1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil POST OFFICE BOX 3990 COLUMBUS, OHIO 43218-3990 http:/www.dscc.
2、dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Joseph D. Rodenbeck MICROCIRCUIT, HYBRID, ANALOG SWITCH, QUAD CHANNEL AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 07-02-20 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-06252 SHEET 1 OF 10 DSCC FORM 22
3、33 APR 97 5962-E581-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This draw
4、ing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in th
5、e PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 06252 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness
6、 assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic num
7、ber Circuit function 01 MSK 1692H Analog switch with single drain, quad channel 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as w
8、ell as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. Th
9、is level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified inc
10、oming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified i
11、n the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This produc
12、t may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case o
13、utline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 14 Ceramic flat pack with bottom brazed leads 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum
14、ratings. 1/ Voltage differential, VCC- VEE. 33 V dc Drain voltage 33 V dc Source voltage. 33 V dc Drain source differential voltage VD- VS22 V dc Source drain differential voltage VS- VD22 V dc Input voltage 6 V dc Current (any terminal) 30 mA Power dissipation at TC= +25C, (channel on) 145 mW Power
15、 dissipation at TC= +25C, (channel off) 6 mW Power dissipation at TC= +70C 2/. 750 mW Junction temperature (TJ) +150C Thermal resistance, junction to case (JC), TC= +25C . 15C/W Lead temperature (soldering, 10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating condition
16、s. Positive supply voltage (VCC) . +10 V dc Negative supply voltage (VEE) -20 V dc Reference voltage (VR) 0 V dc Case operating temperature range (TC). -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks
17、form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS
18、MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available o
19、nline at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited h
20、erein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum le
21、vels may degrade performance and affect reliability. 2/ Derated above 70C at 10 mW/C (JA= 100C/W). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-399
22、0 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as des
23、ignated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable dev
24、ice class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3
25、.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Timing waveform and test circuit. The timing waveform and test circuit shall be as specified on figure 3. 3.3
26、 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subg
27、roups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may al
28、so be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed her
29、ein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate
30、 of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Cer
31、tificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in t
32、he device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MI
33、L-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and powe
34、r dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TCas specified in the approved manufacturers QM plan. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to
35、burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234
36、 APR 97 TABLE I. Electrical performance characteristics. Limits Test Symbol Conditions -55C TC +125C VR= 0 V dc, VCC= +10 V dc, VEE= -20 V dc unless otherwise specified Group A subgroups Device type Min Max Unit 1 10 Input off current IINH VIN= 5 V dc, TC= +25C and +125C 2 01 20 A Input on current I
37、INL VIN= 0 V dc 1,2,3 01 -0.5 mA 1,3 150 VD= 10 V dc, IS= -1 mA dc, VIN= 0.8 V dc 2 250 1,3 200 VD= 0 V dc, IS= -1 mA dc, VIN= 0.8 V dc 2 350 1,3 450 Switch on resistance rDS(ON) VD= -10 V dc, IS= -1 mA dc, VIN= 0.8 V dc 2 01 600 1 4 Switch drain leakage current, (switch on, source open) IDLVD= 10 V
38、 dc, VS= open, VIN= 0.8 V dc, TC= +25C and +125C 2 01 4000 nA dc 1 -4 Switch drain leakage current, (switch off) IDHVD= -10 V dc, VS= +10 V dc, VIN= 2.4 V dc, TC= +25C and +125C 2 01 -4000 nA dc 1 -1 Switch source leakage current ISHVD= +10 V dc, VS= -10 V dc, VIN= 2.4 V dc, TC= +25C and +125C 2 01
39、-1000 nA dc ICCLSwitch on one channel, VIN= 0 V, TC= +25C 1 2 Positive supply voltage drain current ICCHAll channels off, VIN= 5 V, TC= +25C 1 01 2 mA dc IEELSwitch on one channel, VIN= 0 V, TC= +25C 1 -0.5 Negative supply voltage drain current IEEHAll channels off, VIN= 5 V, TC= +25C 1 01 -0.5 mA d
40、c Turn on time tONSee figure 3, TC= +25C 9 01 0.3 s Turn off time tOFFSee figure 3, TC= +25C 9 01 0.75 s Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 432
41、18-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 Case outline X. Symbol Inches Millimeters Min Max Min Max A - .089 - 2.26 b .015 .019 0.38 0.48 c .004 .007 0.10 0.18 D .382 .399 9.70 10.13 D1 .295 .305 7.49 7.75 E .262 .278 6.65 7.06 E1 .750 - 19.05 - e .050 TYP 1.27 TYP L1/L2 .250 - 6.35 - Q .
42、006 .040 0.15 1.02 S1 .040 REF 1.02 REF NOTES: 1. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take prec
43、edence. 2. Pin 1 is also indicated by an equilateral triangle. 3. Including braze material. 4. Pin numbers are for reference only. FIGURE 1. Case outline(s).Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-062
44、52 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 S3 S4 D NC VEEIN4 IN3 IN2 IN1 VL VR VCCS1 S2 NOTE: NC is no connect. FIGURE 2. Terminal connections.
45、 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Timing waveform and test circuit. Provide
46、d by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-06252 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test
47、requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3, 9 Group A test requirements 1, 2, 3, 9 Group C end-point electrical parameters 1, 9 End-point electrical parameters for Radiation Hardness Assurance (RH
48、A) devices Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in tabl
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