BS QC 790304-1994 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - L.pdf

1、BRITISH STANDARD BS QC790304: 1994 IEC748-4-2: 1993 Specification for Harmonized system of quality assessment for electronic components Semiconductor devices Integratedcircuits Blank detail specification Linear analogue-to-digital converters (ADC)BSQC 790304:1994 BSI10-1999 ISBN 0580356191 Amendment

2、s issued since publication Amd. No. Date CommentsBSQC790304:1994 BSI 10-1999 i Contents Page National foreword ii Introduction 1 1 Marking and ordering information 2 2 Application related description 3 3 Specification of the function 3 4 Limiting values 3 5 Operating conditions 4 6 Electrical charac

3、teristics 4 7 Programming 8 8 Mechanical and environmental ratings, characteristics and data 8 9 Additional information 8 10 Screening 8 11 Quality assessment procedures 8 12 Structural similarity procedures 8 13 Test conditions and inspection requirements 8 14 Additional measurement method 16 Figur

4、e 1 Typical diagram with inputs and outputs connections 6BSQC790304:1994 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee, ECL/-. It is identical with IEC Publication IEC748-4-2:1993 (QC790304) Semico

5、nductor devices Integrated circuits Part4: Interface integrated circuits Section2: Blank detail specification for linear analogue-to-digital converters (ADC) published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ system of quality assessmen

6、t for electronic components. This blank detail specification is one of a series of blank detail specifications for semiconductor devices to be used with BS QC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and integrated circu

7、its and BS QC790100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Cross-references International Standard a Corresponding British Standard IEC68-2-17 BS2011 Envir

8、onmental testing Part2.1Q:1981 Test Q. Sealing (Identical) IEC747-1 BS6493 Semiconductor devices Part1 Discrete devices Section1.1:1984 General (Identical) IEC747-10 BS QC700000:1991 Harmonized system of quality assessment for electronic components. Generic specification for discrete devices and int

9、egrated circuits (Identical) BS6493 Semiconductor devices Part2. Integrated circuits IEC748-1 Section2.1:1985 General (Identical) IEC748-4 Section2.4:1989 Recommendations for interface integrated circuits (Identical) IEC748-11 BS QC790100:1991 Harmonized system of quality assessment for electronic c

10、omponents. Semiconductor devices. Sectional specification for semiconductor integrated circuits excluding hybrid circuits (Identical) IEC749 BS6493 Semiconductor devices Part3:1985 Mechanical and climatic test methods (Identical) QC001002 BS QC001002:1991 Rules of Procedure of the IEC Quality Assess

11、ment System for Electronic Components (IECQ) (Identical) a Undated in the text.BSQC790304:1994 BSI 10-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a Britis

12、h Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pagesi toiv, pages1to16 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be in

13、dicated in the amendment table on the inside front cover.iv blankBSQC790304:1994 BSI 10-1999 1 Introduction The IEC Quality Assessment System for Electronic Components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define qu

14、ality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specifi

15、cation is one of a series of blank detail specifications for semiconductor devices and shall be used with the following IEC Publications: 747-10/QC700000, Semiconductor devices Discrete devices and integrated circuits Part10: Generic specification for discrete devices and integrated circuits. 748-11

16、/QC790100, Semiconductor devices Integrated circuits Part11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Required information Numbers shown in brackets on this and the following pages correspond to the following items of required information, which should

17、 be entered in the spaces provided. Identification of the detail specification 1 The name of the National Standards Organization under whose authority the detail specification is issued. 2 The IECQ number of the detail specification. 3 The numbers and issue numbers of the generic and sectional speci

18、fications. 4 The national number of the detail specification, date of issue and any further information, if required by the national system. Identification of the component 5 Main function and type number. 6 Information on typical construction (materials, the main technology) and the package. If the

19、 device has several kinds of derivative products, those differences should be indicated, e.g.features of the characteristics in the comparison table. If the device is electrostatic sensitive, a caution statement shall be added in the detail specification. 7 Outline drawing, terminal identification,

20、marking and/or reference to the relevant document for outlines. 8 Category of assessed quality according to 2.6 of the generic specification. 9 Reference data. Throughout this standard, the texts given in square brackets are intended for guidance to the specification writer and shall not be included

21、 in the detail specification. When confusion may arise as to whether a paragraph is only instruction to the writer or not, the paragraph shall be indicated between brackets.BSQC790304:1994 2 BSI 10-1999 1 Marking and ordering information 1.1 Marking See 2.5 of the generic specification. The detail s

22、pecification shall prescribe the information marked for the relevant types, such as letters, figures and/or codes. When the marking contains information other than that specified in 2.5 of the generic specification, such as that used for the manufacturers internal use, it shall be distinguished. Nam

23、e (address) of responsible NAI (and possibly of the body from which the specification is available). 1 Number of IECQ detail specification, plus issue number and/or date. QC790304 2 ELECTRONIC COMPONENT OF ASSESSED QUALITY IN ACCORDANCE WITH: Generic specification: Publication747-10/QC700000 Section

24、al specification: Publication748-11/QC790100 and national references if different. 3 National number of detail specification. This box need not be used if the national number repeats the IECQ number. 4 BLANK DETAIL SPECIFICATION FOR: LINEAR ANALOGUE-TO-DIGITAL CONVERTERS (ADC) Type number(s) of the

25、relevant device(s). Ordering information: see subclause1.2 of this standard. 5 Mechanical description Outline references: Standard package reference shouldbe given, IEC number (mandatory if available) and/or national number. Outline drawing may be transferred to or given with more details in clause8

26、 of this standard. 7 Short description Application: Function: Typical construction: Si, monolithic, bipolar, MOS. Encapsulation: cavity or non-cavity. Comparison table of characteristics for variant products. CAUTION: Electrostatic sensitive devices. 6 Terminal identification drawing showing pin ass

27、ignments, including graphical symbols. Categories of assessed quality From subclause 2.6 of the generic specification. 8 Marking: letters and figures, or colour code. The detail specification shall prescribe the information to be marked on the device, if any. See subclause 2.5 of the generic specifi

28、cation and/or subclause1.1 of this standard. Reference data Reference data on the most important properties to permit comparison between types. 9 Information about manufacturers who have components qualified to this detail specification is available in the current Qualified Products List.BSQC790304:

29、1994 BSI 10-1999 3 If all the information has already appeared in box7 of the front page, this shall be indicated. 1.2 Ordering information The following minimum information is necessary to order a specific device, unless otherwise specified: precise type reference (and nominal voltage value, if req

30、uired); IECQ reference of detail specification with issue number and/or date when relevant; category of assessed quality as defined in clause9 of the sectional specification and, if required, screening sequence as defined in clause8 of sectional specification; packaging for delivery; any other parti

31、culars. 2 Application related description Information on the application of the device in equipment or circuits and its relations to the associated devices shall be given here. The contents will depend on the function to be described. 3 Specification of the function A detailed block diagram or equiv

32、alent circuit information of the integrated circuit shall be given, if necessary. 4 Limiting values (absolute maximum rating system) This clause is not for inspection purposes. These values apply over the operating temperature range, unless otherwise specified. Any specific mechanical or environment

33、al ratings particular to the device and any interdependence of limiting conditions should be stated here. Curves shall preferably be given under clause9 of the detail specification. Subclause Parameters a Symbol Values Min. Max. Unit 4.1 4.2 4.3.1 4.3.2 4.3.3 4.3.4 4.4 4.5 4.6 4.7 4.8 4.9 4.10 Power

34、 supply voltages (see note of clause5 of this document) Power supply currents (where appropriate) Analogue input voltage(s) Reference input voltage (where appropriate) or Reference differential voltage (where appropriate) Input voltage of digital control Applied digital output voltages Reference inp

35、ut current(s) (where appropriate) Digital output current(s) (where appropriate) Other terminal voltages and/or currents Power dissipation Short-circuit output current Duration of the short-circuit (where appropriate) V CCV EE I CC I EE V I(A) V REF V REF(D) V I(D) V O I REF I O P tot I OS t OS V V m

36、A mA V V V V V mA mA V and/or mA W mA s a See IEC748-1, Amendment1, chapter VI, notes1 and2 of 10.4.1. Subclause Parameters of temperature limiting values b Symbol Values Unit Min. Max. 4.11 4.12 Operating temperature Storage temperature T ambT stg C C b See IEC748-1, Amendment1, chapter VI, note of

37、 10.4.2.BSQC790304:1994 4 BSI 10-1999 5 Operating conditions (within the specified operating temperature range) Operating conditions are specified in the relevant measuring methods (see IEC748-4, chapter IV, section3, category II). See13.3 of this standard for inspection requirements. General condit

38、ions of measurement and corresponding values: 6 Electrical characteristics These characteristics requirements are based on linear analogue-to-digital converters (ADC). The apply to the different types such as: a) ADC with utilization of a successive approximate DA converter; b) tracking conversion m

39、odel; c) semi-flash ADC; d) AD converters using different operation and numeric processes stated above. The symbols, terms and conditions of electrical characteristics are given here in accordance with the relevant part of IEC748-4. See terms and definitions, chapter II, category II, clause2 and con

40、ditions of electrical characteristics, chapter III, section 2, category II, clause4. Curves should preferably be given under clause9 of this standard. The following characteristics apply over the full operating ambient temperature range, unless otherwise stated. Where the stated performance of the c

41、ircuit varies over the operating ambient temperature range, the values of the appropriate characteristics shall be stated at25 C and at the extremes of the operating temperature range. 5.1 Power supply voltages see note V CC V EE 5.2 Power supply currents I CC I EE 5.3 Digital outputs: 5.3.1 All bit

42、s logic “1” V OHB I OHA 5.3.2 All bits logic “0” V OLA I OLB NOTEFor bipolar converters: V CC(positive supply voltage), V EE(negative supply voltage), with respect to ground reference. For unipolar converters: V CC(positive supply voltage) only with respect to ground reference. (Same for I CC , I EE

43、 .)BSQC790304:1994 BSI 10-1999 5 Table of the electrical characteristics 6.1 Static characteristics (see Figure 1) Subclause Static characteristics Symbol Values Min. Max. Unit 6.1.1 6.1.2 6.1.3 6.1.4 6.1.5 6.1.6 6.1.7 6.1.8 6.1.9 6.1.10 6.1.11 6.1.12 Reference bias current or Reference bias voltage

44、 (where appropriate) and change of the reference voltage versus temperature (if applicable) Digital input voltages of control (if applicable): for a logic “1” input for a logic “0” input NOTEMinimum values to be guaranteed for control voltages should be: for a logic “1” level for a logic “0” level D

45、igital input current of control (if applicable): for a logic “1” level for a logic “0” level NOTEClock pulses are included with digital control inputs. Analogue input voltage range Digital output voltage, all bits (where appropriate): for a logic “1” level for a logic “0” level Digital output curren

46、t, all bits (where appropriate): for a logic “1” level for a logic “0” level Digital output current for a high impedance output state(where appropriate) Power supply current(s) (if applicable) Power dissipation (if applicable) Short-circuit current of logic output (if applicable) Miscellaneous volta

47、ges and currents (if applicable) Example: Sampling, information of digital outputs, etc. I REFV REF %V REF V IH V IL V IH V IL I IH I IL V I(A) V OH(MSB) V OL(LSB) I OH(MSB) I OL(LSB) I OZ I CCand I EE P D I OS mA V V/ C V V V V mA mA V V V mA mA 4A mA W mA, A V or mABSQC790304:1994 6 BSI 10-1999 1

48、Reference inputs: 6.1.1 and6.1.2 3 Digital inputs control: 6.1.3 and6.1.4 2 Analogue input: 6.1.5 4 Digital outputs: 6.1.6, 6.1.7, 6.1.8, 6.1.11 5 and6 Miscellaneous voltages and currents: 6.1.12 7 Power supply: 6.1.9 and6.1.10 Figure 1 Typical diagram with inputs and outputs connectionsBSQC790304:1

49、994 BSI 10-1999 7 Table of the electrical characteristics (continued) 6.2 Characteristics of conversion errors 6.3 Dynamic characteristics Subclause Characteristics of conversion error Symbol Values Min. Max. Unit 6.2.1 6.2.2 6.2.3 6.2.4 6.2.5 6.2.6 6.2.7 6.2.8 6.2.9 6.2.10 6.2.11 6.2.12 Origin error, determination of of