DLA SMD-5962-09204-2009 MICROCIRCUIT HYBRID LINEAR 32 CHANNEL ANALOG MULTIPLEXER.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET 15 16 17 REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve Duncan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.ds

2、cc.dla.mil/ THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Joseph D. Rodenbeck MICROCIRCUIT, HYBRID, LINEAR, 32 CHANNEL, ANALOG MULTIPLEXER AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 09-05-08 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-09204 SHEET 1 OF

3、17 DSCC FORM 2233 APR 97 5962-E019-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Sc

4、ope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are r

5、eflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 09204 01 K X C Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radi

6、ation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device ty

7、pe Generic number Circuit function 01 ACT8518 32 channel analog multiplexer, high impedance analog input with ESD protection 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL

8、-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications

9、. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited

10、temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that

11、 class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufactu

12、rers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LE

13、VEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 96 Ceramic quad flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38

14、534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage between +VEEand GND . +20 V dc Negative supply voltage between -VEEand GND -20 V dc VREFto GND . +7.5 V dc Digital input overvoltage range: VEN(pins 5 and 92) . ( GND - 0.5)V VA(pins 1, 3, 93, and 95) . ( GND - 0.5)V VB(pins 2, 4, 94, and

15、 96) . ( GND - 0.5)V Analog input overvoltage range . -18 V dc VS +18 V dc Power dissipation (PD) . 45 mW Junction temperature (TJ) +150C Thermal resistance junction-to-case (JC) 2/ 10C/W Storage temperature -55C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating condi

16、tions. 3/ Positive supply voltage (+VEE) 4/ . +15 V dc Negative supply voltage (-VEE) 4/ -15 V dc VREF4/ +5 V dc Logic low level voltage (VAL) +0.8 V dc Logic high level voltage (VAH) +4.0 V dc Case operating temperature range (TC) -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification,

17、standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 -

18、Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended o

19、peration at the maximum levels may degrade performance and affect reliability. 2/ Based on the maximum power dissipation spread over the multiplexer die. 3/ The devices cannot be operated with analog inputs from -15 V up to -5 V. 4/ Supply voltages must be applied in the following sequence -VEE, VRE

20、F,followed by +VEE.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE HANDBOOKS M

21、IL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094

22、.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREM

23、ENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM

24、) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan sh

25、all not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in acco

26、rdance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Switching waveform(s). The switching waveform(s) shall be as specified on figure 4. 3.2.5 B

27、lock diagram. The block diagram shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical

28、 test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed i

29、n 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conf

30、ormance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made avail

31、able to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product m

32、eets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted wi

33、thout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TC +125C unless otherwise specified G

34、roup A subgroups Device type Limits Unit Min Max Supply currents +IEE VEN(0-31)= VA(0-3)A= VA(0-3)B= 0 1,2,3 01 0 1 mA -IEEVEN(0-31)= VA(0-3)A= VA(0-3)B= 0 1,2,3 01 -1 0 mA +ISBY VEN(0-31)= 4 V, VA(0-3)A= VA(0-3)B= 0 4/ 1,2,3 01 0 1 mA -ISBY VEN(0-31)= 4 V, VA(0-3)A= VA(0-3)B= 0 4/ 1,2,3 01 -1.0 0 m

35、A Address input currents IAL(0-3)VA= 0 V 2/ 1,2,3 01 -1 1 A IAH(0-3) VA= 5 V 2/ 1,2,3 01 -1 1 A Enable input current IENL(0-15) VEN(0-15)= 0 V 1,2,3 01 -1 1 A IENH(0-15)VEN(0-15)= 5 V 1,2,3 01 -1 1 A IENL(16-31)VEN16-31)= 0 V 1,2,3 01 -1 1 A IENH(16-31)VEN(16-31)= 5 V 1,2,3 01 -1 1 A See footnotes a

36、t end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance char

37、acteristics - Continued. Test Symbol Conditions 1/ 2/ 3/ -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Positive input leakage current (CH0-CH31) +ISOFFOUTPUT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 5/ 6/ 1,2,3 01 -100 +1000 nA +ISO

38、FFCURRENT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 5/ 6/ 1,2,3 01 -100 +1000 nA Negative input leakage current (CH0-CH31) -ISOFFOUTPUT(ALL) VIN= -10 V, VEN= 4 V, output and all unused inputs = +10 V 5/ 6/ 1,2,3 01 -100 +1000 nA -ISOFFCURRENT(ALL) VIN= -10 V, VEN= 4 V, output a

39、nd all unused inputs = +10 V 5/ 6/ 1,2,3 01 -100 +1000 nA Output leakage current outputs (pins 25 and 70) +IDOFFOUTPUT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 6/ 7/ 1,2,3 01 -100 +100 nA +IDOFFCURRENT(ALL) VIN= +10 V, VEN= 4 V, output and all unused inputs = -10 V 6/ 7/ 1,2,3

40、 01 -100 +100 nA -IDOFFOUTPUT(ALL) VIN= -10 V, VEN= 4 V, output and all unused inputs = +10 V 6/ 7/ 1,2,3 01 -100 +100 nA -IDOFFCURRENT(ALL) VIN= -10 V, VEN= 4 V, output and all unused inputs = +10 V 6/ 7/ 1,2,3 01 -100 +100 nA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduct

41、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ 3/

42、-55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input clamped voltage (CH0-CH31) +VCLMP(0-31) VEN= 4 V, all unused inputs are open 6/ 8/ 1 01 18.0 23.0 V 2 18.0 23.5 3 17.5 22.5 -VCLMP(0-31) VEN= 4 V, all unused inputs are open 6/ 8/ 1 01 -23.0 -18.0 V 2 -2

43、3.5 -18.0 3 -22.5 -17.5 Switch ON resistance outputs (pins 25 and 70) RDS(ON)(0-31)AVIN= +15 V, VEN= 0.8 V, IOUT= -1 mA 5/ 6/ 9/ 1,2,3 01 200 1000 RDS(ON)(0-31)BVIN= +5 V, VEN= 0.8 V, IOUT= -1 mA 5/ 6/ 9/ 1,2,3 01 200 1500 RDS(ON)(0-31)CVIN= -5 V, VEN= 0.8 V, IOUT= +1 mA 5/ 6/ 9/ 1,2,3 01 200 2500 S

44、witching tests tAHLRL= 10 k, CL= 50 pF, See figure 4 9,10,11 01 10 1000 ns tALHRL= 10 k, CL= 50 pF, See figure 4 9,10 01 10 1000 ns 11 10 1000 tONENRL= 1 k, CL= 50 pF, See figure 4 9,10,11 01 10 1000 ns tOFFENRL= 1 k, CL= 50 pF, See figure 4 9,10,11 01 10 1000 ns See footnotes at top of next page. P

45、rovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09204 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Con

46、tinued. 1/ +VEE= +15 V dc, -VEE= -15 V dc, and VREF= +5 V dc, unless otherwise specified. Recommended power supply turn on sequence -VEE, VREF, followed by +VEE. 2/ Measure inputs sequentially. Ground all unused inputs. VAis the applied input voltage to the address lines A(0-3). VBis the applied inp

47、ut voltage to the address lines B(0-3). 3/ The device cannot be operated with analog inputs from -15 to -5 volts. 4/ If not tested, shall be guaranteed to the limits specified in table I. 5/ VINis the applied input voltage to the input channels (CH0-CH31). 6/ VENis the applied input voltage to the e

48、nable lines EN(0-15), EN(16-31). 7/ VOUTis the applied input voltage to the output lines OUTPUT(0-15), OUTPUT(16-31). 8/ Clamping test performed at 25 V dc and a 2 k limiting resistor between the input and the power supply. 9/ Negative current is the current flowing out of each of the pins. Positive current is the current flowing into each of the pins. Provided by IHSNot for ResaleNo reproduction or networking permitted wi