CR 13935-2000 Non-Destructive Testing - Generic NDE Data Format Model《无损检验 总的NDE数据格式模型》.pdf

1、PUBLISHED DOCUMENT Non-destructive testing - Generic NDE data format model ICs 19.100 NO COPYING WITHOUT BSI PERMISSION EXCEPT As PERMITED BY COPYRIGHT LAW PD CR L3935:2000 STD-BSI PD CR 23935-ENGL 2000 M Lb24bb9 0870099 TbT been prepared under the direction of the Engineering AmdNo. Sector Committe

2、e, was published under the authority of the Standards Committee and comes into effect on 16 September Zoo0 Q BSI 09-2000 ISBN O 580 36507 7 PD CR 13935:2000 Date Comments National foreword This Published Document reproduces verbatim CR 139352000. “he UK participation in its preparation was enirusted

3、 to Technical Committee WEW46, Nondestsuctive testing, which has the responsibility to: - aid enquirers to understand the text; - present to the responsible intedonal/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; - monitor relate

4、d internationai and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its secre-. Cross-references The British Standads which implement intedord or European publications referred to in this document may be found i

5、n the BSI Stan- CaIalogue under the section entitled “Intedonal Standards Correspondence Index”, or by using the “Find” faciiity of the BSI St;uidasds Electronic Catalogue. Summary of pages This document comprises a hnt cover, an inside front cover, the CR title page, pages 2 to 80, an inside back c

6、over and a back cover. The BSI copyright notice displayed in this document indicates when the document waslastissued. STD*BSI PD CR L3735-ENGL 2000 = Lb24bb9 0870100 501 H CEN REPORT RAPPORT CEN CEN BERICHT CR 13935 July 2000 ICs English version Non-destructive testing - Generic NDE data format mode

7、l This CEN Report was approved by CEN on 26 May 2000. It has been drawn up by the Technical Committee CENiTC 138. CEN members are the national standards bodies of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Po

8、rtugal, Spain, Sweden, Switzerland and United Kingdom. EUROPEAN COMMTEE FOR STANDARDIZATION COMITE EUROPEEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG Central Secretarlat: rue de Stassart, 36 8-1050 Brussels Q 2000 CEN All rights of exploitation in any form and by any means resewed worldwide fo

9、r CEN national Members. Ref. No. CR 13935:2000 E . _ STDoBSI PD CR 13935-ENGL 2000 I Lb24bb9 0870101 448 m Page 2 CR 13935 : 2000 Contents Foreword 3 Introduction . 4 1 2 3 4 5 6 7 8 8.1 8.2 8.2.1 8.2.2 8.2.3 8.3 8.3.1 8.3.2 8.3.3 8.3.4 8.3.5 8.3.6 8.3.7 8.3.8 8.4 8.4.1 8.4.2 8.5 SCOPE . 8 REFERENCE

10、S . 8 DEFINITIONS RELATED TO THE MODELLING METHOD 8 CONVENTIONS AND SYMBOLS . 8 GENERAL REQUIREMENTS FOR COMPLIANCE . 9 CHARACTERISTICS OF NDE DATA . 9 TERMINOLOGY RELATED TO NDE 9 NDE FORMAT MODEL - Functional description . 10 Domain description . 10 Main view of the model 10 Generic overview . 10

11、Objects definitions and relationships 11 Dictionary 15 Parameters of standard devices . 21 Detailed view of the radiographic testing device . 21 Detailed view of the eddy current testing device . 34 Detailed view of the penetrant testing device . 37 Detailed view of the magnetic particle testing dev

12、ice 39 Detailed view of the leak testing device 40 Detailed view of the acoustic emission testing device 40 Detailed view of the visual inspection device . 40 Detailed view of the acquisition data . 47 Objects definitions and relationships 47 Dictionary 49 General rules for use . 52 Detailed view of

13、 the ultrasonic testing device 27 Bibliography 53 Annex A APPENDIX 1 : DIAGRAM FORMALISM 54 Annex B APPENDIX 2 : FORMAL DESCRIPTION OF ANALYSIS MODEL . Data model objects 55 STDoBSI PD CR L3935-ENGL 2000 M 3b24bb9 0870302 384 Page 3 CR 13935 : 2000 Foreword This CEN Report has been prepared by Techn

14、ical Committee CENKC 138 o 60 c-ray source, e.g. X-ray tube, ieutron source, linear 2ccelerator, betatron Ir) dalue of last activity measurement e.g. EN 12543-2, EN 12679 STD-BSI PD CR 13935-ENGL ZOO0 M I1624669 0870123 O09 Page 24 CR 13935 : 2000 DEVICE NAME PARAMETER conformance schedule IQ1 value

15、 RADIATION CONVERTER front screen description back screen description input image window spatial resolution spatial resolution I radiographic density I I ranne calibration standard TYPE OF COMMENTS VALUE (when string Name of standard specification, e.g. EN 462-1, EN 462-2, EN 462-5) real string X-ra

16、y film system class, Imaging plate, Image intensifier, Scintillator screen, string absence or presence; type of I films string I string e.g. 2.0-3.5 O.D. I I string I STDmBSI PD CR L3935-ENGL 2000 9 lib24bb9 08701i24 T45 TYPE OF VALUE (when available) Page 25 CR 13935 : 2000 Comments DEVICE NAME RAD

17、IATION DETECTOR type PARAMETER string dynamic range contrast sensitivity input horizontal resolution input vertical resolution string e.g. 500:1, 1.8% real real maximum light level dark signal noise real real e.g. 15.10“ VPC gamma exponent temperature drift automatic processing real real flag variat

18、ion over a period of time yes or no (no = manual) developer type developer temperature string real developer ti me real Page 26 CR 13935 : 2000 DEVICE NAME IMAGE DIGITIZER PARAMETER TYPE OF VALUE (when available) type horizontal resolution string real vertical resolution dynamic range (in bits) Inpu

19、t transfer function Output transfer function transfer function real integer string string array of reals horizontal pixel number image gain characteristics integer string vertical pixel number maximum number of horizontal lines maximum number of vertical lines integer integer integer COMMENTS pre im

20、age conditioning applied e.g. film scanning, . string Line pairs per mm. image offset characteristics Line pairs per mm. e.g. 8 bits, 12 bits, . string mapping of output signal to input signal ratio, linear, non- linear Background subtraction, integration, averaging, image sharpening etc. Minimum si

21、gnal level, maximum signal level. Signal level conditioning. STD*BSI PD CR L3935-ENGL 2000 W Lb24bb9 087012b 818 Digitizer Receiver UTprobe A Page 27 CR 13935 : 2000 Couplant 8.3.2 Detailed view of the ultrasonic testing device 8.3.2.1 Definition of objects Pulser Gaie Cable Filter Figure 4 - Ultras

22、onic testing standard devices PULSER : device which produces an electrical pulse to drive a probe. UT PROBE : electro-acoustic device which transforms the electrical pulse into an acoustic signal and vice-versa. RECEIVER : device which receives and amplifies the analogue electrical signal corning fr

23、om the probe. DIGITIZER : device which transforms an electrical analogue signai into a digital signal. FILTER : device which transforms the frequency response of the electrical signal. GATE : device which selects a time period and, in some cases, a level threshold of the electrical signal. COUPLANT

24、: medium interposed between the probe and the examination object. CABLE : the electrical link between analogue devices. Page 20 CR 13935 : 2000 DEVICE NAME Parameter TYPE OF VALUE (when available) PULSER pulse type string I pulse width I real repetition rate pulse amplitude I pulse rise time I real

25、real real negative pulse pulse damping factor burst frequency flag real real burst width trigger mode COMMENTS real string shape of the pulse, e.g. spike, square, . trigger delay defined as an attribute of UT PROBE object in case of multiple cells probe real yes, no in percentage when pulse is a burst when pulse is a burst internal time-based, external defined as an attribute of UT PROBE object in case of multiple cells probe