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本文(DLA SMD-5962-77054 REV G-2011 MICROCIRCUIT LINEAR DUAL TRACKING VOLTAGE REGULATOR MONOLITHIC SILICON.pdf)为本站会员(sofeeling205)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-77054 REV G-2011 MICROCIRCUIT LINEAR DUAL TRACKING VOLTAGE REGULATOR MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Page 6, 7: Added static cond. A, B, C to burn-in and life test paragraphs. 81-09-30 N. A. HAUCK B Change to approved source format, update document. 84-03-12 N. A. HAUCK C Page 4, table I, change output short circuit current and output noise volt

2、age. Guarantee TC for output voltage and ripple rejection. 85-11-29 N. A. HAUCK D Page 2: Absolute maximum rating; change power dissipation rating. Page 4: table I, change test condition for line and load regulation, stand-by current, ripple rejection, and output noise voltage. Add ILvalue to footno

3、te 1. Page 9: R package not available from approved source. 86-07-03 R. P. EVANS E On page 1, at the bottom of the open area between the revision information and REV status block add “CURRENT CAGE CODE 67268”. Changes in accordance with N.O.R. 5962-R173-96. 96-07-10 M. A. FRYE F Replaced reference t

4、o MIL-STD-973 with reference to MIL-PRF-38535. Drawing updated to reflect current requirements. Redrawn. - gt 04-05-19 R. MONNIN G Update boilerplate paragraphs to current MIL-PRF-38535 requirements. - ro 11-08-29 C. SAFFLE THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHET REV SHE

5、T REV STATUS REV G G G G G G G G G OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY William E. Shoup DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTME

6、NT OF DEFENSE CHECKED BY C. R. Jackson APPROVED BY N. A. Hauck MICROCIRCUIT, LINEAR, DUAL TRACKING VOLTAGE REGULATOR, MONOLITHIC SILICON DRAWING APPROVAL DATE 77-12-05 AMSC N/A REVISION LEVEL G SIZE A CAGE CODE 67268 77054 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E399-11 Provided by IHSNot for Resale

7、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non

8、-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 77054 01 C A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The devi

9、ce type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 4194 Dual tracking voltage regulator 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-

10、T14 or CDIP2-T14 14 Dual-in-line R See figure 1 9 TO-66 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Input voltage V to ground . 45 V Input-output voltage differential 45 V Power dissipation at 25C: Case C . 900 mW Case R . 3.0 W Load

11、 current: Case C . 150 mA Case R . 250 mA Operation junction temperature range . -55C to +125C Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) +300C Power dissipation, (TC= +25C): Case C . 1.8 W Case R . 13.9 W Thermal resistance junction-to-ambient (JA) : Case C .

12、 128 C/W Case R . 41.6 C/W Thermal resistance junction-to-case (JC) : Case C . 55 C/W Case R . 7.15 C/W Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISIO

13、N LEVEL G SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are thos

14、e cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Ou

15、tlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue

16、, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specifi

17、c exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (

18、QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as

19、documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-

20、38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2

21、 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient op

22、erating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be m

23、arked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with

24、 a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-39

25、90 REVISION LEVEL G SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. 1/ Test Symbol Conditions Group A subgroups Device type Limits Unit Min Max Line regulation VIN= 0.1 VIN, VIN= VMAX4, 5, 6 01 0.1 %VOUTLoad regulation Case C: IL= 1 to 100 mA 4, 5, 6 01 0.004 %VO/mA Ca

26、se R: IL= 1 to 200 mA, VS= (VO+ 5), VS= 10 V 0.004 TC of output voltage 2/ 4, 5, 6 01 0.015 %/C Stand by current drain 3/ VIN= VMAX, VO= 0 V, IL= 0 1, 2, 3 01 +2.5 mA IL= 0 -4.0 Input voltage range 1, 2, 3 01 9.5 45 V Output voltage scale factor RSET= 71.5 k, TJ= 25C 4 01 2.38 2.62 k/V Output voltag

27、e range RSET= 71.5 k 1, 2, 3 01 0.05 42 V Output voltage tracking 4, 5, 6 01 2.0 % Input-output voltage differential IL= 50 mA 1, 2, 3 01 3.0 V Ripple rejection 2/ f = 120 Hz, TJ= 25C, VO= 15 V, VIN= 19 V 4 01 40 dB Output short circuit current VIN= 30 V max, TJ= 25C 1 01 600 mA Output noise voltage

28、 CL= 4.7 F, VO= 5 V, f = 10 Hz to 100 kHz, TJ= 25C, VIN= 30 V 4 01 350 V rms Internal thermal shutdown 4/ 1/ 5 VOUT VMAX; -55C TJ +125C; IL = 1 mA, unless otherwise specified. 2/ If not tested, shall be guaranteed to the specified limits. 3/ Plus or minus quiescent current will increase by 50 A/VOUT

29、 on positive side and 100 A/VOUT on negative side. 4/ Internal thermal shutdown occurs normally at 175C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISI

30、ON LEVEL G SHEET 5 DSCC FORM 2234 APR 97 FIGURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 6 DSCC FORM 2234 APR 97

31、 Symbol Inches Millimeters Min Max Min Max A 0.250 0.340 6.35 8.64 D - 1.252 - 31.80 D1 0.470 0.500 11.94 12.70 D2 0.958 0.962 24.30 24.43 D3 0.477 0.483 12.12 12.27 E - 0.700 - 17.78 e 0.325 BSC 8.26 BSC e1 0.163 BSC 4.14 BSC F 0.050 0.075 1.27 1.90 L 0.360 - 9.14 - b 0.028 0.032 0.71 0.81 b1 0.142

32、 0.152 3.61 3.86 R - 0.145 - 3.68 NOTES: 1. Dimensions are in inches. 2. Metric equivalent are given for general information only. FIGURE 1. Case outline - Continued. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE

33、A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 7 DSCC FORM 2234 APR 97 Device type 01 Case outlines R C Terminal number Terminal symbol 1 VO- VO+ 2 RONC 3 RSETCOMP+ 4 GND BAL 5 V+ COMP- 6 VO+ NC 7 COMP+ V- 8 BAL VO- 9 COMP- NC 10 - RO11 - RSET12 - GND 13 - NC 14 - V+

34、NC = No connection FIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 8 DSCC FORM 2234 APR 97 3.6 Certifica

35、te of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affi

36、rm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Not

37、ification of change. Notification of change to DLA Land and Maritime -VA shall be required for any change that affects this drawing. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and

38、 applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accord

39、ance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer

40、under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125

41、C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordan

42、ce with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.3.2

43、Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control

44、and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 h

45、ours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 77054 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL G SHEET 9 DSCC FORM 2234 APR 97 TABLE I

46、I. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*,2,3,4 Group A test requirements (method 5005) 1*,2,3,4,5,6 Groups C and D en

47、d-point electrical parameters (method 5005) 1 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Gover

48、nment microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record

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