DLA SMD-5962-06223 REV A-2012 MICROCIRCUIT HYBRID LINEAR 5 VOLT DUAL CHANNEL DC-DC CONVERTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I; For the power dissipation (PD) test, combined subgroup 1 with subgroups 2 and 3 for pre-irradiation testing with the maximum limit of 28 W. Paragraph 4.3.5 table for the single event upset survival level (LET) changed the units from “MeV

2、“ to “MeV-cm2/mg“. Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 12-03-01 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME COLU

3、MBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, LINEAR, 5 VOLT, DUAL CHANNEL, DC-DC CONVERTER AND AGENCIES OF THE DEPARTMENT OF DEFENSE

4、DRAWING APPROVAL DATE 08-09-09 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-06223 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E228-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MA

5、RITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or

6、Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 06223 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see

7、1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA devic

8、e. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SMRT2805D DC-DC converter, 30 W, 5 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance lev

9、el. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available.

10、 This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screenin

11、g and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G)

12、 with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified qual

13、ity class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MAR

14、ITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Flange mount 1.2.5 Lead finish. The lead finish

15、shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) -0.5 V dc to +80 V dc Power dissipation (PD): Device type 01 (non-RHA) 28 W Device type 01 (RHA levels P, R, and F) 30 W Output power . 30 W Lead soldering temperature (10 seconds) . +300 C Storage tem

16、perature range -65 C to +150 C 1.4 Recommended operating conditions. Input voltage range (VIN) +19 V dc to +56 V dc Case operating temperature range (TC) . -55 C to +125 C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rads(Si)/s): Device type 01 (RHA levels P, R, and F) . 300 k

17、rads(Si) 2/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation

18、or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOK

19、S MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-

20、5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stre

21、sses above the absolute maximum ratings may cause permanent damage to the device. Input voltage transients between 56 V to 80 V are allowed for no more than 120 milliseconds. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sens

22、itive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rads(Si)/s.Provided by IHSNot for ResaleNo reproduction or ne

23、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E,

24、G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or

25、 optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Desig

26、n, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as

27、specified on figure 2. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless o

28、therwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

29、 for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the genera

30、l performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of a

31、ll parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate o

32、f compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of c

33、onformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device man

34、ufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1

35、) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and

36、 power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical p

37、arameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET

38、 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTVOUTIOUT= 3.0 A 1 01 4.95 5.05 V 2,3 4.

39、90 5.10 P,R,F 1,2,3 4.83 5.18 Output current IOUTVIN= 19 V dc, 28 V dc, and 1,2,3 01 3.0 A 50 V dc P,R,F 1,2,3 3.0 Output ripple voltage VOUTVRIPIOUT= 3. A, B.W. 20 MHz 1 01 180 mVp-p 2,3 200 P,R,F 1,2,3 300 Line regulation VOUTVRLINEIOUT= 3.0 A, VIN= 19 V dc to 50 V dc 1,2,3 01 30 mV P,R,F 1,2,3 60

40、 Load regulation VOUTVRLOADIOUT= 0 to 3.0 A, both outputs changed 1,2,3 01 40 mV simultaneously P,R,F 1,2,3 60 Input current IINIOUT= 0, Inhibit (pin) 3 = 0 V dc (tied to pin 2) 1,2,3 01 50 mA P,R,F 1,2,3 60 IOUT= 0, Inhibit (pin) 3 = 1,2,3 110 open P,R,F 1,2,3 120 Input ripple current 3/ IRIPIOUT=

41、3.0 A, 1,2,3 01 50 mAp-p B. W. 20 MHz P,R,F 1,2,3 60 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET

42、 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Efficiency Eff IOUT= 3.0 A 1 01 67 % 2,3 66 P,

43、R,F 1,2,3 63 Isolation ISO Input to either output or to sync return, or any pin to case at 500 V dc, 1 01 100 MW TC= +25 C P,R,F 1 100 Capacitive load 4/ 5/ VOUTCLNo affect on dc 4 01 5000 mF performance, TC= +25 C P,R,F 4 5000 Power dissipation PDShort circuit on both outputs simultaneously: PD= PI

44、N- total POUT 1,2,3 01 28 W P,R,F 1,2,3 30 Switching frequency FSIOUT= 3.0A 4,5,6 01 270 330 kHz P,R,F 4,5,6 270 330 External sync range 6/ FSYNCIOUT= 3.0 A, TTL level to 4,5,6 01 270 330 kHz pin 4 P,R,F 4,5,6 270 330 Output response to step load transient 7/ VOUTVOTLOAD50 percent load to/from 100 p

45、ercent load; balanced4,5,6 01 450 mV pk loads on each output P,R,F 4,5,6 700 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06223 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-399

46、0 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Recovery time from ste

47、p load transient 7/ 8/ VOUTTTLOAD50 percent load to/from 100 percent load; balanced4,5,6 01 3 ms loads on each output P,R,F 4,5,6 4 Output response to step line transient 5/ 9/ VOUTVOTLINEIOUT= 3.0 A, Input step 19 V dc to/from 50 V dc 4,5,6 01 500 mV pk P,R,F 4,5,6 1000 Recovery time from step line

48、 transient 5/ 8/ 9/ VOUTTTLINEIOUT= 3.0 A, Input step 19 V dc to/from 50 V dc 4,5,6 01 4 ms P,R,F 4,5,6 5 Start up overshoot VOUTVtonOSIOUT= 3.0 A, VIN= 0 to 4,5,6 01 50 mV pk 28 Vdc P,R,F 4,5,6 100 Start up delay 10/ VOUTTonDIOUT= 3.0 A, VIN= 0 to 28 V dc 4 01 20 ms 5,6 25 P,R,F 4,5,6 30 Load fault recovery 5/ 8/ VOUTTrLFIOUT= from S.C. to 3.0 A 4,5,6 01 25 ms P,R,F 4,5,6 30 1/ Post irradiation testing shall be in accordance with paragraph 4.3.5 herein. 2/ These p