yse dimages Partie 1: Mthodes par analyse dimages statiquesINTERNATIONAL STANDARDISO13322-1Second edition2014-05-15Reference numberISO 13322-1:2014(E)BS ISO 13322-1:2014ISO 13322-1:2014(E)ii ISO 2014 All rights reservedCOPYRIGHT PROTECTED DOCUMENT ISO 2014All rights reserved. Unless otherwise specif
6、ied, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO
7、s member body in the country of the requester.ISO copyright officeCase postale 56 CH-1211 Geneva 20Tel. + 41 22 749 01 11Fax + 41 22 749 09 47E-mail copyrightiso.orgWeb www.iso.orgPublished in SwitzerlandBS ISO 13322-1:2014ISO 13322-1:2014(E) ISO 2014 All rights reserved iiiContents PageForeword ivI
8、ntroduction v1 Scope . 12 Normative references 13 Terms and definitions and list of symbols . 13.1 Terms and definitions . 13.2 Symbols . 44 Preparation for image capture 54.1 Introduction 54.2 Procedures 55 Sample preparation demands for method description 65.1 Sample splitting and reduction . 65.2
9、 Touching particles 65.3 Particle distribution 65.4 Number of particles to be counted 65.5 Particle suspending fluid 76 Quality of captured images 76.1 General . 76.2 Pixels per particle . 77 Image analysis . 87.1 General . 87.2 Size classes and magnification 88 Counting procedure . 98.1 General . 9
10、8.2 Particle image edges . 98.3 Particles cut by the edge of the measurement frame108.4 Touching particles . 118.5 Measurements 129 Calculation of the particle size results 1210 Calibration and traceability .1210.1 General 1210.2 Recommendations and requirements 1311 Accuracy .1411.1 General 1411.2
11、Reference materials . 1411.3 Instrument preparation . 1411.4 Qualification test 1511.5 Qualification acceptance 1512 Test report 15Annex A (informative) Estimation of the number of particles to be counted for a given accuracy 17Annex B (informative) Common segmentation methods for particle edge dete
12、ction22Annex C (informative) Flow chart showing a typical image analysis method.23Bibliography .24BS ISO 13322-1:2014ISO 13322-1:2014(E)ForewordISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing I
13、nternational Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison
14、 with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directi
15、ves, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some
16、of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarati
17、ons received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about
18、ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary informationThe committee responsible for this document is ISO/TC 24, Particle characterization including sieving, Subcommittee SC 4, Particle characterization.This second edi
19、tion cancels and replaces the first edition (ISO 13322-1:2004), which has been technically revised.ISO 13322 consists of the following parts, under the general title Particle size analysis Image analysis methods: Part 1: Static image analysis methods Part 2: Dynamic image analysis methodsiv ISO 2014
20、 All rights reservedBS ISO 13322-1:2014ISO 13322-1:2014(E)IntroductionThe purpose of this part of ISO 13322 is to give guidance when using images for particle size analysis.Image analysis is a technique that has gained popularity in different applications. The aim of this part of ISO 13322 is to giv
21、e a standardized description of the technique used and its validation. This part of ISO 13322 does not describe specific instruments and is restricted to those parts of the acquisition of images that are relevant to the accuracy of the particle size analysis.This part of ISO 13322 includes methods o
22、f calibration verification and recommends using a certified standard as a reference scale. However it is sensible to make some measurements on particles under study, or other reference objects, of known size so that the likely systematic uncertainties introduced by the equipment can be assessed.Erro
23、rs introduced at all stages of the analysis from sub-division of the sample to generation of the final result add to the total uncertainty of measurements and it is important to obtain estimates for the uncertainty arising from each stage.Essential operations are identified to ensure that measuremen
24、ts made conform to this part of ISO 13322 and are traceable. ISO 2014 All rights reserved vBS ISO 13322-1:2014BS ISO 13322-1:2014Particle size analysis Image analysis methods Part 1: Static image analysis methods1 ScopeThis part of ISO 13322 is applicable to the analysis of images for the purpose of
25、 determining particle size distributions where the velocity of the particles against the axis of the optical system of the imaging device is zero. The particles are appropriately dispersed and fixed in the object plane of the instrument. The field of view may sample the object plane dynamically eith
26、er by moving the sample support or the camera provided this can be accomplished without any motion effects on the image. Captured images can be analysed subsequently.This part of ISO 13322 concentrates upon the analysis of digital images created from either light or electron detection systems. It do
27、es not address the method of creating the image although the detection settings chosen together with its calibration are important to particle sizing accuracy. This part of ISO 13322 considers only image evaluation methods using complete pixel counts.Both the type of distribution, (by number or by v
28、olume) together with the width of the particle size distribution has a very material influence upon the number of particles to be measured to secure the desired accuracy within the specified confidence limits. An example is shown in Annex A.Automation of the analysis is possible in order to measure
29、sufficient particle numbers for a required degree of precision.This part of ISO 13322 does not address the sample preparation. However, the sub sampling, dispersion and presentation of particles to be measured are a vital part of the operational chain of actions necessary to ensure accuracy and prec
30、ision of any final result.NOTE Further details about sampling and sample preparation can be found in ISO 14887 and ISO 14488.2 Normative referencesThe following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references
31、, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.ISO 9276-1, Representation of results of particle size analysis Part 1: Graphical representationISO 9276-2, Representation of results of particle size analysis P
32、art 2: The calculations of average particle sizes/diameters and moments from particle size distributionsISO 14488, Particulate materials Sampling and sample splitting for the determination of particulate properties3 Terms and definitions and list of symbols3.1 Terms and definitionsFor the purposes o
33、f this document, the following terms and definitions apply.INTERNATIONAL STANDARD ISO 13322-1:2014(E) ISO 2014 All rights reserved 1BS ISO 13322-1:2014ISO 13322-1:2014(E)3.1.1area equivalent diameterdiameter of a circle having the same area as the projected image of the particleNote 1 to entry: It i
34、s also known as the Heywood diameter or as the equivalent circular diameter.3.1.2binary imagedigitized image consisting of an array of pixels, each of which has a value of 0 or 1, whose values are normally represented by dark and bright regions on the display screen or by the use of two distinct col
35、ours3.1.3contrast (of an image)difference between the intensity of the particle image with respect to the background near to the particle3.1.4edge detectionmethods used to detect transition between objects and backgroundNote 1 to entry: See segmentation method (3.1.13).3.1.5Feret diameterdistance be
36、tween two parallel tangents on opposite sides of the image of a particle3.1.6field of viewfield which is viewed by the viewing deviceNote 1 to entry: The full image frame of a digital imaging device corresponds to its field of view.SEE: Figure 1.3.1.7grey imageimage in which multiple grey level valu
37、es are permitted for each pixel3.1.8image analysisprocessing and data reduction operation which yields a numerical or logical result from an image3.1.9measurement fieldfield which is composed by the set of all measurement framesSEE: Figure 1.3.1.10measurement frameselected area from the field of vie
38、w in which particles are sized and counted for image analysisSEE: Figure 1.3.1.11pixelpicture elementindividual sample in a digital image that has been formed by uniform sampling in both the horizontal and vertical directions2 ISO 2014 All rights reservedBS ISO 13322-1:2014ISO 13322-1:2014(E)3.1.12r
39、aster patternscanning order of measurement frames in the total measurement fieldSEE: Figure 1.3.1.13segmentation methodstrategy employed to separate the objects of interest from their surroundingsNote 1 to entry: Method of dividing the particle image from the background.Note 2 to entry: See edge det
40、ection (3.1.4).3.1.14thresholdgrey level value which is set to discriminate objects of interest from backgroundKey1 measurement frame2 field of view3 raster pattern of measurement frames4 measurement fieldX enlarged view of a field of viewFigure 1 Relationship between the terms “field of view”, “mea
41、surement frame”, “raster pattern” and “measurement field” ISO 2014 All rights reserved 3BS ISO 13322-1:2014ISO 13322-1:2014(E)3.2 SymbolsAiprojected area of particle i1horizontal calibration factor2vertical calibration factord minimum feature lengthdcdiameter of a circleN number of particles to be m
42、easuredncmeasured number of pixels within a circlenjnumbers of particles in size interval xjPiprobability that particle i exists in the measuring frame (also called Miles-Lantujoul factor)ishape descriptor standard deviationVivolume of particle ixA,iarea equivalent diameter of particle ixF1horizonta
43、l Feret diameter of objectxF2vertical Feret diameter of objectxidimension of particle ixFmax,ilongest dimension of particle i, also called maximum Feret diameterxFmin,ishortest dimension of particle i, also called minimum Feret diameterx1horizontal dimension of objectx1,mhorizontal dimension of obje
44、ct in SI unitx1,phorizontal dimension of object in pixelx2vertical dimension of objectx2,mvertical dimension of object in SI unitx2,pvertical dimension of object in pixelx10,3particle size corresponding to 10 % of the cumulative undersize distribution by volumex90,3particle size corresponding to 90
45、% of the cumulative undersize distribution by volumeZ1horizontal side length of the rectangular measurement frameZ2vertical side length of the rectangular measurement frame4 ISO 2014 All rights reservedBS ISO 13322-1:2014ISO 13322-1:2014(E)4 Preparation for image capture4.1 IntroductionA pre-requisi
46、te for accurate particle size measurement using this method requires a full understanding of the settings and calibration applied within the image capture device as well as a consideration of the purpose for conducting the measurement.The final settings and calibration of the image capture device ne
47、ed to be established via an iterative approach. The size range of the particles within an unknown test sample has an influence upon the settings required within the image capturing device. These remain unknown until the first image has been taken, the result observed and the necessary adjustments to
48、 the image capture device to achieve the desired accuracy of particle size measurement required. A fully trained operator shall conduct the assessment.The imaging instrument should be set up and operated in accordance with the manufacturers recommendations considering the conditions prevailing.In or
49、der to achieve accurate particle size measurements it is preferred that the illumination be uniform over the total field of view and of a type designed to create images of high contrast. The magnification should be such as to provide a minimum number of pixels for the smallest particle consistent with the accuracy demanded and set to achieve a sharp focus. The number of pixels for the smallest dimension of a particle is relevant for cases where linear dimensions or combinations thereof are measured.Distortion in the image m
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