DLA SMD-5962-79016 REV B-1992 MICROCIRCUIT DIGITAL CMOS 1-TO-64 BIT SHIFT REGISTER MONOLITHIC SILICON《硅单片1至64比特移位寄存器 氧化物半导体数字微型电路》.pdf

1、SMD-59b2-790Lb REV B = b 003LL99 547 LTR A B DESCRIPTION DATE (YR-MO-DA) APPROVED Pages 4, 5: DC parameters specified over temp. 80-03-07 N.A. Hauck Convert to SMD format. Editorial changes throughout. Redrawn. M.L. Poelking 92-11-18 THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED CURRENT

2、CAGE CODE 67268 , REV III SHEET SHEET REV STATUS OF SHEETS PMIC NIA STANDARDIZED MILITARY DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A 5A33z SHEET PREPARED BY A.J. Foley CHECKED BY C.R. Jackson APPROVED BY N.A. Hauck DRAWING APPROVAL

3、 DATE 79-05-15 REVISION LEVEL B DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 MICROCIRCUIT, DIGITAL, CMOS, MONOLITHIC SILICON 1-TO-64 BIT SHIFT REGISTER, SIZE CAGE CODE 79016 A 14933 SHEET 1 OF 11 ESC FORM 193-1 JUL 91 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unl

4、imited. 5962-650-92 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-1. SCOPE 1.1 Scope. This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunctio

5、n with compliant non-JAN devices“. 1.2 Part or Identifying Number (PIN). The complete PIN shall be as shown in the following exampie: I DESC FORM 193A JUL 91 7- I I STANDARD1 ZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 RFXISION LEVEL B T I I 79016 SHEET 2 i I X T

6、 I Lead finish Case outline Device type (See 1.2.1) (See 1.2.2) (see 1.2.3) 1 Drawing number 1.2.1 Device type(s). The device typeCs) shall identify the circuit function as follows: Device type Generic number Circuit function o1 45578 I-to-64 bit shift register 1.2.2 Case outline(s). The case outlin

7、e(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E F GDIPI-TI6 or CDIP2-Tl6 16 GDFP2-FI6 or CDFP3-FI6 16 Dual-in-line Flat package 1.2.3 Lead finish. The lead finish shall be as specified in MIL-M-38510. Finish letter “X“ shall

8、 not be marked on the microcircuit or its packaging. are considered acceptable and interchangeable without preference. The “X“ designation is for use in specifications when lead finishes A, 6, and C 1.3 Absolute maximum ratings. Supply voltage range (VDDI Input voltage range - - - - - - - - - - - -

9、- - - - - - - - - - - - - - - - - - - - - - -0.5 V dc to +I8 V dc -0.5 V dc to V + 0.5 V dc (voltages referenced to Vss terminal) Storage temperature range - - - - - - - - - - - - - - - - Raximum power dissipation (PD) - - - - - - - - - - - - - Lead temperature (soldering, 10 seconds) Thermal resist

10、ance, junction-to-case (QJc) - - - - - - - Junction temperature (TJ) - - - - - - - - - - - - - - - - -65OC to +150eD 400 m i/ +260c See MIL-STD -1835 +17SoC - - - - - - - - 1.4 Recommended operating conditions. Supply voltage range (VDDI - - - - - - - - - - - - - - - Minimum high level input voltage

11、 (VI I - - - - - - - - - Maximum low level input voltage (VILY - - - - - - - - - - Case operating temperature range (TC) - - - - - - - - - - +3.0 V dc minimum to +I5 V de maximum +3.5 V dc at VDD = 5 V dc +1.5 V dc at VDD = 5 V dc -55OC to +12SC - I/ For TA = +loOC, derate linearly at 12 mW/DC to 2M

12、) m. L “i Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5762-79016 REV B 9999996 0031201 T25 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and bulletin. Unless otherwise specified, the following specification, standards, and

13、bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein. SPECIFICATION MIL I TARY MIL-M-38510 - Microcircuits, General Specification for. STANDARDS MILITARY

14、 MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-1835 - Microcircuit Case Outlines. BULLET IN MILITARY MIL-BUL-103 - List of Standardized Military Drawings (SMDs). (Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acqu

15、isition functions should be obtained from the contracting activity or as directed by the contracting activity.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence. 3. REQUIREMENTS 3.1 It

16、em requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, “Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices“ and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical

17、 dimensions shall be as specified in MIL-M-38510 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. 3.2.3 Truth table. 3.2.4 Logic diaqram. The terminal connections shall be as specified on figure 1. The truth table shall be a

18、s specified on figure 2. The logic diagram shall be as specified on figure 3. 3.2.5 Switchinq time waveforms. 3.3 Electrical performance characteristics. The switching time waveforms shall be as specified on figure 4. Unless otherwise specified herein, the electrical performance characteristics are

19、as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in a

20、ccordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the PIN listed in 1.2 herein. herein). In addition, the manufacturers PIN may also be marked as listed in MIL-BUL-103 (see 6.6 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer i

21、n order to be The certificate of compliance submitted to listed as an approved source of supply in MIL-BUL-103 (see 6.6 herein). DESC-EC prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-STD-883 (see 3.1 herein) and the require

22、ments herein. STANDARDIZED SIZE 79016 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SND-59b2-790Lb REV B 9999996 0033202 961 unless o

23、therwise specified TABLE I. Electrical performance characteristics. I Min I Max I I High level output voltage I VoH IVDD = 5.0 V IVIN = O or VDD 1 1,2,3 1 All 1 4.951 I 9.951 I I I I 14.951 I IVDD = 10 v I l I IVDD = 15 V I I I I I I I l I I I I I I I I Vo = 9.0 V I Low level output voltage I VOL IV

24、DD = 5.0 V IVIN = VDD or O I 1,2,3 I All I I 0.051 V I 0.051 I 0.051 I I I I I 1 l I I I l l IVDD = 10 v I I I I IVDD = 15 v I I I I VDD = 10 v High level input voltage I IH 11 or 1.5 V vo = 4.5 v VDD = 5.0 V 1,2,3 I All 1 3.5 I 1 V or 0.5 v I I I I iu I or 1.5 V I I l I 1 I 1 I I STANDARDIZED MILIT

25、ARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 SIZE 79016 A REVISION LEVEL SHEET B 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Test STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER Quiescent current SIZE 79016 A

26、 Functional tests Propagation delay - time, clockor CE to Q or Q Propagation delay time,-reset to Q or Q Transition time Transition time, reset TABLE I. Electrical performance characteristics - Continued. See footnotes at end of table. ymbol IDD tTHL2 CL = 50 pF min - 21 I/ VDD = 5.0 V VDD = 15 V RL

27、 = 2 kR VDD = 10 v I 390 I I 285 I I I I I 1 I I I I I i All I - 3/ VDD = 15 V 2/ I I I CL = 50 pF min VDD = 5.0 V i RL = 200 M VDD = 10 v 2/ I 9 I I I I I I 300 I I 150 I g/ y VDD = 15 V ! ! ! I 120 I CL = 50 pF min VDD = 5.0 V I 10/11 I I RL = 200 M VDD = 10 v I I I l l I I I CL = 50 pF min VDD =

28、5.0 V I 9 I All I I 15 I PS RL = 200 M VDD = 10 v 2/ I I I I 5-0 I I I I I - 3/ VDD = 15 V 2/ I I CL = 50 pF min - 2/ I/ VDD 5.0 V VDD = 15 V RL = 200 M VDD = 10 v I I 22 I I I 7.0 I I I 4.0 I DAYTON, OHIO 45444 I REVISION LEVEL I SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduct

29、ion or networking permitted without license from IHS-,-,-SflD-59b2-7901b REV B m 9999996 0031204 734 m Test Clock pu Ise frequency Clock pulse width Reset pulse width Setup time, A E B to clock or CE Hold firne, clock or CE to A or B TABLE I. Electrical performance characteristics - Continued. ,ymbo

30、l f CL tQW (Cu) tPW (RST) CL = 50 pF min VDD = 5.0 V RL = ZW 161 2/ 31 VDD = 10 v VDD = 15 v I I 10,ll I I I CL = 50 pF min 21 3/ VDD = 5.0 V VDD = 15 V RL = 200 M VDD = 10 v I 10,ll I I Devi ce type All All All Al 1 ALL Limits Min I Max I I 5.0 I 1.7 I 6.7 I + + _II_ 0.851 2.5 I 3.351 200 I 100 I 7

31、5 I 300 I 150 I L I 100 I 113 I 300 I 140 I - 450 I 150 I 210 1 I 700 I 290 I 145 I I 435 I 1050 I z1B 225 I 185 I 85 I _i_ 340 1 280 1 130 1 I - I/ V - 21 Tils condition is guaranteed, if not tested, to the specification limits in table I. - 31 See figure 4 for switching time waveforms. and VIL tes

32、ts are not required if applied as forcing functions for the VOH and VOL tests. Unit MHz ns ns ns ns REVISiON LEVEL STMDARbIZED MILITARY DRAWING DEFERSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 49444 79016 SHEET DESC FOM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted w

33、ithout license from IHS-,-,-SMD-5962-77036 REV B 9999996 0033205 670 rn I Device type 1 o1 I I l I Case outline 1 E and F I Terminal number I Terminal symbol I J I I I I I L I I 1 I L2 I i 2 3 8 9 10 11 12 13 14 15 16 V A% SEL Q Q - u2 LI 6 L8 L4 “DD FIGURE I. Terminal connections. H = logic high vo

34、ltage level L = logic tow voltage level X = dont care H-L = high-to-low transition L-H = low-to-high transition GI = the output of the first selected shift register stage FIGURE 2. Truth table. I I I STANDARDIZED SIZE 79016 MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVI

35、SION LEVEL SHEET DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-790Lb REV B 999999b O033206 507 STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 7 RESET SIZE 79016 A REVISION LEVEL SHE

36、ET CLOCK CE - 8 A A/B SELECT L1 L2 L4 L8 L16 L 32 O - O VDD = PIN 16 Vss = PIN 8 FIGURE 3. Logic diagram. DESC FORM 193A JUL 91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-5962-79016 REV B = 9999996 0031207 443 STANDARDIZED MILITARY DRAWING D

37、EFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CLOCK SIZE 79016 A REVISION LEVEL SHEET B 9 A INPUT RESET I r OD SS DO SS DD SS tpw RSTI PHL2 OH Q “OL NOTE: The inverter waveform is not shown. Dynamic test waveforms InDut Dulse VGEN = v i1.m t = l.BD*o.l ps tPH= tc = 20 *2 ns DESC FORM 193A JUL

38、91 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-SMD-59b2-790Lb REV B 999999b 0031208 38T STANDARDIZED MILITARY DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 3.7 Certificate of conformance. A certificate of conformance as required in

39、 MIL-STD-883 (see 3.1 herein) shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DESC-EC shall be required in accordance with MIL-STD-883 (see 3.1 herein). 3.9 Verification and review. DESC, DESCs agent, and the acquiring

40、 activity retain the option to review the manufacturers facility and applicable required documentation. at the option of the reviewer. Offshore documentation shall be made available onshore 4. QUALITY ASSURANCE PROVISIONS SIZE 79016 A REVISION LEVEL SHEET B 10 4.1 Samplina and inspection. Sampling a

41、nd inspection procedures shall be in accordance with section 4 of MIL-M-38510 to the extent specified in MIL-STD-883 (see 3.1 herein). 4.2 Screeninq. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The f

42、ollowing additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, E, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The

43、 test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA = +12SoC, minimum. Interim and final electrical test parameters shall be as specified in table II herein, except interim e

44、lectrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. b. TABLE II. Electrical test requirements. 1 I MIL-STD-883 test requirements l Subgroups I I I (in accordance with I I method 5005. table I) L I l I l I I interim electrical parameters I 1 I (method 5004)

45、I I I 1 (method 5004) I I _-_ I Final electrical test parameters I I*, 2, 3, 7, 9 I I I Group A test requirements I (method 5005) I I I 1, 2, 3, 4, 7, I I I 8, 9, IO,* Il* I I Groups C and D end-point I electrical parameters (method 5005) 1, 2, 3 I I * PDA applies to subgroup 1. * Subgroups 10 and 1

46、1, if not tested, shall be guaranteed to the limits specified in table.1. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-a STANDARDIZED SIZE MILITARY DRAWING A DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 REVISION LEVEL B SMD-5762-770Lb REV

47、B D 7777776 0033207 23b 79016 SHEET 11 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method SKI5 of i1L-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. b. Tests shall be

48、as specified in table II herein. Subgroup 4 (GIN measurement) shall be measured only for the initial test and after process or design changes which may affect input capacitance. a frequency of 1 MHz. Subgroups 7 and 8 tests shall include verification of the truth table. Capacitance shall be measured

49、 between the designated terminal and Vss at Test all applicable pins on 5 devices with zero failures. c. 4.3.2 Groups C and D inspections. a. b. End-point electrical parameters shall be as specified in table II herein. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, 8, C, or D. The test circuit shall be mainta