DLA SMD-5962-07232-2012 MICROCIRCUIT LINEAR SINGLE HIGH SPEED CURRENT FEEDBACK OPERATIONAL AMPLIFIER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 15 16 17 REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY RICK OFFICER DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAW

2、ING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY RAJESH PITHADIA APPROVED BY CHARLES F. SAFFLE MICROCIRCUIT, LINEAR, SINGLE, HIGH SPEED, CURRENT FEEDBACK, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 12-07-03 AMSC N/A REVISION LEVEL

3、SIZE A CAGE CODE 67268 5962-07232 SHEET 1 OF 17 DSCC FORM 2233 APR 97 5962-E274-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2

4、DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying N

5、umber (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 F 07232 01 V X C Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outl

6、ine (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The devi

7、ce type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 RHF350 Radiation hardened, single, high speed, current feedback, operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance l

8、evel as follows: Device class Device requirements documentation Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 8 Flat pac

9、k 1/ 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V. . _ 1/ Al2O3ceramic header with metalized bottom side and pullback of 0.01 inch x 0.02 inch. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

10、 MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 2/ Supply voltage: Single supply mode . VCCwith respect to GND = 6 V Dual supply voltage . +VCC= +3 V Input voltage range (VIN) 2.5 V Dif

11、ferential input voltage (VID) . 0.5 V 3/ Power dissipation (PD) at TA= +25C for TJ= 150C 830 mW 4/ Maximum junction temperature (TJ) +150C Lead temperature (soldering, 10 seconds) +260C 5/ Storage temperature range . -65C to +150C Thermal resistance, junction-to-case (JC) . 22C/W Thermal resistance,

12、 junction-to-ambient (JA) 150C/W 1.4 Recommended operating conditions. Supply voltage (VCC) 4.5 V to 5.5 V Common mode input voltage range (VICM) -VCC+ 1.5 V to +VCC 1.5 V Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 30

13、0 rads(Si)/s) 300 krads(Si) 6/ Maximum total dose available (dose rate 10 mrads(Si)/s) . 300 krads(Si) 6/ The manufacturer supplying RHA device type 01 on this drawing has performed characterization test to demonstrate that the parts do not exhibit enhanced low dose rate sensitivity (ELDRS) in accor

14、dance with MIL-STD-883, method 1019, paragraph 3.13.1.1. Therefore these parts may be considered ELDRS free at a level of 300 krads(Si). _ 2/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affe

15、ct reliability. 3/ Differential voltages are the non-inverting input terminal with respect to the inverting input terminal. 4/ Short circuits can cause excessive heating. Destructive dissipation can result from short circuit on amplifiers. 5/ Distance of not less than 1.5 mm from the device body and

16、 the same lead shall not be resoldered until 3 minutes have elapsed. 6/ This part has been tested and does not demonstrate low dose rate sensitivity at 300 krads(Si). For high dose rate, the radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-88

17、3, method 1019, condition A. For low dose rate, the radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MIC

18、ROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the ex

19、tent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Meth

20、od Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.

21、mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in

22、 this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modified in the d

23、evice manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.1.1 Microcircuit die. For the requirements of microcircuit die, see appendix A to this document. 3.2 Design, construction, and physical dimensions. The

24、 design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figur

25、e 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon reque

26、st. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 E

27、lectrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

28、SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C Group A subgroups Device type Limits Unit +VCC= +2.5 V, -VCC= -2.5 V unless otherwise specified Min

29、Max Input offset voltage VIO1,2,3 01 -4 4 mV Input bias current +IIB1,2,3 01 35 A -IIB1 20 2,3 25 Common mode rejection ratio CMRR VIC= 1 V 1 01 54 dB 2,3 50 Supply voltage rejection ratio SVRR VCC= 3.5 V to 5 V 1 01 68 dB 2,3 55 Supply current ICCNo load 1,2,3 01 4.9 mA Transimpedance ROLVOUT= 1 V,

30、 RL= 100 1 01 170 k 2,3 150 Output sink current ISINKOutput to GND 1,2,3 01 135 mA Output source current ISOURCEOutput to GND 1,2,3 01 -140 mA Low level output voltage VOLRL= 100 1 01 -1.44 V 2,3 -1.3 High level output voltage VOHRL= 100 1 01 1.44 V 2,3 1.3 -3 dB bandwidth BW RL= 100 , AV= -2 4,5,6

31、01 250 MHz Slew rate 2/ +SR VOUT= 2 VPP, AV= +2, 4,5,6 01 700 V/s -SR RL= 100 700 1/ RHA devices supplied to this drawing have been characterized through all levels M, D, P, L, R, and F of irradiation. However, this device is only tested at the “F” level for high and low dose rates. Pre and post irr

32、adiation values are identical unless otherwise specified in table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. This part has been tested and does not demonstrate low dose rate sensitivity at 300 krads(Si). The radiation end points limits for the noted para

33、meters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition A for high dose rate and condition D for low dose rate. 2/ Controlled via design or process and is not directly tested. Characterized on initial design release and upon design or process changes which affect th

34、is parameter. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 Case X FIGURE 1. Case outline. Provided by IHSN

35、ot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 Case X Continued. Symbol Dimensions Inches Millimeters Min Max Min Max A .088

36、 .104 2.24 2.64 b .015 .019 0.38 0.48 c .004 .006 0.10 0.16 D .250 .260 6.35 6.61 E .250 .260 6.35 6.61 E2 .170 .180 4.32 4.58 E3 .035 .045 0.88 1.14 e .050 BSC 1.27 BSC L .118 BSC 3.00 BSC Q .026 .036 0.66 0.92 S1 .036 .052 0.92 1.32 n 8 8 NOTES: 1. The US government preferred system of measurement

37、 is the metric SI system. However, since this item was originally designed using inch-pound units of measurement, in the event of conflict between the metric and inch pound units, the inch pound units shall take precedence. 2. n is the number of terminal numbers. FIGURE 1. Case outline Continued. Pr

38、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 Device type 01 Case outline X Terminal number Terminal symbol 1

39、 NC 2 -INPUT 3 +INPUT 4 -VCC5 NC 6 OUTPUT 7 +VCC8 NC FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET

40、9 DSCC FORM 2234 APR 97 FIGURE 3. Block diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-07232 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 10 DSCC FORM 2234 APR 97 3.5 Marking

41、. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA pro

42、duct using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. 3.6 Certificate

43、 of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approve

44、d source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall be provided with

45、 each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the

46、 QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. 4.2.1 Additional criteria for

47、device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturers QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the de

48、vice manufacturers Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table IIA herein. c. Additional screening for devi