DLA SMD-5962-06235 REV A-2013 MICROCIRCUIT LINEAR SINGLE RAIL-TO-RAIL OPERATIONAL AMPLIFIERS MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Delete references to device class M requirements. Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 13-02-04 C. SAFFLE REV SHEET REV SHEET REV STATUS REV A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY

2、 RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY ROBERT M. HEBER MICROCIRCUIT, LINEAR, SI

3、NGLE RAIL-TO-RAIL OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON DRAWING APPROVAL DATE 07-04-12 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-06235 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E055-13 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ST

4、ANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device cla

5、ss V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 06235 01 Q P C Fede

6、ral stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are ma

7、rked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 EL8102 Single rail-to-rail operational amplifiers 02 EL8103 Single rail-to-rail operation

8、al amplifiers 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as des

9、ignated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. Provided by IHSNot for ResaleNo reproduction or networking permi

10、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Supply voltage from +VSto VS. 5.5 V Input voltage . +VS+0.3 V to -VS-0.3 V Differential in

11、put voltage . 2 V Continuous output current . 20 mA Power dissipation (PD) 60.5 mW Storage temperature range . -65C to +150C Operating junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-883 Thermal resistance, junction-to-ambient (JA) 135C/W Electrostatic disch

12、arge (ESD): Human body model (HBM) 3500 V Machine model (MM) . 350 V 1.4 Recommended operating conditions. Supply voltage from +VSto -VS5 V Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifica

13、tion, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specif

14、ication for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (

15、Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references

16、 cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. _ 1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the m

17、aximum levels may degrade performance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR

18、97 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit

19、, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein. 3.2.2 T

20、erminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in tab

21、le I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN l

22、isted in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designato

23、r shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate of compliance. For device classes Q and

24、V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall

25、 affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with each lot of microcircuits delivered to t

26、his drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristic

27、s. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input characteristics section Offset voltage VOS1,2,3 01,02 -9 +9 mV Input bias current IIBVIN= 0 V 1,2,3 01,02 -13 A Input offset current IOSVIN= 0 V 1,2,3 01,02 1.6 A Common mode

28、 rejection ratio CMRR VS= -2 V to +2 V, +VS= +2.5 V, -VS= -2.5 V 1,2,3 01,02 70 dB Open loop gain AVOL VOUT= +1.5 V to +3.5 V, RL= 1 k to GND 1,2,3 01,02 75 dB Output characteristics section Positive output voltage swing VOPRL= 1 k 1,2,3 01,02 4.7 V RL= 150 4.55 Negative output voltage swing VONRL=

29、1 k 1,2,3 01,02 60 mV RL= 150 150 Short circuit current ISC(source) RL= 10 1,2,3 01,02 70 mA Short circuit current ISC(sink) RL= 10 1,2,3 01,02 120 mA Power supply section Power supply rejection ratio PSRR +VS= +2 V to +3 V, +VS= +2.5 V, -VS= -2.5 V 1,2,3 01,02 65 dB Supply current - enabled IS-ON1,

30、2,3 01,02 11 mA Supply current - disabled IS-OFF1,2,3 01,02 76 A Enable section ENABLEpin input for current high IIH-ENBCE = 2 V 1,2,3 01 0 5 A ENABLEpin input for current low IIL-ENBCE = 0.8 V 1,2,3 01 -1 1 A 1/ Unless otherwise specified, +VS= 5 V, -VS= GND, VCM= 2.5 V, RLto 2.5 V, gain (AV) = 1.

31、Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 Device types 01 02 Case outline P Terminal numbers Terminal

32、 symbol 1 NC NC 2 -INPUT -INPUT 3 +INPUT +INPUT 4 -VS-VS5 NC NC 6 OUTPUT OUTPUT 7 +VS+VS8 ENABLE NC Terminal symbol Description NC Not connected -INPUT Inverting input +INPUT Non-inverting input -VSNegative power supply OUTPUT Amplifier output +VSPositive power supply ENABLE Enable and disable input

33、 FIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampli

34、ng and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Sc

35、reening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test te

36、mperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-3853

37、5 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters

38、shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

39、accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38

40、535 including groups A, B, C, D, and E inspections, and as specified herein. 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspectio

41、n end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordan

42、ce with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturers TRB in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, bias

43、es, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein. 4.4.4 Group E inspection. Group E inspection is required only fo

44、r parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table II herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 f

45、or the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA= +25C 5C, after exposure, to the subgroups specified in table II herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without lice

46、nse from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06235 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-PRF-38535, table III) Device class Q Device clas

47、s V Interim electrical parameters (see 4.2) - - Final electrical parameters (see 4.2) 1,2,3 1/ 1,2,3 1/ Group A test requirements (see 4.4) 1,2,3 1,2,3 Group C end-point electrical parameters (see 4.4) 1,2,3 1,2,3 Group D end-point electrical parameters (see 4.4) 1 1 Group E end-point electrical par

48、ameters (see 4.4) - - 1/ PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor prepared specifi