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本文(DLA SMD-5962-86723 REV D-2009 MICROCIRCUIT DIGITAL BIPOLAR OCTAL 3-STATE BIDIRECTIONAL BUS TRANSCEIVER MONOLITHIC SILICON.pdf)为本站会员(confusegate185)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

DLA SMD-5962-86723 REV D-2009 MICROCIRCUIT DIGITAL BIPOLAR OCTAL 3-STATE BIDIRECTIONAL BUS TRANSCEIVER MONOLITHIC SILICON.pdf

1、 REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Add device 02. Editorial changes throughout. Change drawing CAGE to 67268. 90-03-07 W. Heckman B Changes IAW NOR 5962-R023-99. - ljs 99-01-27 Raymond Monnin C Update to reflect latest changes in format and requirements. Editorial changes througho

2、ut. -les 01-11-28 Raymond Monnin D Update drawing to current requirements. Editorial changes throughout. - gap 09-03-12 Robert M. Heber CURRENT CAGE CODE 67628 The original first sheet of this drawing has been replaced. REV SHET REV D D SHET 15 16 REV STATUS REV D D D D D D D D D D D D D D OF SHEETS

3、 SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY David W. Queenan DEFENSE SUPPLY CENTER COLUMBUS STANDARD MICROCIRCUIT DRAWING CHECKED BY D. A. DiCenzo COLUMBUS, OHIO 43218-3990 http:/www.dscc.dla.mil THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS APPROVED BY N. A. Hauck MICROCIRCU

4、IT, DIGITAL, BIPOLAR, OCTAL, 3-STATE, BIDIRECTIONAL, BUS TRANSCEIVER, AND AGENCIES OF THE DEPARTMENT OF DEFENSE DRAWING APPROVAL DATE 87-02-09 MONOLITHIC SILICON AMSC N/A REVISION LEVEL D SIZE A CAGE CODE 14933 5962-86723 SHEET 1 OF 16 DSCC FORM 2233 APR 97 5962-E455-08 Provided by IHSNot for Resale

5、No reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 2 DSCC FORM 2234 APR 97 1. SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883

6、compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-86723 01 R X Drawing number Device type (see 1.2.1) Case outline(see 1.2.2) Lead finish(see 1.2.3)1.2.1 Devic

7、e type(s). The device type(s) identify the circuit function as follows: Device type Generic number Circuit function 01 2947 Octal, 3-state, bi-directional, bus transceivers noninverting 02 2946 Octal, 3-state, bi-directional, bus transceivers inverting 1.2.2 Case outline(s). The case outline(s) are

8、as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style R GDIP1-T20 or GDIP2-T20 20 Dual-in-line package 2 CQCC1-N20 20 Square chip carrier 1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A. 1.3 Absolute maximum rating

9、s. Supply voltage . -0.5 V dc to +7.0 V dc Input voltage range . -1.5 V dc to +5.5 V dc Storage temperature range . -65C to +150C Maximum power dissipation (PD) per device 1/ 775 mW Lead temperature (soldering, 10 seconds) +300C Thermal resistance, junction-to-case (JC) See MIL-STD-1835 Junction tem

10、perature (TJ) +175C 1.4 Recommended operating conditions. Supply voltage range (VCC) . +4.5 V dc to 5.5 V dc Minimum high level input voltage (VIH) 2.0 V dc Maximum low level input voltage (VIL) . 0.7 V dc Ambient operating temperature range (TA) . -55C to +125C _ 1/ Must withstand the added PDdue t

11、o short circuit test (e.g. IOS). Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 3 DSCC FORM 2234 APR 97 2. APPLICABLE DOC

12、UMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DE

13、FENSE SPECIFICATION MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - Li

14、st of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http:/assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of

15、precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item re

16、quirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing (QML) certified and qualified manufacturer or a manufacture

17、r who has been granted transitional certification to MIL-PRF-38535 may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make mo

18、difications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These modifications shall not affect the PIN as described herein. A “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is

19、used. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535, appendix A and herein. 3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein. 3.2.2 Terminal connections. The terminal connecti

20、ons shall be as specified on figure 1. 3.2.3 Truth table. The truth table shall be as specified on figure 2. 3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3. 3.2.5 Test circuit and switching waveforms. The test circuit and switching waveforms shall be as specified on figures

21、 4 through 6. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements sh

22、all be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO

23、 43218-3990 REVISION LEVEL D SHEET 4 DSCC FORM 2234 APR 97 3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturers PIN may also be marked. For packages where marking of the entire SMD PIN n

24、umber is not feasible due to space limitations, the manufacturer has the option of not marking the “5962-“ on the device. 3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to MIL-PRF-38535, appendix A. The compliance indicator

25、“C” shall be replaced with a “Q“ or “QML“ certification mark in accordance with MIL-PRF-38535 to identify when the QML flow option is used. 3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HD

26、BK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply shall affirm that the manufacturers product meets the requirements of MIL-PRF-38535, appendix A and the requirements herein. 3.7 Certificate of conformance. A certificate of c

27、onformance as required in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing. 3.9 Verification and review. DSCC, DSCCs agent, an

28、d the acquiring activity retain the option to review the manufacturers facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in acc

29、ordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. The following additional criteria shall apply: a. Burn-in test, method 1015 of MIL-STD-883. (1) Test

30、 condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable,

31、in accordance with the intent specified in method 1015 of MIL-STD-883. (2) TA= +125C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. Prov

32、ided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 5 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics. Test

33、Symbol Conditions -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max High level output voltage, A0- A7VOH1IOH= -0.4 mA 1, 2, 3 All 3.35 V VCC= 4.5 V, T/ R = 0.8 V, CD = 0.7 V IOH = -3.0 mA 1, 2, 3 All 2.7 V High level output voltage, B0- B7VOH2IOH= -0.4 mA 1, 2,

34、 3 All 3.35 V VCC= 4.5 V, T/ R = 2.0 V, CD = 0.7 V IOH = -5.0 mA 1, 2, 3 All 2.7 V OH= -10 mA 1, 2, 3 All 2.4 V Low level output voltage, A0- A7VOL1VCC= 4.5 V, T/ R = 0.8 V, CD = 0.7 V, IOL= 12 mA 1, 2, 3 All 0.4 V Low level output voltage, B0- B7VOL 2IOL= 20 mA 1, 2, 3 All 0.4 V VCC= 4.5 V, T/ R =

35、2.0 V, CD = 0.7 V IOL = 48 mA 1, 2, 3 All 0.55 V Input clamp voltage, A0- A7and B0- B7VI C1VCC= 4.5 V, CD = 2.0 V, IIN= -12 mA 1, 2, 3 All -1.5 V Input clamp voltage, CD, T/ R VI C2VCC= 4.5 V, IIN= -12 mA 1, 2, 3 All -1.5 V High level input current, A0- A7IIH1VCC= 5.5 V, T/ R = 2.0 V, CD = 0.7 V, VI

36、N= 2.7 V 1, 2, 3 All 80 A High level input current, B0- B7IIH2VCC= 5.5 V, T/ R = CD = 0.7 V, VIN= 2.7 V 1, 2, 3 All 80 A High level input current, CD, T/ R IIH3VCC= 5.5 V, VIN= 2.7 V 1, 2, 3 All 20 A High level input current, A0- A7, B0- B7IIH4VCC= 5.5 V, CD = 2.0 V, VIN= 5.5 V 1, 2, 3 All 1 mA High

37、 level input current, T/ R , CD IIH5VCC= 5.5 V, VIN= 5.5 V 1, 2, 3 All 1 mA Low level input current, A0- A7IIL1 VCC = 5.5 V, T/ R = 2.0 V, CD = 0.7 V, VIN= 0.4 V 1, 2, 3 All -200 A Low level input current, B0- B7IIL2 VCC = 5.5 V, T/ R = 0.7 V, CD = 0.7 V, VIN= 0.4 V 1, 2, 3 All -200 A Low level inpu

38、t current, CD, T/ R IIL3 VCC= 5.5 V, VIN= 0.4 V 1, 2, 3 All -250 A See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990

39、 REVISION LEVEL D SHEET 6 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C Group A subgroups Device type Limits Unit unless otherwise specified Min Max Short circuit output current, A0- A7IOS1 VCC = 5.5 V, T/ R = 0.8 V, CD = 0.7 V,

40、VOUT= 0.0 V 1/ 1, 2, 3 All -10 -75 mA Short circuit output current, B0- B7IOS2 VCC = 5.5 V, T/ R = 2.0 V, CD = 0.7 V, VOUT= 0.0 V 1/ 1, 2, 3 All -25 -150 mA Functional tests See 4.3.1c 7, 8 All A0- A71, 2, 3 All 80 A Off state output current high IOZH VCC= 5.5 V, CD = 2.0 V, VOUT= 4.0 V B0- B71, 2,

41、3 All 200 A Off state output current low, A0- A7, B0- B7IOZL VCC= 5.5 V, CD = 2.0 V, VOUT= 0.4 V 1, 2, 3 All -200 A VIN= 0.4 V 1, 2, 3 01 100 mA Supply current ICCVCC= 5.5 V, CD = 2.0 V, T/ R = 0.4 V VIN= 2.0 V 1, 2, 3 02 100 mA VIN= 0.4 V 1, 2, 3 01 140 mA VCC= 5.5 V, CD = 0.4 V, T/ R = 2.0 V VIN=

42、2.0 V 1, 2, 3 02 150 mA 01 18 ns 9 2/ 02 12 ns 01 24 ns tPHL1 9, 10, 11 3/ 02 19 ns 01 18 ns 9 2/ 02 16 ns 01 24 ns Propagation delay time, input B port to output A port tPLH1 CD = T/ R = 0.4 V, R1= 1 k, R2= 5 k, C1= 30 pF (See figure 4) 9, 10, 11 3/ 02 23 ns 9 2/ All 15 ns tPLZ1 B0- B7= 0.4 V, S3=

43、1 9, 10, 11 3/ All 21 ns 9 2/ All 15 ns Disable time, CD to A port tPHZ1 T/ R = 0.4 V, R5= 1 k, C4= 15 pF (See figure 6) B0- B7= 2.4 V, S3= 0 9, 10, 11 3/ All 21 ns See footnotes at end of table. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDA

44、RD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 7 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise s

45、pecified Min Max 9 2/ All 25 ns tPZL1 B0- B7= 0.4 V, S3= 1, R5= 1 k 9, 10, 11 3/ All 33 ns 9 2/ All 25 ns Enable time, CD to A port tPZH1C4= 30 pF, T/ R = 0.4 V, (See figure 6) 4/ B0- B7= 2.4 V, S3= 0, R5= 5 k 9, 10, 11 3/ All 33 ns 01 23 ns 9 2/ 02 18 ns 01 34 ns R1= 100 R2= 1 k C1= 300 pF 9, 10, 1

46、1 3/ 02 29 ns 01 18 ns 9 2/ 02 12 ns 01 25 ns tPHL2R1= 667 R2= 5 k C1= 45 pF 9, 10, 11 3/ 02 19 ns 01 23 ns 9 2/ 02 20 ns 01 34 ns R1= 100 R2= 1 k C1= 300 pF 9, 10, 11 3/ 02 30 ns 01 18 ns 9 2/ 02 14 ns 01 25 ns Propagation delay time, input A port to output B port tPLH2 CD = 0.4 V, T/ R = 2.4 V, (S

47、ee figure 4) 4/ R1= 667 R2= 5 k C1= 45 pF 9, 10, 11 3/ 02 22 ns 9 2/ All 18 ns tPLZ2 A0- A7= 0.4 V, S3= 1 9, 10, 11 3/ All 26 ns 9 2/ All 15 ns Disable time, CD to B port tPHZ2T/ R = 2.4 V, R5= 1 k C4= 15 pF, (See figure 6) 4/ A0- A7= 2.4 V, S3= 0 9, 10, 11 3/ All 21 ns See footnotes at end of table

48、. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-STANDARD MICROCIRCUIT DRAWING SIZE A 5962-86723 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 REVISION LEVEL D SHEET 8 DSCC FORM 2234 APR 97 TABLE I. Electrical performance characteristics Continued. Test Symbol Conditions -55C TA+125C Group A subgroupsDevice type Limits Unit unless otherwise specified Min Max 9 2/ All 35 ns R5= 100 C4= 300 pF 9, 10, 11 3/ All 43 ns 9 2/ All 22 ns tPZL2A0- A7= 0.4 V, T/ R = 2.4

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