DLA SMD-5962-85514 REV J-2011 MICROCIRCUIT LINEAR +5 VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to military drawing format. Changes to output adjustment range. Add conditions for load regulation test at -55C and +125C. Change group A subgroups for load regulation and line regulation tests, and output voltage temperature coefficient.

2、Add vendor CAGE 64155. Editorial changes throughout. 88-03-17 M. A. FRYE B Add vendor CAGE 07933. Add vendor CAGE 54186. Add case outline 2. Change output voltage temperature coefficient test limits. 89-04-12 M. A. FRYE C Add device type 02. Editorial changes throughout. Delete vendors CAGEs 54186 a

3、nd 07933. Add vendor CAGE 1ES66. 92-11-25 M. A. FRYE D Add class V devices. Replace CAGE 06665 with 24355. Add case outline H and TABLE IIB. Make changes to 1.2.2 and TABLE II. 97-06-10 R. MONNIN E Add radiation hardness assurance requirements. - ro 98-08-07 R. MONNIN F Make changes to 1.5, table II

4、A, 4.4.1b, and output voltage temperature coefficient test as specified in table I. - ro 00-01-21 R. MONNIN G Add device types 03 and 04. Make changes 1.2.2 and to the output voltage noise test as specified under TABLE I. - ro 01-02-07 R. MONNIN H Drawing updated to reflect current requirements. -rr

5、p 05-12-07 R. MONNIN J Removed “RADIATION HARDENED” from title block. Add device type 05 tested at low dose rate. Make change to paragraphs 1.2.2, 1.5, and 3.2.3. Make changes to footnotes 2/ and 3/ as specified under Table I. Removed figure 2. Make change to paragraph 4.4.4.1. Delete paragraphs 4.4

6、.4.1.1 and 4.4.4.2. -rrp 11-11-29 C. SAFFLE CURRENT CAGE CODE 67268 THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS REV J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY DONALD OSBORNE DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3

7、990 http:/www.landandmaritime.dla.mil STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE CHECKED BY DANIEL A. DiCENZO APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, +5 VOLT ADJUSTABLE PRECISION VOLTAGE REFERENCE, MONOLITHIC SIL

8、ICON DRAWING APPROVAL DATE 86-03-08 AMSC N/A REVISION LEVEL J SIZE A CAGE CODE 14933 85514 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E020-12 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85514 DLA LAND AND MARITI

9、ME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are av

10、ailable and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. 1.2 PIN. The PIN is as shown in the following examples. For device classes M and Q: 85514 01 G A Drawing number Device type (see 1.2.1) Ca

11、se outline (see 1.2.2) Lead finish (see 1.2.3) For device class V: 5962 R 85514 01 V G A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) Device class designator Case outline (see 1.2.4) Lead finish (see 1.2.5) / (see 1.2.3) / Drawing number 1.2.1 RHA designator. Dev

12、ice classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a

13、non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function Output voltage noise 01 REF02A Precision reference +5-volt 18 VP-Padjustable output 02 REF02 Precision reference +5-volt 18 VP-Padjustable output 03 REF02A P

14、recision reference +5-volt 100 VP-Padjustable output 04 REF02 Precision reference +5-volt 100 VP-Padjustable output 05 REF02A Radiation hardened, 18 VP-PPrecision reference +5-volt adjustable output Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STA

15、NDARD MICROCIRCUIT DRAWING SIZE A 85514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 3 DSCC FORM 2234 APR 97 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as listed below. Since the device class designa

16、tor has been added after the original issuance of this drawing, device classes M and Q designators will not be included in the PIN and will not be marked on the device. Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN c

17、lass level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style G MACY1-X8 8 Can

18、H GDFP1-F10 or CDFP2-F10 10 Flat pack P GDIP1-T8 or CDIP2-T8 8 Dual-in-line 2 CQCC1-N20 20 Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 1.3 Absolute maximum ratings. 1/ Inp

19、ut voltage (VIN) 40 V dc Power dissipation (PD) . 500 mW 2/ Output short circuit duration Indefinite Storage temperature . -65C to +150C Lead temperature (soldering, 10 seconds) . +300C Junction temperature (TJ) . +150C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 1.4 Recommended ope

20、rating conditions. Ambient operating temperature range (TA) -55C to +125C 1.5 Radiation features: Device type 01: Maximum total dose available (dose rate = 50 300 rads(Si)/s) . 100 krads (Si) 3/ Device type 05: Maximum total dose available (dose rate 10 mrads(Si)/s) 50 krads (Si) 4/ 1/ Stresses abov

21、e the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. 2/ Derate 7.1 mW/C above +80C for the “G“ and “H“ packages, 6.6 mW/C above +75C for the “P“ package, and 7.8 mW/C above +72C for the “2“ pa

22、ckage. 3/ Device type 01 may be dose rate sensitive in a space environment and may demonstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions as specified in MIL-STD-883, method 1019, condition A for device type 01. 4/ For d

23、evice type 05, radiation end point limits for the noted parameters are guaranteed for the conditions specified in MIL-STD-883, method 1019, condition D. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85514 DLA LA

24、ND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 4 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise

25、specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835

26、- Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standar

27、dization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes

28、applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturers Quality Manag

29、ement (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construct

30、ion, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein. 3.

31、2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Radiation exposure circuit. The radiation exposure circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing and acquiring activity upo

32、n request. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range

33、. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be m

34、arked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be

35、in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-

36、3990 REVISION LEVEL J SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min Max Quiescent supply current ISYNo load 1 All 1.4 mA 2,3 2.0 M,D,P,L,R 2/ 3/ 1 01 1.4

37、M,D,P,L 2/ 3/ 1 05 1.4 Output adjustment 4/ range VTRIMRP= 10 k, TA= +25C 1 All 3.0 % Output voltage VOIL= 0 mA 1 01,03,05 4.985 5.015 V 02,04 4.975 5.025 2,3 01,03,05 4.978 5.022 02,04 4.953 5.047 M,D,P,L,R 2/ 3/ 1 01 4.975 5.025 M,D,P,L 2/ 3/ 1 05 4.975 5.025 Short circuit current 4/ IOSVO= 0 V, T

38、A= +25C 1 All +15 +60 mA Sink current 4/ ISTA= +25C 1 All -0.3 mA Load regulation LD reg IL= 0 mA to 10 mA 5/ 1 All 0.01 %/mA M,D,P,L,R 2/ 3/ 1 01 0.015 M,D,P,L 2/ 3/ 1 05 0.015 IL= 0 mA to 8 mA 5/ 2,3 01,03,05 0.012 02,04 0.015 Line regulation LN reg VIN= 8 V to 33 V 5/ 1 01,03,05 0.010 %/V 02,04 0

39、.012 2,3 All 0.015 M,D,P,L,R 2/ 3/ 1 01 0.030 M,D,P,L 2/ 3/ 1 05 0.030 Load current ILTA= +25C 4/ 6/ 1 All 10 mA Output voltage noise enp-p 0.1 Hz to 10 Hz 4/ 4 01,02,05 18 VP-P03,04 100 Output voltage TCVO4/ 7/ 8 01,03,05 8.5 ppm/C temperature coefficient 02,04 25 See footnotes at end of table. Pro

40、vided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 85514 DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 REVISION LEVEL J SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics continued. 1/ VIN=

41、15 V. 2/ Device type 01 supplied to this drawing has been characterized through all levels M, D, P, L, R of irradiation. Device type 05 supplied to this drawing has been characterized through all levels P and L of irradiation. However, device type 01 is only tested at the “R” level and device type 0

42、5 is only tested at the “L” level. Pre and Post irradiation values are identical unless otherwise specified in Table I. When performing post irradiation electrical measurements for any RHA level, TA= +25C. 3/ For device type 01, this part may be dose rate sensitive in a space environment and may dem

43、onstrate enhanced low dose rate effects. Radiation end point limits for the noted parameters are guaranteed only for the conditions specified in MIL-STD-883, method 1019, condition A for device type 01 and condition D for device type 05. Device type 05, has been tested at low dose rate. 4/ This para

44、meter is not tested to post irradiation. 5/ Line and load regulation specifications include the effect of self heating. 6/ Minimum of 10 mA load current guaranteed by load regulation test. 7/ TCVO= (VMAX- VMIN) / 5 V x (-55C to +125C) x (1 x 106) / 180C. 3.5.1 Certification/compliance mark. The cert

45、ification mark for device classes Q and V shall be a “QML“ or “Q“ as required in MIL-PRF-38535. The compliance mark for device class M shall be a “C“ as required in MIL-PRF-38535, appendix A. 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required fro

46、m a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate

47、 of compliance submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturers product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535,

48、 appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DLA Land and Maritime-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 Verification and review for device class M. For device class M, D