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本文(DLA SMD-5962-86712 REV D-2007 MICROCIRCUIT LINEAR DUAL-IMPACT GATED WIDEBAND AMPLIFIER MONOLITHIC SILICON《硅单块 选通宽带放大器 双影响直线型微型电路》.pdf)为本站会员(hopesteam270)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-86712 REV D-2007 MICROCIRCUIT LINEAR DUAL-IMPACT GATED WIDEBAND AMPLIFIER MONOLITHIC SILICON《硅单块 选通宽带放大器 双影响直线型微型电路》.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Changes in accordance with NOR 5962-R306-92. 92-11-05 CHARLES BESORE B Changes in accordance with NOR 5962-R014-95. 94-10-28 M. A. FRYE C Changes in accordance with NOR 5962-R175-96. 96-07-10 M. A. FRYE D Drawing updated as part of 5 year review.

2、 -rrp 07-04-13 Robert M. Heber THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. CURRENT CAGE CODE 67268 REV SHET REV SHET REV STATUS REV D D D D D D D D OF SHEETS SHEET 1 2 3 4 5 6 7 8 PMIC N/A PREPARED BY DONALD R. OSBORNE DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHEC

3、KED BY D. A. DiCENZO COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. HAUCK MICROCIRCUIT, LINEAR, DUAL-IMPACT, GATED WIDEBAND AMPLIFIER, MONOLITHIC SILICON AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 86-12-05

4、AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 14933 5962-86712 SHEET 1 OF 8 DSCC FORM 2233 APR 97 5962-E659-06 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

5、43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in

6、the following example: 5962-86712 01 C X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 1545 Two-channel input wideband amplifier 1.

7、2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style C GDIP1-T14 or CDIP2-T14 14 Dual-in-line I MACY1-X10 10 Can 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Ab

8、solute maximum ratings. Supply voltage 12 V dc Input differential voltage range . 5 V dc Load current . 25 mA Power dissipation (PD), TA= 25C: Case C . 625 mW 1/ Case I . 680 mW 1/ Storage temperature range -65C to +150C Lead temperature (soldering, 60 seconds) . +300C Junction temperature . 150C 1.

9、4 Recommended operating conditions. Ambient operating temperature range (TA) -55C to +125C 1/ Derate above TA= 25C, 5.0 mW/C for case C and 4.6 mW/C for case I.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-

10、86712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified here

11、in. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microci

12、rcuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch

13、/ or http:/assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes preceden

14、ce. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as spec

15、ified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved

16、 program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not

17、 affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-3853

18、5, appendix A and herein. 3.2.1 Case outline. The case outline shall be in accordance with 1.2.2 herein. 3.2.2 Functional diagram and terminal connections. The functional diagram and terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics. Unless otherwise

19、specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each s

20、ubgroup are described in table I. 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN number is not feasible due

21、 to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced wit

22、h a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS

23、, OHIO 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test Symbol Conditions 1/ -55C TA +125C unless otherwise specified Group A subgroups Device type Limits Unit Min MaxInput offset voltage VIO1 01 5.0 mV dc 2, 3 6.0 Input bias current IIB

24、1 01 25 A dc 2, 3 60 Gate current low IgL(G)VIL(G)= 0 V 1 01 2.5 mA dc 2, 3 3.0 Gate current high IgH(G)VIH(G)= +5.0 V 1, 3 01 2.0 A dc 2 20 Gate voltage low VgL(G)2/ 1 01 0.45 V dc 2, 3 0.15 Gate voltage high VgH(G)3/ 1 01 2.2 V dc 2, 3 2.5 Power supply drain ID+ 1 01 11 mA dc ID- 2, 3 13 Input imp

25、edance ZINf = 50 kHz 4 01 4.0 k 5, 6 3.0 Output voltage swing VOPEIN= 200 mV rms, f = 50 kHz, RL= 1,000 4 01 1.5 VP-P5, 6 1.0 Single-ended voltage gain AV EIN= 20 mV rms, CL= 15 pF 4 01 6.3 11.2 V/V 5, 6 5.0 12.6 Bandwidth 4/ BW EIN= 20 mV rms, CL= 15 pF 4 01 45 MHz 5, 6 35 Rise time 5/ trEIN= 20 mV

26、 rms, CL= 15 pF, see figure 2 9 01 15 ns Fall time 5/ tfEIN= 20 mV rms, CL= 15 pF, see figure 2 9 01 15 ns Propagation delay 5/ tPD+ EIN= 20 mV rms, CL= 15 pF, see figure 2 9 01 10 ns tPD- 10 1/ VCC= +5.0 V dc, VEE= -5.0 V dc, unless otherwise specified. 2/ VIL(G)is the gate voltage which results in

27、 channel A gain of unity or less and channel B gain of 16 dB or greater at TA= +25C (14 dB or greater at TA= -55C, +125C). 3/ VIH(G)is the gate voltage which results in channel B gain of unity or less and channel A gain of 16 dB or greater at TA= +25C (14 dB or greater at TA= -55C, +125C). 4/ Bandwi

28、dth if not tested shall be guaranteed to the specified limits. 5/ If not tested, shall be guaranteed to the limits specified in table I herein.Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENSE SUP

29、PLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 FIGURE 1. Functional diagram and terminal connections. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENS

30、E SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 FIGURE 2. Timing waveforms. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENSE SUPPLY CENTER COLUMB

31、US COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted

32、 to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be pro

33、vided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufac

34、turers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening

35、 shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained b

36、y the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-ST

37、D-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Quality conformance inspection. Quality conformance inspection s

38、hall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 10 and 11 in table I, method 5005 of MIL-STD-883 shall be

39、omitted. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test conditions, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision

40、 level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test du

41、ration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86712 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8

42、DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) 1 Final electrical test parameters (method 5004) 1*, 2, 3, 4, 5, 6, 9 Group A test requirements (me

43、thod 5005) 1, 2, 3, 4, 5, 6, 9 Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A. 6. NOTES 6.1 Intended use. Microcircuits con

44、forming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or dr

45、awing. 6.3 Configuration control of SMDs. All proposed changes to existing SMDs will be coordinated with the users of record for the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall

46、inform Defense Supply Center Columbus (DSCC) when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devi

47、ces (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-0547 6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in M

48、IL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 07-04-13 Approved sources of supply for SMD 5962-86712 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-3

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