1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED E Delete vendor, CAGE 34335, CAGE 07263, CAGE 27014, and CAGE 18324. Add logic diagram. Table I, change IOS(min), from -6 to -15. Table I, change the following from (CL= 50 pF, subgroups 10 and 11): tPLH1and tPHZ1from 70 ns to 75 ns. tPHL2and tPLH2
2、from 53 ns to 57 ns. tPHL3and tPLH3from46 ns to 50 ns. tPHL4and tPLH4, from 28 ns to 30 ns. tPZL1and tPZL2, from 63 ns to 68 ns. tPZH2from 45 ns to 48 ns. tPLZ1and tPLZ2from 42 ns to 45 ns. tPHZ2from 84 ns to 90 ns. Editorial changes throughout. Change Code Ident. No. to 67268. Revise to Military Dr
3、awing format. 87-10-06 R. P. Evans F Changes in accordance with NOR 5962-R139-92. pvn 92-02-21 Monica L. Poelking G Changes in accordance with NOR 5962-R166-96. les 96-07-30 Raymond Monnin H Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 03-03-05 Raym
4、ond Monnin J Update to reflect latest changes in format and requirements. Correct paragraph in 3.5. Editorial changes throughout. les 05-08-02 Raymond Monnin THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV J J J J J J J J J J J OF S
5、HEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY Monica L. Grosel DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Robert P. Evans MICROCIRCU
6、IT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, MULTIPLEXER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 76-03-23 MONOLITHIC SILICON AMSC N/A REVISION LEVEL J SIZE A CAGE CODE 14933 76016 SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E399-05 Provided by IHSNot for ResaleNo reproduction
7、or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN cl
8、ass level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 76016 01 E X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type. The device type id
9、entify the circuit function as follows: Device type Generic number Circuit function 01 54LS251 Data selector/multiplexer with 3-state outputs 1.2.2 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1
10、-T16 or CDIP2-T16 16 dual-in-line F GDFP2-F16 or CDFP3-F16 16 flat 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc at -18 mA to +5.5 V dc Storage temperature range -
11、65C to +150C Maximum power dissipation (PD) 1/ . 66 mW Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC): See MIL-STD-1835 Junction temperature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . 4.5 V dc minimum to 5.5 V dc maximum
12、Minimum high level input voltage (VIH) . 2.0 V dc Maximum low level input voltage (VIL) 0.7 V dc Case operating temperature range (TC) -55C to +125C _ 1/ Maximum power dissipation is defined as VCCx ICCand must withstand the added PDdue to short circuit test (e.g., IOS). Provided by IHSNot for Resal
13、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The
14、 following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufactu
15、ring, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Micr
16、ocircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflic
17、t between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requi
18、rements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional c
19、ertification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herei
20、n. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and p
21、hysical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1
22、. 3.2.3 Truth table. The truth tables shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and
23、 shall apply over the full case operating temperature range. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 4 DSCC FORM 2234 A
24、PR 97 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN li
25、sted in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certi
26、fication mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of com
27、pliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, append
28、ix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to r
29、eview the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 D
30、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max High level output voltage VOHVCC= 4
31、.5 V, IOH= -1.0 mA VIL= 0.7 V, VIH =2.0 V 1, 2, 3 All 2.4 V Low level output voltage VOLVCC= 4.5 V, IOL= 4.0 mA VIL= 0.7 V, VIH =2.0 V 1, 2, 3 All 0.4 V Input clamp voltage VICVCC= 4.5 V, IIN= -18 mA, 1 All -1.5 V High level input current IIH1VCC= 5.5 V, 1, 2, 3 All 20 A IH= 2.7 V IIH2VCC= 5.5 V, 1,
32、 2, 3 All 100 A VIH= 5.5 V Off-state output current IO (off)VCC= 5.5 V, 1, 2, 3 All 20 A VOUT= 2.4 V IH= 2.0 V, 1, 2, 3 All -20 A OUT= 0.4 V Low level input current data inputs IIL1VCC= 5.5 V, 1, 2, 3 All -720 A Low level input current enable inputs IIL2VIL= 0.4 V 1, 2, 3 All -200 A Low level input
33、current select inputs IIL31, 2, 3 All -400 A Short circuit output current IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 All -15 -130 mA Supply current ICCVCC= 5.5 V, enable grounded 1, 2, 3 All 10 mA CC= 5.5 V, strobe at 4.5 V 1, 2, 3 All 12 mA Functional tests See 4.3.1c 7 All tPHL19 All 45 ns VCC= 5.0 V,
34、RL= 2 k 5% CL= 15 pF 10% 10, 11 All 63 ns 50 Propagation delay time, A, B, or C (4 levels) to Y 2/ CL= 50 pF 10% 10, 11 All 75 ns tPLH19 45 CL= 15 pF 10% 10, 11 All 63 ns 50 CL= 50 pF 10% 10, 11 All 75 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permi
35、tted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TC +125C unless otherwise spec
36、ified Group A subgroupsDevice type Limits Unit Min Max tPHL29 All 33 ns VCC= 5.0 V, RL= 2 k 5% CL= 15 pF 10% 10, 11 All 46 ns 38 Propagation delay time, A, B, or C (3 levels) to W 2/ CL= 50 pF 10% 10, 11 All 57 ns tPLH29 33 CL= 15 pF 10% 10, 11 All 46 ns 38 CL= 50 pF 10% 10, 11 All 57 ns tPHL39 28 C
37、L= 15 pF 10% 10, 11 All 39 ns 33 Propagation delay time, any D to Y CL= 50 pF 10% 10, 11 All 50 ns tPLH39 28 CL= 15 pF 10% 10, 11 All 39 ns 33 CL= 50 pF 10% 10, 11 All 50 ns tPHL49 15 CL= 15 pF 10% 10, 11 All 21 ns 20 Propagation delay time, any D to W CL= 50 pF 10% 10, 11 All 30 ns tPLH49 15 CL= 15
38、 pF 10% 10, 11 All 21 ns 20 CL= 50 pF 10% 10, 11 All 30 ns tPZH19 45 CL= 15 pF 10% 10, 11 All 63 ns 50 Output enable time, strobe to Y CL= 50 pF 10% 10, 11 All 75 ns tPZL19 40 CL= 15 pF 10% 10, 11 All 56 ns 45 CL= 50 pF 10% 10, 11 All 68 ns See footnotes at end of table. Provided by IHSNot for Resal
39、eNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions
40、 -55C TC +125C unless otherwise specified Group A subgroupsDevice type Limits Unit Min Max tPZH29 All 27 ns VCC= 5.0 V, RL= 2 k 5% CL= 15 pF 10% 10, 11 All 38 ns 32 Output enable time, strobe to W CL= 50 pF 10% 10, 11 All 48 ns tPZL29 40 CL= 15 pF 10% 10, 11 All 56 ns 45 CL= 50 pF 10% 10, 11 All 68
41、ns tPHZ19 45 CL= 15 pF 10% 10, 11 All 63 ns 50 Output disable time, from strobe to Y CL= 50 pF 10% 10, 11 All 75 ns tPLZ19 25 CL= 15 pF 10% 10, 11 All 35 ns CL= 50 pF 10% 10, 11 All 45 ns tPHZ29 55 CL= 15 pF 10% 10, 11 All 77 ns 60 Output disable time, from strobe to W CL= 50 pF 10% 10, 11 All 90 ns
42、 tPLZ29 25 CL= 15 pF 10% 10, 11 All 35 ns CL= 50 pF 10% 10, 11 All 45 ns 1/ Not more than one output should be shorted at a time, and the duration of the short-circuit condition should not exceed one second. 2/ Propagation delay time testing may be performed using either CL= 15 pF or CL= 50 pF. Howe
43、ver, the manufacturer must certify and guarantee that the microcircuits meet the switching test limits specified for a 50 pF load. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMB
44、US COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 8 DSCC FORM 2234 APR 97 Device types 01 Case outlines E, F Terminal number Terminal symbols 1 D3 2 D2 3 D1 4 D0 5 Y 6 W 7 G 8 GND 9 C 10 B 11 A 12 D7 13 D6 14 D5 15 D4 16 VCCFIGURE 1. Terminal connections. INPUTS OUTPUTS SELECT ENABLE C B A G Y W X
45、 X X H Z Z L L L L D0 D0 L L H L D1 D1 L H L L D2 D2 L H H L D3 D3 H L L L D4 D4 H L H L D5 D5 H H L L D6 D6 H H H L D7 7D H = High logic level. L = Low logic level. X = Irrelevant Z = High impedance (off) D0, D1D7 = The level of the respective D input. FIGURE 2. Truth table. Provided by IHSNot for
46、ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 9 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or netwo
47、rking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 76016 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 10 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with
48、 MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request
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