CECC 30 701- 802 ISSUE 1-1995 Fixed Capacitors of Ceramic Dielectric Class 2F4 (En)《陶瓷介质固定电容器 2级产品 2F4(英文)》.pdf

1、 CECC CECC*30*?01- BOE*ISSUE*L 95 1974499 0081354 211 D CECC 30 701-802 D ETA I L SPEC I FI CAT Io N SPCIf ICATION PARTICULIRE BAUARTSPEZI FI KATION September 1995 English version Detail Specification: Fixed capacitors of ceramic dielectric, Class 2F4 h This CECC Detail Specification was approved on

2、 i 995-05-04. Up-to-date lists and bibliographical references of other detail specifications relating to EN 130000:1993 and CECC 30 700:i 989 may be obtained on application to the Central Secretariat or to any CENELEC member. CENELEC members are the national electrotechnical committees of Austria, B

3、elgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comit Europen.de Normalisation Electrotechnique Europisches Komitee fr

4、 Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 1995 Copyright reserved to CENELEC members Ref. No. CECC 30 701-802:1995 E Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permit

5、ted without license from IHS-,-,-CECC CECC*30*701- B02*ISSUE*L 95 M 1974499 0081355 158 9 PREFACE This specification was prepared by CECC WG3: “Capacitors. It is based, wherever possible, on the Publications of the International Electrotechnical Commission. The text of this specification was circula

6、ted to the members of CECC WG3 and was ap roved for publication under the (ccelerated procedure for the acceptance of de e ail specifications with Decisions 10,11 and 12 of the minutes of the CECC CD meeting in document CECC(Sec)l813. Secretariat Note: The document was originally drafted by members

7、of CECC WG3 and discussed as document CECC WG3(West)145B by.kG3 at their meeting in Graz in October 1994 with the decision to published it without voting (see minutes CECC WG3(Sec)285, item 15.1.2). To allow early publication, this detail specification is issued initially in English only. Correspond

8、ing versions in French and German will follow on request.of 0“s. b . CECC 30 701-802 (Issue 1) -2- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- - CECC CECC*30*701- 802*ISSU

9、E*L 95 1974499 0081356 094 Specification available from: National Authorized Institution ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH: EN 130000:1993 CECC 30 700 Issue 2 to Amendment 3 First angle projection Outline drawing and Patter Se2ti plane dimensions All d

10、imerisions are in m, see Table 1. the dimensions given. Other shapes permitted within CECC 30 701-802 ISSUE 1 1995 MANUFACTURERS TYPE NUMBERS See CECC O0 200 For ordering information see 1.6 DETAIL SPECIFICATION FOR FIXED CAPACITORS OF CERAMIC DIELECTRIC CLASS 2F4 Conformal coating, or in non-metall

11、ic case Insulated Radia 1 ternina t ions ASSESSMENT LEXEL: E REFERENCE DATA: Rated capacitance range: 10 nF to 27 FF Capacitance tolerance: * 10 2, f 20 2 d.crated voltage range: 50 V, 63 V, 100 V Climatic category: 551125156 Information about manufacturers who have components qualified to this deta

12、il specification is available in the current CECC O0 200: Register of Firns, Products and Services Approved under CECC System (Register of Approvals). This specification is intended to replace the following detail specifications: CECC 30 701-006 - 3- CECC 30 701-802 (Issue 1) Copyright CENELEC Elect

13、ronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1 - GENERBL DATA 1.1 The capacitors shall be mounted on a printed wiring board with the seating plane coincident with the top surface of the board. Met

14、hod of mounting for vibration and bump or shock tests 1.2 Dimensions Table 1 :ase size :e f e r enc e D1 D2 D3 D4 D5 06 D7 D8 D9 D1 O D11 D12 D 13 D14 DI5 Pattern reference A A B A B A B A A A A B B A A Maximum dimensions (4) X Wire diameter (3) Permitted 2,54 2,54 5,08 2,54 5,08 2,54 5,08 2,54 5,08

15、 5,08 5.08 10,16 10,16 10,16 5,08 IOTES (1) Dimension S is measured at the seating plane with a gauge according to sub-clause 3.2.1 of IEC 717. (2) Capacitors may be-supplied with pre-shaped terminations, in which case dimension Y shall be increased by 3,O mm. The specific shape may be agreed betwee

16、n user and manufacturer. (3) For additional information on tolerances see IEC 310. (4) For the measurement of dimensions X, Y and Z gauges may be set up to 0,05 rmn larger than the value in the table, to accommodate capacitors originally designed to inch dimensions. CECC 30 701-802 (Issue 1) -4- Cop

17、yright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*701- 802*ISSUE*1 95 H 1974479 0081358 767 1.3 Ratings and characteristics Capacitance range Tolerance on rated capacit

18、ance Rated voltage Category voltage Climatic category Rated temperature Tangent of loss angle Insulation resistance Test point la: Test point IC: . . Vol tage proof Temperature characteristic of capacitance See Table 2 f 10 x, f 20 x See Table 2 As rated voltage 2S/8S/ 56 8.5 OC 5 0,025 2 10 Gn or 1

19、00 s whichever is less 2 5 G2 2F4 (see Table 2A) 2,5 Table 2 Values of capacitance in nF related to case sizes and rated voltages Case Size D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D12 D13 D14 D15 50 V 10 to 270 10 to 330 10 to 330 10 to 330 10 to 330 10 to 1200 10 to 1200 10 to 1200 10 to 1200 100 to 220

20、0 100 to 5600 100 to 5600 1000 to 10000 2200 to 27000 1000 to 15000 Rated vol tage 63 V 10 to 270 10 to 330 10 to 330 10 to 330 10 to 330 10 to 1200 10 to 1200 10 to 1200 10 to 1200 100 to 2200 100 to. 5600 100 to 5600 1000 to 10000 2200 to 27000 1000 to 15000 100 v 10 to 220 10 to 220 10 to 220 10

21、to 220 10 to 220 10 to 1000 10 to 1000 10 to 1000 10 to 1000 100 to 1200 100 to 4700 100 to 4700 1000 to 6800 2200 to 22000 1000 to 12000 JOTES (i) Individual capacitance values should preferably be selected from the E12 series of IEC 63. (2) Capacitance values are for guidance only. Values outside

22、these ranges but within these case sizes may be approved. See CECC O0 200 for individual manufacturers ranges. -5- CECC 30 701-802 (Issue 1) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license

23、from IHS-,-,-CECC CECC*30*703- 8OZ*ISSUE*IJ 75 L77LtLt77 0083357 8T3 Sub- Temperature Class range 2F4 - 25 OC / + 85 OC Table A Permissible capacitance variation With no voltage applied With UR applied t 20 I / - 80 X t20XJ-90X 1.4 Belated documents Generic specification : EN 130000:1993 Sectional s

24、pecification : CECC 30 700 issue 2, Amendment 1 to 2 1.5 Marking The capacitors shall be marked with rated capacitance and tolerance, and with as many as possible of the remaining items listed in 1.5 of CECC 30 700. . If code is used for capacitance and tolerance, it shall be according to IEC 62. 1.

25、6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or coded form,the following information: (1) Rated capacitance. (2) Tolerance on rated capacitance. (3) Rated voltage. (4) Case size reference (5) Wire diameter (if not preferred value) and shape (for

26、example pre-shaped) (6) Wire length (7) Method of. packaging (taped or bulk; if taped according to IEC 268-2) (8) This detailspecification number, issue and date if applicable Example: 100 nF f 20 1, 100 V, case D10, tape packaging CECC 30 701-802 Issue 1 (date) CXC 30 701-802 (Issue 1) - -6- Copyri

27、ght CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- - CECC CECC*30*701- BOE!*ISSUE*1 95 1974499 00L3b0 515 1.7 Certified test records Certified test records are not required. 1.8 Additi

28、onal information (not for inspection purposes) None. 1.9 Additional or increased severities or requirements to those specified in the Generic and/or Sectional Specification 4.3.3 4.14.5 Table 3 Requirements tighter than those given in CECC 30 700 - - Tan 6 5 0,025 Insulation resistance Z 10 GR or 10

29、0 s whichever is less Capacitance change after endurance: IfiC/Cl 2 20 z 2 - INSPECTION REQUIREMENTS L 2.1 Procedures 2.1.1 CECC 30 700. For Qualification Approval procedures shall be in accordance with 3.4 of 2.1.2 For Quality Conformance nspection the test schedule (Table 4) includes sampling, per

30、iodicity, severities and requirements. The formation of inspection lots 1s covered by 3.5.1 of CECC 30 700. -7- CECC 30 701-802 (Issue 1) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license fro

31、m IHS-,-,-CECC CECC*30*701- 802*ISSUE*3 95 W 3974499 0083363 Y53 Table 48 Lot-By-Lot Inspection (Groups A and B) Notes: See end of table Clause number and test 1) Group A. 4.2 Visual examination 4.2 Dimensions (gauging 1 :roup A2 4.3.1 Capacitance 4.3.2 Tangent of loss angle (tan ) 4.3.4 Voltage pro

32、of 5.3.3 Insulation resistance :roup B1 5.6 Solderability ;roup B2 t. 4 Temperature characteristic of capacitance 4) Conditions of test 1) Non-destructive Non-destructive Frequency: 1 kHz Voltage: (0.3 * 0,2) V Frequency: 1 kHz Voltage: (0,3 * 0,2) V Applied voltage: 2,5 UR rest point la only .leacu

33、ring voltage: UR rest point la only gen. destructive 51 JO preliminary drying r preconditioning. Solder bath method, . immersion up to ? -0/+0,5 mm from the ;eating plane or up to :he heat shield, if used lest ruc tive jpecial preconditioning LS in 4.1 at 150 OC :apaci tance CECC 30 701-802 (Issue i

34、) -8- IL JAQL2 2: 5-4 - II - ;-3 - -2 - PerfoGnce 1) requirements As in 4.1 Marking legible and as specified in 1.5 of this specification As specified in Table : of this specification Within specified to1 e ranc e See Table 3 of this specification No breakdown or flashover See Table 3 of this specif

35、ication ;ood tinning iee Table 2A of this ;pecif ica tion Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Table 4A (continued) NOTES 1 Clause numbers of tests and performance r

36、equirements refer to the Sectional specification, CECC 30 700 Issue 2. 2 Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. 3 p = periodicity in months n = sample size c = acceptance criterion (permitted number of non-conforming items) IL = inspection level AQL = a

37、cceptable quality level 4 This group may be omitted if a corresponding test is carried out on each manufacturing batch of dielectric material. 5 Specimens having passed the Group B non-destructive tests shall still satisfy the tests of Group A. -9- CECC 30 701-802 .(Issue 1) Copyright CENELEC Electr

38、onic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Table 4B Periodic Inspection (Group C) Notes: See end of table ;lause number and test 1)3) Jroup CIA 4.2 4.5 4.6 Dimensions (detail) Robustness of . ter

39、minations Ua: Tensile Ub: Bending 5) Resistance to soldering heat 4.6.1 Preconditioning 4.6.1 Initial measurement 4.6.4 Final measurements Conditions of test 1) Destructive Test Ub Method 2 Visual examination Method 1A: immersion up to 2 -0/t0,5 m from the seating plane or up to the heat shield, if

40、used mmersion time: 5 s Special preconditioning as in 4.1 at 150 OC Capacitance Visual examination Perf ormance requirements 1) As specified in Table 1 of this specification No visible damage Cracking of coating extending down the wires is permitted Bo visible dasnage iarking legible 4s in 4.6.4 . _

41、-_-_- CECC 30 701-802 (Issue 1) -10- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*30*701- 802*ISSUE*1 95 1974499 00813b4 LbO 4.8.1 Preconditioning Table 4B (contin

42、ued) Notes: See end of table Five cycles Duration t = 30 min . Recovery: 22 to 26 h Special preconditioning as in 4.1 Group C1B Des truc tive No visible damage 4.7 Rapid change of TA = Lower category temperature tempe r a t ur e Method of mounting: see 1.1 of this specification Procedure B4 Frequenc

43、y range: from 10 Hz to 2000 Hz Amplitude: 0.75 mm or acceleration 98 mlsz Duration: 6 h 113 of the sample in each of three mutually perpendicular axes 6) lisual examination 1.8.4 Intermediate lethod of mounting: ee 1.1 of this ;pe c i fica t ion lumber of bumps: 4000 cceleration: 390 m/sz kration of

44、 pulse: 6 ms .9 1. 9.2 10 inspection Vibra tion4 Int e media t e inspection Bump4) (or shock, see 4.11) .- . . Visual examination I 1: o visible damage -11- CECC 30 701-802 (Issue 1) I Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduct

45、ion or networking permitted without license from IHS-,-,-Table 4B (continued) Notes: See end of table Clause number and test 113) Group C1B (contd) 4.11 Shock4) (or bump, see 4.9) 4.12 Climatic sequence 4.12.1(1) Initial measurement 4.12.2 Dry heat L 4.12.3 Damp heat . cyclic,Test Db first cycle 4.1

46、2.4 Cold 4.12.4(1) Intermed- iate inspection 4.12.6 Damp heat cyclic,Test Db remaining cycles 1) Conditions of test Method of mounting: see 1.1 of this specification Acceleration: 390 mis* Duration of puise: 11 m! half sine 3 shocks in each direction of 3 mutually perpendicular axes Visual examinati

47、on Capacitance Temperature: Upper category temperature Duration: 16 h Temperature: 55 OC Temperature : Lower category temperature Duration: 2 h risual inspection remperature: 55 “C Five cycles iecovery: 22 to 26 h CECC 30 701-802 (Issue 1) -12- Perf ormance requirements 1) go visible damage 9s in 4.

48、11.3 io visible damage Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- CECC CECC*30*701- BOZ*ISSUE*L 95 3974499 0083366 T33 D insulation resistance Table 4B (continued) Notes: See end of table =lause number xnd tes tl) ;roup Ci (contd) 5.12.7 Final measurements :roup C2 13 Damp heat, steady state .13.1 Pre- conditioning .13.2 Initial measurement .13.3 Test conditions .13.4 Recovery .13.5 Final measurement