DLA SMD-5962-06226 REV C-2012 MICROCIRCUIT HYBRID LINEAR +5 VOLT AND 5 V TRIPLE CHANNEL DC-DC CONVERTER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Table I, capacitive load test, units column, correct pF to mF. -gz 07-08-23 Robert M. Heber B Table I, load regulation test, change the (-aux) non-RHA and the (aux) RHA maximum limit from 60 mV to 500 mV. -gz 07-10-23 Robert M. Heber C Paragraph

2、1.3; changed the power dissipation (PD) from 26 W to 25 W. Table I; For the power dissipation (PD) test, combined subgroup 1 with subgroups 2 and 3 for pre-irradiation testing with the maximum limit of 25 W. Paragraph 4.3.5 table for the single event upset survival level (LET) changed the units from

3、 “MeV“ to “MeV-cm2/mg“. Added footnote 1 to table II, under group C end-point electricals. Updated drawing paragraphs. -sld 12-03-01 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV C C C C C C C C C C C C C OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Gary Zahn DLA LAND AN

4、D MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert M. Heber MICROCIRCUIT, HYBRID, LINEAR, +5 VOLT AND 15 V, TRIPLE CHANNEL, DC-DC CONVERTER AND AGENCIES OF

5、 THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 07-07-13 AMSC N/A REVISION LEVEL C SIZE A CAGE CODE 67268 5962-06226 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E231-12Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

6、 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are

7、 reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 06226 01 H X X Federal RHA Device Device Case Lead stock class designator type class outli

8、ne finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-)

9、 indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 SMRT28515T DC-DC converter, 30 W, +5 V and 15 V outputs 1.2.3 Device class designator. This device class designator shall be a single letter

10、identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K

11、 Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class.

12、 This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon

13、one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system perfo

14、rmance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWI

15、NG SIZE A 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 12 Flange mount

16、 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage range (VIN) 2/ -0.5 V dc to +80 V dc Power dissipation (PD) . 25 W Output power . 30 W Lead soldering temperature (10 seconds) . +300 C Storage temperature range -65 C to +150 C

17、 1.4 Recommended operating conditions. Input voltage range (VIN) +19 V dc to +56 V dc Case operating temperature range (TC) . -55 C to +125 C 1.5 Radiation features. Maximum total dose available (dose rate = 9 rads(Si)/s): Device type 01 (RHA levels P, L, and F) 300 krads(Si) 2/ 2. APPLICABLE DOCUME

18、NTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFEN

19、SE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standar

20、d Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence.

21、In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum

22、ratings may cause permanent damage to the device. Input voltage transients between 56 V to 80 V are allowed for no more than 120 milliseconds. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate sensitive in a space environment and

23、 may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition C, tested at 9 rads(Si)/s. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

24、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordan

25、ce with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspecti

26、ons herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical di

27、mensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Rad

28、iation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the e

29、lectrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined i

30、n table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MI

31、L-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, a

32、nd for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required f

33、rom a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of con

34、formance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (Q

35、M) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D.

36、The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicabl

37、e, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in

38、are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 5 DSCC FORM 2234 APR 97 TABLE I.

39、 Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output voltage VOUTIOUT= 3 A (main) 1 01 4.95 5.05 V 2,3 4.92 5.08 P,R,F 1,2,3 4.88 5.12 IO

40、UT= 500 mA (+aux) 1 14.85 15.15 2,3 14.77 15.23 P,R,F 1,2,3 14.70 15.30 IOUT= 500 mA (-aux) 1 14.77 15.23 2,3 14.70 15.30 P,R,F 1,2,3 14.60 15.40 Output current 3/ IOUTVIN= 19 V dc, 28 V dc, and 50 V dc (main) 1,2,3 01 3 A P,R,F 1,2,3 3 VIN= 19 V dc, 28 V dc, and 50 V dc (aux) 1,2,3 750 mA P,R,F 1,2

41、,3 750 Output ripple voltage VRIPB.W. 20 MHz, IOUT= 3 A (main) 1 01 180 mVp-p 2,3 200 P,R,F 1,2,3 200 B.W. 20 MHz, IOUT= 500 mA (aux) 1 150 2,3 200 P,R,F 1,2,3 200 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDAR

42、D MICROCIRCUIT DRAWING SIZE A 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no external sync, CL= 0 unless otherw

43、ise specified Group A subgroups Device type Limits Unit Min Max Line regulation VRLINEVIN= 19 V dc to/from 50 V dc, IOUT= 3 A (main) 1,2,3 01 25 mV P,R,F 1,2,3 50 VIN= 19 V dc to/from (+aux) 50 V dc, IOUT= 500 mA (-aux) 1,2,3 25 1,2,3 35 P,R,F 1,2,3 70 Load regulation VRLOADIOUT= 0 to 3 A (main) 1,2

44、,3 01 50 mV P,R,F 1,2,3 50 IOUT= 0 to 500 mA, (+aux) both outputs changed simultaneously (-aux) 1,2,3 50 1,2,3 500 P,R,F 1,2,3 500 Input current IINAll IOUT= 0, Inhibit (pin) 3 = 0 V dc (tied to pin 2) 1,2,3 01 50 mA P,R,F 1,2,3 50 All IOUT= 0, Inhibit (pin) 3 = open 1,2,3 110 P,R,F 1,2,3 110 Input

45、ripple current 4/ IRIPIOUT= 3 A (main), IOUT= 500 mA (aux), B. W. 20 MHz 1,2 01 100 mAp-p 3 150 P,R,F 1,2,3 150 Efficiency Eff IOUT= 3 A, (main) IOUT= 500 mA (aux) 1 01 72 % 2,3 70 P,R,F 1,2,3 70 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted with

46、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06226 DLA LAND AND MARITME COLUMBUS, OHIO 43218-3990 REVISION LEVEL C SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55 C TC +125 C VIN= 28 V dc 0.5 V dc no ex

47、ternal sync, CL= 0 unless otherwise specified Group A subgroups Device type Limits Unit Min Max Isolation ISO Input to either output or to sync return, or any pin to case at 500 V dc 1 01 100 MW TC= +25 C P,R,F 1 100 Capacitive load 5/ 6/ CLNo affect on dc (main) 4 01 5000 mF performance TC= +25 C P

48、,R,F 4 5000 No affect on dc (aux) 4 1000 performance TC= +25 C P,R,F 4 1000 Power dissipation PDShort circuit on main, PD= PIN- total POUT 1,2,3 01 25 W P,R,F 1,2,3 25 Short circuit on both aux outputs simultaneously, PD= PIN- total POUT1,2,3 25 P,R,F 1,2,3 25 Switching frequency 7/ FSIOUT= 3 A (main), IOUT= 500 mA (aux) 4 01 270 330 kHz 5,6 270 330 P,R,F 4,5,6 270 330 External sync range 7/ FSYNCIOUT= 3 A (main), IOUT= 500 mA (aux), 4,5,6 01 270 330 kHz TTL leve