BS QC 300202-1985 Specification for harmonized system of quality assessment for electronic components - Fixed capacitors for use in electronic equipment - Blank detail specificatio.pdf

1、BRITISH STANDARD CONFIRMED JUNE 1999 BS QC 300202:1985 IEC 384-15-2: 1984 QC 300202 Incorporating Amendment No. 1 Specification for Harmonized system ofquality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification: Fixed tantalum capacitors

2、with non-solid electrolyte and porous anode Assessment level EBSQC 300202:1985 BSI 04-2000 ISBN 0 580 34755 9 Amendments issued since publication Amd. No. Date of issue Comments 5946 September 1988 Indicated by a sideline in the marginBSQC 300202:1985 BSI 04-2000 i Contents Page National foreword ii

3、 Introduction 1 Section 1. General data 1.1 Recommended method(s) of mounting 3 1.2 Dimensions 3 1.3 Ratings and characteristics 3 1.4 Related documents 4 1.5 Marking 4 1.6 Ordering information 4 1.7 Certified records of released lots 5 1.8 Additional information 5 1.9 Additional or increased severi

4、ties or requirements to those specified in the generic and/or sectional specification 5 Section 2. Inspection requirements 2.1 Procedures 6 Table I 3 Table IIA Values of capacitance and of voltage related to case sizes 3 Table IIB Characteristics at high and low temperature 4 Table IIC Impedance at.

5、 . . kHz (if applicable) 4 Table III Other characteristics 5 Table IV 6BSQC 300202:1985 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication384-15-2: “Fixed cap

6、acitors for use in electronic equipment. Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E” published by the International Electrotechnical Commission (IEC). Terminology and conventions. The text of the International Standard has be

7、en approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard which implements IEC Publications QC001001:1986 and QC001002:1986 is BS9000: “Gener

8、al requirements for a system for electronic components of assessed quality”: Part 3:1987 “Specification for national implementation of the IECQ basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandator

9、y requirements in accordance with BSQC300200. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS9000 the latter shall take precedence except that the front page layout will be in accordance with PD9004:1986 BS9000, CECC and I

10、ECQ UK administrative guide Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal ob

11、ligations. International Standard Corresponding British Standard IEC 384-1:1982 (QC 300000:1982) BS QC 300000:1983 Fixed capacitors for use in electronic equipment. Generic specification (Identical) IEC 384-15:1982 (QC 300200:1982) BS QC 300200:1983. Sectional specification: Fixed tantalum capacitor

12、s with non-solid or solid electrolyte (Identical) IEC 410:1973 BS 6001: Sampling procedures for inspection by attributes: Part 1:1972 Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection (Technically equivalent) Summary of pages This document comprises

13、 a front cover, an inside front cover, pagesiandii, pages1to12 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.BSQC 300202:1985 BSI 04-2000 1 Introduction Blank det

14、ail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accorda

15、nce with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause 1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inse

16、rted in the position indicated. Identification of the detail specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of i

17、ssue and any further information required by the national system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short description of the type of capacitor. 6 Information on typical c

18、onstruction (when applicable). NOTEWhen the capacitor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the nation

19、al or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the section

20、al specification, Sub-clause 3.5.4. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor typ

21、es.BSQC 300202:1985 2 BSI 04-2000 1 IEC 384-15-2-XXX QC 300202-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 384-15-2 QC 300202 4 3 FIXED TANTALUM CAPACITORS WITH NON-SOLID ELECTROLYTE AND POROUS ANODE WITH LEAD OR TAG TERMINATIONS (Sub-family 2) 5 Outline drawing: (see Tab

22、le I) (. angle projection) 7 Typical construction: 6 Assessment level(s): E 8 (Other shapes are permitted within thedimensionsgiven) Performance grade: Information on the availability of components qualified to this detailspecification is given in the Qualified Products List. 9BSQC 300202:1985 BSI 0

23、4-2000 3 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publication384-15) 1.2 Dimensions Table I 1.3 Ratings and characteristics Table IIA Values of capacitance and of voltage related to case sizes Case size reference Dimensions (in milli

24、metres or inches and millimetres) L H d . NOTE 1When there is no case size reference, Table I may be omitted and the dimensions shall be given in Table IIA, which then becomes Table I. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. NOTE 3Other pr

25、esentations of the above information may be necessary, but the above presentation should be followed as much as possible. Capacitance range (see Table IIA) Tolerance on rated capacitance Rated voltage (see Table IIA) Category voltage (if applicable) (see Table IIA) Climatic category Rated temperatur

26、e Variation of capacitance with temperature (see Table IIB) Tangent of loss angle (see Table IIB) Leakage current (see Table IIB) Impedance (if applicable) (see Table IIC) Reverse voltage (if required) Rated voltage Category voltage a Case size Case size Case size Case size Rated capacitance (in 4F)

27、 a If different from the rated voltage.BSQC 300202:1985 4 BSI 04-2000 Table IIB Characteristics at high and low temperature Table IIC Impedance at. kHz (if applicable) 1.4 Related documents 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of IECPu

28、blication384-15, Sub-clause1.6. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: a)

29、 Rated capacitance. b) Tolerance on rated capacitance. c) Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. U R C R Capacitance change Maximum values Tan Impedance (100/120 Hz) Leakage current (%) (%) (7) (4A) (V) (4F) A R B A b 20 C B b A 20 C R B a

30、A B R = Lower category temperature = Upper category temperature = Rated temperature a Measured with category voltage b If applicable Case size Impedance (7) 1 2 3 4 Generic specification: IEC Publication 384-1 (1982): Fixed Capacitors for Use in Electronic Equipment. Part 1: Generic specification. S

31、ectional specification: IEC Publication 384-15 (1982): Part 15: Sectional Specification: Fixed Tantalum Capacitors with Non-solid or Solid Electrolyte.BSQC 300202:1985 BSI 04-2000 5 1.7 Certified records of released lots Required/not required. 1.8 Additional information (not for inspection purposes)

32、 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table III Other characteristics This table is to be used for defining characteristics which are ad

33、ditional to or more severe than those given in the sectional specification.BSQC 300202:1985 6 BSI 04-2000 Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedures shall be in accordance with the Sectional Specification, IEC Publication 384-15, Sub-clause 3.4

34、. 2.1.2 For Quality Conformance Inspection, the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.5.1 of the Sectional Specification. Table IV NOTE 1Sub-clause numbers of tests and performance requirement

35、s refer to the Sectional Specification, IEC Publication 384-15 and Section One of this specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c

36、 = acceptance criterion (permitted number of defectives) D = destructive ND = non-destructive IL = inspection level AQL = acceptable quality level IEC Publication 410 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Not

37、e 2) Group A inspection (lot-by-lot) Sub-group A1 ND S-4 2.5% 4.1 Visual examination As in 4.1 Legible marking and as specified in 1.5 of this specification 4.1 Dimensions (gauging) As specified in Table I of this specification Sub-group A2 ND II 1.0% 4.2.1 Leakage current Protective resistance: u.

38、4A, . . . 7 see Table IIB 4.2.2 Capacitance Frequency:. Hz Within specified tolerance Bias voltage:. V 4.2.3 Tangent of loss angle Frequency:. Hz u., see Table IIB 4.2.4 Impedance (if applicable) Frequency:. kHz u. 7, see Table IICBSQC 300202:1985 BSI 04-2000 7 Table IV Sub-clause number and Test (s

39、ee Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Note 2) Group B inspection (lot-by-lot) Sub-group B1 D S-3 2.5% 4.5 Solderability Without ageing Method:. Good tinning as evidenced by free flowing of the solder with wetting of the terminations or s

40、older shall flow within. s, as applicable Sub-group B2 ND S-3 2.5% 4.15 Characteristics at high and low temperature (if required) The capacitors shall be measured at each temperature step Step 1: 20 C For use as reference value Leakage current Capacitance Tangent of loss angle Impedance a(at same fr

41、equency as Step 2) Step 2: Lower category temperature Capacitance u.% b Tangent of loss angle a u. b Impedance a u.7 b Step 3: Rated temperature Leakage current u. 4A b Capacitance u.% b Tangent of loss angle a u. b Step 4: Upper category temperature Leakage current u. 4A b Capacitance u.% b Tangent

42、 of loss angle a u. b a If applicable. b See Table IIB. %C C - %C C - %C C -BSQC 300202:1985 8 BSI 04-2000 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Grou

43、p C inspection (periodic) Sub-group C1A D 6 9 1 Part of sample of Sub-group C1 4.3.1 Initial measurement Capacitance 4.3 Robustness of terminations Visual examination No visible damage and no leakage of electrolyte 4.4 Resistance to soldering heat Method:. 4.4.2 Final measurements Visual examination

44、 No visible damage and no leakage of electrolyte Legible marking Sub-group C1B D 6 18 1 Other part of sample of Sub-group C1 4.6.1 Initial measurement Capacitance 4.6 Rapid change of temperature A = Lower category temperature B = Upper category temperature Five cycles Duration t = 30 min Recovery: 1

45、6 h 4.6.3 Final measurements Leakage current u. 4A, see Table IIB Capacitance u.% of value measured in 4.6.1 Tangent of loss angle u. see Table IIB 4.7 Vibration Method of mounting: see1.1 of this specification Procedure B4 Frequency range: . Hz to. Hz Amplitude:. mm or acceleration:. m/s 2 (whichev

46、er is the less severe) Duration:. h 4.7.2 Final inspection Visual examination No visible damage and no leakage of electrolyte %C C -BSQC 300202:1985 BSI 04-2000 9 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see

47、Note 3) Performance requirements (see Note 1) p n c 4.8 Bump (or shock, see4.9) Method of mounting: see 1.1 of this specification Number of bumps:. Acceleration: 390 m/s 2 Duration of pulse: 6 ms 4.9 Shock (or bump, see4.8) Method of mounting: see 1.1 of this specification Acceleration: . . . m/s 2

48、Duration of pulse:. ms 4.8.2 or 4.9.2 Final measurements Visual examination No visible damage and no leakage of electrolyte Sub-group C1 D 6 27 1 Combined sample of specimens of Sub-groups C1A and C1B 4.10 Climatic sequence 4.10.1 Initial measurement Capacitance 4.10.2 Dry heat Temperature: upper ca

49、tegory temperature Duration: 16 h Visual examination No visible damage and no leakage of electrolyte 4.10.3 Damp heat, cyclic, Test Db, first cycle 4.10.4 Cold Temperature: lower category temperature Duration: 2 h Visual examination No visible damage and no leakage of electrolyte 4.10.5 Low air pressure (if required by the detail specification) Air pressure: 8.5 kPa (85mbar) 4.10.5.3 Intermediate measurement Visual examination No