DLA SMD-5962-11210-2011 MICROCIRCUIT HYBRID LINEAR HIGH CURRENT LOW OUTPUT VOLTAGE REGULATOR.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS REV OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY Gary Zahn DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY Greg Cecil COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil THIS DRAWING IS

2、AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles F. Saffle MICROCIRCUIT, HYBRID, LINEAR, HIGH CURRENT, LOW OUTPUT, VOLTAGE REGULATOR AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 11-09-01 AMSC N/A REVISION LEVEL SIZE A CAGE CODE 67268 5962-11210 SHEET 1 OF 8 DSCC FORM 2233

3、APR 97 5962-E355-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing document

4、s five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 P

5、IN. The PIN shall be as shown in the following example: 5962 - 11210 01 H X X Federal RHA Device Device Case Lead stock class designator type class outline finish designator (see 1.2.1) (see 1.2.2) designator (see 1.2.4) (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 Radiation hardness assurance (

6、RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device types identify the circuit function as follows: Device type Generic number Circuit func

7、tion 01 MSK 5251-0.8H High current, low output, +0.8 V voltage regulator 02 MSK 5251-0.9H High current, low output, +0.9 V voltage regulator 03 MSK 5251-1.0H High current, low output, +1.0 V voltage regulator 04 MSK 5251-1.2H High current, low output, +1.2 V voltage regulator 05 MSK 5251-1.3H High c

8、urrent, low output, +1.3 V voltage regulator 06 MSK 5251-1.4H High current, low output, +1.4 V voltage regulator 07 MSK 5251-1.5H High current, low output, +1.5 V voltage regulator 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance

9、level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class availab

10、le. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H scree

11、ning and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, o

12、r G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified

13、quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND

14、 MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 3 DSCC FORM 2234 APR 97 1.2.4 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style X See figure 1 3 Bottom terminal chip carrier, ceramic 1.2.5 Lead fini

15、sh. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Input voltage (VIN) +6.5 V dc Power dissipation (PD) . Internally limited Thermal resistance junction-to-case (JC) 2.0C/W Junction temperature (TJ= TC) +125C Storage temperature -65C to +150C Lead temperatur

16、e (soldering, 10 seconds). +300C 1.4 Recommended operating conditions. Input voltage range (VIN) +3.0 V dc to +6.5 V dc Case operating temperature range (TC) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and ha

17、ndbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE S

18、TANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are availa

19、ble online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this

20、 drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade perfor

21、mance and affect reliability. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 4 DSCC FORM 2234 APR 97 3. REQUIREMENTS 3.1 Item requir

22、ements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designate

23、d for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the for

24、m, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline and terminal connections. The case outline and terminal connec

25、tions shall be in accordance with 1.2.4 herein and figure 1. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test

26、requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 here

27、in. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance in

28、spection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to th

29、e preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that t

30、he manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. VERIFICATION 4.1 Sampling and inspection.

31、Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with

32、MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA

33、or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Inter

34、im and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

35、MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ 2/ -55C TC+125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max

36、Output voltage tolerance 3/ VOTOLIOUT= 10 mA, VIN= +5 V 1 All 1.0 % 2,3 2.5 Dropout voltage 4/ VODOPVOUT= -1%, IOUT= 2.5 A, TC= +25C 1 All 2.0 V VOUT= -1%, IOUT= 5.0 A, TC= +25C 2.1 Load regulation 5/ VRLOAD10 mA IOUT 5.0 A 1 All 1.0 % 2,3 2.0 Line regulation VRLINEVIN(min) to +6 V, IOUT= 10 mA 1 Al

37、l 0.5 % 2,3 1.0 Output current limit 4/ IOUTLIMVOUT= 0 V, All 9.5 A 1/ TC= +25C, TC= +125C, and TC= -55C. Output decoupled to ground using 10 F ceramic capacitor, unless otherwise specified. 2/ All parameters are tested using a low duty cycle pulse to maintain TJ= TC. 3/ Subgroup 2 is tested at TC=

38、135C. 4/ Parameter is guaranteed by design but need not be tested. 5/ Due to internal thermal shutdown, maximum output current may not be available at all values of VIN- VOUTand temperatures. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD

39、MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 6 DSCC FORM 2234 APR 97 Case outline X and terminal connections. Symbol Inches Millimeters Min Max Min Max A .110 2.79 A1 .005 .025 0.13 0.64 b .365 .385 9.27 9.78 b1 .405 .425 10.29 10.80 b2

40、130 .150 3.30 3.81 b3 .147 .167 3.73 4.24 D .615 .635 15.62 16.13 D1 .030 0.76 E .440 .460 11.18 11.68 e .035 0.89 S1 .027 .047 0.69 1.19 S2 .040 .060 1.02 1.52 NOTES: 1. Terminal 1 is input (VIN). Terminal 2 is output (VOUT). Terminal 3 is ground (GND). 2. The U.S. government preferred system of m

41、easurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch- pound units shall rule. 3. Lead identification for reference only. FIGURE 1. Case outline and terminal connections. Pr

42、ovided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-11210 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL SHEET 7 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requ

43、irements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3 Group A test requirements 1, 2, 3 Group C end-point electrical parameters 1, 2, 3 End-point electrical parameters for radiation hardness assurance (RHA) devi

44、ces Not applicable * PDA applies to subgroup 1. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-

45、38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance w

46、ith MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and s

47、hall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TAas specified in acco

48、rdance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-