DLA SMD-5962-09211-2010 MICROCIRCUIT HYBRID LINEAR POSITIVE LOW DROPOUT ADJUSTABLE VOLTAGE REGULATOR.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Gary Zahn DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS D

2、RAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, LOW DROPOUT, ADJUSTABLE VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 10-07-21 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-09211 SHEET 1 OF

3、 13 DSCC FORM 2233 APR 97 5962-E208-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 S

4、cope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are

5、reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 R 09211 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Rad

6、iation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Ge

7、neric number Circuit function 01 MSK 5970RH Radiation hardened, 1.5 A, adjustable voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QM

8、L Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military qua

9、lity class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufa

10、cturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s

11、) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certif

12、ied flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 223

13、4 APR 97 1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 3 Bottom terminal chip carrier, ceramic X See figure 1 3 TO-257AA with tab, straight leads, glass sealed Y See figure 1 3 TO-

14、257AA with tab, leads formed up, glass sealed Z See figure 1 3 TO-257AA with tab, leads formed down, glass sealed 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VIN- VOUT) +25.0 V dc Output current 1.5 A 2/ Junction tempera

15、ture (TJ) +150C Thermal resistance, junction-to-case (JC), TC= +125C: Case outline U 5.1C/W Case outlines X, Y, and Z . 5.7C/W Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds) +300C 1.4 Recommended operating conditions. Supply voltage (VIN- VOUT) +1.5 V dc to +20 V dcCase o

16、perating temperature range (TC) -55C to +125C 1.5 Radiation features. Maximum total dose available 100 Krads (Si) 3/ 4/ 5/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent s

17、pecified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcir

18、cuits. MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quickse

19、arch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ F

20、or compliance with MIL-PRF-38535 appendix A current density specifications, the maximum output current is derated to 1 A. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guara

21、nteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, condition A. 4/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not bee

22、n characterized for displacement damage. 5/ See figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 A

23、PR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUI

24、REMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (Q

25、M) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan s

26、hall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accorda

27、nce with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified her

28、ein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are

29、 defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements

30、 of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tes

31、ted, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufa

32、cturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PR

33、F-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in t

34、he QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET

35、5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxReference voltage VREF(VOUT+ 3 V) VIN (VOUT+ 20 V), IOUT= 10 mA 1 01 1.238 1.262 V 2,3 1.225 1.270 M,D,P,L

36、,R 1/ 1 01 1.210 1.270 Dropout voltage VDO10 mA IOUT 1.5 A 1,2,3 01 1.5 V Line regulation VRLINE(VOUT+ 3 V) VIN (VOUT+ 15 V), IOUT= 10 mA 1 01 -0.50 0.50 % 2,3 -0.75 0.75 Load regulation VRLOADVIN= VOUT+ 3 V, 10 mA IOUT 1.5 A 1 01 -1.0 1.0 % 2,3 -2.0 2.0 Short circuit current 4/ ISCVIN= VOUT+ 5 V, T

37、C= +25C 1 01 1.5 A Ripple rejection 5/ RR IOUT= 1.5 A, COUT= 25 F, f = 120 Hz 1,2,3 01 60.0 dB 1/ Device type 01 has been characterized through all levels M, D, P, L, R of irradiation and tested to 1.5 times at the R level. Pre and post irradiation values are identical unless otherwise specified in

38、table I. When performing post irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified, VIN= VOUT+ 5 V, IOUT= 10 mA, COUT= 22 F minimum. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiatio

39、n end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. 4/ For compliance with MIL-PRF-38535 appendix A current density specifications, the maximum output current is derated to 1 A. 5/ Guaranteed by design but not test

40、ed. Parameter shall be tested as part of the initial characterization and after design and process changes. Parameter shall be guaranteed to limits specified in table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS

41、-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 Case outline U. Symbol Millimeters Inches Min Max Min Max A - 3.30 - .130 A1 0.305 0.457 .012 .018 b 9.27 9.78 .365 .385 b1 10.29 10.80 .405 .425

42、 b2 3.30 3.81 .130 .150 b3 3.86 4.11 .152 .162 D 15.62 16.13 .615 .635 D1 0.76 .030 E 11.18 11.68 .440 .460 e 0.89 .035 S1 0.81 1.07 .032 .042 S2 1.14 1.40 .045 .055 NOTES: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measu

43、rement. In case of problems involving conflicts between the metric and inch-pound units, the inch- pound units shall rule. 2. Lead identification for reference only. 3. Case outline U weight: 2.2 grams typical. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permi

44、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 Case outline X. Symbol Millimeters InchesMin Max Min Max A - 5.33 - .210 A1 0.89 1.14 .035 .045 A2 2.79 3.30 .110 .1

45、30 b 0.71 0.81 .028 .032 D 16.26 16.76 .640 .660 D1/E 10.29 10.80 .405 .425 e 2.54 TYP .100 TYP e1 5.08 REF .200 REF L 10.16 - .400 - L1 13.39 13.64 .527 .537 P 3.56 3.81 .140 .150 S1 2.73 REF .1075 REF NOTES: 1. Pin 1 is indicated by the ESD marking on the package. Pin numbers are for reference onl

46、y. 2. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall take precedence. 3. Case outline X weight: 3.2 grams

47、typical. FIGURE 1. Case outlines - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09211 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 Case o

48、utline Y. Symbol Millimeters InchesMin Max Min Max A - 5.33 - .210 A1 0.89 1.14 .035 .045 A2 2.79 3.30 .110 .130 b 0.71 0.81 .028 .032 D 16.26 16.76 .640 .660 D1/E 10.29 10.80 .405 .425 e 2.54 TYP .100 TYP e1 5.08 REF .200 REF L 2.16 2.67 .085 .105 L1 13.39 13.64 .527 .537 L2 5.08 - .200 - P 3.56 3.81 .140 .150 S1 2.73 REF .1075 REF NOTES: 1. Pin 1 is indicated by the ESD