DLA SMD-5962-00506 REV C-2013 MICROCIRCUIT DIGITAL LOW VOLTAGE CMOS QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR MULTIPLEXER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Make corrections to table I minimum propagation delay times at 2.7 V. Update boilerplate to MIL-PRF-38535 requirements. jak 00-12-12 Thomas M. Hess B Update boilerplate to MIL-PRF-38535 requirements. LTG 07-10-24 Thomas M. Hess C Update boilerpla

2、te paragraphs to the current MIL-PRF-38535 requirements. - LTG 13-01-25 Thomas M. Hess REV SHEET REV SHEET REV STATUS REV B B B B B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joseph A. Kerby DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landan

3、dmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY Charles F. Saffle, Jr. APPROVED BY Monica L. Poelking MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, QUADRUPLE 2-LINE TO 1-LINE DATA SELECTOR/M

4、ULTIPLEXER, MONOLITHIC SILICON DRAWING APPROVAL DATE 00-07-11 REVISION LEVEL C SIZE A CAGE CODE 67268 5962-00506 SHEET 1 OF 14 DSCC FORM 2233 APR 97 5962-E213-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 596

5、2-00506 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and l

6、ead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 00506 01 Q E A Federal stock class designator RHA designa

7、tor (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designat

8、or. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54LVC157A 2-line to 1-line data selector/multiplexer 1.2.3 Device class designator. The device class designator is a single let

9、ter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals

10、Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permitte

11、d without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00506 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ 2/ 3/ Supply voltage range (VCC) -0.5 V dc to +6.5 V dc DC input voltage range (VIN) -0.5 V d

12、c to +6.5 V dc 4/ DC output voltage range (VOUT) . -0.5 V dc to VCC+ 0.5 V dc 4/ 5/ Input clamp current (IIK) (VINVCC) . -50 mA Continuous output current (IO) . 50 mA Continuous current through VCCor GND . 100 mA Maximum power dissipation at TA= +55C (in still air) (PD) . 550 mW 6/ Storage temperatu

13、re range (TSTG) . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) +150C 1.4 Recommended operating conditions. 2/ 3/ 7/ Supply voltage range (VCC): Operating . +2.0 V dc to +3.6 V dc Data retention onl

14、y . +1.5 V dc Minimum high level input voltage (VIH): VCC= 2.7 V to 3.6 V . +2.0 V Maximum low level input voltage (VIL): VCC= 2.7 V to 3.6 V +0.8 V Input voltage range (VIN) +0.0 V dc to 5.5 V dc Output voltage range (VOUT). +0.0 V dc to VCCMaximum high level output current (IOH): VCC= 2.7 V -12 mA

15、 VCC= 3.0 V -24 mA Maximum low level output current (IOL): VCC= 2.7 V +12 mA VCC= 3.0 V +24 mA Input transition rise or fall rate (t/V):. 0.0 to 10.0 ns/V Case operating temperature range (TC) . -55C to +125C _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. E

16、xtended operation at the maximum levels may degrade performance and affect reliability. 2/ Unless otherwise noted, all voltages are referenced to GND. 3/ The limits for the parameters specified herein shall apply over the full specified VCCrange and case temperature range of -55C to +125C. 4/ The in

17、put and output negative-voltage ratings may be exceeded provided that the input and output clamp-current ratings are observed. 5/ The value of VCCis provided in the recommended operating conditions table. 6/ The maximum package power dissipation is calculated using a junction temperature of 150C and

18、 a board trace length of 750 mils. 7/ Unused inputs must be held high or low to prevent them from floating. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00506 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-399

19、0 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents

20、 are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Componen

21、t Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Av

22、enue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a spe

23、cific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM pla

24、n shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outlines. The case outlines shall be in acc

25、ordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Ground bounce load circuit and wave

26、forms. The ground bounce load circuit and waveforms shall be as specified on figure 4. 3.2.6 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 5. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless other

27、wise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in ta

28、ble II. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00506 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM

29、2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on

30、the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF

31、-38535. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior t

32、o listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535

33、 shall be provided with each lot of microcircuits delivered to this drawing. . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-00506 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DS

34、CC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups Limits 3/ Unit Min Max High level output voltage 3006 VOHFor all inputs affecting output

35、under test VIN= VIH= 2.0 V or VIL= 0.8 V For all other inputs VIN= VCCor GND IOH= -100 A 2.7 V and 3.6 V 1, 2, 3 VCC-0.2 V IOH= -12 mA 2.7 V 1, 2, 3 2.2 3.0 V 2.4 IOH= -24 mA 3.0 V 1, 2, 3 2.2 Low level output voltage 3007 VOLFor all inputs affecting output under test VIN= VIH= 2.0 V or VIL= 0.8 V F

36、or all other inputs VIN= VCCor GND IOL= +100 A 2.7 V and 3.6 V 1, 2, 3 0.2 V IOL= +12 mA 2.7 V 1, 2, 3 0.4 IOL= +24 mA 3.0 V 1, 2, 3 0.55 Input current high 3010 IIHFor input under test, VIN= 5.5 V 3.6 V 1, 2, 3 +5.0 A Input current low 3009 IILFor input under test, VIN= GND 3.6 V 1, 2, 3 -5.0 A Qui

37、escent supply current 3005 ICCFor all inputs, VIN= VCCor GND IOUT= 0 A 3.6 V 1, 2, 3 10.0 A Quiescent supply current delta TTL input levels 3005 ICCFor input under test, VIN= VCC-0.6 V For all other inputs at VIN= VCCor GND 2.7 V and 3.6 V 1, 2, 3 500 A Input capacitance 3012 CINTC= +25C VIN= VCCor

38、GND, See 4.4.1c 3.3 V 4 8.0 pF Power dissipation capacitance CPD4/ See 4.4.1c TC= +25C, f = 10 MHz 3.3 V 4 20.0 pF Functional test 3014 5/ VIN= VIH= 2.0 V or VIL= 0.8 V Verify output VO, See 4.4.1b 2.0 V, 2.7 V and 3.6 V 7, 8 L H Low level ground bounce noise VOLP6/ VIH= 2.7 V, VIL= 0.0 V TC= +25C S

39、ee 4.4.1d See figure 4 3.0 V 4 1040 mV VOLV6/ 3.0 V 4 -780 High level VCCbounce noise VOHP6/ 3.0 V 4 750 VOHV6/ 3.0 V 4 -1080 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-005

40、06 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test and MIL-STD-883 test method 1/ Symbol Test conditions 2/ -55C TC +125C +2.0 V VCC +3.6 V unless otherwise specified VCCGroup A subgroups

41、 Limits 3/ Unit Min Max Propagation delay time, mA or mB to mY 3003 tPHL1, tPLH17/ CL= 50 pF minimum See figure 5 2.7 V 9,10,11 6.2 ns 3.0 V and 3.6 V 0.8 5.4 Propagation delay time, A/B to mY 3003 tPHL2, tPLH27/ 2.7 V 9,10,11 8.2 3.0 V and 3.6 V 0.8 7.0 Propagation delay time, G to mY 3003 tPHL3, t

42、PLH37/ 2.7 V 9,10,11 7.8 3.0 V and 3.6 V 0.8 6.5 1/ For tests not listed in the referenced MIL-STD-883, utilize the general test procedure of 883 under the conditions listed herein. 2/ Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the te

43、sts in table I herein. Output terminals not designated shall be high level logic, low level logic, or open, except for the ICCtest, where the output terminals shall be open. When performing the ICCtest, the current meter shall be placed in the circuit such that all current flows through the meter. T

44、he values to be used for VIHand VILshall be the VIHminimum and VILmaximum values listed in section 1.4 herein. 3/ For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and the direction of current flow, respectively; and the absolute v

45、alue of the magnitude, not the sign, is relative to the minimum and maximum limits, as applicable, listed herein. 4/ Power dissipation capacitance (CPD) determines both the power consumption (PD) and current consumption (IS). Where: PD= (CPD+ CL) (VCCx VCC)f + (ICCx VCC) IS= (CPD+ CL) VCCf + ICCf is

46、 the frequency of the input signal; and CLis the external output load capacitance. 5/ Tests shall be performed in sequence, attributes data only. Functional tests shall include the truth table and other logic patterns used for fault detection. The test vectors used to verify the truth table shall, a

47、t a minimum, test all functions of each input and output. All possible input to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 2 herein. Functional tests shall be performed in sequence as approved by the qualifying activity on qualified devices. A

48、llowable tolerances per MIL-STD-883 may be incorporated. For outputs, L VILmax, H VIHmin, where VILmax and VIHmin are listed in section 1.4 herein. 6/ This test is for qualification only. Ground and VCCbounce tests are performed on a non-switching (quiescent) output and are used to measure the magnitude of induced noise caused by other simultaneously switching outputs. The test is performed on a low noise bench test fixture. For the device under test, all outputs shall be loaded with 500 of load resistance and a minimum of 50 pF of load capacitance (see figu