1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationBS ISO 7637-2:2011Road vehicles Electricaldisturbances from conductionand couplingPart 2: Electrical transient conduction alongsupply lines onlyBS ISO 7637-2:2011 BRITISH STANDAR
2、DNational forewordThis British Standard is the UK implementation of ISO 7637-2:2011.The UK participation in its preparation was entrusted to TechnicalCommittee AUE/16, Electrical and electronic equipment.A list of organizations represented on this committee can beobtained on request to its secretary
3、.This publication does not purport to include all the necessaryprovisions of a contract. Users are responsible for its correctapplication. BSI 2011ISBN 978 0 580 61196 4ICS 33.100.10; 43.040.10; 43.080.01Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Sta
4、ndard was published under the authority of theStandards Policy and Strategy Committee on 31 March 2011.Amendments issued since publicationDate Text affectedBS ISO 7637-2:2011Reference numberISO 7637-2:2011(E)ISO 2011INTERNATIONAL STANDARD ISO7637-2Third edition2011-03-01Road vehicles Electrical dist
5、urbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only Vhicules routiers Perturbations lectriques par conduction et par couplage Partie 2: Perturbations lectriques transitoires par conduction uniquement le long des lignes dalimentation BS ISO 7637-2:201
6、1ISO 7637-2:2011(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In dow
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9、 given below. COPYRIGHT PROTECTED DOCUMENT ISO 2011 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at
10、 the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2011 All rights reservedBS ISO 7637-2:2011ISO 7637-2:201
11、1(E) ISO 2011 All rights reserved iiiContents Page Foreword iv 1 Scope1 2 Normative references1 3 Terms and definitions .1 4 Test procedure.1 4.1 General .1 4.2 Test temperature and supply voltages2 4.3 Voltage transient emissions test .2 4.4 Transient immunity test6 5 Test instrument description an
12、d specifications 9 5.1 Artificial network .9 5.2 Shunt resistor Rs10 5.3 Switch S10 5.4 Power supply .11 5.5 Measurement instrumentation .12 5.6 Test pulse generator for immunity testing .12 Annex A (informative) Example of test pulse severity levels associated with function performance status class
13、ification 17 Annex B (normative) Transient emissions evaluation Voltage waveform .19 Annex C (normative) Test pulse generator verification procedure .23 Annex D (informative) Determination of pulse generator energy capability 26 Annex E (informative) Origin of transients in the electric system of ro
14、ad vehicles 30 Annex F (informative) Alternative transient testing technique using electromechanically switched inductive loads 33 Bibliography43 BS ISO 7637-2:2011ISO 7637-2:2011(E) iv ISO 2011 All rights reservedForeword ISO (the International Organization for Standardization) is a worldwide feder
15、ation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that commit
16、tee. International organizations, governmental and non-governmental, in liaison with ISO, also take Part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordanc
17、e with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires a
18、pproval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 7637-2 was prepared by Technical Co
19、mmittee ISO/TC 22, Road vehicles, Subcommittee SC 3, Electrical and electronic equipment. This third edition cancels and replaces the second edition (ISO 7637-2:2004), which has been technically revised. It also incorporates the Amendment ISO 7637-2:2004/Amd.1:2008. It does not specify test pulses 4
20、, 5a, and 5b, which are now specified in ISO 16750-2 and ISO 21848. ISO 7637 consists of the following parts, under the general title Road vehicles Electrical disturbances from conduction and coupling: Part 1: Definitions and general considerations Part 2: Electrical transient conduction along suppl
21、y lines only Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines BS ISO 7637-2:2011INTERNATIONAL STANDARD ISO 7637-2:2011(E) ISO 2011 All rights reserved 1Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrica
22、l transient conduction along supply lines only 1 Scope This part of ISO 7637 specifies test methods and procedures to ensure the compatibility to conducted electrical transients of equipment installed on passenger cars and commercial vehicles fitted with 12 V or 24 V electrical systems. It describes
23、 bench tests for both the injection and measurement of transients. It is applicable to all types of road vehicles independent of the propulsion system (e.g. spark ignition or diesel engine, electric motor). Function performance status classification for immunity to transients is given in Annex A. 2
24、Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 7637-1, Road vehicles El
25、ectrical disturbances from conduction and coupling Part 1: Definitions and general considerations 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 7637-1 apply. 4 Test procedure 4.1 General Methods for measuring the transient emission on supply lines
26、and test methods for the immunity of devices against such transients are given. These tests, called “bench tests”, are performed in the laboratory. The bench test methods, some of which require the use of the artificial network, will provide comparable results between laboratories. A bench test meth
27、od for the evaluation of the immunity of a device against supply line transients may be performed by means of a test pulse generator. This may not cover all types of transients which can occur in a vehicle; therefore, the test pulses described in 5.6 are characteristic of typical pulses. In special
28、cases, it may be necessary to apply additional test pulses. However, some test pulses may be omitted if a device, depending on its function or its connection, is not influenced by comparable transients in the vehicle. It is part of the vehicle manufacturers responsibility to define the test pulses r
29、equired for a specific device. BS ISO 7637-2:2011ISO 7637-2:2011(E) 2 ISO 2011 All rights reserved4.2 Test temperature and supply voltages The ambient temperature during the test shall be (23 5) C. The supply voltages shall be as shown in Table 1 unless other values are agreed upon by the users of t
30、his part of ISO 7637, in which case such values shall be documented in the test reports. UAis the supply voltage defined in Table 1, which shall be measured at the output of the pulse generator. Table 1 Supply voltages Supply voltage Nominal 12 V system V Nominal 24 V system V UA13,5 0,5 27 1 4.3 Vo
31、ltage transient emissions test 4.3.1 General This clause defines a test procedure to evaluate automotive electrical and electronic components for conducted emissions of transients along battery fed or switched supply lines of a device under test (DUT). A DUT which is considered a potential source of
32、 conducted disturbances should be tested according to the procedure described in this clause. Care shall be taken to ensure that the surrounding electromagnetic environment does not interfere with the measurement set-up. The test method applies to DUT with or without internal mechanical or electroni
33、c switch driving inductive loads. Voltage transients from the disturbance source, the DUT, are measured using the artificial network to standardize the impedance loading on the DUT (see 5.1). All wiring connections between the artificial network, switch, and the DUT shall be spaced (50 5) mm above t
34、he metal ground plane. The cable sizes shall be chosen in accordance with the real situation in the vehicle, i.e. the wiring shall be capable of handling the operating current of the DUT, and as agreed between vehicle manufacturer and supplier. Grounding of the DUT case to the ground plane shall ref
35、lect the vehicle installation and shall be defined in a test plan. If no requirements are specified in the test plan, then the DUT shall be placed on a non-conductive material (50 5) mm above the ground plane. The supply voltage UAand the disturbance voltage shall be measured (see 4.3.2 and 4.3.3 fo
36、r measurement guidance) using a voltage probe (see 5.5) and an oscilloscope or waveform acquisition equipment. For values, see Annex B. DUT operating conditions of particular interest in the measurements are the switch-off and the exercising of the various operating modes of the DUT. Exact operating
37、 conditions of the DUT shall be specified in the test plan. NOTE Measurements at turn-on can be of interest in some instances. BS ISO 7637-2:2011ISO 7637-2:2011(E) ISO 2011 All rights reserved 3The sampling rate and trigger level shall be selected to capture a waveform displaying the complete durati
38、on of the transient, and with sufficient resolution to display the highest positive and negative portions of the transient. Utilising the proper sampling rate and trigger level, the voltage amplitude shall be recorded by actuating the DUT according to the test plan. Other transient parameters, such
39、as rise time, fall time, transient duration, etc. may also be recorded. Unless otherwise specified, ten waveform acquisitions are necessary. It is necessary to report only the waveforms with the highest positive and negative amplitude (with their associated parameters). The measured transient shall
40、be evaluated in accordance with Annex B. All pertinent information and test results shall be reported. If required per test plan, include transient evaluation results with respect to the performance objective as specified in the test plan. The test applies to an inductive load (such as power window,
41、 power seat, relay, electric mirror, etc.) with a large inductance or a high load current, which connects to the vehicle power supply, or a DUT which switches such an inductive load. If an inductive load has a small inductance or a low load current and is driven by an internal regulated voltage (e.g
42、. 5 V), which is isolated from the vehicle power supply, the test is not applicable unless specified in a test plan. 4.3.2 Test set-up for slow pulses The test set-up is described in Figure 1 a). The disturbance source is connected via the artificial network to the shunt resistor Rs(see 5.2), the sw
43、itch S (see 5.3) and the power supply (see 5.4). The switch S represents the main switch (e.g. ignition switch, relay, etc.) which supplies the DUT and could be located at several metres from the DUT. In the case of a DUT having an internal mechanic and/or electronic switch driving inductive load, t
44、he test set-up described in Figure 1 a) is applicable with the DUT internal switch closed (DUT inductive loads powered when opening switch S). Depending on the DUT internal switch type (relay, electronic switches, IGBT, etc.) it may not be possible to ensure a controlled closure of the internal swit
45、ch. The detail state of the internal switch(es) shall be recorded in the test report. Transients generated by the supply disconnection of the DUT are measured at the moment of opening the switch S (the switch S is operated in order to generate transient disturbance). BS ISO 7637-2:2011ISO 7637-2:201
46、1(E) 4 ISO 2011 All rights reservedDimensions in millimetres Drawing not to scale a) Transient emission test set-up to measure slow pulses (ms-range or slower) Figure 1 Transient emission test set-up to measure pulses (continued) 4.3.3 Test set-up for fast pulses The test set-up is described in Figu
47、re 1 b) for DUT without internal switch. The disturbance source is connected via the artificial network to the shunt resistor Rs(see 5.2), the switch S (see 5.3) and the power supply (see 5.4). Transients generated by the supply disconnection of the DUT are measured at the moment of opening the swit
48、ch S (the switch S is operated in order to generate transient disturbance). BS ISO 7637-2:2011ISO 7637-2:2011(E) ISO 2011 All rights reserved 5Dimensions in millimetres Drawing not to scale b) Transient emission test set-up to measure fast pulses (ns to s range) for DUT without internal switch Figur
49、e 1 Transient emission test set-up to measure pulses (continued) The test set-up is described in Figure 1 c) for DUT with internal switch. The disturbance source is connected via the artificial network to the shunt resistor Rs(see 5.2) and the power supply (see 5.4). In this case the internal switch shall be operated in order to generate transient disturbance (there is no need for the switch S). Transients generated by the supply disconnection of the DUT are measured at the moment of opening the int
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