BS PD IEC TR 61000-4-38-2015 Electromagnetic compatibility (EMC) Testing and measurement techniques Test verification and calibration protocol for voltage fluctuation and flicker c.pdf

1、BSI Standards PublicationElectromagnetic compatibility (EMC)Part 4-38: Testing and measurement techniques Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systemsPD IEC/TR 61000-4-38:2015National forewordThis Published Document is the UK implementation

2、of IEC/TR 61000-4-38:2015.The UK participation in its preparation was entrusted by TechnicalCommittee GEL/210, EMC - Policy committee, to Subcommittee GEL/210/11,EMC product standards.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication do

3、es not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 77605 2ICS 33.100.20Compliance with a British Standard cannot confer immunity fromlegal

4、 obligations.This Published Document was published under the authority of theStandards Policy and Strategy Committee on 30 September 2015.Amendments/corrigenda issued since publicationDate Text affectedPUBLISHED DOCUMENTPD IEC/TR 61000-4-38:2015IEC TR 61000-4-38 Edition 1.0 2015-08 TECHNICAL REPORTE

5、lectromagnetic compatibility (EMC) Part 4-38: Testing and measurement techniques Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systemsINTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 33.100.20 ISBN 978-2-8322-2870-8 BASIC EMC PUBLICATION Registered trad

6、emark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colourinsidePD IEC/TR 61000-4-38:2015 2 IEC TR 61000-4-38:2015 IEC 2015 CONTENTS FOREW ORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references . 7 3 Terms an

7、d definitions. 84 General . 8 5 Objectives of flicker and voltage fluctuations test protocols 8 6 Manufacturer s or owner s information required 9 7 Performance criteria 9 8 General test guidelines 11 8.1 General . 11 8.2 Essential information . 11 9 Test equipment and accuracy . 12 10 Detailed test

8、 procedures 13 10.1 Procedures common to all tests . 13 10.2 Test no. 1 Simple power source qualification test 14 10.2.1 Rationale . 14 10.2.2 Test procedure . 14 10.3 Test no. 2 Verification of the Zrefand/ or Ztestimpedance . 15 10.3.1 Rationale . 15 10.3.2 Test procedure . 15 10.4 Tests no. 3 to

9、6 Low frequency rectangular modulation rates of 1 CPM to 39 CPM . 16 10.4.1 Rationale . 16 10.4.2 Test procedure . 16 10.5 Tests no. 7 to 9 High frequency rectangular modulation rates of 110 CPM and up 17 10.5.1 Rationale . 17 10.5.2 Test procedure . 17 10.5.3 Uncertainties of this protocol, and met

10、hods to verify modulation accuracy 18 Annex A (normative) Requirements for external test equipment to verify modulation accuracy . 20 Annex B (informative) Example test setup for modulation load unit . 21 Annex C (informative) Some typical flicker test system integration issues to avoid 22 Bibliogra

11、phy 25 Figure 1 Illustration showing a rectangular 8 A current modulation pattern at 7 CPM 15 Figure 2 Illustration showing the method to determine the inductance of Zrefor Ztest16 Figure 3 Illustration showing a rectangular modulation pattern at 3,166 7 Hz . 17 Figure 4 Illustration showing a recta

12、ngular modulation pattern at 1 052 CPM. 18 Figure B.1 Typical test setup for tests 1 to 9 . 21 Figure C.1 Single phase arrangement with excessive or near “ zero” impedance 22 Figure C.2 Single phase arrangement with sense lines present . 23 PD IEC/TR 61000-4-38:2015IEC TR 61000-4-38:2015 IEC 2015 3

13、Figure C.3 Single phase arrangement with connecting lines to power analyzer 23 Figure C.4 Neutral impedance bypassed externally . 24 Table 1 Calibration points from IEC 61000-4-15:2010, Table 5 10 Table 2 Summary of tests to verify/ calibrate flicker test systems . 11 PD IEC/TR 61000-4-38:2015 4 IEC

14、 TR 61000-4-38:2015 IEC 2015 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ _ _ _ _ _ _ _ _ _ _ _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-38: Testing and measurement techniques Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems FOREW ORD 1) The In

15、ternational Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and el

16、ectronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “ IEC Publication(s)” ). Their preparation is entrusted to technical comm

17、ittees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization fo

18、r Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee

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21、onal publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in

22、 some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agen

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24、or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some o

25、f the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees is to prepare International Standards. However, a technical committee may propose the publication of

26、a technical report when it has collected data of a different kind from that which is normally published as an International Standard, for example “ state of the art“ . IEC 61000-4-38, which is a technical report, has been prepared by subcommittee 77A: EMC Low frequency phenomena, of IEC technical co

27、mmittee 77: Electromagnetic compatibility. It forms Part 4-38 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. PD IEC/TR 61000-4-38:2015IEC TR 61000-4-38:2015 IEC 2015 5 The text of this technical report is based on the following documents: Enquiry draft R

28、eport on voting 77A/ 881/ DTR 77A/ 898/ RVC Full information on the voting for the approval of this technical report can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/ IEC Directives, Part 2. A list of all parts in the IEC

29、 61000 series, published under the general title Electromagnetic compatibility (EMC), can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “ http:/ / webstore.iec.ch“ in the

30、data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover page of this publication indicates t

31、hat it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer.PD IEC/TR 61000-4-38:2015 6 IEC TR 61000-4-38:2015 IEC 2015 INTRODUCTION Flicker measurement systems are used to measure voltage

32、fluctuations from equipment that is tested in accordance with IEC 61000-3-3 and/ or IEC 61000-3-11 standards. The IEC adopted measurement and evaluation techniques that are specified in IEC 61000-4-15, but limits, limit comparisons, certain exclusions, and test conditions for a variety of products a

33、re specified in IEC 61000-3-3 (for 16 A/ phase and below) and IEC 61000-3-11 (up to 75 A/ phase). This TR specifies recommended methods and acceptability criteria for performance verification of test systems designed to measure voltage fluctuations and flicker in accordance with IEC 61000-3-3 and IE

34、C 61000-3-11. A typical IEC 61000-3-3 and IEC 61000-3-11 compliance test system includes not only the flicker meter, but also a suitable power source and a test impedance. The reference impedance, per IEC TR 60725, is used for IEC 61000-3-3 tests, while the Ztestas specified in IEC 61000-3-11 is use

35、d for higher power products. This TR therefore also includes a method to verify that the impedance, according to IEC TR 60725 or the Ztestspecification, is within reasonable tolerances and that the power source does not contribute more to the measured flicker levels as is permitted in IEC 61000-3-3

36、and IEC 61000-311. This protocol is neither intended as a type test nor as an exhaustive test of all required flicker meter capabilities according to IEC 61000-4-15. The primary objective is to verify, on a periodic basis, that the flicker test system, consisting of a previously type tested analyzer

37、, a suitable power source and impedance unit, performs correctly, and that the system performance is not adversely affected by the system integration or by deterioration of one of the system components. For example this TR can be one of the methods to achieve accreditation of a test laboratory or fa

38、cility. NOTE To characterize individual system components, both digital volt meters 1 and 2 (DVM-1 and DVM-2) in Figure B.1 are needed, and care is taken that DVM-2 measures the exact same voltage point that the flicker meter uses as its input. For previously calibrated systems undergoing a periodic

39、 verification, the measurement of current will generally suffice and the use of DVM-2 is not mandatory. The purpose of the flicker test system is to evaluate voltage fluctuations that may be caused by the tested equipment when this equipment will be connected to the public electricity supply. The fl

40、icker test system may have automatic limit evaluation software or firmware, data storage, additional analysis capabilities, and report generation capabilities that facilitate the process of certifying the tested products according to IEC 61000-3-3 and/ or IEC 61000-3-11. The primary purpose of the t

41、est, verification, and calibration protocol in this technical report is to establish methods that may be used to verify that a given flicker test system measures and evaluates common voltage fluctuations in accordance with the standards and thus allows the user to perform a correct pass/ fail analys

42、is of the tested product. Additional capabilities, such as the data storage, reporting, or analysis functions of the analyzer or test system may also be tested using some of the tests described in this protocol. The methodology used in this protocol consists of applying a known load to the flicker t

43、est system. This known load is modulated on/ off, simulating an electrical product with varying power demand, which in turn causes voltage fluctuations. Thus, not only is the flicker meter tested, but also the power source that has to accommodate the varying power level and the reference impedance o

44、r the Ztestas specified in IEC 61000-3-3 or IEC 61000-3-11 is tested. The tests as summarized in Table 2 and Clause 10 may also be used to calibrate or adjust the flicker test system, including adjustments to the test impedance and/ or power source. This calibration can be done by means of comparing

45、 the generated voltage fluctuations, verified by using external reference equipment if so required, with the values reported by the system. This calibration includes the response of the power source and the impedance that are part of the test system. PD IEC/TR 61000-4-38:2015IEC TR 61000-4-38:2015 I

46、EC 2015 7 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-38: Testing and measurement techniques Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems 1 Scope This part of IEC 61000, which is a Technical Report, defines a test protocol for flicker test sy

47、stems designed to perform compliance tests in accordance with IEC 61000-3-3 and IEC 61000-3-11. It is intended to provide test system manufacturers and testing laboratories with systematic methods to determine if the flicker test system meets the IEC design specifications for a wide range of voltage

48、 fluctuations and fluctuation frequencies, as specified in IEC 61000-4-15:2010, Table 5, that have been observed in product testing. This protocol is intended to be compatible with related standards, in particular with any requirements set forth by listing organizations or measurement standards of t

49、he IEC. Meeting the criteria defined herein should not be construed as a waiver of any other relevant performance or safety requirements. The main purpose of this technical report is to provide guidance and methods for periodic calibration and verification of systems consisting of previously type tested equipment. For complete flicker test systems that exhibit deviations of less than 5 % from the specifications of this protocol, it can be assumed that individual components are performi