DLA SMD-5962-77058 REV H-2011 MICROCIRCUIT DIGITAL CMOS 12-BIT BINARY COUNTER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED D Add vendor CAGE 27014. Remove vendor CAGE 07263. Device 01FX inactive for new design. Convert to military drawing format. Editorial changes throughout. 86-03-28 M. A. Frye E Technical changes in table I, table II, and 1.4. Change CAGE code to 672

2、68. Delete vendor CAGE 31019. Change vendor CAGE 27014 part number from MM4640BJ/883B to CD4040BMJ/883. Editorial changes throughout. 89-02-09 M. A. Frye F Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout.- LTG 03-08-19 Thomas M. Hess G Made change to paragraph 3.5. Upd

3、ate boilerplate to MIL-PRF-38535 requirements. - LTG 05-01-14 Thomas M. Hess H Correct condition VOfor input voltage tests in table I. Update boilerplate to MIL-PRF-38535 requirements. jak 11-08-22 Thomas M. Hess CURRENT CAGE CODE 67268 REV SHEET REV SHEET REV STATUS REV H H H H H H H H H OF SHEETS

4、SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY William E. Shoup DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil/ STANDARD MICROCIRCUIT DRAWING CHECKED BY A. J. Foley THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Nelson A. Hauck MICROCIRCUIT, DIGITAL

5、, CMOS, 12-BIT BINARY COUNTER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 78-02-24 AMSC N/A REVISION LEVEL H SIZE A CAGE CODE 14933 77058 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E475-11 .Provided by IHSNot for ResaleNo reproduction or networking permitted with

6、out license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordan

7、ce with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 77058 01 E A Drawing number Device type (see 1.2.1) Case outline (see 1.2.2) Lead finish (see 1.2.3) 1.2.1 Device type(s). The device type(s) identify the circuit function

8、as follows: Device type Generic number Circuit function 01 4040B CMOS, 12-bit binary counter 1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line package F G

9、DFP2-F16 or CDFP3-F16 16 Flat pack 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum ratings. Supply voltage range . -0.5 V dc to +18 V dc Input voltage range -0.5 V dc to VDD+ 0.5 V dc Storage temperature range -65C to +150C Maximum power dissipat

10、ion (PD) . 500 mW 1/ Lead temperature (soldering, 10 seconds) . +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Junction temperature (TJ) . +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) +3.0 V dc to +15 V dc Case operating temperature range (TC) . -55C to

11、+125C Minimum CP width, low or high (tW): TC= +25C . 335 ns TC= -55C, TC= +125C 503 ns Minimum reset pulse width (tWR): TC= +25C . 640 ns TC= -55C, TC= +125C 950 ns 1/ For TC= +100C to +125C, derate linearly at 12 mW/C to 200 mW. Provided by IHSNot for ResaleNo reproduction or networking permitted w

12、ithout license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks

13、form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFE

14、NSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are a

15、vailable online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

16、 this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class

17、 level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance wit

18、h the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. T

19、hese modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be

20、as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.3

21、 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups

22、 specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET

23、 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). 3.5.1 Certification/compliance mark. A co

24、mpliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of comp

25、liance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DLA Land and Maritime -VA prior to listing as an approved source of supply shall affirm that th

26、e manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification

27、of change. Notification of change to DLA Land and Maritime-VA shall be required in accordance with MIL-PRF-38535, appendix A. 3.9 Verification and review. DLA Land and Maritime, DLA Land and Maritime s agent, and the acquiring activity retain the option to review the manufacturers facility and appli

28、cable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 7

29、7058 REVISION LEVEL H SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Quiescent device current IDDVDD= 15 V VIN= 0.0 V or VDD1 All 100 A 2 600 3 80 Low lev

30、el output voltage VOLVDD= 15 V VIN= 0.0 V or VDD1, 2, 3 All .05 V High level output voltage VOHVDD= 15 V VIN= 0.0 V or VDD1, 2, 3 All 14.95 V Low level input voltage VILVDD= 5.0 V VOL= 0.5 V, VOH= 4.5 V 1, 2, 3 All 1.5 V VDD= 15.0 V VOL= 1.5 V, VOH= 13.5 V 1, 2, 3 All 4.0 V High level input voltage

31、VIHVDD= 5.0 V VOL= 0.5 V, VOH= 4.5 V 1, 2, 3 All 3.5 V VDD= 15.0 V VOL= 1.5 V, VOH= 13.5 V 1, 2, 3 All 11 V Low level output current IOLVDD= 5 V VO= 0.4 V 1 All .51 mA 2 All .36 3 All .64 VDD= 15 V VO= 1.5 V 1 All 3.4 2 All 2.4 3 All 4.2 High level output current IOHVDD= 5 V VO= 4.6 V 1 All -.20 mA

32、2 All -.14 3 All -.25 VDD= 15 V VO= 13.5 V 1 All -1.5 mA 2 All -1.1 3 All -1.8 Input current IINVDD= 15 V VIN= 0.0 V or VDD1, 3 All 0.1 A 2 1.0 Input capacitance CINVIN= 0.0 V TC= +25C See 4.3.1c 4 All 7.5 pF Functional test See 4.3.1d 7 All Provided by IHSNot for ResaleNo reproduction or networking

33、 permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified Group A s

34、ubgroups Device type Limits Unit Min Max Minimum clock frequency fMAX VDD= 5.0 V CL= 50 pF 10% RL= 200 k tr= tf= 20 ns TC= +25C 9 All 1.5 MHz TC= -55C, TC= +125C 10, 11 1.0 MHz Transition time tTHL, tTLHTC= +25C 9 All 2.0 350 ns TC= -55C, TC= +125C 10, 11 2.0 525 ns Propagation delay time, RESET to

35、QntPLH1. tPHL1TC= +25C 9 All 2.0 1080 ns TC= -55C, TC= +125C 10, 11 2.0 1620 ns Interstage propagation delay time Qnto Qn + 1tPLH2. tPHL2TC= +25C 9 All 2.0 700 ns TC= -55C, TC= +125C 10, 11 2.0 1050 ns Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

36、STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 7 DSCC FORM 2234 APR 97 Device type All Case outlines E and F Terminal number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Q12Q6Q5Q7Q4Q3Q2VSSQ1CP RESET Q9Q8Q10Q11VDDFIGURE 1. T

37、erminal connections. CP RESET Output state 0 No change 0 Advanced to next state X 1 All outputs are low = Low to high transition = High to low transition X = Irrelevant FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD M

38、ICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 8 DSCC FORM 2234 APR 97 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in

39、accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A or D. The test circuit shall be maintained by the manufacturer u

40、nder document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA=

41、+125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in

42、 accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - Final electrical test parameters (method 5004) 1*, 2, 3, 9 Group A test requirements (method 5005) 1, 2, 3, 4, 7, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA a

43、pplies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the specified limits in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following add

44、itional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroup 4 (CINmeasurement) shall be measured only for the initial test and after process or design changes

45、which may affect input capacitance. Test all applicable pins on five devices with zero failures. d. Subgroup 7 tests shall include verification of the truth table as specified in figure 2 herein. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA

46、RD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 SIZE A 77058 REVISION LEVEL H SHEET 9 DSCC FORM 2234 APR 97 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-

47、STD-883. (1) Test condition A or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as ap

48、plicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Govern