DLA SMD-5962-11205 REV A-2013 MICROCIRCUIT HYBRID VOLTAGE REGULATOR ULTRA LOW DROPOUT POSITIVE ADJUSTABLE .pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Added Enhanced Low Dose Rate Sensitivity (ELDRS) testing. Figure 1; corrected dimension “b1“ min and max from “.220 and .230“ Inches to “.195 and .205“ Inches and “5.59 and 5.84“ Millimeters to “4.95 and 5.21“ Millimeters. Table I; corrected test

2、 conditions for the test Set pin current from “1.6 V VIN - VOUT 25 V“ to “ VIN - VOUT= 1.6 V“ and removed footnote 1 from the test block. Added test symbol IREF2and conditions to the set pin current test. Table I; corrected test conditions for the test Output offset voltage from “ VIN= 2 V“ to “ VIN

3、= 1 V“ and added the condition “ VCONTROL= 2.0 V“. Table I; corrected the test conditon from “ ILOAD= 10 mA“ to “ IOUT= 10 mA“. Table I; removed footnote 2 from the conditions block for the Droput voltage test. -sld 13-01-03 Charles F. Saffle REV SHEET REV SHEET REV STATUS REV A A A A A A A A A A A

4、A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PMIC N/A PREPARED BY Steve L. Duncan DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPAR

5、TMENT OF DEFENSE APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, VOLTAGE REGULATOR ULTRA LOW DROPOUT, POSITIVE, ADJUSTABLE, DRAWING APPROVAL DATE 12-09-26 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 67268 5962-11205 SHEET 1 OF 13 DSCC FORM 2233 APR 97 5962-E024-13 Provided by IHSNot for ResaleNo

6、reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in par

7、agraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following exa

8、mple: 5962 R 11205 01 K X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the

9、 MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 8666 Voltage regulator, positive , low

10、 dropout, adjustable 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Cl

11、ass G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-spac

12、e high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not te

13、st) periodic and conformance inspections (Group A, B, C and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisitio

14、n document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot

15、for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 a

16、nd as follows: Outline letter Descriptive designator Terminals Package style Y See figure 1 5 Bottom terminal chip carrier, ceramic 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage, Vcontrol40 V dc Output current 1.2 A Input-Ou

17、tput differential voltage . 26 V dc Output voltage . 36 V dc Operating junction temperature range . -55C to +150C Thermal Resistance, Junction temperature (JC) 5C/W Lead temperature (soldering, 10 seconds) +300C Storage temperature range -65C to +150C 1.4 Recommended operating conditions. Input volt

18、age range 0 V to 35 V Output voltage range 0.1 V to +34 V dc Input-Output differential voltage range .5 V to 26 V dc Case operating temperature range (TC) -55C to +125C 1.5 Radiation features. 2/ Maximum total dose available (Dose rate = 50 - 300 rad(Si)/s) . 100 krad(Si) 3/ Enhanced Low Dose Rate S

19、ensitvity (ELDRS): (dose rate 10 mrad(Si)/s) 50 krad(Si) 4/ 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of thes

20、e documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. _ 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may d

21、egrade performance and affect reliability. 2/ Bipolar device types may degrade from displacement damage from radiation which could affect RHA levels. These device types have not been characterized for displacement damage. 3/ The active elements that make up the devices on this drawing have been test

22、ed for Total Ionizing Dose (TID) in accordance with MIL-STD-883 test method 1019 condition A. RHA testing of the active elements covered on this SMD are tested in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. 4/ The active elements that make up this device on

23、 this drawing has been tested for Enhanced Low Dose Rate Sensitivity (ELDRS) in accordance with MIL-STD-883, Method 1019 condition D and paragraph 3.13.1 for initial qualification. No ELDRS effect was observed. The active elements will be re-tested after design or process changes that can affect RHA

24、 response of these elements. RHA testing of the active elements covered on this SMD were done in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCU

25、IT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HA

26、NDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111

27、-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQ

28、UIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturers Quality Managemen

29、t (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM pl

30、an shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in

31、 accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Block diagram. The block diagram shall be as specified on figure 3. 3.2.4 Maximum power dissipation verses case temperature chart. The maximum power dissipation v

32、erses case temperature is specified on figure 4. 3.2.5 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance

33、 characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in tabl

34、e II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data.

35、 In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data sho

36、uld include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. Provided by IHSNot f

37、or ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 3.7 Certificate of compliance. A certificate of compliance shall be required fr

38、om a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conf

39、ormance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 4321

40、8-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C VCONTROL = 2.0 V, P PMAX, unless otherwise specified Group A subgroups Device types Limits Unit Min Max Set pin current IREF11.0 mA IOUT 1.0 A, VIN - VOUT= 1.6 V

41、 1,2,3 01 9.8 10.2 A IREF2VIN= 1 V, VCONTROL= 2.0 V, 1/ IOUT= 1 mA Output offset voltage 1/ VOSVIN= 1 V, IOUT= 1 mA VCONTROL= 2.0 V 1,2,3 01 -9.0 +9.0 mV Line regulation 1/ VOS2.0 V VCONTROL 26 V 1.6 V VIN- VOUT 25 V, IOUT= 10 mA 1,2,3 01 -0.15 0.15 mV/V Load regulation 1/ VOS1.0 mA IOUT 1.0 A, (VIN

42、 - VOUT)= 3 V 1,2,3 01 -1.4 1.4 mV Thermal regulation 30 ms pulse, TC= +25C 1 01 0.03 %/W Dropout voltage VDROPIOUT= 1.0 A, VCONTROL = VIN1,2,3 01 1.60 V IOUT= 0.1 A, VCONTROL = VIN 1/ 1.60 IOUT= 1.0 A, VCONTROL 1.6 V 01 0.5 IOUT= 0.1 A, VCONTROL 1.6 V 1/ 0.25 Current limit IMAXVIN = VCONTROL= 26 V,

43、 VOUT= 0.1 V, TC= +25C 1 01 1.1 A Minimum load current 1/ 2/ IMINVIN = VCONTROL= 26 V, VOUT= 0.1 V 1,2,3 01 0.9 mA Ripple rejection IOUT= 0.2 A, (VIN - VOUT)= 3 V, f = 120 Hz, COUT= 2.2 F, CSET= 0.1 f 1,2,3 01 60 dB 1/ The active elments that make up this device has been tested to 200 krad(Si) to en

44、sure RHA designator level “R“ (100 krad(Si) of Method 1019, condition A of MIL-STD-883 and low dose rate tested to the requirements of Method 1019, condition D and paragraph 3.13.1 of MIL-STD-883 to 50 krad(Si) at +25C for these parameters. No ELDRS effect was observed. The elements will be re-teste

45、d after design or process changes that can affect RHA response of these elements. RHA testing of the active elements covered on this SMD were done in alternate packages (TO3) and (TO39), not the packages as specified in paragraph 1.2.4. 2/ Not tested. Shall be guaranteed by design, characterization,

46、 or correlation to other tested parameters. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11205 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Case Y Symbol I

47、nches Millimeters Min Max Min Max A .127 3.23 A1 .010 .020 .25 .51 b .281 .291 7.14 7.39 b1 .195 .205 4.95 5.21 b2 .090 .100 2.29 2.54 b3 .115 .125 2.92 3.18 D .550 12.83 E .301 7.65 e .030 7.62 e1 .030 7.62 R .015 .025 .38 .64 S .010 .25 NOTE: 1. The U.S. preferred system of measurement is the metr

48、ic SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 2. The package and lid are electrically isolated. FIGURE 1. Case outline(s) - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-1