DLA SMD-5962-09213-2011 MICROCIRCUIT HYBRID LINEAR POSITIVE LOW DROPOUT ADJUSTABLE VOLTAGE REGULATOR.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHET REV SHET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS

2、 AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, POSITIVE, LOW DROPOUT, ADJUSTABLE VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 11-01-10 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-09213 SHEET 1 OF 13 DSCC

3、FORM 2233 APR 97 5962-E210-09Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing

4、 documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the P

5、IN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 R 09213 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness as

6、surance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type. The device type identify the circuit function as follows: Device type Generic number Circu

7、it function 01 MSK 5972RH Radiation hardened, 1.5 A, adjustable voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as

8、 well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level.

9、This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified i

10、ncoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specifie

11、d in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This pro

12、duct may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline

13、s. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style U See figure 1 3 Bottom terminal chip carrier, ceramic X See figure 1 3 TO-257AA with tab, straight leads, glass sealed Y See figure 1 3 TO-257AA with tab, leads forme

14、d up, glass sealed Z See figure 1 3 TO-257AA with tab, leads formed down, glass sealed 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage (VIN- VOUT) . +40 V dc Output current 1.5 A Junction temperature (TJ) +150C Thermal resist

15、ance, junction-to-case (JC), TC= +125C: Case outline U 3.5C/W Case outlines X, Y, and Z . 4.5C/W Storage temperature -65C to +150C Lead temperature (soldering, 10 seconds). +300C 1.4 Recommended operating conditions. Supply voltage (VIN- VOUT) +3.0 V dc to +32 V dcCase operating temperature range (T

16、C) . -55C to +125C 1.5 Radiation features. Maximum total dose available 100 krads (Si) 2/ 3/ 4/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless oth

17、erwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Inter

18、face Standard for Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardi

19、zation Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ These parts may be dose rate

20、 sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. Dose rate shall be in accordance with MIL-STD-883, method 1019, cond

21、ition A. 3/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 4/ See figure 3. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

22、-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precede

23、nce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compli

24、ance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the perform

25、ance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construct

26、ion, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Radiation exposure circuits. The

27、 radiation exposure circuits shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical te

28、st requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 h

29、erein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance

30、 inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to

31、 the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime-VA shall affirm that

32、the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection.

33、 Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. Provided by IHSNot for ResaleNo reproduction or netw

34、orking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ 3/ -55C TC+125C unless otherwise sp

35、ecified Group A subgroups Device type Limits Unit Min MaxReference voltage VREF3.0 V (VIN- VOUT) 40 V 1,2,3 01 1.20 1.30 V Adjust pin current IADJ2.5 V (VIN- VOUT) 40 V 1,2,3 01 100 A Adjust pin current change IADJ2.5 V (VIN- VOUT) 40 V 1 01 -5 5 A 2,3 -6 6 Line regulation VRLINE3.0 V (VIN- VOUT) 40

36、 V 1 01 -0.02 0.02 %/V 2,3 -0.05 0.05 M,D,P,L,R 1/ 1 01 -0.03 0.03 Load regulation VRLOADVIN= VOUT+ 3 V, VOUT 5 V, 10 mA IOUT 1.5 A 1 01 -20 20 mV 2,3 -50 50 M,D,P,L,R 1/ 1 01 -60 60 Current limit ILIMVIN= VOUT+ 5 V 1,2,3 01 1.5 A Minimum load current 4/ IMINVIN= VOUT= 40 V, TC= +25C 1 01 5 mA Rippl

37、e rejection 4/ RR VOUT= 10 V, COUT= 10 F, f = 120 Hz 1,2,3 01 66 dB 1/ Device type 01 has been characterized through all levels M, D, P, L, R of irradiation and tested to 1.5 times at the R level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing po

38、st irradiation electrical measurements for any RHA level, TC= +25C. 2/ Unless otherwise specified, VIN= VOUT+ 5 V, IOUT= 10 mA, COUT= 10 F. 3/ These parts may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end-point limits for the noted pa

39、rameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A. 4/ Guaranteed by design but not tested. Parameter shall be tested as part of the initial characterization and after design and process changes. Parameter shall be guaranteed to limits specified in

40、table I for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 Case outline U.

41、 Symbol Millimeters Inches Min Max Min Max A - 3.30 - .130 A1 0.305 0.457 .012 .018 b 9.27 9.78 .365 .385 b1 10.29 10.80 .405 .425 b2 3.30 3.81 .130 .150 b3 3.86 4.11 .152 .162 D 15.62 16.13 .615 .635 D1 0.76 .030 E 11.18 11.68 .440 .460 e 0.89 .035 S1 0.81 1.07 .032 .042 S2 1.14 1.40 .045 .055 NOTE

42、S: 1. The U.S. government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch- pound units shall rule. 2. Lead identification for reference only. 3. C

43、ase outline U weight: 2.2 grams typical. FIGURE 1. Case outlines. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 AP

44、R 97 Case outline X. Symbol Millimeters InchesMin Max Min Max A - 5.33 - .210 A1 0.89 1.14 .035 .045 A2 2.79 3.30 .110 .130 b 0.71 0.81 .028 .032 D 16.26 16.76 .640 .660 D1/E 10.29 10.80 .405 .425 e 2.54 TYP .100 TYP e1 5.08 REF .200 REF L 10.16 - .400 - L1 13.39 13.64 .527 .537 P 3.56 3.81 .140 .15

45、0 S1 2.73 REF .1075 REF NOTES: 1. Pin 1 is indicated by the ESD marking on the package. Pin numbers are for reference only. 2. The U. S. Government preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts

46、between the metric and inch-pound units, the inch-pound units shall take precedence. 3. Case outline X weight: 3.2 grams typical. FIGURE 1. Case outlines- Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

47、 5962-09213 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 8 DSCC FORM 2234 APR 97 Case outline Y. Symbol Millimeters InchesMin Max Min Max A - 5.33 - .210 A1 0.89 1.14 .035 .045 A2 2.79 3.30 .110 .130 b 0.71 0.81 .028 .032 D 16.26 16.76 .640 .660 D1/E 10.29 10.80 .405 .425 e 2

48、.54 TYP .100 TYP e1 5.08 REF .200 REF L 2.16 2.67 .085 .105 L1 13.39 13.64 .527 .537 L2 5.08 - .200 - P 3.56 3.81 .140 .150 S1 2.73 REF .1075 REF NOTES: 1. Pin 1 is indicated by the ESD marking on the package. Pin numbers are for reference only. 2. The U. S. Government preferred system of measurement is the metric SI. This item was designed using in