DLA SMD-5962-86050-1986 MICROCIRCUITS DIGITAL PROGRAM CONTROL UNIT PUSH-POP STACK MONOLITHIC SILICON《硅单块 程序控制装置 数字微型电路》.pdf

1、 a b 0122852 820 PRCPARLD BY c- Lzn.a-c/i Lrf4QIlqh “tlKif?izk ;rb2 - DAT L - BEFfltE flftTIDIICt SW11 CfllfP BATTO, OU11 TITLE MICROCIRCUITS, DIGITAL, PROGRAM CONTROL UI4IT/PUSH-POP STACK, APPROVED 1 Prepared in accordance with DOD-STD-100 Selected item drawing Original date of drawing 7 March 1986

2、 e- I 1 REV PAOE 1 or :5 I 6 I D ! 3.6.3 Qual i ty confonnance inspection. qua1 i ty conformance inspection shall be in accordance with !IL-M-38510 and 4.4 herein. 3.6.4 Burn-in test circuit documentation. ivailable to the acquiring activity on request. The burn-in test circuit 4ocumentation Shall b

3、e made 3.7 !danufacturer eligibility. To be eligible to supply microcircuits to this 4rauing. a manufacturer shall have manufacturer certification in accordance with YIL-#-38510.for at least one line in4 have part I listing on Qualified Products List OPL-38510 for at least one device type (not ieces

4、sarlly the one For which the acquisition of this drawing is to apply). wder to be listed as an approved source of supply (see 6.7 and 6.8). 3.8 Certificate of compliance. 4 certificate of compliance shall Je required from a nanufacturer in 4. QUALITY ASSURANCE PROVISIOiiS 4.1 Sampling an4 inspection

5、. Sanplin and inspection procedures shall be in accordance with (IL-M-38510 and method 50U5 of MIL-ST-d3, except as modified herein. 4.2 Screenin . Screening shall e in accordance with niethod 5004 of !41L-STD-883,aan4 shall :onductd devices prior to quality conformance inspection. The following add

6、itional cr shall apply: a. Burn-in test (method 1015 of ;4IL-STD-983). (1) Test condition 4, 8, C. or O. (2) T4 = *125*C, minimum. be teri a b. Interim and ffnal electrical test p3raaeters shall be as specified in table II herein, except interim elpctrfcal parameter tests prior to burn-in aro option

7、al at the discretion of the aanu facturer. The percent defective allowable (PDA) sball be as specified in HIL-M-38510. c. 4.3 Qualification inspection. 4.4 QiJal ification inspection for the device type specified herein shall not be required. Qual i ty confonnance inspection. MIL-M-38510 and method

8、5005 of MIL-STD-883. inspection lot or as specified in inethod 5005 of MIL-STD-883. Groups C and D shall be performed on a periodic basis in accordance with NIL-M-38510. Generic test data (see 6.5) may be used to satisfy the requirements for groups C and D inspections. (rninimvnl, inoni tor for comp

9、liance to the prescribed procedures, and observe that WtiSfaCtOrY nanufacturing conditions and records on lots 3re inaintained for these devices. The records, inClUdin3 an attri5utes sumnary of all screening and quality conformance inspections conducted on each lot shall Se av21aSle For review by cu

10、stomers at all :ines. Qudl ity conformance inspection shall be in accordance with Sroups A and B inspections shall be performed on eich Yanufacturers shall keep lot records for 5 years Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TABLE II. Electri

11、cal test requirements. I I sungroups r I HIL-ST-a3 test requirements I (per method I I I 5005, table I) I I I I 1nter.n electrical pamneters I I I (method 5904) I I I I IFinal electrical test parameters I Iimethod 5004) I 1“. 2. 3. 7. 8.1 - SIZE CODE IDENT. NO. DEFENSE ELECTRONICS SUPPLY CENTER 4 14

12、933 .- I I 9; l, il I I(method 5005) I 1, 2, 3, 7, 8, I I I 9, 10, 11- I lei ectrical parameters I 1, 2, 3 I I (method 5005) I I 1 I I JAdditional electrical subgroups I I Ifor group C periodic inspections I I I I niroup A test requirements I xrorips C and D end-point I - DWG NO. 86050 * POA applies

13、 to subgroup 1 (see 4.2). * Subgroups 10 and 11. if not tested, shall be guaranteed to the specified limits in table I. REV 4.4.1 Group A ins ection. Group A inspection shall consist of the test subgroups and LTPO values hown in table I ot kthoa M O5 of MIL-ST9-883, class B. and as follows: PAGE 13

14、a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be mitted. 4.4.2 Group li inspection. 4.4.3 Group 8 inspectfon shall consist of the test subgroups and LTPO values Groups C and O inspections shall consist of the test subgroups ;

15、horn In table Il8 of method 5005 of YIL-STO-883. class E. ind LIP0 values shown in tables II and IV, method 5005 of MIL-STO-883, class 8, and as follows: Groups C and D inspections. a. End-point electrical parameters shall Le as specified in table II herein. b. Steady-state 1 ife test (method 1005 o

16、f MIL-STD-883) conditions: (1) Test condition A, B. C, or D. (2) T4 = +1?5*C, minimum. (3) Test duration: 1,000 hours, except as permitted by appendix 8 of NIL-M-38510 and method 1005 of MIL-STO-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-5.

17、 PACKAC I tfG 6 . fi:) TES 6.1 Votes. 6.2 Only the note “Xeevdluation 3f lot qwiity“ of the noter specified in MIL-?1-3951r) shall - pply to thi drasJing. ,pecifications do not exist and qualified nilitary devices that will perform the required function are iot available for OE:4 3pplication. if unn

18、ecesc,ary duplicate s?ecifications, drawings, .in4 stock catalog 1 istings. pecification exists and the product covered by this drawing has been qualified for listin on )PL-33510, this drawing ,411 Se inactivated and will not be used for new design. The OPL-!OSlO product #hail be the preferred itein

19、 for all applications. Intended use. Yicrocircuits conforming to this drawing are intended for use Wien military This drading is intended exclusively to prevent the proliferation Yhen d ailitary 6.3 Ordering lata. The contract or purchase order should specify the FolloHing: a. b. Complete part numbe

20、r (see 1.2). Requireinents for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. C. Requirements for certificate of conpliance. if applicable. d. Requirements for notific

21、ation of change of product or process to the contracting activity, if appl icable. Reqiiirements for special carriers, leal lenjths, 9r lead foming, if applicable. requireinents shall not affect the ?art number. Hill not apply to direct shipment to the Government. 6 4 Re laceabilit 6.5 Generic test

22、iata. e. These Unless otherwise specified. these requirements Yicrocircuits covered by this drawing will replace the same generic device Scneric test data my be used to satisfy the requirements of 4.4.3. :ov;re*or-prepared specification or drawing. jeneric test datd shall se on date codes ?o qore th

23、an 1 year old and on a die in the same aictocirciiit jroup (see appendix E of 41L-:1-38513) with the sane :naterial, desigri, and process and from the sane )lant 3s the lie represented. Group O generic dita ;hall be on date codes no more than 1 year old and in the sme package type (terns, definition

24、s, and spnbols of :4IL-M-38513) and from the same plant as the package represented. The vendor is required to retain the generic data for a period of not leSS than 5 years from the date of shipment. Group C 6.6 Comments. Comments an this &Hing should be directed to OESC-ECS, Dayton, Ohio 45444. or t

25、elephone 513-296-5375. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-3 SIZE DEFENSE ELECTRONICS SUPPLY CENTER A 6.7 Submission of certificate of compliance. The certificate of compliance submitted to DESC-ECS, irior to listing as an approved source

26、 of supply in 6.9. shall state that the manufacturer?s product ieets the provisions for MIL-STO-883 compliant devices and the requirements herein. CODE IDENT. NO. DWG NO. 14933 36053 6.8 Approved source of supply. An approved source of supply is listed herein. Additional sources rill be added as the

27、y becane ivailable. :ertificate of compliance (see 3.9) has been submitted to #ESC-ECS. The vendor listed herein has agreed to this drawing and a REV 1 I Vendor I Vendor I Rep1 acement r I ESC drawing I FSCH I similar part Imilitary specification1 I part number I number I number 1 part number I I I

28、1 I I I I I I I I 86050019X I 34335 I AM2932/BRA I I I I I I - PAGE 15 Vendor FSCM number 34335 Vendor name and address Advanced Mcro Devices, Incorporated 901 Thompson Place P. o. Box 3453 Sunnyvale, CA 94088 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-