CECC 50 008- 005 Ambient Rated Rectifier Diode (En)《额定环境整流二极管(英文)》.pdf

1、CECC CECC*50*008- 005 * m 2974499 0037377 7bL m . _. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*50*008- 005 * m l1974499 0037378 bT8 m 1 1 P;iqc I aie CECC 50008

2、405 Of i;lt t roiiic Coinpoiiciit of :s scs sed Quality in ilCCOrdaZtCC with I.S. i300 : i975 I 1.S. 1309N005 : 1976 Dc t a il S pec i f icii t: ion for Type Number A14 1OOV Device Ambient Ratcd liectif ier Diode Construct ion Senucoriductor Material : Silicon Encapsulation Material : Glass Drawing

3、., TJTC : Current : 1 A Application : Rectification, etc. Level of Quality Assessnient : F LiniitiiiS Valucs (Absolute Maxiniuin Ratings Systeni). Thecc apply over thc operating teinpcratuie raiize, unless otherwise stated. o1 taSe Crest woi.kin= reverse voltage = 1oov Repetitive peak reverse voltag

4、e VRIW = 1oov Non-repetitive pak reverse voltaze (maxburn duration = ims.) Current !teciii forward current at the breakpoint tcitipcrn tiire Tbr = 100 sinusoidal i80 coiiduction with resi%tive load. O i(AV) MJIX. -LA c ($cc Fig. i). III siiGlc phsc ciixuits Sui-qc (non-repetitive) Forward Curi-ent.

5、ilnxiinuin curciit pc.i.missiblc for a half-sine ( tiiis), iGittiout rcapplicatioii of reverse voltage. This intiii$ coi.rcspoiids to a ciirt-erit surge appl icci aftcr continuous opcrntioti at the iiinxiniuin valuc of thc nicati forward current. Copyright CENELEC Electronic Components Committee Pro

6、vided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Max. mean forward current % (AV)MAX. Amps O 1 O Temperature Ambient Temperature: Maximum amb ient tempera tu re . Storage Tempera ture: Minimum and maximum storage temperature Elect

7、 rical Characteristics Tamb = 25OC unless otherwise stated. Tstg min. = - 6SoC *. Tstg max. = 175OC %Maximum Forward Voltage at = 3A vFFri = 103ov -:Maximurn Forward Vol tage at 5 = 1A VFM2 = 1.ov :-Maximum Reverse Current at V = 100V R i;Maxhum Reverse Current at V = 1OOV R Tamb = i7S0C, no forward

8、 dissipation. Trr = 6 s r Maxinnim Reverse Recovery The at T+ = O.SA, = l.OA, recovery to O.25A. s = Verified under inspection (See Group A, I3 and C tables). Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitte

9、d without license from IHS-,-,-$1 CECC CECC*50*008- 005 * m 1974497 0037380 25b m = 1oov 4.3.4 a) vRRM Peak Reverse Current b) Frequency = 50HZ c) fa rwa rd dis c ipa t ion. O D-o42 Tamb = 25 C, no %ri I Test Conditions : These are given in the tables for Group A, B and C. Certified Test Records: At

10、tributes information shall be given as per Sub-Group CTR in the Group B and C tables. Inspection Requirements: Ac per Group A, B and C requiremeczs set out below. Abbreviations used: IL = Inspection level, AQL = acceptable quality level. I P = Periodicity of Tests (months) n = sample size. c = accep

11、tance criterion. All clause references are to I.S. i300 : 1975, Generic Specification for Discrete Semiconductor Devices. EXAMINATION OR TEST SUI3-GHOUP Al REF. CONDITIONS, at Tamb=2SC, msPEcrIoN REQ 1.s.1300: unless otherwise stated. LIMITS 1975 Visual Inspection 4.2.1 Note 1 4.2.1 standard factory

12、 lighting, normal visual conditions. SUB-GKOUP A2 Peak Forward Voltage VFM1 1 = 1.30 mX. 403.4 % = 3A vFf.ll D-O41 IL I. II Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC

13、 CECC*50*008- 005 * = 1974499 0037381 172 GROUP U - Lt by Lot bending and tensile suu-Giou I u4 Solderability SUS-GROUP BS (D) Yapid chaige of temperature followed by: Accelerated damp heat. SUB-GROUP Us (D) Electrical Endu raiice REF. . S. 130( 197 5 4.4.9 4.4.7 4.4.4 4.4.2 1.5.2.4 CONDITIONS, at T

14、amb=2S0C, unless otherwise stated. 4.2,s App. III Rectifier to be gauged as per dimensioned drawing Fig. 2. 4.4.9 Wire diameter D = .89m. Wire Length L = 25.4 m. 4.4-7 4.4.4 Test Na. 6 cycles, Tamb = -65 to 17soC 4.402 4-5-2.4 168, +72, -10 hours a) VRwl = 1OOV b) Frequency = 5OHZ c) At any point on

15、 thc dcrating cume between tlic bt-ciilipoiiit and 30$ o I ,i c iixu it wtiicli s iiiiu Lat- cs tlic abovc coiidit ions . d) Mounting conditions as pcr fig. 3. - tA or Li I: ( AV ) FUX INSPECTION REQU LIMITS 4.2.2 hl = 1.30 max. bri = SrA max. No damage. 4.4.7 ;ood wett big I = 1.30 nux. FMl IRMI =

16、Inax. = 1.43V nuix. FM I = LO iA nux. NM( ) U“TS LEVEL AQL% SUI-GROUP CTII At t rbut es Inf orniat ion for 137- ik. RF. R8. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC

17、 CECC+50*008- 005 St D 1974499 O037382 O29 *I CROUP C - Periodic Only tests marked: (D) are destnictive (3.5.6 of I.S. i300 : 1975) EXAMINATION OR TEST - .- SUB-GROUP C1 Dhens ions SUB-GROUP C2b Peak reverse current IRMZ (high temperature) SUB-GROUP C2c Non-repet it ive peak revcrse RSH dtage V Surg

18、e (non- rep e t it ive ) forward cur r e II t IFSM REF. .S. 1300 : 1975 4.2.2 APP III 4.3.4 D-042 4- 3.4 u444 4.3.3 D-043 CONDITIONS, at Tamb=2S0C, unless otherwise stated. 4.2.2 App. III Rectifier to be gauged as per dimensioned drawin; Fig. 2. a) vRRN = 1oov b) Frequency = 58HZ c) Tamb = 175 C wit

19、hout forward dissip- ation. a) vWM = 12OV b) Pulse duration = IOms . c) No. of Pulses = 1 d) Tamb = 1750 a) +, = 45A b) one half sine wave 1Oms duration pulse without reapplication of reverse voltage. c) Tamb = 175 INSPECTION REQUIREMENTS I LINITS = 1.30V max. 3 FM i IIUfl = 5 in nmx. -) iFM1 = 1.3O

20、V nux. Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*50*008- O05 * L9i1i199 O037383 Tb5 1 SUB-GROUP C4 I Soldering heat (D) GROUP C - Periodic Only tests marked : (

21、D) are destructive (3.5.6 of I.S. 1300 : 1975) EXAMINATION OR TEST SUB-GROUP CU Vibration followed by: Shock i JB-GHOUP Cs Electrical (D) hduranc e REF. S. 1300 1975 4.4.8 4.4.6 4.4.5 APP. IV 5.2.4 CONDITIONS, at Tamb=2S0C, unless otherwise stated. 4.4.8 Frequency range = 100 - 2000 HZ. Acceleration

22、 = 200m/s Duration = minimum of 2 hours in each of 3 axes 2 Peak acc leration = Duration = 0.5 m,i8 shocks as per 4.4.5 App. IV. 1470Om/s 5 = 15OOg. 4. S* 2.4 1000 hours minimum, a) RW b) Frequency = SOH2 c) At any point on the derating curve between the breakpoint aiid 30% Of %(AV)NAX in a circuit

23、which simulates the above conditions. d) Mounting conditions as per fig. 3. = 1oov = 1A or At t ribu tes inf onm t ion for. c2c, c4, CG, c8. INSPECTION REQUI“TS LIMITS = 1.30 IIUX. FM 1 RMl = Inax* LEVEL Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for

24、 ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*50*008- 005 * m l1974499 O037384 9TL m Page 7 of 10 Note 1: Test Requirements for Visual Inspection (See also 1.S. 1300 : 1975 Clause 4.2.1): 1. 2. Y 2. Correct terminal identification shall appear on the rectifier

25、 body. Correct terminal identification shall be by the following method: The cathode end of the rectifier body shall be identified by a black band on the body nearest the cathode end. The colour of the rectifier body shall be such as to allow the black band to be clearly distinguished, Correct Appea

26、rance: No broken encapsulation or teminal leads, no cracks in encapsulation, no open encapsulation, no bent or damaged leads, no gaps or discontinuities in the plating on the leads. Fig. 2 Dimensioned Drawing. Cathode Band _) - ;:- Weld and solder flash iiot controlled in this area. -89 max m .74 mi

27、n All dimensions are in millimetres. t- Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-CECC CECC*50*008- 005 * m Lq74499 0037385 838 m Fig.3 Mounting Conditions for Electrical

28、 Endurance Test (Subgroup Bg and CS). FORWARD CHAR ACT E f1IST ICs Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-. CECC CECC*50*008- 005 * = I1974499 0037386 774 I l u I 3 Y x Y Lu L O Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-