DLA MIL-PRF-19500 488 E-2008 SEMICONDUCTOR DEVICE TRANSISTOR NPN SILICON HIGH-POWER TYPES 2N5671 AND 2N5672 JAN JANTX JANTXV AND JANS.pdf

1、 MIL-PRF-19500/488E 9 December 2008 SUPERSEDING MIL-PRF-19500/488D 1 May 2007 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, HIGH-POWER, TYPES 2N5671 AND 2N5672, JAN, JANTX, JANTXV, AND JANS This specification is approved for use by all Departments and Agencies of th

2、e Department of Defense. The requirements for acquiring the product described herein shall consist of this specification sheet and MIL-PRF-19500. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for NPN, silicon, high-power transistors. Four levels of product assurance are

3、provided for each device type as specified in MIL-PRF-19500. 1.2 Physical dimensions. See figure 1 (similar to TO-3). 1.3 Maximum ratings. Unless otherwise specified, TC= +25C. Types PT(1) TA= +25C PT(2) TC= +25C RJC VCBOVCEOVEBOICIBTSTGand TJ2N5671 2N5672 W 6.0 6.0 W 140 140 C/W 1.25 1.25 V dc 120

4、150 V dc 90 120 V dc 7.0 7.0 A dc 30 30 A dc 10 10 C -65 to +200 (1) Derate linearly 34.2 mW/C for TA +25C. (2) Derate linearly 800 mW/C for TC +25C. 1.4 Primary electrical characteristics at TA = +25C. Pulse response Limits hFE1VCE= 2.0 V dc IC= 15 A dc VCE(sat)1IC= 15 A dc IB= 1.2 A dc Cobo100 kHz

5、 10 s; RS= 0.1 ohm; RBB1= 1; VBB1= 10 V dc max; RBB2= 20; VBB2= 4 V dc; IC= 30 A dc; VCC= 90 V dc (2N5671) and 120 V dc (2N5672); RL 3.0 (2N5671), 4.0 (2N5672); L = 50 H, 0.1 ; CR = 1N1186A; Clamp voltage = 90 V dc +0, -5 (2N5671); 120 V dc +0, -5 (2N5672). Device fails if clamp voltage is not reach

6、ed. Electrical measurements See table I, subgroup 2 herein Subgroups 6 and 7 Not applicable 1/ For sampling plan, see MIL-PRF-19500. 2/ This test required for the following end-point measurements only: Group B, subgroups 3, 4, and 5 (JANS). Group B, subgroups 2 and 3 (JAN, JANTX, and JANTXV). Group

7、C, subgroup 2 and 6. Group E, subgroup 1. * Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/488E 11 * TABLE II. Group E inspection (all quality levels) for qualification or re-qualification only. Inspection MIL-STD-750 Sample Method Con

8、ditions plan Subgroup 1 45 devices c = 0 Temperature cycling (air to air) 1051 Test condition C, 500 cycles. Hermetic seal 1071 Fine leak Gross leak Test conditions G or H. Test conditions C or D. Electrical measurements See table I, subgroup 2. Subgroup 2 45 devices c = 0 Blocking life 1048 Test te

9、mperature = +125C; VCB= 80 percent of rated; T = 1,000 hours. Electrical measurements See table I, subgroup 2. Subgroup 4 Thermal impedance curves See MIL-PRF-19500. Sample size N/A Subgroup 8 Reverse stability 1033 Condition B. 45 devices c = 0 Provided by IHSNot for ResaleNo reproduction or networ

10、king permitted without license from IHS-,-,-MIL-PRF-19500/488E 12 FIGURE 2. Safe operating area for switching between saturation and cutoff (unclamped inductive load). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/488E 13 NOTE: V(BR)C

11、EQ, V(BR)CER, V(BR)CEX, is acceptable when the trace falls to the right and above point “A“ for type 2N5671. The trace shall fall to the right and above point “B“ for type 2N5672. FIGURE 3. V(BR)CEO, V(BR)CER, V(BR)CEX, measurement circuit. Provided by IHSNot for ResaleNo reproduction or networking

12、permitted without license from IHS-,-,-MIL-PRF-19500/488E 14 NOTES: 1. The rise time (tr) and fall time (tf) of the applied pulse shall be each 20 ns; duty cycle 2 percent; generator source impedance shall be 50 ohms; pulse width = 20 s. 2. Output sampling oscilloscope: Zin 100 k; Cin 50 pF; rise ti

13、me 20 ns. FIGURE 4. Pulse response test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/488E 15 FIGURE 5. Maximum safe operating area graph (continuous dc). Provided by IHSNot for ResaleNo reproduction or networking permitted w

14、ithout license from IHS-,-,-MIL-PRF-19500/488E 16 FIGURE 6. Safe operating area for switching between saturation and cutoff (clamped inductive load). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/488E 17 5. PACKAGING 5.1 Packaging. Fo

15、r acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements.

16、Packaging requirements are maintained by the Inventory Control Points packaging activities within the Military Service or Defense Agency, or within the Military Services system commands. Packaging data retrieval is available from the managing Military Departments or Defense Agencys automated packagi

17、ng files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. The notes specified in MIL-PRF-19500 are applicable to this specification.) 6.1 Intended use. Semi

18、conductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of this specification. b. Packaging requirement

19、s (see 5.1). c. Lead finish (see 3.4.1). d. Product assurance level and type designator. * 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List (

20、QML 19500) whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that

21、 they may be eligible to be awarded contracts or orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from Defense Supply Center, Columbus, ATTN: DSCC/VQE, P.O. Box 3990, Columbus, OH 43218-3990 or e-mail vqe.chiefdla.mil. An onli

22、ne listing of products qualified to this specification may be found in the Qualified Products Database (QPD) at http:/assist.daps.dla.mil . 6.4 Changes from previous issue. The margins of this specification are marked with asterisks to indicate where changes from the previous issue were made. This w

23、as done as a convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the las

24、t previous issue. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-PRF-19500/488E 18 Custodians: Preparing activity: Army - CR DLA - CC Navy - EC Air Force - 85 (Project 5961- 2008-030) NASA - NA DLA - CC Review activities: Army - AR, MI, SM Navy

25、- SH Air Force - 13, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http:/assist.daps.dla.mil/ . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-