CECC 90 104- 145 ISSUE 1-1986 CEI CECC 90 104-145 Silicon Complementary MOS with (B) Buffered Outputs Cavity and Non Cavity Packaging (En)《CEI CECC 90 104-145 带(B)缓冲输出腔体封装和非腔体封装的硅互.pdf

1、KCECCISO 104-145tIS*L 86 = 1974499 0052969 320 COMITATO BLBT“l?OCWICO ITALIANO I Viale Honza, 259 - 20126 MILANO Specification available from :- As shown in CECC 00200 -c. I CE.1 -CECC 90 104-1 45 ISSUE I, December 1986 PAGE 1 OF 2 ELECTRONIC Coc.1PoNENT OF ASSESSED QUALITY IN ACCORMCE WITH CECC 90

2、O00 : 1976 CECC 90 100 : 19t7 MECMI CAL DESCRI PT I ON MUFACTURERS TYPE NWBER 4076% Func t i on : QWD O TYPE REGISTER WITH 3-STATE OLiIPUTS - I Sil icon complementary MOS with (BI buffered outputs cauity and non cavi tr packaging. ASSESSMENT LEVELS R, S, T and V. Opt i ona screen i ng categor es A,

3、B, C and O. I I I c(SUlI0IJ: THESE ARE -ub-group c2 lesistance to cleaning dvents t.4 iubjlroup c4 lesistance to soldering heat :olloued by change of :mperature dpoint tests ?) for non cavity packages Damp heat, accelerated 6.6.3.1 or all packages: electrical tests sub-grap C7 a (Non cavity packages

4、) Daip heat, steady state C.6.2 Endeint tests Electrical tests sub-group C7 b (Non cavity packages) kitionai .accelerated test Endpoint tests Electrical tests Test Conditions -6.8.1 test Na &SOC and +lMC -6.3.1 test Da s for su-groups A2 and A3 est X A 6.11 T = +lMOC 6.8.1 est Na = -65OC and +15OOC

5、1.6.3.1 test a is for sub-groups A2 and A3 Iias conditions: 15 V 6.6.2 condition 3, 21 days bis for sub-groups A2 and A3 1 I +121oc +toc 2.08 Ab Duration: 96 h Recovery: 24 h As for subgroups ti? and 3 - - essaen eve1 - C - 3.3. 1 Inspection Requiraients -1 I ,s for 83 sub-groups A2 and I is for sub-groups A2 and u k for aibqroups A2 and A3 As for subqroups ti? and A3 Page 2 of CEI-CECC 90 104- 105 up to -223 (inc. ) Copyright CENELEC Electronic Components Committee Provided by IHS under license with CECCNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-