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本文(DLA SMD-5962-80013 REV T-2011 MICROCIRCUIT HYBRID LINEAR OPERATIONAL AMPLIFIER THICK FILM.pdf)为本站会员(registerpick115)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-80013 REV T-2011 MICROCIRCUIT HYBRID LINEAR OPERATIONAL AMPLIFIER THICK FILM.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change TAto TC; Minor corrections to table I; rewrite para 3.7; Change vendor. 82-03-30 N. A. Hauck B Reinstate vendor, FSCM 27014. 82-05-14 W. E. Shoup C Modify para 3.7; general update. 83-08-03 N. A. Hauck D Add vendors FSCMs 63071 and 64762.

2、Remove vendor FSCM 27014. Editorial changes throughout. 84-12-14 N. A. Hauck E Add vendor FSCM 27014. 85-12-03 N. A. Hauck F Convert to military format. Change CAGE to 67268. Add vendors CAGES 23223 and 34031. 88-01-14 W. Heckman G Made technical change to 1.3. Removed CAGE 63071. Made editorial cha

3、nges throughout. Changed to reflect MIL-H-38534 processing. 90-01-08 W. Heckman H Corrections to table I. Update document. Editorial changes throughout. 92-06-26 G. A. Lude J Changes in accordance with NOR 5962-R195-93. 93-06-22 K. A. Cottongim K Changes in accordance with NOR 5962-R266-94. 94-08-17

4、 K. A. Cottongim L Changes in accordance with NOR 5962-R102-96. 96-04-15 K. A. Cottongim M Changes IAW NOR 5962-R195-93, 5962-R266-94, and 5962-R102-96. Entire document redrawn. 96-08-02 Raymond Monnin N Remove CAGE codes 23223 and 64762. Changes to table I. 98-06-22 K. A. Cottongim P Updated drawin

5、g to the latest requirements. -sld 05-04-04 Raymond Monnin R Table I, supply voltage rejection ratios test, Group A subgroups column, add “1, 2, 3 or“. Output voltage swing (maximum) test: Delete “(maximum)“ and for the Group A subgroups column, add “or 4, 5, 6“. 06-03-27 Raymond Monnin T Add device

6、 type 02. Table I, add note 3 to SVRR(), CMRR, VOP, AVand remove note 3 from AVS(). Table II, correct the subgroups for Final electrical parameters and Group A test requirements. -gz 11-02-10 Charles F. Saffle THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SH

7、EET REV SHEET REV STATUS REV T T T T T T T T T OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 PMIC N/A PREPARED BY C. R. Jackson DLA LAND AND MARITIME STANDARD MICROCIRCUIT DRAWING CHECKED BY William E. Shoup COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AP

8、PROVED BY N.A Hauck MICROCIRCUIT, HYBRID, LINEAR, OPERATIONAL AMPLIFIER, THICK FILM AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 80-12-22 AMSC N/A REVISION LEVEL T SIZE A CAGE CODE 14933 80013 SHEET 1 OF 9 DSCC FORM 2233 APR 97 5962-E078-11Provided by IHSNot for ResaleNo reproduct

9、ion or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to proces

10、sed in accordance with MIL-PRF-38534. 1.2 PIN. The PIN shall be as shown in the following example: 80013 01 Z C Drawing number Device type Case outline Lead finish (see 1.2.1) (see 1.2.2) (see 1.2.3) 1.2.1 Device types. The device types identify the circuit function as follows: Device type Generic n

11、umber Circuit function 01 FLH0032G, MSK 0032B Operational amplifier 02 MSK 0032B Operational amplifier 1.2.2 Case outline. The case outline are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style Z See figure 1 12 Can 1.2.3 Lead finish. The lea

12、d finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Supply voltage range 18 V dc maximum Input voltage range . 18 V dc Maximum power dissipation (PD) TA= +25C . 1.5 W 2/ 3/ Storage temperature range -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction

13、 temperature(TJ) +150C 1.4 Recommended operating conditions. Supply voltage (VS) . 15 V dc Ambient operating temperature range (TA) . -55C to +125C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of thi

14、s drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. 1/ Stresses above the absolute maximum ratings ma

15、y cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ No heat sink. 3/ Derate at 10 mW per C. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING

16、SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 3 DSCC FORM 2234 APR 97 DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK

17、-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2

18、 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3

19、.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturers Quality Management (QM) plan or as designated fo

20、r applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit,

21、or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein and figure

22、1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperatu

23、re range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of devices. Marking of devices shall be in accordance with MIL-PRF-38534. The device shall be marked w

24、ith the PIN listed in 1.2 herein. In addition, the manufacturers vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the

25、initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufactur

26、er and be made available to the preparing activity (DLA Land and Maritime-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Mar

27、itime-VA shall affirm that the manufacturers product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. Provided by IHSNo

28、t for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C T

29、A +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Input offset voltage VIORL= 100 k, VIN= 0 V 1 01 5.0 mV 2,3 10.0 RL= 100 k, VIN= 0 V, -40C TC +71C 1 02 2.0 mV RL= 100 k, VIN= 0 V, TC= -55C, +125C 2,3 10.0 Input voltage range 2/ VCM1,2,3 01,02 10 V Input offset cu

30、rrent IIOVIN= 0 V 1 01,02 0.025 nA 2,3 25 Input bias current IIBVIN= 0 V 1 01,02 0.1nA 2,3 50Supply current ICCIO= 0 mA, TA= +25C 1 01,02 20 mA Supply voltage rejection 3/ ratios SVRR() 5 V VS 20 V 1,2,3 or 4,5,6 01,02 50 dB Large signal voltage 2/ gain AVS() RL= 1 k, VOUT= 10 V 4 01,02 48 dB 5,6 45

31、 Input voltage common- mode rejection ratio 3/ CMRR VIN= 10 V 4,5,6 01,02 50 dB Input offset voltage temperature coefficient V/T 1,2,3 01,02 50 V/C Output voltage swing 3/ VOPRL= 1 k 1,2,3 or 4,5,6 01,02 10 V Voltage gain 3/ AVRL= 1 k, VOUT= 10 V, f = 1 kHz 4,5,6 01,02 57 dB Slew rate SR RL= 1 k, AV

32、= +1, VIN= 20 V, TA= +25C 4 01,02 350 V/s See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 5 DSCC FORM 223

33、4 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Small signal rise time trAV= +1, RL= 1 k, TA= +25C 9 01,02 20 ns Small signal delay time tdAV= +1, RL= 1 k, VIN=

34、1 V, TA= +25C 9 01,02 25 ns Settling time to 1 percent of final value 2/ tSETAV= -1, RL= 1 k, VIN= 20 V, TA= +25C 9 01,02 0.5 s 1/ VS= 15.0 V dc. 2/ Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. 3/ Subgroups 5 and 6 shall be tested as part of

35、device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified for subgroups 5 and 6 for all lots not specifically tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

36、UIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 6 DSCC FORM 2234 APR 97 Case outline Z. Symbol Inches Millimeters Notes Symbol Inches Millimeters Notes Min Max Min Max Min Max Min Max A .130 .181 3.30 4.60 F .022 .030 0.56 0.76 b .016 .019 0.41 0.48 2,

37、 6 k .026 .036 0.66 0.91 b1.016 .021 0.41 0.53 2, 6 k1.026 .036 0.66 0.91 3 D .595 .610 15.11 15.49 L .500 .560 12.70 14.22 2 D1.545 .555 13.84 15.37 L1- .050 - 1.27 2 e .400 BSC 10.16 BSC 4 L2.250 - 6.35 - 2 e1.200 BSC 5.08 BSC 4 Q - .045 1.14 e2.100 BSC 2.54 BSC 4 45 BSC 45 BSC NOTES: 1. The U.S.

38、government preferred system of measurement is the metric SI system. However, this item was originally designed using inch-pound units of measurement. In the event of conflict between the metric and inch-pound units, the inch-pound units shall take precedence. 2. All leads b applies between L1and L2.

39、 b1applies between L2and .500 (12.70 mm) from the reference plane. Diameter is uncontrolled in L1and beyond .500 (12.70 mm) from the reference plane. 3. Measured from the maximum diameter of the product. 4. Leads having a maximum diameter .019 (0.48 mm) measured in gauging plane .054 (1.37 mm) +.001

40、 (0.03 mm) -.000 (0.00 mm) below the base plane of the product shall be within .007 (0.18 mm) of their true position relative to a maximum tab width. 5. The product may be measured by direct methods or by gauge. 6. All leads: Increase maximum limit by .003 (0.08 mm) when lead finish A is applied. FI

41、GURE 1. Case outline. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 7 DSCC FORM 2234 APR 97 Device types 01, 02 Case outline Z Termina

42、l number Terminal symbol 1 2 3 4 5 6 7 8 9 10 11 12 No connection Output compensation Balance/compensation Balance/compensation Inverting input Noninverting input No connection No connection No connection -VSOutput +VSFIGURE 2. Terminal connections. Provided by IHSNot for ResaleNo reproduction or ne

43、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 80013 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL T SHEET 8 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-3853

44、4, group A test table) Interim electrical parameters - Final electrical parameters 1*, 2, 3, 4, 9 Group A test requirements 1/ 1, 2, 3, 4, 5, 6, 9 Group C end-point electrical parameters 1, 2, 3 End-point electrical parameters for Radiation Hardness Assurance (RHA) devices Not applicable * PDA appli

45、es to subgroup 1. 1/ See table I note 3. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturers Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit,

46、or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document r

47、evision level control and shall be made available to either DLA Land and Maritime-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.

48、(2) TAas specified in accordance with table I of method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Gro

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