DLA SMD-5962-77037 REV H-2011 MICROCIRCUIT DIGITAL CMOS 4-BIT MAGNITUDE COMPARATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED E Add to 1.3, 1.4, and table I for device type 01 - mbk. 92-04-23 Monica L. Poelking F Update boilerplate to MIL-PRF-38535 requirements. jak 01-05-07 Thomas M. HessG Made change to paragraph 3.5. Update boilerplate to MIL-PRF-38535 requirements. LT

2、G 05-02-09 Thomas M. Hess H Update boilerplate paragraphs to the current MIL-PRF-38535 requirements. - LTG 11-03-28 David J. Corbett CURRENT CAGE CODE 67268 REV SHET REV H SHET 15 REV STATUS REV H H H H H H H H H H H H H H OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY A. J. F

3、oley DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A CHECKED BY C. R. Jackson APPROVED BY Nelson A. Hauck MICROCIRCUIT, DIGITAL, CMOS, 4-BIT MA

4、GNITUDE COMPARATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 77-09-26 REVISION LEVEL H SIZE A CAGE CODE 14933 77037 SHEET 1 OF 15 DSCC FORM 2233 APR 97 5962-E286-11 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A

5、77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Num

6、ber (PIN). The complete PIN is as shown in the following example: 77037 01 E A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 54C85

7、4-bit magnitude comparator 02 4585B 4-bit magnitude comparator1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack 1.2.

8、3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. 1/ Supply voltage range (VDD) device type 01 -0.5 V dc to +15.0 V dc 2/ Supply voltage range (VDD) device type 02 -0.5 V dc to +20.0 V dc 2/ Input voltage range device type 01 -0.3 V dc to VDD+

9、 0.3 V dc Input voltage range device type 02 -0.5 V dc to VDD+ 0.5 V dc DC input current (any one input) 10 mA Storage temperature range (TSTG) . -65C to +150C Maximum power dissipation (PD) 500 mW 3/ Lead temperature (soldering, 10 seconds) +260C Thermal resistance, junction-to-case (JC) . See MIL-

10、STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. Supply voltage range (VDD) device type 01 +3.0 V dc to +15.0 V dc Supply voltage range (VDD) device type 02 +3.0 V dc to +18.0 V dc Case operating temperature range (TC) . -55C to +125C 1/ Stresses above the absolute ma

11、ximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Supply voltages are referenced to the VSSterminal. 3/ For TC= +100C to +125C, derate linearly at 12 mW/C to 200 mW. Provided by IHSNot for ResaleNo repro

12、duction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specifi

13、cation, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Spec

14、ification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings.

15、 (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the ref

16、erences cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38

17、535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed

18、 as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form,

19、fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction,

20、and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth tables. The truth tables shall b

21、e as specified on figure 2. 3.2.4 Logic diagrams. The logic diagrams shall be as specified on figure 3. 3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4. Provided by IHSNot for ResaleNo reproduction or networking permitted without

22、 license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 4 DSCC FORM 2234 APR 97 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified i

23、n table I and shall apply over the full (case or ambient) operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in ac

24、cordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN device

25、s built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a

26、 manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38

27、535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DLA Land and Maritime -

28、VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be m

29、ade available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. El

30、ectrical performance characteristics. Test Symbol Test conditions -55C TC +125C unless otherwise specified Device type Group A subgroups Limits Unit Min Max High-level output voltage VOHVIH= 3.0 V, VIL= 0.8 V IOH= -360 A VDD= 4.5 V 01 1, 2, 3 2.4 V VIH= 3.5 V, VIL= 1.5 V IOH= -10 A VDD= 5.0 V 1, 2,

31、3 4.5 VIH= 8.0 V, VIL= 2.0 V IOH= -10 A VDD= 10.0 V 1, 2, 3 9.0 VIN= 0.0 V or VDDIOH= -1 A VDD= 5.0 V 1/ 02 1, 2, 3 4.95 VDD= 10.0 V 1/ 1, 2, 3 9.95 VDD= 15.0 V 1, 2, 3 14.95 Low-level output voltage VOLVIN= 0.8 V IOL= +360 A VDD= 4.5 V 01 1, 2, 3 0.4 V VIN= 1.5 V IOL= +10 A VDD= 5.0 V 1, 2, 3 0.5 V

32、IN= 2.0 V IOL= +10 A VDD= 10.0 V 1, 2, 3 1.0 VIN= 0.0 V or VDDIOL= +1 A VDD= 5.0 V 1/ 02 1, 2, 3 0.05 VDD= 10.0 V 1/ 1, 2, 3 0.05 VDD= 15.0 V 1, 2, 3 0.05 Low-level input voltage VILVDD= 4.5 V 2/ 01 1, 2, 3 0.8 V VDD= 5.0 V 2/ 1, 2, 3 1.5 VDD= 10.0 V 2/ 1, 2, 3 2.0 VOL= 4.5 V or 0.5 V VDD= 5.0 V IOL

33、= +1 A 02 1, 2, 3 1.5 VOL= 9.0 V or 1.0 V VDD= 10.0 V IOL= +1 A 1/ 1, 2, 3 3.0 VOL= 13.5 V or 1.5 V VDD= 15.0 V IOL= +1 A 1, 2, 3 4.0 High-level input voltage VIHVDD= 4.5 V 2/ 01 1, 2, 3 3.0 V VDD= 5.0 V 2/ 1, 2, 3 3.5 VDD= 10.0 V 2/ 1, 2, 3 8.0 VOH= 4.5 V or 0.5 V VDD= 5.0 V IOH= -1 A 02 1, 2, 3 3.

34、5 VOH= 9.0 V or 1.0 V VDD= 10.0 V IOH= +1 A 1/ 1, 2, 3 7.0 VOH= 13.5 V or 1.5 V VDD= 15.0 V IOH= +1 A 1, 2, 3 11.0 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND

35、MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Device type Group A subgroups Limits Unit Min Max High-level output current IOHVDD= 5.0

36、V VO= 0.0 V VIN= 0.0 V or VDD01 1 -1.75 mA 2 -1.20 3 -1.75 VDD= 10.0 V VO= 0.0 V VIN= 0.0 V or VDD1 -8.0 2 -5.6 3 -8.0 VDD= 5.0 V 3/ VO= 4.6 V VIN= 0.0 V or VDD02 1 -0.51 2 -0.36 3 -0.64 VDD= 5.0 V 3/ VO= 2.5 V VIN= 0.0 V or VDD1 -1.6 2 -1.15 3 -2.0 VDD= 10.0 V 1/ VO= 9.5 V VIN= 0.0 V or VDD1 -1.3 2

37、 -0.9 3 -1.6 VDD= 15.0 V 1/ VO= 13.5 V VIN= 0.0 V or VDD1 -3.4 2 -2.4 3 -4.2 Low-level output current IOLVDD= 4.5 V VO= 0.4 V VIN= 0.0 V or VDD01 1 0.36 mA 2 0.36 3 0.36 VDD= 5.0 V VO= 5.0 V VIN= 0.0 V or VDD1 1.75 2 1.20 3 1.75 VDD= 10.0 V VO= 10.0 V VIN= 0.0 V or VDD1 8.0 2 5.6 3 8.0 VDD= 5.0 V 3/

38、 VO= 0.4 V VIN= 0.0 V or VDD02 1 0.51 2 0.36 3 0.64 VDD= 10.0 V 1/ VO= 0.5 V VIN= 0.0 V or VDD1 1.3 2 0.9 3 1.6 VDD= 15.0 V 1/ VO= 1.5 V VIN= 0.0 V or VDD1 3.4 2 2.4 3 4.2 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,

39、-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Devicetype Group A subgroups Limi

40、ts Unit Min Max High-level input current IIHVDD= 15.0 V VIN= VDD01 1, 3 0.15 A 2 1.0VDD= 20.0 V 4/ VIN= VDD02 1, 3 0.1 2 1.0Low-level input current IILVDD= 15.0 V VIN= 0.0 V 01 1, 3 -0.15 A 2 -1.0 VDD= 20.0 V 4/ VIN= 0.0 V 02 1 -0.1 2 -1.0 Quiescent supply current IDDVDD= 15.0 V VIN= 0.0 V or VDD01

41、1, 3 10.0 A 2 300.0VDD= 5.0 V 1/ VIN= 0.0 V or VDD02 1, 3 5.0 2 150.0VDD= 10.0 V 1/ VIN= 0.0 V or VDD1, 3 10.0 2 300.0VDD= 15.0 V 1/ VIN= 0.0 V or VDD1, 3 20.0 2 600.0VDD= 20.0 V 4/ VIN= 0.0 V or VDD1, 3 100.0 2 3.0 mA Input capacitance CINVIN= 0.0 V, TC= +25C See 4.3.1c All 4 7.5 pF Functional test

42、s See 4.3.1d All 7, 8 Propagation delay time, comparing A, B data inputs to data outputs tPHL1, tPLH1CL= 50 pF minimum RL= 200 k tr= tf= 20 ns See figure 4 6/ VDD= 5.0 V 01 9 1.5 600.0 ns VDD= 10.0 V 1/ 1.5 300.0VDD= 5.0 V 10, 11 1.5 750.0 VDD= 10.0 V 1/ 1.5 375.0CL= 50 pF minimum RL= 200 k tr= tf=

43、20 ns See figure 4 5/ 6/ VDD= 5.0 V 02 9 1.5 600 ns VDD= 10.0 V 1/ 1.5 250 VDD= 15.0 V 1/ 1.5 160VDD= 5.0 V 10, 11 1.5 780 VDD= 10.0 V 1/ 1.5 325 VDD= 15.0 V 1/ 1.5 208See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA

44、NDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL H SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Test conditions -55C TC +125C unless otherwise specified Device type Group A subgroups Limits

45、Unit Min Max Propagation delay time, cascading inputs to outputs tPHL2, tPLH2CL= 50 pF minimum RL= 200 k tr= tf= 20 ns See figure 4 6/ VDD= 5.0 V 01 9 1.5 500.0 ns VDD= 10.0 V 1.5 250.0 VDD= 5.0 V 10, 11 1.5 625.0 VDD= 10.0 V 1.5 312.0 CL= 50 pF minimum RL= 200 k tr= tf= 20 ns See figure 4 5/ 6/ VDD

46、= 5.0 V 02 9 1.5 400 ns VDD= 10.0 V 1/ 1.5 160 VDD= 15.0 V 1/ 1.5 120VDD= 5.0 V 10, 11 1.5 520 VDD= 10.0 V 1/ 1.5 208 VDD= 15.0 V 1/ 1.5 156Transition time tTHL, tTLHCL= 50 pF minimum RL= 200 k tr= tf= 20 ns See figure 4 5/ 6/ VDD= 5.0 V 02 9 1.5 200 ns VDD= 10.0 V 1/ 1.5 100 VDD= 15.0 V 1/ 1.5 80VD

47、D= 5.0 V 10, 11 1.5 260 VDD= 10.0 V 1/ 1.5 130 VDD= 15.0 V 1/ 1.5 1041/ This parameter is guaranteed, if not tested, to the specified limits in table I. 2/ The VIHand VILtests are not required, and shall be applied as forcing functions for the VOHand VOLtests. 3/ The IOLand IOHtests are tested 100 p

48、ercent at TC= +25C, and are guaranteed, if not tested, for TC = -55C and TC= +125C. 4/ This test is performed using VDD= 18 V at TC= -55C. 5/ Propagation delay time and transition time tests are performed on a one-input-to-one-output basis only. 6/ See figure 4 for switching waveforms and test circuit. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77037 DLA LAND AND MARITIME COLUMBUS, OHIO 432