DLA SMD-5962-04204 REV A-2012 MICROCIRCUIT HYBRID 2 0 AMP GATE DRIVE OPTOCOUPLER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Updated drawing paragraphs. -sld 12-01-17 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Steve Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/w

2、ww.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Raymond Monnin MICROCIRCUIT, HYBRID, 2.0 AMP GATE DRIVE OPTOCOUPLER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 04-08-13 AMSC N/A REVIS

3、ION LEVEL A SIZE A CAGE CODE 67268 5962-04204 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E122-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LE

4、VEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a

5、choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 04204 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (s

6、ee 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s)

7、identify the circuit function as follows: Device type Generic number Circuit function 01 HCPL-5121 Optocoupler, single channel, 2.0 Amp 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirem

8、ents of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space a

9、pplications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possib

10、le limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requiremen

11、ts of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the

12、 manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION L

13、EVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P CDIP2-T8 8 Dual-in-line X See figure 1 8 Dual-in-line Y See figure 1 8 Dual-in-line 1.2.5 Lead finish. The

14、 lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VCC-VEE) . 0 V dc to +35.0 V dc Average input current (IFAVG) . 25 mA 2/ Peak transient input current (IF PK), ( 5 V 1, 2, 3 01 9.0 mA Threshold input voltage High to low VFHLIO= 0 mA, VO 5 V

15、1, 2, 3 01 0.8 V Input forward voltage VFIF= 10 mA 1, 2, 3 01 1.2 1.8 V Input reverse breakdown voltage BVRIR= 10 A 1, 2, 3 01 5 V UVLO Threshold VUVLO+VO 5 V, IF= 10 mA 1, 2, 3 01 11.0 13.5 V VUVLO-9.5 12.0Input-output leakage current 5/ 6/ II-OVI-O = 1500 Vdc, RH 45 %, t = 5 seconds, TA= +25C 1 01

16、 1.0 A Propagation delay time to high output level 7/ tPLHRg = 10 , Cg = 10 nF, f = 10 kHz, Duty cycle = 50% 9, 10, 11 01 0.10 0.50 s Propagation delay time to low output level 7/ tPHL9, 10, 11 01 0.10 0.50 s Pulse width distortion PWD 9, 10, 11 01 0.30 s Propagation delay difference between any two

17、 parts 8/ PDD (tPHLtPLH) 9, 10, 11 01 -0.35 0.35 s See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6

18、 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output high level common mode transient immunity 9/, 10/, 12/ |CMH| IF= 10mA, VCM= 1000V, VCC= 30 V, TA

19、= +25C 9 01 10 kV/s Output low level common mode transient immunity 9/, 11/, 12/ |CML| VF= 0 V, VCM= 1000V, VCC= 30 V, TA= +25C 9 01 10 kV/s 1/ Maximum pulse width = 50 s, maximum duty cycle = 0.5%. 2/ Maximum pulse width = 10 s, maximum duty cycle = 0.2%. This value is intended to allow for compone

20、nt tolerances for designs with IOpeak minimum = 2.0 A. 3/ In this test VOHis measured with a dc load current. When driving capacitive loads VOHwill approach VCCas IOH approaches zero amps. 4/ Maximum pulse width = 1 ms, maximum duty cycle = 20%. 5/ This is a momentary withstand test, not an operatin

21、g condition. 6/ Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted together. 7/ This load condition approximates the gate load of a 1200 V/75 A IGBT. 8/ The difference between tPHLand tPLHbetween any two of the same devices under the same tes

22、t condition. 9/ Pins 1 and 4 need to be connected to LED common. 10/ Common mode transient immunity in the high state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in the high state (i.e., VO 15.0 V). 11/ Common mode transient immunity in the

23、 low state is the maximum tolerable |dVCM/dt| of the common mode pulse, VCM, to assure that the output will remain in the low state (i.e., VO 1.0 V). 12/ |CMH| and |CML| shall be tested as part of device initial characterization and after design or process changes. |CMH| and |CML| shall be guarantee

24、d to the limits specified in table 1 for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC F

25、ORM 2234 APR 97 Case outline X. Symbol Millimeters Inches Min Max Min MaxA 4.57 .180A1 1.40 1.65 .055 .065b 0.41 0.51 .016 .020c 0.18 0.33 .007 .013D 9.40 9.91 .370 .390e 2.29 2.79 .090 .110E 9.65 9.91 .380 .390E1 8.13 .320L 1.07 1.32 .042 .052S 0.89 1.27 .035 .050Case outline Y. Symbol Millimeters

26、InchesMin Max Min MaxA 4.32 .170A1 1.14 1.40 .045 .055b 0.41 0.51 .016 .020c 0.18 0.33 .007 .013D 9.40 9.91 .370 .390e 2.29 2.79 .090 .110E 8.13 .320eA 7.37 7.87 .290 .310Q 0.51 .020S 0.89 1.27 .035 .050NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was des

27、igned using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. Pin 1 is indicated by the ESD triangle(s) marked on top of the package. FIGURE 1. Case outline(s). Provided by IHSNot for ResaleNo reprodu

28、ction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outlines All Terminal number Terminal symbol 1 No connection 2 Anode3 Cathode

29、4 No connection 5 VEE 6 VO 7 VO8 VCC FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 9 DSCC FORM 22

30、34 APR 97 FIGURE 3. Switching time test circuit and waveform(s). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 10 DSCC FORM 2234

31、APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1 Final electrical parameters 1*, 2, 3, 9 Group A test requirements 1, 2, 3, 9*, 10, 11 Group C end-point electrical parameter

32、s 1, 2, 3 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA applies to subgroup 1. * See Note 12 of table 1. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 10

33、15 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs,

34、 outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except

35、 interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI)

36、. Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. Provided by IHSNot for Resal

37、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-04204 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 11 DSCC FORM 2234 APR 97 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-

38、38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made

39、 available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in accordance with

40、table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently

41、applicable to this drawing. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), desig

42、n applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated as specified

43、in MIL-PRF-38534. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination an

44、d distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-0547. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (

45、614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have agreed to this drawing. Provided by IHSNot for ResaleNo

46、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 12-01-17 Approved sources of supply for SMD 5962-04204 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions

47、. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated

48、 revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime maintains an online database of all current sources of supply at http:/www.landandmaritime.dla.mil/Programs/Smcr/. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-0420401HPC 5962-0420401HPA 50434 50434 HCPL-5121 HCPL-5121-200 5962-0420401HYA 5962-0420401HYC 50434 50434 HCPL-5121-100 HCPL-5121-