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本文(DLA SMD-5962-01519 REV A-2006 MICROCIRCUIT DIGITAL-LINEAR DUAL CHANNEL 12-BIT ANALOG TO DIGITAL CONVERTER MULTICHIP MICROCIRCUIT MONOLITHIC SILICON《单片硅多微电路双通道数字线性微电路12位类比数位转换器》.pdf)为本站会员(wealthynice100)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-01519 REV A-2006 MICROCIRCUIT DIGITAL-LINEAR DUAL CHANNEL 12-BIT ANALOG TO DIGITAL CONVERTER MULTICHIP MICROCIRCUIT MONOLITHIC SILICON《单片硅多微电路双通道数字线性微电路12位类比数位转换器》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add low dose rate paragraph to 1.5 and Table I. Add paragraph 3.2.3. - ro. 06-11-06 R. MONNIN REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY DAN WONNELL DEFENSE SUPPLY CENT

2、ER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY RAYMOND MONNIN COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY RAYMOND MONNIN AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 01-09-14 MICROCIRCUIT, DIGITAL-LINEAR,

3、DUAL CHANNEL, 12-BIT, ANALOG TO DIGITAL CONVERTER, MULTICHIP MICROCIRCUIT, MONOLITHIC SILICON AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-01519 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E003-07 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

4、-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space appl

5、ication (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in

6、 the PIN. For device class T, the user is encouraged to review the manufacturers Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application. 1.2 PIN. The PIN is as shown in the following example: 5962 R 01519 01 T X A Federal stock cla

7、ss designator RHA designator (see 1.2.1) Device type (see 1.2.2)Device class designatorCase outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q, T and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with th

8、e appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device

9、 type Generic number Circuit function 01 AD10265 Multichip A/D converter, dual channel, 12-bit, 65 MSPS 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation M Vendor self-certi

10、fication to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q, V Certification and qualification to MIL-PRF-38535 T Certification and qualification to MIL-PRF-38535 with performance as specified in the device manufacturers

11、approved quality management plan. 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 68 Gullwing lead chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-3853

12、5 for device classes Q, T and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A

13、 SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Positive supply voltage (VCC) . 0 V dc to +7.0 V dc Negative supply voltage (VEE) 0 V dc to -7.0 V dc Analog input voltage -7.0 V dc to +7.0 V dc Analog input current -10 mA to +10 mA Digital input voltage (ENCODE) 0 V dc to +7.0 V dc E

14、NCODE, ENCODE differential voltage 4 V dc Digital output current . -40 mA to +40 mA Gain and offset adjust voltage range . -VEEto +VCCDigital input voltage range . +0.5 V to -VEEPower dissipation (PD) 2.4 W Thermal resistance, junction-to-case (JC) . 2.2C/W Thermal resistance, junction-to-ambient (J

15、A) 24.3C/W Junction temperature (TJ) . +175C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Positive supply voltage (VCC) . +4.75 V dc to +5.25 V dc Negative supply voltage (VEE) -5.20 V dc to +4.75 V dc Case operating temperature range (TC) . -25C to +125C 1.5

16、Radiation features Maximum total dose available (dose rate = 0.01 0.1 rad(Si) / s . 100 Krad (Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unles

17、s otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. M

18、IL-STD-1835 - Interface Standard Electronic Component Case Outlines. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space

19、 environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH

20、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies

21、of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this

22、drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes

23、Q, T and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M s

24、hall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q, T and V or MIL-

25、PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit sh

26、all be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance

27、 characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup ar

28、e defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “

29、5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q, T and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. T

30、he certification mark for device classes Q, T and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q, T and V, a certificate of compliance shall be

31、 required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). Th

32、e certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q, T and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535,

33、appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q, T and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleN

34、o reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/, 2/,

35、3/ -25C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Offset error OFFERROR 5/ 1, 2, 3 01 -10 +10 mV Gain error 4/ AVerror 1 01 -1.5 +1.5 % FS2, 3 -2.5 +2.5 Analog input resistance AIN1 5/ 1, 2, 3 01 99 101 AIN2 198 202 AIN3 396 404 Input capacitance CINTA= +2

36、5C, 5/, 6/ 4 01 7.0 pF Logic “1” voltage (analog) VIH5/, 7/, 8/ 1, 2, 3 01 2.0 5.0 V Logic “0” voltage (analog) VIL5/, 7/, 8/ 1, 2, 3 01 0 0.8 V Logic “1” current (analog) IIHVINH= 5 V, 5/, 7/, 8/ 1, 2, 3 01 800 A Logic “0” current (analog) IIHVINH= 0 V, 5/, 7/, 8/ 1, 2, 3 01 -400 A Logic “1” voltag

37、e (digital) VOH9/ 1, 2, 3 01 2.8 V Logic “0” voltage (digital) VOL10/ 1, 2, 3 01 0.5 V Supply currents ICCTOTAL1, 2, 3 01 520 mA ENCODE pulse width high ENCHI5/ 9, 10, 11 01 6.5 ns ENCODE pulse width low ENCLO5/ 9, 10, 11 01 6.5 ns Output delay tDD5/ 9, 10, 11 01 7.0 12.5 ns Maximum conversion rate

38、CNVMAX 11/ 4, 5, 6 01 65 MSPS Spurious free dynamic range 12/ SFDR Analog input at 1.24 MHz 4 01 75 dBFS 5, 6 74 Analog input at 17 MHz 4 71 5, 6 70 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT

39、DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. Test Symbol Conditions 1/, 2/ , 3/ -25C TC +125C unless otherwise specified Group A subgroups Devicetype Limi

40、ts Unit Min Max Signal-to-noise ratio 13/ SNR Analog input at 1.24 MHz 4 01 62 dBFS 5, 6 60.5 Analog input at 17 MHz 4 61 5, 6 60 Analog input at 32 MHz 4 61 5, 6 59.5 Signal-to-noise and distortion 14/ SINAD Analog input at 1.24 MHz 4 01 61 dBFS 5, 6 60 Analog input at 17 MHz 4 61 5, 6 59.5 Analog

41、input at 32 MHz 4 61 5, 6 59 Two tone intermodulation distortion rejection 15/ IMD F1, F2, at 7 dBFS 4, 5, 6 01 66 dBc Channel to channel isolation 5/, 16/ ISO TA= +25C 4 01 80 dB Power supply rejection ratio 5/ PSRR +4.75 V VCC +5.25 V 4, 5, 6 01 0.02 %FSR / %VCC-5.20 V VEE 4.75 V 0.02 %FSR / %VEE1

42、/ VCC(analog) = +5 V dc, VEE= -5 V dc, and VCC(digital) = +5 V dc, unless otherwise specified. 2/ Devices supplied to this drawing have been characterized through all levels M, D, L, and R of irradiation. However, this device is only tested at the “R” level. Pre and post irradiation values are ident

43、ical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters a

44、re guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition C. 4/ Gain test preformed on AIN1 over the specified input voltage range. 5/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed

45、 to the limits specified in table I for all lots not specifically tested. 6/ Input capacitance specifications combines die and package capacitance. 7/ ENCODE (pins 29, 51) driven single-ended source: ENCODE (pins 28, 52) bypassed to ground through 0.01 F capacitor. 8/ ENCODE (pins 29, 51) may also b

46、e driven differentially in conjunction with ENCODE (pins 28, 52). 9/ Outputs sourcing 10 A or less. 10/ Outputs sinking 10 A or less. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-01519 DEFENSE SUPPLY CENTE

47、R COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - continued. 11/ Maximum conversion rate allows for variation in ENCODE DUTY CYCLE of 50%, 5%. 12/ Analog input signal equals 1 dBFS; SFDR is the ratio of converter ful

48、l scale to worst spur. 13/ Analog input signal powers at 1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise (first 5 harmonics removed). ENCODE = 65 MSPS. 14/ Analog signal power at 1 dBFS; signal-to-noise ratio and distortion (SINAD) is the ratio of signal level to total noise plus harmonics. ENCODE = 65 MSPS. 15/ Both input zones at 7 dBFS; two tone intermodulation distortion (IMD) rejection is the ratio of either tone to the worst third order intermod product. F1 = 17.0 MHz 100 kHz, F2 = 18.0 M

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