DLA SMD-5962-05220-2008 MICROCIRCUIT HYBRID LINEAR POSITIVE LOW DROPOUT ADJUSTABLE AND FIXED VOLTAGE REGULATOR.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHEET 15 16 17 18 19 20 REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/w

2、ww.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, LOW DROPOUT, ADJUSTABLE AND FIXED VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 08-06-09 AMSC N/A REVISION LEVEL SIZE A CAGE CO

3、DE 67268 5962-05220 SHEET 1 OF 20 DSCC FORM 2233 APR 97 5962-E417-07Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC F

4、ORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation

5、hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 R 05220 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2

6、.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit

7、 function as follows: Device type Generic number Circuit function 01 MSK 5900RH Radiation hardened, 4.0 A adjustable voltage regulator 02 MSK 5910RH Radiation hardened, 5.0 A adjustable voltage regulator 03 MSK 5921RH Radiation hardened, 5.0 A adjustable voltage regulator 04 MSK 5920-1.5RH Radiation

8、 hardened, 5.0 A, 1.5 V voltage regulator 05 MSK 5920-1.9RH Radiation hardened, 5.0 A, 1.9 V voltage regulator 06 MSK 5920-2.5RH Radiation hardened, 5.0 A, 2.5 V voltage regulator 07 MSK 5920-2.8RH Radiation hardened, 5.0 A, 2.8 V voltage regulator 08 MSK 5920-3.3RH Radiation hardened, 5.0 A, 3.3 V

9、voltage regulator 09 MSK 5920-5.0RH Radiation hardened, 5.0 A, 5.0 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certificati

10、on as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class le

11、vel. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specif

12、ied incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be spe

13、cified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. Thi

14、s product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.

15、4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style S See figure 1 12 Flat pack with gull wing leads T See figure 1 20 Flat pack with straight leads U See figure 1 20 Flat pack with gull wing leads X S

16、ee figure 1 5 TO-254 with tab, straight leads, glass sealed Y See figure 1 5 TO-254 with tab, leads formed up, glass sealed Z See figure 1 5 TO-254 with tab, leads formed down, glass sealed 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Su

17、pply voltage (VIN). +10.0 V dc Bias supply voltage (VBIAS) Device type 02, only. +10.0 V dc Output current: Device type 01 4.0 A 2/ Device types 02 through 09 5.0 A 2/ Junction temperature (TJ) +150C Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended ope

18、rating conditions. Supply voltage (VIN) Device type 01 +2.9 V dc to +7.5 V dc Device type 02 +2.0 V dc to +7.5 V dc Device types 03 through 09 +2.9 V dc to +6.5 V dc Bias supply voltage (VBIAS) Device type 02, only. +2.9 V dc to +7.5 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radia

19、tion features. Maximum total dose available: Device type 01 100 Krads (Si) 3/ 4/ 5/ Device types 02 through 09 100 Krads (Si) 3/ 4/ 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to

20、the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Stand

21、ard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Output current limit is de

22、pendent on the value of VIN- VOUT. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Do

23、se rate shall be in accordance with MIL-STD-883, method 1019, condition A. 4/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 5/ See figure 3. Provided by IHSNot for Resale

24、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Draw

25、ings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a co

26、nflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item

27、performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device

28、class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the d

29、evice for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal

30、connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are

31、 as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Mark

32、ing of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the devi

33、ce described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guarantee

34、d. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The

35、certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of micr

36、ocircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or f

37、unction as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical per

38、formance characteristics. Limits Test Symbol Conditions 1/ 2/ 3/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit 01 2.9 7.5 02 2.0 7.5 Input voltage range 4/ VIN10 mA IOUT 1.0 A 5/ 1,2,3 03-09 2.9 6.5 V Input bias voltage 4/ VIBVBIAS VIN1,2,3 02 2.9 7.5 V 10 mA IO

39、UT 1.0 A, VOUT= 1.5 V 1,2,3 01,02,03 1.225 1.305 Feedback voltage VFBM,D,P,L,R 1/ 1 01,02,03 1.215 1.315 V VIN= 7.5 V 01 20 IIN+ IBIAS, VBIAS= VIN= 7.5 V 02 20 Quiescent current IQVIN= 6.5 V 1,2,3 03-09 20 mA Bias current IBIASVBIAS= 7.5 V 1,2,3 02 4 mA 1 1.0 VIN= VOUT+ 1 V, IOUT= 1.0 A 2,3 04-09 2.

40、5 Output voltage tolerance 6/ VOUTTOL M,D,P,L,R 1/ 1 04-09 4.0 % IOUT= 10 mA, 2.9 V VIN 7.5 V, VOUT= 1.5 V 1,2,3 01,02 0.50 1 0.50 IOUT= 50 mA, VOUT+ 0.4 V VIN VOUT+ 1.3 V 2,3 03 2.5 1 0.50 Line regulation 6/ VRLINEIOUT= 50 mA, VOUT+ 0.4 V VIN VOUT+ 1.3 V 2,3 04-09 2.5 %VOUTSee footnotes at end of t

41、able. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

42、s - Continued. Limits Test Symbol Conditions 1/ 2/ 3/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit 10 mA IOUT 1.0 A, VOUT= 2.5 V 1,2,3 01,02 0.80 1 0.80 50 mA IOUT 3.0 A, VOUT= 2.5 V 2,3 03 2.5 1 0.80 Load regulation 6/ VRLOAD50 mA IOUT 3.0 A, VIN= VOUT+ 1 V 2,

43、3 04-09 2.5 %VOUT01 0.70 Delta FB = 1%, IOUT= 1.0 A 02 0.40 Delta FB = 1%, IOUT= 2.5 A 03 0.40 Dropout voltage 7/ VDODelta VOUT= 1%, IOUT= 2.5 A 1,2,3 04-09 0.40 V 2.9 V VIN 7.5 V, VOUT= 1.5 V 01,02 10 2.9 V VIN 6.5 V, VOUT= 1.5 V 03 10 Minimum output current 4/ IOUTMIN2.9 V VIN 6.5 V 1,2,3 04-09 10

44、 mA 01 1.5 6.8 VIN= 7.5 V 02 1.5 7.0 Output voltage range 4/ VOUTVIN= 6.5 V 1,2,3 03 1.5 6.0 V 1 1.5 2.0 VIN= 4.4 V, VOUT= 3.3 V 2,3 01 1.3 2.2 1 3.2 4.0 VIN= 2.5 V, VOUT= 1.5 V 2,3 02 3.0 VIN= 3.5 V, VOUT= 2.5 V 1,2,3 03 3.0 5.0 Output current limit 8/ IOUTVIN= VOUT+ 1 V Over-current latch up 1,2,3

45、 04-09 3.0 5.0 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-05220 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 TABL

46、E I. Electrical performance characteristics - Continued. Limits Test Symbol Conditions 1/ 2/ 3/ -55C TC +125C unless otherwise specified Group A subgroups Device type Min Max Unit VOUT 0.2 V (OFF) 1.0 1.6 Shutdown threshold VSTVOUT= Nominal (ON) 1,2,3 All 1.0 1.6 V Shutdown hysteresis VSH Difference

47、 between voltage threshold of VSDI(ON) and VSDI(OFF) 1,2,3 01,02 0.2 V 1/ Device types 01 through 09 have been characterized through all levels M, D, P, L, R of irradiation. However, device types 01 through 09 are tested at the F level. Pre and post irradiation values are identical unless otherwise

48、specified in table I. When performing post irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified: Device types 01 and 03; VIN= 5.0 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. Device type 02; VBIAS= VIN= 5.0 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. Device types 04 through 09; VIN= VOUT+ 1 V, VSHUTDOWN= 0 V, and IOUT= 10 mA. 3/ These parts may be dose rate sensitive in a space environment and may demonst