DLA SMD-5962-86720 REV B-2009 MICROCIRCUIT DIGITAL BIPOLAR BUS TRANSCEIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Update to reflect latest changes in format and requirements. Editorial changes throughout. -les 01-11-26 Raymond Monnin B Update drawing to current requirements. Editorial changes throughout. - gap 09-02-12 Robert M. Heber CURRENT CAGE CODE IS 67

2、268 The original first sheet of this drawing has been replaced. REV SHET REV SHET REV STATUS REV B B B B B B B B B B OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3

3、990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY Charles Reusing MICROCIRCUIT, DIGITAL, BIPOLAR, BUS AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-02-03 TRANSCEIVER, MONOLITHIC SILICON AMSC N/A REVISION LEVEL B SIZE A CAGE CODE 14933 59

4、62-86720 SHEET 1 OF 10 DSCC FORM 2233 APR 97 5962-E454-08 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 2 DSCC FORM 2234

5、 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86720 01 E X Drawing n

6、umber Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 26S10 Quad bus transceiver 1.2.2 Case outline(s). The case outline(s) are as designated in MIL

7、-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style E GDIP1-TF16 or GDIP2-T16 16 Dual-in-line package F GDFP2-F16 or GDFP3-F16 16 Flat package 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 A

8、bsolute maximum ratings. Supply voltage . -0.5 V +7.0 V Input voltage range . -1.5 V to +7.0 V Storage temperature range . -65C to +150C Maximum power dissipation (PD) per device 1/ 700 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) . See MIL-STD-1835 Jun

9、ction temperature (TJ) +150C DC input current -30 mA to +5.0 mA DC output current into bus 200 mA DC output current into outputs 30 mA 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5 V dc minimum to 5.5 V dc maximum Minimum high level input voltage (VIH) 2.0 V dc Maximum low

10、level input voltage (VIL) . 0.8 V dc Ambient temperature range (TA) . -55C to +125C _ 1/ Maximum power dissipation is defined as VCCx ICC, and must withstand the added PDdue to short circuit test (e.g. IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IH

11、S-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a p

12、art of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STAN

13、DARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available

14、 online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this dra

15、wing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B

16、devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the man

17、ufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modi

18、fications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specif

19、ied in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diag

20、ram. The logic diagram shall be as specified on figure 3. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requi

21、rements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 D

22、EFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For pa

23、ckages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-

24、38535, appendix A. The compliance indicator “C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be list

25、ed as an approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Ce

26、rtificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Ve

27、rification and review. DSCC, DSCCs agent, and the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampli

28、ng and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-i

29、n test, method 1015 of MIL-STD-883. (1) Test condition A, B, or C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biase

30、s, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at

31、 the discretion of the manufacturer. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Elec

32、trical performance characteristics. Test Symbol Conditions -55C TA+125C Group A subgroups Limits Unit unless otherwise specified Min Max High level output voltage (receiver) VOHVCC= 4.5 V, Bus inputs = 1.6 V or 2.4 V, IOH= -1.0 mA 1, 2, 3 2.5 V Low level output voltage (receiver) VOL 1VCC= 4.5 V, Bu

33、s inputs = 1.6 V or 2.4 V, IOL= 20 mA 1, 2, 3 0.5 V IOL= 40 mA 1, 2, 3 0.5 V IOL= 70 mA 1, 2, 3 0.7 V Low level output voltage (bus) VOL 2VCC= 4.5 V, VIN= 0.8 V or 2.0 V IOL= 100 mA 1, 2, 3 0.8 V Input clamp voltage VI CVCC= 4.5 V, IIH= -18 mA 1, 2, 3 -1.2 V High level input current II H1 Enable 1,

34、2, 3 20 A VCC= 5.5 V, VIN= 2.7 V Data 1, 2, 3 30 A II H2 VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 100 A Low level input current IILEnable 1, 2, 3 -0.36 mA VCC= 5.5 V, VIN= 0.4 V Data 1, 2, 3 -0.54 mA Short circuit output current IOSVCC= 5.5 V, VOUT= 0.0 V 1/ 1, 2, 3 -20 -55 mA Bus leakage current (high impeda

35、nce) IOVCC= 5.5 V VO= 0.8 V 1, 2, 3 -50 A O= 4.5 V 1, 2, 3 200 A Bus leakage current (power off) IOFFVO= 4.5 V, VCC= 0.0 V 1, 2, 3 100 A Supply current ICCVCC= 5.5 V, All bus outputs low, Enable = GND 1, 2, 3 70 mA See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networ

36、king permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions -55C TA+125C Group A

37、 subgroups Limits Unit unless otherwise specified Min Max 2/ 9 15 ns Propagation delay time, data input to bus tPLH1, tPHL13/ 9, 10, 11 18 ns 2/ 9 18 ns Propagation delay time, enable input to bus tPLH2, tPHL2CB= 50 pF RB= 50 3/ 9, 10, 11 21 ns Propagation delay time, bus to receiver output 2/ 9 15

38、ns tPLH3, tPHL3CB= 50 pF, RB= 50 CL= 15 pF, RL= 280 3/ 9, 10, 11 22 ns Bus output rise time tr 2/ 9, 10, 11 4 ns 3/ 9, 10, 11 4 ns Bus output fall time tf 2/ 9, 10, 11 2 ns CB= 50 pF RB= 50 3/ 9, 10, 11 2 ns 1/ Not more than one output should be shorted at a time, and the duration of the short circu

39、it condition should not exceed one second. 2/ VCC= +5.0 V. 3/ VCC= +4.5 V to +5.5 V. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEV

40、EL B SHEET 7 DSCC FORM 2234 APR 97 Case outlines E and F 2 Terminal number Terminal symbols 1 GND1NC 2 B0 GND1 3 Z0 B0 4 I0Z0 5 I1I0 6 Z1 NC 7 B1 I1 8 GND2Z1 9 B2 B1 10 Z2 GND2 11 I2 NC 12 E B2 13 I3 Z2 14 Z3 I2 15 B3 E 16 VCCNC 17 I318 Z3 19 B3 20 VCC FIGURE 1. Terminal connections. Inputs Outputs

41、E I B Z L L H L L H L H H X Y Y H = High voltage level L = Low voltage level X = Irelevant Y = Voltage level of bus (Assumes control by another bus transceiver) FIGURE 2. Truth table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRC

42、UIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 8 DSCC FORM 2234 APR 97 FIGURE 3. Logic diagram. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-8

43、6720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 9 DSCC FORM 2234 APR 97 TABLE II. Electrical test requirements. MIL-STD-883 test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (method 5004) - - - Final

44、electrical test parameters (method 5004) 1*, 2, 3, 7, 8, 9 Group A test requirements (method 5005) 1, 2, 3, 7, 8, 9, 10*, 11* Groups C and D end-point electrical parameters (method 5005) 1, 2, 3 * PDA applies to subgroup 1. * Subgroups 10 and 11, if not tested, shall be guaranteed to the limits spec

45、ified in table I. 4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-883 including groups A, B, C, and D inspections. The following additional criteria shall apply. 4.3.1 Group A inspection. a. Tests shall be as specified in table II

46、 herein. b. Subgroups 4, 5, and 6 in table I, method 5005 of MIL-STD-883 shall be omitted. c. Subgroups 7 and 8 shall include verification of the truth table. 4.3.2 Groups C and D inspections. a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test cond

47、itions, method 1005 of MIL-STD-883. (1) Test condition A, B, or C. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biase

48、s, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. (2) TA= +125C, minimum. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86720 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL B SHEET 10 DSCC FORM 2234 APR 97 5. PACKAGING 5.1 P