DLA SMD-5962-86707 REV A-2010 MICROCIRCUIT MEMORY DIGITAL OCTAL DYNAMIC MEMORY DRIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update drawing to current requirements. Editorial changes throughout. ksr 10-02-22 Charles F. Saffle THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV A A A A A A A A A A A A OF SHE

2、ETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 PMIC N/A PREPARED BY Sandra Rooney DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCUIT, ME

3、MORY, DIGITAL, OCTAL DYNAMIC MEMORY DRIVER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-09-11 AMSC N/A REVISION LEVEL A SIZE A CAGE CODE 14933 5962-86707 SHEET 1 OF 12 DSCC FORM 2233 APR 97 5962-E193-10 .Provided by IHSNot for ResaleNo reproduction or networ

4、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class

5、level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86707 01 R_ A Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device ty

6、pe(s) identify the circuit function as follows: Device type Generic number Circuit function 01 2965 Octal dynamic memory driver with three-state outputs and inverting drivers 02 2966 Octal dynamic memory driver with three-state outputs and non-inverting drivers 1.2.2 Case outline(s). The case outlin

7、e(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or CDIP2-T20 20 dual-in-line package 2 CQCC1-N20 20 square chip carrier package 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolu

8、te maximum ratings. Supply voltage range - -0.5 V dc to 7.0 V dc Input voltage range - -1.5 V dc to 5.5 V dc Storage temperature range - -65C to +150C Maximum power dissipation 1/ Device type 01 - 770 mW Device type 02 - 830 mW Lead temperature (soldering, 10 seconds) - +300C Thermal resistance, jun

9、ction-to-case (JC): Case outline R and 2 - See MIl-STD-1835 Junction temperature (TJ) - +175C 1.4 Recommended operating conditions. Supply voltage (VCC) - 4.5 V dc minimum to 5.5 V dc maximum Minimum high-level input voltage (VIH) - 2.0 V dc Maximum low-level Input low voltage (VIL) - 0.8 V dc Case

10、operating temperature range (TC) - -55C to +125C 1/ Must withstand the added PDdue to short circuit test (e.g., IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUM

11、BUS, OHIO 43218-3990 REVISION LEVEL A SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues

12、 of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard

13、Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at https:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Or

14、der Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and

15、regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qual

16、ified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-

17、PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark

18、 in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Terminal connections. The terminal con

19、nections shall be as specified on figure 1. 3.2.2 Logic diagram. The logic diagram shall be as specified on figure 2. 3.2.3 Truth table. The truth table shall be as specified on figure 3. 3.2.4 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.3 Electrical performance char

20、acteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The

21、electrical tests for each subgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN

22、 number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicato

23、r “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPP

24、LY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC+125C 4.5 V VCC 5.5 V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output high voltage VOHVCC= 4.

25、5 V and 5.5 V, 1/ IOH= -1.0 mA, 1, 2, 3 All VCC-1.5 V IN= VIH, VILOutput low voltage VOL1VCC= 4.5 V IOL= 1.0 mA 1, 2, 3 All 0.5 V VOL2VIN= VIHor VILIOL= 12.0 mA 0.8 Input high voltage 2/ VIH1, 2, 3 All 2.0 V Input low voltage 2/ VIL1, 2, 3 All 0.8 V Input low voltage 2/ VICVCC= 4.5 V, IIN= -18 mA 1,

26、 2, 3 All -1.2 V Input low current IILVIN= 5.5 V, VIN= 0.4 V DATA 1, 2, 3 All -200 A 1G , 2G -400 Input high current IIH1VCC= 5.5 V VIN= 2.7 V 1, 2, 3 All 20 A IIH2VIN= 7.0 V 0.1 mA Off-state output current IOZHVCC= 5.5 V, G = VIHVO= 2.7 V 1, 2, 3 All 100 A IOZL O= 0.4 V -200 Output sink current IOL

27、VCC= 4.5 V, VOL= 2.0 V 1, 2, 3 All 50 mA Output source current IOHVCC= 4.5 V, VOH= 2.0 V 1, 2, 3 All -35 mA Output short circuit IOSVCC= 5.5 V, 1, 2, 3 All -60 -200 mA current 3/ VO= 0 V Supply current ICC1VCC= 5.5 V, outputs open Outputs high 1, 2, 3 01 50 mA 02 75 ICC2Outputs low 01 125 02 130 ICC

28、3Outputs high Z 01 125 02 150 Functional tests (see 4.3.1c) 7, 8A, 8B All Propagation delay time, tPLH1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 6.0 15 ns from low to high output tPLH2CL= 50 pF 9, 10, 11 4.0 20 (see figure 4) tPLH3CL= 500 pF, TC= +25C 4/ 18 30tPLH4CL= 500 pF 4/ 18 40 Propagation delay t

29、ime, tPHL1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 5.0 15 ns from high to low output tPHL2CL= 50 pF 9, 10, 11 01 6.0 22 02 4.0 20 (see figure 4) tPHL3CL= 500 pF, TC= +25C 4/ All 18 30 tPHL4CL= 500 pF 4/ All 18 40 See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking

30、permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TC+125C 4.5 V VCC 5.5

31、V unless otherwise specified Group A subgroups Device type Limits Unit Min Max Output enable time, from low (see figure 5) tPLZ1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 20 ns tPLZ2CL= 50 pF 10, 11 All 24 Output enable time, from high (see figure 5) tPHZ1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 12 ns tPHZ2

32、CL= 50 pF 10, 11 All 16 Output disable time, from low (see figure 5) tPZL1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 20 ns tPZL2CL= 50 pF 10, 11 All 28 Output disable time, from high (see figure 5) tPZH1VCC= 5.0 V, CL= 50 pF, TC= +25C 9 All 20 ns tPZH2CL= 50 pF 10, 11 All 28 Output to output skew tSKEWVC

33、C= 5.0 V, CL= 50 pF All 3.0 ns 5/ TC= +25C Output to voltage undershoot 5/ VONPCL= 50 pF All -0.5 V 1/ VOHis tested at both VCC= 4.5 V and VCC= 5.5 V. 2/ Input thresholds are tested during DC tests and may be done in combination with testing of other DC parameters. 3/ Not more than one output should

34、 be shorted at a time. Duration of short-circuit should not exceed one second. 4/ 500 pF loads are not tested, but correlated to 50 pF loads. 5/ Parameter guaranteed to the limits specified in table I, but not tested. Provided by IHSNot for ResaleNo reproduction or networking permitted without licen

35、se from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 6 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approve

36、d source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of con

37、formance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and r

38、eview. Defense Supply Center Columbus (DSCC), DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and i

39、nspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall

40、 apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs, outputs

41、, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are opti

42、onal at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall b

43、e as specified in table II herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7, 8A, and 8B tests shall be sufficient to verify the function table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table

44、II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing activity upon request. The test circuit shall spe

45、cify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or ne

46、tworking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 7 DSCC FORM 2234 APR 97 Device types All Case outlines R and 2 Terminal number Terminal symbol 1 1G 2 1A13 2Y44 1A25 2Y36 1A

47、37 2Y28 1A49 2Y110 GND 11 2A112 1Y413 2A214 1Y315 2A316 1Y217 2A418 1Y119 2G 20 VCCFIGURE 1. Terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86707 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL A SHEET 8 DSCC FORM 2234 APR 97 FIGURE 2. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without