DLA SMD-5962-78023 REV T-2012 MICROCIRCUIT LINEAR QUAD HIGH SPEED DIFFERENTIAL LINE DRIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED K Add device type 02 and add vendor CAGE 27014. Change to one part-one part number format. Technical changes to 1.3, 1.4, table I, and table II. Change figure 2 to figure 3. Add figure 2. - mlp 91-04-19 M. A. Frye L Changes in accordance with N.O.R

2、. 5962-R062-92. - jt 91-11-22 M. Poelking M Changes in accordance with N.O.R. 5962-R168-98. - drw 98-09-01 R. Monnin N Add radiation hardened information. Editorial changes throughout. - drw 99-05-12 R. Monnin P Make change to 3.2.5. Delete the radiation hardened circuit as specified in figure 4. -

3、ro 00-10-26 R. Monnin R Add case outline Z. - ro 01-05-02 R. Monnin T Redraw. Update drawing to current requirements. - drw 12-01-26 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV T T SHEET 15 16 REV STATUS REV T T T T T T T T T T T T T T OF SHEETS SHEET

4、1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Joan M. Fisher DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY C. R. Jackson

5、 APPROVED BY N. A. Hauck MICROCIRCUIT, LINEAR, QUAD HIGH SPEED DIFFERENTIAL LINE DRIVER, MONOLITHIC SILICON DRAWING APPROVAL DATE 79-02-02 AMSC N/A REVISION LEVEL T SIZE A CAGE CODE 67268 78023 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E115-12 Provided by IHSNot for ResaleNo reproduction or networkin

6、g permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device clas

7、ses Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the

8、 following example: 5962 F 78023 01 M E A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the

9、 MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device types. The device

10、types identify the circuit function as follows: Device type Generic number Circuit function 01 26LS31 Quad, high speed, differential line driver 02 26F31 Quad, high speed, differential line driver 1.2.3 Device class designator. The device class designator is a single letter identifying the product a

11、ssurance level as follows: Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case out

12、lines. The case outlines are as designated in MIL-STD-1835 as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-T16 or CDIP2-T16 16 Dual-in-line F GDFP2-F16 or CDFP3-F16 16 Flat pack Z GDFP1-G16 16 Flat pack with gullwing leads 2 CQCC1-N20 20 Square leadless chip carrier

13、 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND M

14、ARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 3 DSCC FORM 2234 APR 97 1.3 Absolute maximum ratings. 1/ Power supply and input voltage 7.0 V dc Output voltage . 5.5 V dc Storage temperature range . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Maximum power dissipation (PD

15、) 450 mW 2/ Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC): Device 01: Case E 16C/W Case F 14C/W Case 2 . 19C/W Device 02: Case E 14C/W Cases F and Z . 13C/W Case 2 . 15C/W Thermal resistance, junction-to-ambient (JA): Device 01: Case E 94C/W derate above +25C at 10.6 mW

16、/C Case F 163C/W derate above +25C at 6.1 mW/C Case 2 . 83C/W derate above +25C at 12 mW/C Device 02: Case E 88C/W derate above +25C at 11.4 mW/C Cases F and Z . 151C/W derate above +25C at 6.6 mW/C Case 2 . 81C/W derate above +25C at 12.3 mW/C 1.4 Recommended operating conditions. Supply voltage ra

17、nge (VCC) 4.5 V dc to 5.5 V dc Minimum high-level input voltage (VIH) . 2.0 V dc Maximum low-level input voltage (VIL) 0.8 V dc Ambient operating temperature range (TA) . -55C to +125C 1.5 Radiation features. Maximum total dose available (dose rate = 50 to 300 rads (Si)/s) 300 Krads(Si) 3/ _ 1/ Stre

18、sses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Must withstand the added PDdue to short circuit test: e.g., IOS. 3/ These parts may be dose rate sensitive in a space environme

19、nt and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STAN

20、DARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to t

21、he extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test

22、 Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist

23、.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence.

24、Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 as specified herein, or as modifie

25、d in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and

26、 as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines s

27、hall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Block diagrams. The block diagrams shall be as specified on figure 2. 3.2.4 Test circuit and switching waveforms. The test circuit and switching waveforms shall be a

28、s specified on figure 3. 3.2.5 Radiation test circuit. The radiation test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upon request. 3.3 Electrical performance characteristics and postirradia

29、tion parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements

30、shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 R

31、EVISION LEVEL T SHEET 5 DSCC FORM 2234 APR 97 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the opt

32、ion of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certificati

33、on/compliance mark. The certification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of comp

34、liance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.

35、6.2 herein). The certificate of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the re

36、quirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8

37、Notification of change for device class M. For device class M, notification to DLA Land and Maritime -VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device c

38、lass M, DLA Land and Maritime, DLA Land and Maritimes agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignme

39、nt for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 53 (see MIL-PRF-38535, appendix A). 3.11 PIN supersession information. The PIN supersession information shall be as specified in the appendix. Provided by IHSNot for ResaleNo reproduction or n

40、etworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Condition 1/, 2/ -55C TA +125C unless otherwise spec

41、ified Group A subgroups Device type Limits Unit (MIL-STD-883 test method) Min Max Output high voltage (3006) VOHVCC= 4.5 V, IOH= -20 mA 1, 2, 3 All 2.5 V M,D,P,L,R,F 1 2.5 Output low voltage (3007) VOLVCC= 4.5 V, IOH= 20 mA 1, 2, 3 All 0.5 V M,D,P,L,R,F 1 0.5 Input high voltage VIH VCC= 4.5 V 3/ 1,

42、2, 3 All 2.0 V Input low voltage VILVCC= 5.5 V 3/ 1, 2, 3 All 0.8 V Input low current (3009) IILVCC= 5.5 V, 4/ 1, 2, 3 01 0.10 -0.36 mA VIN= 0.4 V 02 0.10 -0.20 M,D,P,L,R,F 1 01 0.10 -0.36 02 0.10 -0.20 Input high current (3010) IIH VCC= 5.5 V, 4/ VIN= 2.7 V 1, 2, 3 All -2.0 20 A M,D,P,L,R,F 1 -2.0

43、20 Input reverse current IIVCC= 5.5 V, 4/ VIN= 7.0 V 1, 2, 3 All -0.01 0.1 mA M,D,P,L,R,F 1 -0.01 0.1 Off-state (high impedance) output current IOVCC= 5.5 V, VO= 2.5 V 1, 2, 3 All 20 A (3020, 3021) M,D,P,L,R,F 1 20 VCC= 5.5 V, VO= O.5 V 1,2,3 -20 M,D,P,L,R,F 1 -20 Input clamp voltage (3022) VIVCC= 4

44、.5 V, IIN= -18 mA 1, 2, 3 All -1.5 V M,D,P,L,R,F 1 -1.5 Output short circuit current (3011) IOS VCC= 5.5 V 5/ 1, 2, 3 All -30 -150 mA M,D,P,L,R,F 1 -30 -150 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICRO

45、CIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions 1/, 2/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit (MIL

46、-STD-883 test method) Min Max Power supply current (3005) ICC VCC= 5.5 V, 1, 2, 3 01 80 mA all outputs disabled 02 50 M,D,P,L,R,F 1 01 80 02 50 VCC= 5.5 V, all outputs enabled 1,2,3 02 40 M,D,P,L,R,F 1 02 40 Propagation delay, output to output tSKEW VCC= 5.0 V, 6/ 9 01 6.0 ns CL= 30 pF 10, 11 9.0 9

47、02 7/ 4.5 10, 11 7.0 VCC= 5.0 V, 6/ 9 02 6.0 CL= 50 pF 10, 11 9.0 Propagation delay, input to output tPLH VCC= 5.0 V, 6/ 9 01 20 ns (3003) CL= 30 pF, see figure 3 10, 11 30 9 02 7/ 15 10, 11 23 VCC= 5.0 V, 6/ 9 02 16 CL= 50 pF, see figure 3 10, 11 24 tPHL VCC= 5.0 V 6/ 9 01 20 CL= 30 pF, see figure

48、3 10, 11 30 9 02 7/ 15 10, 11 23 VCC= 5.0 V 6/ 9 02 17 CL= 50 pF, see figure 3 10, 11 25 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 78023 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. Test Symbol Conditions 1/, 2/ -55C TA +125C unless otherwise specif